US20060011829A1 - Gas chromatograph and mass spectrometer - Google Patents

Gas chromatograph and mass spectrometer Download PDF

Info

Publication number
US20060011829A1
US20060011829A1 US11/071,992 US7199205A US2006011829A1 US 20060011829 A1 US20060011829 A1 US 20060011829A1 US 7199205 A US7199205 A US 7199205A US 2006011829 A1 US2006011829 A1 US 2006011829A1
Authority
US
United States
Prior art keywords
flange
assembly
mass spectrometer
gas chromatograph
extension
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
US11/071,992
Other languages
English (en)
Inventor
Adi Scheidemann
Gottfried Kibelka
Clare Long
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
OI Corp
Original Assignee
OI Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by OI Corp filed Critical OI Corp
Priority to US11/071,992 priority Critical patent/US20060011829A1/en
Assigned to OI CORPORATION reassignment OI CORPORATION ASSIGNMENT OF ASSIGNORS INTEREST (SEE DOCUMENT FOR DETAILS). Assignors: SCHEIDEMANN, ADI A., LONG, CLARE R., KIBELKA, GOTTFRIED P.
Publication of US20060011829A1 publication Critical patent/US20060011829A1/en
Abandoned legal-status Critical Current

Links

Images

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02—Column chromatography
    • G01N30/62—Detectors specially adapted therefor
    • G01N30/72—Mass spectrometers
    • G01N30/7206—Mass spectrometers interfaced to gas chromatograph
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/025—Detectors specially adapted to particle spectrometers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/28—Static spectrometers
    • H01J49/32—Static spectrometers using double focusing
    • H01J49/322—Static spectrometers using double focusing with a magnetic sector of 90 degrees, e.g. Mattauch-Herzog type
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/44—Energy spectrometers, e.g. alpha-, beta-spectrometers
    • H01J49/46—Static spectrometers
    • H01J49/48—Static spectrometers using electrostatic analysers, e.g. cylindrical sector, Wien filter

Definitions

  • This disclosure generally relates to analytic instruments, and more particularly relates to gas chromatographs, and mass spectrometers and/or mass spectrographs.
  • Mass spectrometry is widely used in many applications ranging from process monitoring to life sciences. Over the course of the last 60 years, a wide variety of instruments have been developed. The focus of new developments has been two fold: (1) a push for ever higher mass range with high mass resolution, and (2) on developing small, desktop mass spectrometry instruments.
  • Mass spectrometers are often coupled with gas chromatographs for analysis of complex mixtures. This is particularly useful for analysis of volatile organic compounds (VOCs) and semi-volatile organic compounds (semi-VOCs).
  • a combined gas chromatograph and mass spectrometer or spectrograph (GC/MS) instrument typically includes a gas inlet system, which may include the gas chromatograph portion of the GC/MS instrument.
  • the GC/MS instrument typically also includes an electron impact (EI) based ionizer with ion extractor, ion optic components to focus the ion beam, ion separation components, and ion detection components. Ionization can also be carried out via chemical ionization.
  • EI electron impact
  • Ion separation can be performed in the time or spatial domain.
  • An example for mass separation in the time domain is a time of flight mass spectrometer. Spatial separation is seen in commonly used quadrupole mass spectrometers. Here a “quadrupole filter” allows only one mass/charge ratio to be transmitted from the ionizer to the detector. A full mass spectrum is recorded by scanning the mass range through a “mass filter.” Other spatial separation approaches are based on magnetic fields, where either ion energy or magnetic field strength is varied, the mass filter allowing only one mass/charge ratio to be transmitted. A spectrum can be recorded by scanning through the mass range.
  • mass spectrometer One type of mass spectrometer is a mass spectrograph.
  • a mass spectrograph the ions are spatially separated in a magnetic field and detected with a position sensitive detector.
  • the concept of a double focusing mass spectrograph was first introduced by Mattauch and Herzog (MH) in 1940 (J. Mattauch,involving der exakten Naturwissenschaften, vol. 19, pages 170-236, 1940).
