JP4959930B2 - 内部表面幾何形状を再構成する方法 - Google Patents

内部表面幾何形状を再構成する方法 Download PDF

Info

Publication number
JP4959930B2
JP4959930B2 JP2004283050A JP2004283050A JP4959930B2 JP 4959930 B2 JP4959930 B2 JP 4959930B2 JP 2004283050 A JP2004283050 A JP 2004283050A JP 2004283050 A JP2004283050 A JP 2004283050A JP 4959930 B2 JP4959930 B2 JP 4959930B2
Authority
JP
Japan
Prior art keywords
artifact
data
thickness
imaging device
thickness map
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2004283050A
Other languages
English (en)
Japanese (ja)
Other versions
JP2005106824A5 (enExample
JP2005106824A (ja
Inventor
ケビン・ジョージ・ハーディング
アレクサンダー・バーナード・フラビアン・レベロ
ドナルド・ロバート・ハワード
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
General Electric Co
Original Assignee
General Electric Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by General Electric Co filed Critical General Electric Co
Publication of JP2005106824A publication Critical patent/JP2005106824A/ja
Publication of JP2005106824A5 publication Critical patent/JP2005106824A5/ja
Application granted granted Critical
Publication of JP4959930B2 publication Critical patent/JP4959930B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
    • G01B21/08—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness for measuring thickness
    • G01B21/085—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness for measuring thickness using thermal means

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Or Analyzing Materials Using Thermal Means (AREA)
JP2004283050A 2003-09-30 2004-09-29 内部表面幾何形状を再構成する方法 Expired - Fee Related JP4959930B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/676,990 US7015473B2 (en) 2003-09-30 2003-09-30 Method and apparatus for internal feature reconstruction
US10/676,990 2003-09-30

Publications (3)

Publication Number Publication Date
JP2005106824A JP2005106824A (ja) 2005-04-21
JP2005106824A5 JP2005106824A5 (enExample) 2007-11-15
JP4959930B2 true JP4959930B2 (ja) 2012-06-27

Family

ID=34314048

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2004283050A Expired - Fee Related JP4959930B2 (ja) 2003-09-30 2004-09-29 内部表面幾何形状を再構成する方法

Country Status (4)

Country Link
US (1) US7015473B2 (enExample)
EP (1) EP1521056B1 (enExample)
JP (1) JP4959930B2 (enExample)
CN (1) CN1603836B (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20210078237A (ko) * 2019-12-18 2021-06-28 전북대학교산학협력단 프레스 성형물 두께 분포도 가시화 시스템 및 이를 이용한 가시화 방법

