JP4961183B2 - 半導体ウェーハの加工方法 - Google Patents
半導体ウェーハの加工方法 Download PDFInfo
- Publication number
- JP4961183B2 JP4961183B2 JP2006260521A JP2006260521A JP4961183B2 JP 4961183 B2 JP4961183 B2 JP 4961183B2 JP 2006260521 A JP2006260521 A JP 2006260521A JP 2006260521 A JP2006260521 A JP 2006260521A JP 4961183 B2 JP4961183 B2 JP 4961183B2
- Authority
- JP
- Japan
- Prior art keywords
- polishing
- semiconductor wafer
- back surface
- thickness
- wheel
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 239000004065 semiconductor Substances 0.000 title claims description 82
- 238000003672 processing method Methods 0.000 title claims description 4
- 238000005498 polishing Methods 0.000 claims description 101
- 239000006061 abrasive grain Substances 0.000 claims description 8
- 230000002093 peripheral effect Effects 0.000 claims description 7
- 230000003014 reinforcing effect Effects 0.000 claims description 7
- 239000002245 particle Substances 0.000 claims description 5
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical group [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims description 3
- 229910052710 silicon Inorganic materials 0.000 claims description 3
- 239000010703 silicon Substances 0.000 claims description 3
- 238000000034 method Methods 0.000 claims description 2
- 238000000227 grinding Methods 0.000 description 13
- 230000000694 effects Effects 0.000 description 9
- 238000005452 bending Methods 0.000 description 8
- 238000005247 gettering Methods 0.000 description 8
- 229910003460 diamond Inorganic materials 0.000 description 6
- 239000010432 diamond Substances 0.000 description 6
- 230000005540 biological transmission Effects 0.000 description 5
- 239000007767 bonding agent Substances 0.000 description 4
- 239000003822 epoxy resin Substances 0.000 description 4
- 229920000647 polyepoxide Polymers 0.000 description 4
- 230000003028 elevating effect Effects 0.000 description 3
- 238000002156 mixing Methods 0.000 description 3
- 230000001681 protective effect Effects 0.000 description 3
- 238000001312 dry etching Methods 0.000 description 2
- 230000014759 maintenance of location Effects 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 239000002861 polymer material Substances 0.000 description 2
- 238000005245 sintering Methods 0.000 description 2
- 238000001039 wet etching Methods 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- 230000002411 adverse Effects 0.000 description 1
- 230000008602 contraction Effects 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 238000005336 cracking Methods 0.000 description 1
- 238000010304 firing Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000003825 pressing Methods 0.000 description 1
- 239000002966 varnish Substances 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/322—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to modify their internal properties, e.g. to produce internal imperfections
- H01L21/3221—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to modify their internal properties, e.g. to produce internal imperfections of silicon bodies, e.g. for gettering
Description
Wa:表面
S:ストリート D:半導体デバイス
W1:デバイス領域 W2:外周余剰領域
Wb:裏面
W3:凹部 100:歪み層
W4:リング状補強部
10:保護部材
1:研磨装置
2:チャックテーブル
20:移動基台 21:ジャバラ
3:研磨手段
30:スピンドル 31:ホイールマウント
32:研磨ホイール 32a:基台 33:研磨砥石
4:研磨送り手段
40:ガイドレール 41:ボールネジ 42:駆動源 43:昇降板
5:研磨ホイール
5a:基台 50:研磨砥石
6:研磨装置
7:研磨ホイール
7a:基台 70:研磨砥石
8:研磨ホイール
8a:基台 80:研磨砥石
Claims (2)
- 複数のデバイスが表面に形成された半導体ウェーハの裏面を粒径が0.01μm〜0.2μmの砥粒を含む砥石を用いて研磨して該半導体ウェーハを所望の厚さに形成する半導体ウェーハの加工方法であって、
該複数のデバイスが形成された領域の裏面を研磨して厚さが10μm〜100μmの凹部を形成するとともに、該凹部の外周側にリング状補強部を形成し、
該研磨によって該凹部の底面に0.05〜0.1μmの厚さの歪み層を残存させる
半導体ウェーハの加工方法。 - 前記半導体ウェーハはシリコンウェーハである請求項1に記載の半導体ウェーハの加工方法。
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2006260521A JP4961183B2 (ja) | 2006-09-26 | 2006-09-26 | 半導体ウェーハの加工方法 |
US11/903,041 US7731567B2 (en) | 2006-09-26 | 2007-09-20 | Semiconductor wafer processing method |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2006260521A JP4961183B2 (ja) | 2006-09-26 | 2006-09-26 | 半導体ウェーハの加工方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2008084930A JP2008084930A (ja) | 2008-04-10 |
