JP4931793B2 - 質量分析計の焦点面検出器アセンブリ - Google Patents

質量分析計の焦点面検出器アセンブリ Download PDF

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Publication number
JP4931793B2
JP4931793B2 JP2007502023A JP2007502023A JP4931793B2 JP 4931793 B2 JP4931793 B2 JP 4931793B2 JP 2007502023 A JP2007502023 A JP 2007502023A JP 2007502023 A JP2007502023 A JP 2007502023A JP 4931793 B2 JP4931793 B2 JP 4931793B2
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Prior art keywords
assembly
microchannel plate
electron multiplier
mass spectrometer
plate electron
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Expired - Lifetime
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JP2007502023A
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Japanese (ja)
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JP2007527601A (ja
JP2007527601A5 (enExample
Inventor
アディ エー． シャイデマン，
ゴットフライド ピー． ジー． キベルカ，
クレア アール． ロング，
マーク ダブリュー． デイゼル，
ユースタシオス バシリオ，
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オイ コーポレイション
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Publication of JP2007527601A5 publication Critical patent/JP2007527601A5/ja
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02—Column chromatography
    • G01N30/62—Detectors specially adapted therefor
    • G01N30/72—Mass spectrometers
    • G01N30/7206—Mass spectrometers interfaced to gas chromatograph
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/025—Detectors specially adapted to particle spectrometers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/28—Static spectrometers
    • H01J49/32—Static spectrometers using double focusing
    • H01J49/322—Static spectrometers using double focusing with a magnetic sector of 90 degrees, e.g. Mattauch-Herzog type
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/44—Energy spectrometers, e.g. alpha-, beta-spectrometers
    • H01J49/46—Static spectrometers
    • H01J49/48—Static spectrometers using electrostatic analysers, e.g. cylindrical sector, Wien filter

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  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
JP2007502023A 2004-03-05 2005-03-04 質量分析計の焦点面検出器アセンブリ Expired - Lifetime JP4931793B2 (ja)

Applications Claiming Priority (9)

Application Number Priority Date Filing Date Title
US55066304P 2004-03-05 2004-03-05
US55066404P 2004-03-05 2004-03-05
US60/550,663 2004-03-05
US60/550,664 2004-03-05
US55796904P 2004-03-31 2004-03-31
US55792004P 2004-03-31 2004-03-31
US60/557,969 2004-03-31
US60/557,920 2004-03-31
PCT/US2005/007128 WO2005088672A2 (en) 2004-03-05 2005-03-04 Focal plane detector assembly of a mass spectrometer

Publications (3)

Publication Number Publication Date
JP2007527601A JP2007527601A (ja) 2007-09-27
JP2007527601A5 JP2007527601A5 (enExample) 2008-04-17
JP4931793B2 true JP4931793B2 (ja) 2012-05-16

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JP2007502023A Expired - Lifetime JP4931793B2 (ja) 2004-03-05 2005-03-04 質量分析計の焦点面検出器アセンブリ

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Country Link
US (2) US20060011829A1 (enExample)
EP (1) EP1721330A2 (enExample)
JP (1) JP4931793B2 (enExample)
WO (2) WO2005088671A2 (enExample)

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CN108962717B (zh) * 2018-08-09 2024-01-26 金华职业技术学院 一种用于研究大分子的质谱仪及研究电荷量方法
JP6734449B1 (ja) 2019-08-02 2020-08-05 浜松ホトニクス株式会社 イオン検出器、測定装置および質量分析装置
JP7252179B2 (ja) * 2020-07-08 2023-04-04 浜松ホトニクス株式会社 イオン検出器、測定装置および質量分析装置

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Also Published As

Publication number Publication date
JP2007527601A (ja) 2007-09-27
WO2005088671A3 (en) 2006-11-09
WO2005088672A3 (en) 2006-08-10
WO2005088672A2 (en) 2005-09-22
EP1721330A2 (en) 2006-11-15
US20060011826A1 (en) 2006-01-19
US20060011829A1 (en) 2006-01-19
WO2005088671A2 (en) 2005-09-22
US7550722B2 (en) 2009-06-23

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