Families Citing this family (33)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4956960B2 (ja) * 2005-10-28 2012-06-20 横浜ゴム株式会社 ３次元形状測定装置及び３次元形状測定方法
CH698140B1 (de) * 2006-01-20 2009-05-29 Alstom Technology Ltd Verfahren zur Digitalisierung dreidimensionaler Bauteile.
WO2007133932A2 (en) 2006-05-11 2007-11-22 Koninklijke Philips Electronics, N.V. Deformable registration of images for image guided radiation therapy
US11064964B2 (en) 2007-03-08 2021-07-20 Sync-Rx, Ltd Determining a characteristic of a lumen by measuring velocity of a contrast agent
US9375164B2 (en) 2007-03-08 2016-06-28 Sync-Rx, Ltd. Co-use of endoluminal data and extraluminal imaging
WO2010058398A2 (en) 2007-03-08 2010-05-27 Sync-Rx, Ltd. Image processing and tool actuation for medical procedures
US11197651B2 (en) 2007-03-08 2021-12-14 Sync-Rx, Ltd. Identification and presentation of device-to-vessel relative motion
US10716528B2 (en) 2007-03-08 2020-07-21 Sync-Rx, Ltd. Automatic display of previously-acquired endoluminal images
US9629571B2 (en) 2007-03-08 2017-04-25 Sync-Rx, Ltd. Co-use of endoluminal data and extraluminal imaging
US9968256B2 (en) 2007-03-08 2018-05-15 Sync-Rx Ltd. Automatic identification of a tool
WO2008107905A2 (en) 2007-03-08 2008-09-12 Sync-Rx, Ltd. Imaging and tools for use with moving organs
US7720649B2 (en) * 2007-03-20 2010-05-18 United Technologies Corporation Reverse engineering method for disk and blade attachments
BE1017976A3 (fr) * 2008-01-31 2010-02-02 Ct Rech Metallurgiques Asbl Controle d'un traitement de decapage.
US7865316B2 (en) * 2008-03-28 2011-01-04 Lockheed Martin Corporation System, program product, and related methods for registering three-dimensional models to point data representing the pose of a part
US9974509B2 (en) 2008-11-18 2018-05-22 Sync-Rx Ltd. Image super enhancement
US9095313B2 (en) 2008-11-18 2015-08-04 Sync-Rx, Ltd. Accounting for non-uniform longitudinal motion during movement of an endoluminal imaging probe
US11064903B2 (en) * 2008-11-18 2021-07-20 Sync-Rx, Ltd Apparatus and methods for mapping a sequence of images to a roadmap image
US9101286B2 (en) 2008-11-18 2015-08-11 Sync-Rx, Ltd. Apparatus and methods for determining a dimension of a portion of a stack of endoluminal data points
US9144394B2 (en) 2008-11-18 2015-09-29 Sync-Rx, Ltd. Apparatus and methods for determining a plurality of local calibration factors for an image
US10362962B2 (en) 2008-11-18 2019-07-30 Synx-Rx, Ltd. Accounting for skipped imaging locations during movement of an endoluminal imaging probe
US8238642B2 (en) * 2008-11-20 2012-08-07 General Electric Company Methods and apparatus for measuring 3D dimensions on 2D images
JP2010169636A (ja) * 2009-01-26 2010-08-05 Nikon Corp 形状測定装置
CN101655355B (zh) * 2009-09-03 2010-12-08 无锡吉兴汽车部件有限公司 汽车天窗遮阳板型面变形量的检测方法
US9015002B2 (en) 2010-10-21 2015-04-21 Siemens Energy, Inc. System for monitoring a high-temperature region of interest in a turbine engine
EP2723231A4 (en) 2011-06-23 2015-02-25 Sync Rx Ltd LUMINAL BACKGROUND CLEANING
EP2863802B1 (en) 2012-06-26 2020-11-04 Sync-RX, Ltd. Flow-related image processing in luminal organs
US9410905B2 (en) * 2013-03-27 2016-08-09 United Technologies Corporation Non-destructive inspection of an article using cross-sections through internal feature
JP6595841B2 (ja) * 2015-08-24 2019-10-23 株式会社荏原製作所 測定方法、傾向管理方法及び診断方法。
TWI659205B (zh) 2017-09-19 2019-05-11 財團法人工業技術研究院 即位量測系統、基準校準方法、誤差量測方法與電腦可讀取記錄媒體
DE102018218516A1 (de) 2018-10-29 2020-04-30 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Verfahren zur Ermittlung von Designparametern eines Rotorblattes
WO2020154966A1 (en) * 2019-01-30 2020-08-06 Baidu.Com Times Technology (Beijing) Co., Ltd. A rgb point clouds based map generation system for autonomous vehicles
WO2021032310A1 (en) * 2019-08-21 2021-02-25 Siemens Aktiengesellschaft Method and system for generating a digital representation of asset information in a cloud computing environment
US11885770B2 (en) 2021-01-27 2024-01-30 The Boeing Company Measurement probe edge guide tool