  • Double focusing refers to the ability of an instrument to refocus both the energy spread as well as the spatial beam spread. Modern developments in magnet and micro-machining technologies allow dramatic reductions in the size of these instruments. The length of the focal plane in a mass spectrograph capable of VOC and semi-VOC analysis is reduced to a few centimeters.
  • the ion optic elements are mounted in the vacuum chamber floor or on chamber walls.
  • the ion optic elements can also be an integral part of the vacuum housing.
  • the ion optic elements can be built on a base plate which acts as an “optical bench” to support the ion optic elements.
  • the base plate is mounted against a vacuum or master flange to provide a vacuum seal needed to operate the mass spectrometer under vacuum.
  • the base plate can also function as the vacuum or master flange itself.
  • a Mattauch-Herzog ion detector is a position sensitive detector. Numerous concepts have been developed over the last decades. Recent developments focus on solid state based direct ion detection as an alternative to previously used electro optical ion detection (EOID).
  • EOID electro optical ion detection
  • EOID employs a multi-channel-plate (MCP) to convert ions into electrons, amplify the electrons, and illuminate a phosphorus film by bombarding the phosphorus film with the electrons emitted from the MCP.
  • MCP multi-channel-plate
  • the image formed on phosphorus film is recorded using a photo diode array, for example, via a fiber optic coupler.
  • This type of EOID is described in detail in U.S. Pat. No. 5,801,380.
  • the EOID is intended for the simultaneous measurement of ions spatially separated along the focal plane of the mass spectrometer.
  • the EOID operates by converting ions to electrons and then to photons.
  • the photons form images of the ion-induced signals.
  • the ions generate electrons by impinging on a micro-channel electron multiplier array.
  • the electrons are accelerated to a phosphor-coated fiber-optic plate that generates photon images. These images are detected using a photo detector array such as the photo diode array.
  • the EOID although highly advantageous in many ways, is relatively complicated since it requires multiple conversions. In addition, there may be complications from the use of phosphors, which may limit the dynamic range of the detector.
  • the micro-channel device may also be complicated, since it may require a high-voltage, for example 1 KV, to be applied.
  • the micro-channel device may be placed in a vacuum environment with a pressure of about 106 Torr.
  • the micro-channel device may experience ion feedback and electric discharge when operating at such high pressures. Additionally, fringe magnetic fields may affect the electron trajectory. Isotropic phosphorescence emission may also affect the resolution. The resolution of the mass analyzer may therefore be compromised due to these and other effects.
  • a direct charge measurement can be based on a micro-machined Faraday cup detector array (FCDA).
  • FCDA micro-machined Faraday cup detector array
  • an array of individually addressable Faraday cups monitors the ion beam.
  • the charge collected in individual elements of the array is provided to an amplifier via a multiplexer unit.
  • This layout reduces the number of amplifiers and feedthroughs needed.
  • This concept is described in detail in recent publications, such as “A. A. Scheidemann, R. B. Darling, F. J. Schumacher, and A. lsakarov, Tech. Digest of the 14th Int. Forum on Process Analytical Chem. (IFPAC-2000), Lake Las Vegas, Nev., Jan. 23-26, 2000, abstract 1-067”; “R. B.
  • a flat metallic strip referred to as a strip charge detector (SCD) positioned on a grounded and insulated background can be used to monitor the ion beam. This is particularly suitable for low energy ions. Again the charge is provided to an amplifier via a multiplexer.
  • SCD strip charge detector
  • the shift register based direct ion detector defines a charge sensing system that can be used in a GC/MS instrument, with a modification to allow direct measurement of ions in the mass spectrometer device without conversion to electrons and photons (e.g., EOID prior to measurement).
  • the ion detector may use charge coupled device (CCD) technology employing metal oxide semiconductors.
  • CCD charge coupled device
  • the GC/MS instrument may use direct detection and collection of the charged particles using the ion detector.
  • the detected charged particles form the equivalent of an image charge that directly accumulates in a shift register associated with a part of the CCD. This signal charge can be clocked through the CCD in a conventional way, to a single output amplifier. Since the CCD uses only one charge-to-voltage conversion amplifier for the entire detector, signal gains and offset variation of individual elements in the detector array are minimized.
  • a Mattauch-Herzog detector array which can be composed of a FCDA, a SCD, or another type of the aforementioned detectors, is placed at the exit end of the magnet, which is commonly referred to as the “focal plane.”
  • the FCDA can be made by deep reactive ion etching (DRIE).
  • the SCD can be made by vapor deposition.
  • a dice with an active element (FCDA or SCD) is usually cut out of a wafer with conventional techniques such as laser cutting or sawing.
  • FCDA or SCD dice is placed in front of the magnet and electrically connected to the multiplexer and amplifier unit, which is referred to as a “FARADAY CUP DETECTOR ARRAY”—“INPUT/OUTPUT”—“PRINTED CIRCUIT BOARD” (FCDA-I/O-PCB), to read out the charge collected with the detector elements.
  • FARADAY CUP DETECTOR ARRAY “INPUT/OUTPUT”—“PRINTED CIRCUIT BOARD” (FCDA-I/O-PCB)
  • Patents discussing mass spectrometers and gas chromatographs include U.S. Pat. No. 5,317,151, U.S. Pat. No. 5,801,380, U.S. Pat. No. 6,182,831, U.S. Pat. No. 6,191,419, U.S. Pat. No. 6,403,956, and U.S. Pat. 6,576,899.
  • FIG. 1 shows a double focusing Mattauch-Herzog mass spectrometer assembly 10 with a gas chromatograph assembly 12 .
  • the gas chromatograph assembly 12 comprises a sample injector valve V, which has an entry port S for introduction of the sample, an exit port W for the waste after the sample has been vaporized and/or decomposed, typically by heat.
  • the sample to be analyzed (referred to as analyte) is carried by a carrier gas to a column M (capillary tube, usually coated with polymeric materials).
  • the carrier gas may be inert (e.g., helium), or may not be inert.
  • the constituents of the analyte are separated by different absorption rates on the wall of the column M, which has a rather small inside diameter, for example on the order of about 50-500 ⁇ m.
  • the carrier gas flows typically at 2-5 atm. cm 3 /sec.
  • the constituents of the analyte are received by the ionizer 14 of the mass spectrometer 10 for further spectrometric analysis.
  • a larger bore of the capillary tube corresponds to a larger bore of the vacuum pump in the mass spectrometer core.
  • a smaller bore of the capillary tube causes narrower peaks of the effluent to be even more narrow, which is indicative of a large loss of signal.
  • the double focusing mass spectrometry assembly 10 comprises an ionizer 14 , a shunt and aperture 16 , an electrostatic energy analyzer 18 , a magnetic section 20 , and a focal plane section 22 .
  • the ion optics are placed on the vacuum chamber wall, and the position sensitive ion detector is mounted on the exit flange of the ion flight path. This arrangement is required as a result of having the magnet outside of the vacuum.
  • the multiplexer and amplifier unit is also positioned outside of the vacuum chamber in the case of traditional Mattauch-Herzog instruments.
  • This disclosure relates to a GC/MS system that includes a master flange comprising a vacuum feed-through, the master flange having a first side and a second side; a holder board integrally connected to the second side of the master flange; a base plate integrally connected to the first side of the master flange; a chromatograph supported on the holder board; and an mass spectrometry assembly of an ionizer, shunt and aperture group, electrostatic energy analyzer, magnetic section, and a focal plane section comprising an ion detector, all supported on the base plate.
  • a gas chromatograph and a mass spectrometer are assembled into one unit where all parts of the gas chromatograph are placed on a holder board and all the parts of the mass spectrometer are placed on a base plate. Both the holder board and the base plate are integral parts of a vacuum or master flange.
