JP4974021B2 - プローブ組立体 - Google Patents

プローブ組立体 Download PDF

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Publication number
JP4974021B2
JP4974021B2 JP2006073505A JP2006073505A JP4974021B2 JP 4974021 B2 JP4974021 B2 JP 4974021B2 JP 2006073505 A JP2006073505 A JP 2006073505A JP 2006073505 A JP2006073505 A JP 2006073505A JP 4974021 B2 JP4974021 B2 JP 4974021B2
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JP
Japan
Prior art keywords
probe
resin film
vertical probe
vertical
probe assembly
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2006073505A
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English (en)
Japanese (ja)
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JP2007218890A (ja
JP2007218890A5 (enExample
Inventor
軍生 木本
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Individual
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Individual
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Application filed by Individual filed Critical Individual
Priority to JP2006073505A priority Critical patent/JP4974021B2/ja
Priority to TW096103868A priority patent/TWI397696B/zh
Priority to CN2007100802360A priority patent/CN101025426B/zh
Priority to US11/706,652 priority patent/US7501840B2/en
Priority to KR1020070016210A priority patent/KR20070083187A/ko
Publication of JP2007218890A publication Critical patent/JP2007218890A/ja
Publication of JP2007218890A5 publication Critical patent/JP2007218890A5/ja
Application granted granted Critical
Publication of JP4974021B2 publication Critical patent/JP4974021B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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  • Measuring Leads Or Probes (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
JP2006073505A 2006-02-19 2006-02-19 プローブ組立体 Expired - Fee Related JP4974021B2 (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP2006073505A JP4974021B2 (ja) 2006-02-19 2006-02-19 プローブ組立体
TW096103868A TWI397696B (zh) 2006-02-19 2007-02-02 Probe assembly
CN2007100802360A CN101025426B (zh) 2006-02-19 2007-02-14 探针组合体
US11/706,652 US7501840B2 (en) 2006-02-19 2007-02-15 Probe assembly comprising a parallelogram link vertical probe made of a metal foil attached to the surface of a resin film
KR1020070016210A KR20070083187A (ko) 2006-02-19 2007-02-15 프로브 조립체

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2006073505A JP4974021B2 (ja) 2006-02-19 2006-02-19 プローブ組立体

Publications (3)

Publication Number Publication Date
JP2007218890A JP2007218890A (ja) 2007-08-30
JP2007218890A5 JP2007218890A5 (enExample) 2009-04-30
JP4974021B2 true JP4974021B2 (ja) 2012-07-11

Family

ID=38496333

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2006073505A Expired - Fee Related JP4974021B2 (ja) 2006-02-19 2006-02-19 プローブ組立体

Country Status (2)

Country Link
JP (1) JP4974021B2 (enExample)
CN (1) CN101025426B (enExample)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100947862B1 (ko) 2008-06-30 2010-03-18 한국기계연구원 힌지 구조를 갖는 캔틸레버형 미세 접촉 프로브
KR101037979B1 (ko) 2008-10-10 2011-06-09 송광석 수직형 프로브 및 이를 포함하는 프로브헤드 조립체
CN102162818A (zh) * 2010-02-21 2011-08-24 木本军生 探针台装置
TWI416142B (zh) * 2011-03-08 2013-11-21 Pleader Yamaichi Co Ltd Cantilever type combined with vertical probe card structure
CN103245808A (zh) * 2013-05-22 2013-08-14 太仓华众金属制品有限公司 一种悬臂式探针
CN106249006A (zh) * 2016-09-30 2016-12-21 乐依文半导体(东莞)有限公司 测试夹具及其单尾回形探针
CN108663553B (zh) * 2017-03-29 2022-01-25 上海中船电气有限公司 一种接触式半导体材料测试头
TWI750552B (zh) * 2019-12-16 2021-12-21 旺矽科技股份有限公司 可定位之探針卡及其製作方法
TWI730806B (zh) * 2020-06-10 2021-06-11 中華精測科技股份有限公司 具有懸臂式探針的垂直式探針卡
JP7647177B2 (ja) * 2021-03-04 2025-03-18 オムロン株式会社 プローブピン、検査治具および検査治具ユニット
JP2023024032A (ja) * 2021-08-06 2023-02-16 マイクロクラフト株式会社 プリント配線板の回路の検査を行うための検査装置において用いられるプローブ、プローブユニット、及び該プローブユニットを備える検査装置
CN115032430B (zh) * 2022-06-07 2024-05-03 长鑫存储技术有限公司 探针结构及其制作方法
CN115951203B (zh) * 2023-03-14 2023-06-16 杭州朗迅科技股份有限公司 一种双模组集成电路高频测试设备

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3611128A (en) * 1968-07-26 1971-10-05 Hitachi Ltd Probe header for testing integrated circuits
US4116523A (en) * 1976-01-23 1978-09-26 James M. Foster High frequency probe
US5599194A (en) * 1992-08-18 1997-02-04 Enplas Corporation IC socket and its contact pin
JPH075196A (ja) * 1993-06-18 1995-01-10 Fujitsu Autom Ltd プローブヘッドとプロービング方法
JP3762444B2 (ja) * 1993-08-24 2006-04-05 信昭 鈴木 回路基板の検査用プローブとその取付構造
US6034534A (en) * 1995-05-25 2000-03-07 Kiyota; Shigeo Laminated contact probe for inspection of ultra-microscopic pitch
US6271674B1 (en) * 1999-04-07 2001-08-07 Kabushiki Kaisha Nihon Micronics Probe card
JP2002296295A (ja) * 2001-03-29 2002-10-09 Isao Kimoto 接触子組立体の接触子保持構造
JP4496456B2 (ja) * 2001-09-03 2010-07-07 軍生 木本 プローバ装置
US7449906B2 (en) * 2003-05-13 2008-11-11 Kabushiki Kaisha Nihon Micronics Probe for testing an electrical device
TWI286606B (en) * 2004-03-16 2007-09-11 Gunsei Kimoto Electric signal connecting device, and probe assembly and prober device using it
JP4721099B2 (ja) * 2004-03-16 2011-07-13 軍生 木本 電気信号接続装置及びこれを用いたプローブ組立体並びにプローバ装置
JP4521611B2 (ja) * 2004-04-09 2010-08-11 ルネサスエレクトロニクス株式会社 半導体集積回路装置の製造方法

Also Published As

Publication number Publication date
JP2007218890A (ja) 2007-08-30
CN101025426A (zh) 2007-08-29
CN101025426B (zh) 2010-09-29

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