Family Cites Families (28)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3566669A (en) * 1968-09-04 1971-03-02 Harry Parker Method and apparatus for thermally examining fluid passages in a body
JPS61139751A (ja) * 1984-12-12 1986-06-27 Seiki Suyama 建造物の壁面剥離部検査方法
US4872762A (en) 1987-08-25 1989-10-10 Nkk Corporation Method and apparatus for detecting defective portion on inner surface of pipe
JPH01121712A (ja) * 1987-11-06 1989-05-15 Nkk Corp 被検査物内面の減肉部検出方法
US4969110A (en) * 1988-08-01 1990-11-06 General Electric Company Method of using a priori information in computerized tomography
JP2922250B2 (ja) * 1990-03-27 1999-07-19 キヤノン株式会社 形状測定装置
US5334934A (en) * 1991-07-15 1994-08-02 General Electric Company Eddy current probe apparatus and interlaced scanning method for interior inspection of metal devices
US5345514A (en) * 1991-09-16 1994-09-06 General Electric Company Method for inspecting components having complex geometric shapes
JP2630717B2 (ja) * 1992-10-23 1997-07-16 新日本製鐵株式会社 自動開先検査装置
JP3202384B2 (ja) * 1993-02-22 2001-08-27 シャープ株式会社 表示装置の駆動回路
JP3307060B2 (ja) * 1994-03-17 2002-07-24 松下電器産業株式会社 三次元形状計測方法
JP3182056B2 (ja) * 1995-02-24 2001-07-03 株式会社リコー 非球面形状測定方法及び装置・非球面評価方法
US6858826B2 (en) * 1996-10-25 2005-02-22 Waveworx Inc. Method and apparatus for scanning three-dimensional objects
US6047041A (en) * 1997-09-08 2000-04-04 Scientific Measurement System Apparatus and method for comparison
JP2000171231A (ja) * 1998-12-09 2000-06-23 Nkk Corp 管体の形状測定方法および装置
JP3404318B2 (ja) * 1999-04-02 2003-05-06 黒田精工株式会社 表面形状測定方法
US6394646B1 (en) * 1999-04-16 2002-05-28 General Electric Company Method and apparatus for quantitative nondestructive evaluation of metal airfoils using high resolution transient thermography
US6367969B1 (en) * 1999-07-21 2002-04-09 General Electric Company Synthetic reference thermal imaging method
JP2001133236A (ja) * 1999-11-08 2001-05-18 Mitsubishi Heavy Ind Ltd 薄肉円筒管の形状検査方法及び装置
US7414732B2 (en) * 2000-05-16 2008-08-19 Steinbichler Optotechnik Gmbh Method and device for determining the 3D profile of an object
DE10044169A1 (de) * 2000-09-07 2002-03-21 Daimler Chrysler Ag Verfahren zur zerstörungsfreien Wandstärkenprüfung
JP3407000B2 (ja) * 2000-11-22 2003-05-19 国際航業株式会社 熱画像による構造物内部の空隙形状の推定システム及び推定方法
US6542849B2 (en) * 2001-01-19 2003-04-01 The University Of Chicago Method for determining defect depth using thermal imaging
JP3963086B2 (ja) * 2001-07-13 2007-08-22 株式会社島津製作所 断層再構成ソフトウエアとその記録媒体と断層撮影装置
JP4517044B2 (ja) * 2001-09-14 2010-08-04 ▲隆▼英 阪上 欠陥検査方法およびその装置
JP3632078B2 (ja) * 2001-10-30 2005-03-23 独立行政法人産業技術総合研究所 透明平行平板の表面形状測定および厚さ不均一測定のための干渉縞解析法
US6978040B2 (en) * 2001-12-19 2005-12-20 Canon Kabushiki Kaisha Optical recovery of radiographic geometry
US7190991B2 (en) * 2003-07-01 2007-03-13 Xenogen Corporation Multi-mode internal imaging

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20210078237A (ko) * 2019-12-18 2021-06-28 전북대학교산학협력단 프레스 성형물 두께 분포도 가시화 시스템 및 이를 이용한 가시화 방법
KR102328956B1 (ko) * 2019-12-18 2021-11-22 전북대학교산학협력단 프레스 성형물 두께 분포도 가시화 시스템 및 이를 이용한 가시화 방법

Also Published As

Publication number Publication date
EP1521056A2 (en) 2005-04-06
EP1521056A3 (en) 2005-04-13
JP2005106824A (ja) 2005-04-21
US7015473B2 (en) 2006-03-21
US20050067568A1 (en) 2005-03-31
EP1521056B1 (en) 2015-09-09
CN1603836A (zh) 2005-04-06
CN1603836B (zh) 2011-02-09