  • an analytic instrument in another aspect, includes a master flange comprising a first side, a second side, and a vacuum feed-through passage extending between the first side and the second side; a holder board coupled to the second side of the master flange; a base plate coupled to the first side of the master flange; a gas chromatograph coupled to the holder board; and a mass spectrometer assembly supported by the base plate, the mass spectrometer assembly having an ionizer, a shunt and aperture group, an electrostatic energy analyzer, a magnetic section, and a focal plane section, which includes an ion detector, wherein the ionizer receives an analyte via the vacuum feed-through passage of the master flange.
  • an analytic system includes a gas chromatograph assembly; a vacuum housing; a mass spectrometer assembly at least partially received within the vacuum housing; a flange having a first side, a second side opposed to the first side, and a passage extending from the first side to the second side to permit the transfer of an analyte from the gas chromatograph assembly to the mass spectrometer assembly; a first extension securely connected to the first side of the flange and supportingly engaging the gas chromatograph assembly; and a second extension securely connected to a second side of the flange and supportingly engaging the mass spectrometer assembly.
  • a method of assembling a gas chromatograph assembly and mass spectrometer assembly includes securely coupling a first extension to a first side of a flange, the flange having the first side, a second side, and a passage extending from the first side to the second side to permit the transfer of an analyte from the gas chromatograph assembly to the mass spectrometer assembly; supporting the gas chromatograph assembly on the first extension; securely coupling the second extension to the second side of the flange; supporting the mass spectrometer assembly on the second extension; and affixing a vacuum housing to the flange, the vacuum housing configured to encompass the mass spectrometer assembly and the second extension.
  • the master flange can include electrical connectors for electrical transfer between the first side and the second side of the master flange.
  • a vacuum housing is supported on the first side of the master flange so that a vacuum can be applied to the mass spectrometry assembly.
  • One or more pumps, in series or in parallel, may be connected to the vacuum housing.
  • the GC/MS assembly includes a GC controller disposed under the holder board and may further include a MCP/CCD controller.
  • the GC/MS assembly includes a valve block (sample injector valve) and a transfer line, which is aligned with the vacuum feed-through.
  • FIG. 1 is a schematic view of a Mattauch Herzog spectrometer connected to a gas chromatograph according to the prior art, wherein the two instruments are separate units.
  • FIG. 2 is a perspective view of a GC/MS instrument according to one illustrated embodiment, where a gas chromatograph and a vacuum housing are integrally connected to a master flange.
  • FIG. 3 is an isometric view of a portion of the mass spectrometer within the vacuum housing including a base plate, an ionizer, an electrostatic energy analyzer, and a magnetic section.
  • the illustrated embodiments are related to integral assemblies of GS/MC instruments.
  • integrated refers to a means for achieving a secure connection, which may be accomplished by bolts, screws, or other mechanical means, such that the relative position of the connected components remains substantially fixed during operation of the GS/MS instrument.
  • FIGS. 2 and 3 show an analytical instrument in the form of a GC/MS instrument 1 according to the illustrated embodiment.
  • the GC/MS instrument 1 comprises a master flange 26 with a first side 26 A, a second side 26 B, and a vacuum feed-through 4 extending from the first side 26 A to the second side 26 B.
  • a holder board 28 B having a support side extension 28 C is integrally connected to the second side 26 B of the master flange 26 .
  • a base plate 28 A is integrally connected to the first side 26 A of the master flange 26 .
  • a gas chromatograph assembly 12 ( FIG. 2 ) is supported on the holder board 28 B, and a mass spectrometry assembly 10 ( FIG. 3 ) is supported on the base plate 28 A, in very well defined and predetermined positions.
  • a sample injector valve V with a lid 13 is attached to the exterior of the gas chromatograph assembly 12 .
  • a microbore column or capillary tube (not shown) originates at the sample injector valve V and ends into a transfer line 2 .
  • the transfer line 2 is aligned with the vacuum feed-through 4 , and is coupled to the vacuum feed-through 4 , at least during operation.
  • the vacuum feed-through 4 is connected to an inlet of the ionizer 14 of the mass spectrometry assembly 10 on the other side of the master flange 26 .
  • the gas chromatograph assembly 12 can also include a means for stabilizing the temperature of the microbore column (not shown) within a desired range.