JP4961183B2 true JP4961183B2 (ja) | 2012-06-27 |
Family
ID=39225547
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2006260521A Active JP4961183B2 (ja) | 2006-09-26 | 2006-09-26 | 半導体ウェーハの加工方法 |
Country Status (2)
Country | Link |
---|---|
US (1) | US7731567B2 (ja) |
JP (1) | JP4961183B2 (ja) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4647228B2 (ja) * | 2004-04-01 | 2011-03-09 | 株式会社ディスコ | ウェーハの加工方法 |
JP2008283025A (ja) * | 2007-05-11 | 2008-11-20 | Disco Abrasive Syst Ltd | ウエーハの分割方法 |
JP2009094326A (ja) * | 2007-10-10 | 2009-04-30 | Disco Abrasive Syst Ltd | ウェーハの研削方法 |
JP2009095947A (ja) * | 2007-10-18 | 2009-05-07 | Disco Abrasive Syst Ltd | 研削装置及びウェーハの研削方法 |
JP5081643B2 (ja) * | 2008-01-23 | 2012-11-28 | 株式会社ディスコ | ウエーハの加工方法 |
JP2010021330A (ja) * | 2008-07-10 | 2010-01-28 | Disco Abrasive Syst Ltd | ウエーハの加工方法 |
JP2022133007A (ja) * | 2021-03-01 | 2022-09-13 | 株式会社ディスコ | 被加工物の研削方法 |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2792464B2 (ja) * | 1995-05-25 | 1998-09-03 | 住友電気工業株式会社 | マイクロデバイス基板およびマイクロデバイス基板の製造方法 |
JP2003173987A (ja) | 2001-12-04 | 2003-06-20 | Disco Abrasive Syst Ltd | 半導体チップの製造方法 |
WO2004021420A2 (en) * | 2002-08-29 | 2004-03-11 | Massachusetts Institute Of Technology | Fabrication method for a monocrystalline semiconductor layer on a substrate |
JP2004281551A (ja) * | 2003-03-13 | 2004-10-07 | Toshiba Corp | 半導体基板及びその製造方法、半導体装置及びその製造方法、半導体パッケージ |
JP2005123425A (ja) * | 2003-10-17 | 2005-05-12 | Toshiba Corp | 半導体基板の製造方法、半導体基板及び半導体装置の製造方法 |
JP4860113B2 (ja) * | 2003-12-26 | 2012-01-25 | ルネサスエレクトロニクス株式会社 | 半導体集積回路装置の製造方法 |
JP2005311025A (ja) * | 2004-04-21 | 2005-11-04 | Naoetsu Electronics Co Ltd | シリコンウエーハの製造方法及びそれにより製造されたシリコンウエーハ |
JP4878738B2 (ja) * | 2004-04-30 | 2012-02-15 | 株式会社ディスコ | 半導体デバイスの加工方法 |
JP2007012810A (ja) * | 2005-06-29 | 2007-01-18 | Renesas Technology Corp | 半導体集積回路装置の製造方法 |
-
2006
- 2006-09-26 JP JP2006260521A patent/JP4961183B2/ja active Active
-
2007
- 2007-09-20 US US11/903,041 patent/US7731567B2/en active Active
Also Published As
Publication number | Publication date |
---|---|
JP2008084930A (ja) | 2008-04-10 |
US7731567B2 (en) | 2010-06-08 |
US20080076329A1 (en) | 2008-03-27 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP4961183B2 (ja) | 半導体ウェーハの加工方法 | |
JP3645528B2 (ja) | 研磨方法及び半導体装置の製造方法 | |
EP2762272B1 (en) | Wafer polishing apparatus and method | |
KR102255728B1 (ko) | 웨이퍼의 가공 방법 | |
JP5916513B2 (ja) | 板状物の加工方法 | |
CN108247528B (zh) | 一种研磨垫的处理方法 | |
JP2018039063A (ja) | 加工装置 | |
JP2013247132A (ja) | 板状物の加工方法 | |
JP4878738B2 (ja) | 半導体デバイスの加工方法 | |
JP5119614B2 (ja) | ウェーハ外周部研削方法 | |
JP2011103379A (ja) | ウェーハの平坦化加工方法 | |
US6478977B1 (en) | Polishing method and apparatus | |
JP2010205861A (ja) | 積層ウエーハの面取り装置およびそれを用いて積層ウエーハのベベル部、エッジ部を面取り加工する方法 | |
KR20200038424A (ko) | 웨이퍼의 가공 방법 | |
JP6963075B2 (ja) | ウェハの表面処理装置 | |
JP3348272B2 (ja) | ウェハ研磨方法 | |
JP2018056500A (ja) | 板状物の加工方法 | |
JP6843554B2 (ja) | ウェハの表面処理装置 | |
JP6717706B2 (ja) | ウェハの表面処理装置 | |
JP7301472B2 (ja) | ウェーハの加工方法 | |
US20240071753A1 (en) | Processing method of wafer | |
CN108735591A (zh) | 晶圆表面平坦化方法 | |
JP2023180612A (ja) | 被加工物の研削方法 | |
JP2022133007A (ja) | 被加工物の研削方法 | |
JP4582671B2 (ja) | 研削ホイール及び該研削ホイールを搭載した研削装置 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20090825 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20111206 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20120203 |
|
TRDD | Decision of grant or rejection written | ||
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20120228 |
|
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 |
|
A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20120326 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20150330 Year of fee payment: 3 |
|
R150 | Certificate of patent or registration of utility model |
Ref document number: 4961183 Country of ref document: JP Free format text: JAPANESE INTERMEDIATE CODE: R150 Free format text: JAPANESE INTERMEDIATE CODE: R150 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20150330 Year of fee payment: 3 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |