JP5005256B2 - 磁場計測システム及び光ポンピング磁束計 - Google Patents
磁場計測システム及び光ポンピング磁束計 Download PDFInfo
- Publication number
- JP5005256B2 JP5005256B2 JP2006138389A JP2006138389A JP5005256B2 JP 5005256 B2 JP5005256 B2 JP 5005256B2 JP 2006138389 A JP2006138389 A JP 2006138389A JP 2006138389 A JP2006138389 A JP 2006138389A JP 5005256 B2 JP5005256 B2 JP 5005256B2
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- Prior art keywords
- magnetic field
- magnetometer
- vapor cell
- coil
- optical pumping
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- Expired - Fee Related
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
- G01R33/035—Measuring direction or magnitude of magnetic fields or magnetic flux using superconductive devices
- G01R33/0354—SQUIDS
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/20—Arrangements or instruments for measuring magnetic variables involving magnetic resonance
- G01R33/24—Arrangements or instruments for measuring magnetic variables involving magnetic resonance for measuring direction or magnitude of magnetic fields or magnetic flux
- G01R33/26—Arrangements or instruments for measuring magnetic variables involving magnetic resonance for measuring direction or magnitude of magnetic fields or magnetic flux using optical pumping
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S505/00—Superconductor technology: apparatus, material, process
- Y10S505/825—Apparatus per se, device per se, or process of making or operating same
- Y10S505/842—Measuring and testing
- Y10S505/843—Electrical
- Y10S505/845—Magnetometer
- Y10S505/846—Magnetometer using superconductive quantum interference device, i.e. squid
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- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Measuring Magnetic Variables (AREA)
- Measurement And Recording Of Electrical Phenomena And Electrical Characteristics Of The Living Body (AREA)
- Superconductor Devices And Manufacturing Methods Thereof (AREA)
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2006138389A JP5005256B2 (ja) | 2005-11-28 | 2006-05-18 | 磁場計測システム及び光ポンピング磁束計 |
| US11/604,767 US7656154B2 (en) | 2005-11-28 | 2006-11-28 | Magnetic field measurement system and optical pumping magnetometer |
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2005342698 | 2005-11-28 | ||
| JP2005342698 | 2005-11-28 | ||
| JP2006138389A JP5005256B2 (ja) | 2005-11-28 | 2006-05-18 | 磁場計測システム及び光ポンピング磁束計 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2007167616A JP2007167616A (ja) | 2007-07-05 |
| JP2007167616A5 JP2007167616A5 (enExample) | 2009-03-19 |
| JP5005256B2 true JP5005256B2 (ja) | 2012-08-22 |
Family
ID=38086804
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2006138389A Expired - Fee Related JP5005256B2 (ja) | 2005-11-28 | 2006-05-18 | 磁場計測システム及び光ポンピング磁束計 |
Country Status (2)
| Country | Link |
|---|---|
| US (1) | US7656154B2 (enExample) |
| JP (1) | JP5005256B2 (enExample) |
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| JPS5812878U (ja) * | 1981-07-15 | 1983-01-27 | 三菱電機株式会社 | 光磁気共鳴磁力計 |
| JPH01191080A (ja) * | 1988-01-26 | 1989-08-01 | Mitsubishi Electric Corp | 光磁気共鳴磁力計 |
| JP3655425B2 (ja) * | 1997-04-18 | 2005-06-02 | 株式会社東芝 | 生体磁場計測装置 |
| JP3451193B2 (ja) * | 1998-04-28 | 2003-09-29 | 株式会社日立製作所 | 生体磁場計測装置 |
| JPH11330768A (ja) * | 1998-05-18 | 1999-11-30 | Shimadzu Corp | 磁気遮蔽装置 |
| JP2000037362A (ja) * | 1998-07-21 | 2000-02-08 | Toshiba Corp | 環境雑音磁場の除去装置 |
| JP3379488B2 (ja) * | 1999-09-14 | 2003-02-24 | 株式会社日立製作所 | 磁場計測装置 |
| JP2002094280A (ja) * | 2000-09-18 | 2002-03-29 | Magbang Kk | アクティブシールド装置 |
| JP2002243817A (ja) * | 2001-02-21 | 2002-08-28 | Hitachi Ltd | 検出コイル一体型グラジオメータ及び磁場計測装置 |
| US6472869B1 (en) * | 2001-06-18 | 2002-10-29 | United States Of America As Represented By The Secretary Of The Air Force | Diode laser-pumped magnetometer |
| US7038450B2 (en) * | 2002-10-16 | 2006-05-02 | Trustees Of Princeton University | High sensitivity atomic magnetometer and methods for using same |
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