JP4980818B2 - 多点プローブの零点誤差の変動検出方法 - Google Patents

多点プローブの零点誤差の変動検出方法 Download PDF

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JP4980818B2
JP4980818B2 JP2007205342A JP2007205342A JP4980818B2 JP 4980818 B2 JP4980818 B2 JP 4980818B2 JP 2007205342 A JP2007205342 A JP 2007205342A JP 2007205342 A JP2007205342 A JP 2007205342A JP 4980818 B2 JP4980818 B2 JP 4980818B2
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measurement
error
value
zero point
sensors
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JP2009041983A5 (enrdf_load_stackoverflow
JP2009041983A (ja
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慧 清野
尚一 島田
豊 宇田
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Nagase Integrex Co Ltd
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JP2007205342A 2007-08-07 2007-08-07 多点プローブの零点誤差の変動検出方法 Active JP4980818B2 (ja)

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JP2009041983A JP2009041983A (ja) 2009-02-26
JP2009041983A5 JP2009041983A5 (enrdf_load_stackoverflow) 2012-05-10
JP4980818B2 true JP4980818B2 (ja) 2012-07-18

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Families Citing this family (6)

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Publication number Priority date Publication date Assignee Title
JP5252649B2 (ja) * 2009-06-15 2013-07-31 株式会社ナガセインテグレックス 校正装置及び真直形状測定装置
JP2014137274A (ja) * 2013-01-16 2014-07-28 Sumitomo Heavy Ind Ltd 幾何学量取得装置及び幾何学量取得方法
CN105937886B (zh) * 2015-03-04 2020-01-10 住友重机械工业株式会社 形状测量装置、加工装置及形状测量装置的校正方法
JP6444783B2 (ja) * 2015-03-18 2018-12-26 住友重機械工業株式会社 形状計測装置、加工装置及び形状計測装置の校正方法
CN113833951A (zh) * 2021-10-22 2021-12-24 上海海事大学 一种波浪补偿平台传感器放置架
KR102826256B1 (ko) * 2023-07-06 2025-06-27 에이치디현대일렉트릭 주식회사 금속부재의 열처리 상태를 진단하는 포터블 진단장치 및 진단방법

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001041733A (ja) * 1999-07-30 2001-02-16 Univ Chuo 表面形状計測装置
JP3790961B2 (ja) * 2001-11-26 2006-06-28 株式会社東北テクノアーチ 表面形状測定装置
WO2006064445A1 (en) * 2004-12-16 2006-06-22 Koninklijke Philips Electronics N.V. Sequential multi-probe method for measurement of the straightness of a straightedge
JP4452651B2 (ja) * 2005-05-31 2010-04-21 株式会社ナガセインテグレックス 逐次３点法における零点誤差補正方法及び零点誤差補正装置
JP4866807B2 (ja) * 2007-07-30 2012-02-01 株式会社岡本工作機械製作所 表面形状校正装置および表面形状校正方法

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