JP5017332B2 - インバータ - Google Patents
インバータ Download PDFInfo
- Publication number
- JP5017332B2 JP5017332B2 JP2009192710A JP2009192710A JP5017332B2 JP 5017332 B2 JP5017332 B2 JP 5017332B2 JP 2009192710 A JP2009192710 A JP 2009192710A JP 2009192710 A JP2009192710 A JP 2009192710A JP 5017332 B2 JP5017332 B2 JP 5017332B2
- Authority
- JP
- Japan
- Prior art keywords
- wiring
- power
- power module
- cooling body
- external
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/44—Structure, shape, material or disposition of the wire connectors prior to the connecting process
- H01L2224/45—Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
- H01L2224/45001—Core members of the connector
- H01L2224/45099—Material
- H01L2224/451—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof
- H01L2224/45117—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof the principal constituent melting at a temperature of greater than or equal to 400°C and less than 950°C
- H01L2224/45124—Aluminium (Al) as principal constituent
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
- H01L2224/48135—Connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip
- H01L2224/48137—Connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip the bodies being arranged next to each other, e.g. on a common substrate
- H01L2224/48139—Connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip the bodies being arranged next to each other, e.g. on a common substrate with an intermediate bond, e.g. continuous wire daisy chain
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
- H01L2224/48151—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/48221—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/48245—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
- H01L2224/48247—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/49—Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
- H01L2224/491—Disposition
- H01L2224/4911—Disposition the connectors being bonded to at least one common bonding area, e.g. daisy chain
- H01L2224/49111—Disposition the connectors being bonded to at least one common bonding area, e.g. daisy chain the connectors connecting two common bonding areas, e.g. Litz or braid wires
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/13—Discrete devices, e.g. 3 terminal devices
- H01L2924/1304—Transistor
- H01L2924/1305—Bipolar Junction Transistor [BJT]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/13—Discrete devices, e.g. 3 terminal devices
- H01L2924/1304—Transistor
- H01L2924/1305—Bipolar Junction Transistor [BJT]
- H01L2924/13055—Insulated gate bipolar transistor [IGBT]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/13—Discrete devices, e.g. 3 terminal devices
- H01L2924/1304—Transistor
- H01L2924/1306—Field-effect transistor [FET]
- H01L2924/13091—Metal-Oxide-Semiconductor Field-Effect Transistor [MOSFET]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/30—Technical effects
- H01L2924/301—Electrical effects
- H01L2924/30107—Inductance
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/30—Technical effects
- H01L2924/301—Electrical effects
- H01L2924/3025—Electromagnetic shielding
Landscapes
- Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
- Inverter Devices (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2009192710A JP5017332B2 (ja) | 2009-08-24 | 2009-08-24 | インバータ |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2009192710A JP5017332B2 (ja) | 2009-08-24 | 2009-08-24 | インバータ |
Related Parent Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2006299816A Division JP4403166B2 (ja) | 2006-11-06 | 2006-11-06 | パワーモジュールおよび電力変換装置 |
Related Child Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2011114278A Division JP5202685B2 (ja) | 2011-05-23 | 2011-05-23 | インバータ |
JP2011114279A Division JP5188602B2 (ja) | 2011-05-23 | 2011-05-23 | インバータ |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2009278134A JP2009278134A (ja) | 2009-11-26 |
JP2009278134A5 JP2009278134A5 (enrdf_load_stackoverflow) | 2011-07-07 |
JP5017332B2 true JP5017332B2 (ja) | 2012-09-05 |
Family
ID=41443198
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2009192710A Expired - Lifetime JP5017332B2 (ja) | 2009-08-24 | 2009-08-24 | インバータ |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP5017332B2 (enrdf_load_stackoverflow) |
Families Citing this family (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2951375B2 (ja) * | 1990-07-31 | 1999-09-20 | 古河電気工業株式会社 | 低風騒音低コロナ騒音架空電線 |
JP5327646B2 (ja) | 2009-06-24 | 2013-10-30 | 株式会社デンソー | 電子回路内蔵型モータ |
EP2637285B1 (en) * | 2010-11-02 | 2020-04-01 | Mitsubishi Electric Corporation | Electric power steering power module and electric power steering drive control device employing same |
CN103229295B (zh) * | 2010-11-29 | 2016-01-06 | 丰田自动车株式会社 | 动力模块 |
WO2012108048A1 (ja) * | 2011-02-10 | 2012-08-16 | 三菱電機株式会社 | 電力変換装置 |
JP2013232445A (ja) * | 2012-04-27 | 2013-11-14 | Toshiba Corp | 半導体装置 |
DE102015104990B4 (de) | 2015-03-31 | 2020-06-04 | Infineon Technologies Austria Ag | Verbindungshalbleitervorrichtung mit einem Abtastlead |
JP6308978B2 (ja) * | 2015-06-16 | 2018-04-11 | 三菱電機株式会社 | 半導体装置 |
KR101663558B1 (ko) * | 2016-05-23 | 2016-10-07 | 제엠제코(주) | 패키지 파괴 방지 구조를 갖는 반도체 칩 패키지 |
WO2018198957A1 (ja) * | 2017-04-24 | 2018-11-01 | ローム株式会社 | 半導体装置 |
JP7484156B2 (ja) * | 2019-12-18 | 2024-05-16 | 富士電機株式会社 | 半導体装置 |
JP7026861B1 (ja) * | 2021-05-11 | 2022-02-28 | 三菱電機株式会社 | 半導体装置及び電力変換装置 |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2667510B2 (ja) * | 1989-05-20 | 1997-10-27 | 株式会社日立製作所 | 半導体装置およびこれを用いた電子装置 |
JPH03191553A (ja) * | 1989-12-20 | 1991-08-21 | Hitachi Ltd | 半導体装置およびその製造方法 |
JPH07231071A (ja) * | 1994-02-16 | 1995-08-29 | Toshiba Corp | 半導体モジュール |
JP3879150B2 (ja) * | 1996-08-12 | 2007-02-07 | 株式会社デンソー | 半導体装置 |
JP3550970B2 (ja) * | 1997-09-19 | 2004-08-04 | 株式会社日立製作所 | 電力変換装置並びに多層積層導体と電気部品接続体 |
JP3903681B2 (ja) * | 1999-03-11 | 2007-04-11 | 三菱マテリアル株式会社 | 半導体装置 |
JP4100483B2 (ja) * | 1999-08-25 | 2008-06-11 | 日本インター株式会社 | 複合半導体装置及びその製造方法 |
JP3529675B2 (ja) * | 1999-09-03 | 2004-05-24 | 株式会社東芝 | 半導体装置及びインバータ装置 |
JP3525832B2 (ja) * | 1999-11-24 | 2004-05-10 | 株式会社デンソー | 半導体装置 |
-
2009
- 2009-08-24 JP JP2009192710A patent/JP5017332B2/ja not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
JP2009278134A (ja) | 2009-11-26 |
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