Similar Documents

Publication Publication Date Title
JP4959930B2 (ja) 内部表面幾何形状を再構成する方法
JP5491493B2 (ja) 部品の姿勢を表す点データに３次元モデルを位置合わせするシステム、プログラム、および関連する方法
JP5911904B2 (ja) 形状および位置の光学的計測のための構造化光システムに関する正確な画像取得
EP1574818A2 (en) Non-contact measurement method and apparatus
US7840367B2 (en) Multi-modality inspection system
CN105051487B (zh) 使用选择性成像测量物体的方法和设备
JP4595979B2 (ja) 放射線非破壊検査システム及び配管の検査方法
JP2006017714A (ja) Ｃｔ計測を使用する境界推定のためのシステム及び方法
JPH1130595A (ja) 物体の実際の形状を予定の形状と比較する方法
JP2005514606A5 (enExample)
CN104142353A (zh) 可见光成像辅助定位局部ct扫描方法及系统
KR101865434B1 (ko) 조사될 대상물에 있는 구조의 위치를 x-선 컴퓨터 단층 촬영기로 결정하는 방법 및 평가 장치
JP5400704B2 (ja) 配管検査装置および配管検査方法
JP5012045B2 (ja) Ｘ線ｃｔ装置
JP2004271222A (ja) 立体形状評価装置
KR20250069914A (ko) 기계 부품의 치수 또는 기하학적 특징을 확인하기 위한 방법 및 시스템
CN203965351U (zh) 可见光成像辅助定位局部ct扫描系统
JP2008292414A (ja) Ｘ線ｃｔ装置
JP2010185888A (ja) 放射線非破壊検査システム及び配管の検査方法
CN116563562B (zh) 航空发动机尾喷管出口面积在位测量方法
Schick Metrology CT technology and its applications in the precision engineering industry
CN111340751B (zh) X射线ct中的ct体积的表面提取方法和装置
JP5292055B2 (ja) 配管検査用断層撮影方法および装置
JP4464106B2 (ja) 機械部品の湾曲の大きな領域を測定するためのスペースカービング
Rianmora et al. Mini-C Arm Rotational Camera Station for Supporting Reverse Engineering Technique

Legal Events

Date Code Title Description
A521 Written amendment

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20070928

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20070928

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20100126

A601 Written request for extension of time

Free format text: JAPANESE INTERMEDIATE CODE: A601

Effective date: 20100423

RD02 Notification of acceptance of power of attorney

Free format text: JAPANESE INTERMEDIATE CODE: A7422

Effective date: 20100423

RD04 Notification of resignation of power of attorney

Free format text: JAPANESE INTERMEDIATE CODE: A7424

Effective date: 20100423

A602 Written permission of extension of time

Free format text: JAPANESE INTERMEDIATE CODE: A602

Effective date: 20100428

A601 Written request for extension of time

Free format text: JAPANESE INTERMEDIATE CODE: A601

Effective date: 20100526

A602 Written permission of extension of time

Free format text: JAPANESE INTERMEDIATE CODE: A602

Effective date: 20100531

A601 Written request for extension of time

Free format text: JAPANESE INTERMEDIATE CODE: A601

Effective date: 20100625

A602 Written permission of extension of time

Free format text: JAPANESE INTERMEDIATE CODE: A602

Effective date: 20100630

A521 Written amendment

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20100726

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20101005

A601 Written request for extension of time

Free format text: JAPANESE INTERMEDIATE CODE: A601

Effective date: 20101228

A602 Written permission of extension of time

Free format text: JAPANESE INTERMEDIATE CODE: A602

Effective date: 20110106

A521 Written amendment

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20110405

A02 Decision of refusal

Free format text: JAPANESE INTERMEDIATE CODE: A02

Effective date: 20110802

A521 Written amendment

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20111202

A911 Transfer of reconsideration by examiner before appeal (zenchi)

Free format text: JAPANESE INTERMEDIATE CODE: A911

Effective date: 20120126

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20120221

A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20120322

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20150330

Year of fee payment: 3

R150 Certificate of patent or registration of utility model

Free format text: JAPANESE INTERMEDIATE CODE: R150

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

LAPS Cancellation because of no payment of annual fees