  • the master flange can include electrical connectors 5 for electrical power transfer between the first side 26 A and the second side 26 B of the master flange 26 .
  • a vacuum housing 27 may be supported on the first side 26 A of the master flange, so that a vacuum can be applied to the components of the mass spectrometry assembly 10 .
  • the GC/MS instrument 1 may further include a gas chromatograph controller 6 disposed under the holder board 28 B and/or an MCP/CCD controller 7 , as previously described.
  • One or more pumps may be connected in series or in parallel, may be connected to a bottom region of the vacuum housing 27 on the side of the MCP/CCD controller 7 .
  • the major components or the Mattauch-Herzog Sector of a miniaturized mass spectrometer assembly 10 are shown to be located on the first side 26 A of the master flange 26 according to the illustrated embodiment.
  • the base plate 28 A is supported on the first side 26 A of the master flange 26 .
  • the vacuum housing 17 covers the vacuum space within which the major components of the mass spectrometer assembly 10 are residing. Using the base plate 28 A to support the components of the mass spectrometry assembly 10 results in a sturdy and accurate configuration.
  • the ionizer 14 is secured on the base plate 28 A, close to the vacuum flange 26 , with a shunt and aperture combination 16 in front of the ionizer 14 . Further from the flange 26 is an electrostatic energy analyzer 18 , which is also secured on the base plate 28 .
  • a magnetic sector or magnetic section 20 is also secured on the base plate 28 .
  • the magnetic sector 20 comprises a yoke 20 B and magnets 20 A attached to the yoke 20 B.
  • the yoke has magnetic flux saturation value in the range of about 15,000 G to 20,000 G.
  • the yokes 20 B can be made from a hyperco-51A VNiFe alloy.
  • the volume and mass of a magnet is typically inversely proportional to the energy product value of the magnetic material.
  • a typical magnetic material is AlNiCo V (Aluminum Nickel Cobalt), which has an energy product of about 5-6 MGOe.
  • Other materials include, but are not limited to Sm-Co (Samarium Cobalt) alloys and Nd-B-Fe (Neodymium Boron Iron) alloys. Some of these materials, in particular Nd-B-Fe, may be sensitive to temperature variations. Thus, methods for temperature compensation may be necessary to avoid frequent instrument calibrations and other temperature related problems. One way to compensate for temperature variations is described in U.S. Pat. No. 6,403,956.
  • a sample of a substance to be analyzed is introduced to the sample injector valve V and at least part of it is decomposed or vaporized.
  • the resulting analyte is carried by a gas, which may be inert such as helium for example, or not inert, to the capillary tube inside the gas chromatograph assembly 12 , where its constituents are separated by different absorption rates on the wall of the capillary tube.
  • the analyte then passes through the transfer line 2 and the vacuum feed-through 4 to the ionizer 14 where it is bombarded by electrons to produce ions.
  • the ions are focused in the shunt and aperture section 16 to form an ion beam 24 .
  • the ions are then separated according to their charge/mass ratio as the ion beam travels through the electrostatic energy analyzer 18 and the magnetic section 20 .
  • the ions with a desired charge/mass ratio are then detected by the focal plane section 22 .
  • the focal plane section 22 is described in U.S. Pat. No. 5,801,380. The operation takes place under vacuum of the order of about 10 ⁇ 5 Torr with a use of a vacuum pump (not shown).
  • the GC/MS instrument 1 is a single integral unit with the mass spectrometer assembly 10 under vacuum and the gas chromatograph assembly 12 under atmospheric pressure.
  • the close proximity of all the components produces a robust system and substantially reduces a considerable amount of electronic and electromagnetic noise that two separate units present.
  • GC/MS instrument 1 may include other advantages, such as:
  • ion detectors such as Strip Charge Detector Arrays, Faraday Cup Detector Arrays, and Shift Register Based Direct Ion Detection Chips
  • Strip Charge Detector Arrays such as Strip Charge Detector Arrays, Faraday Cup Detector Arrays, and Shift Register Based Direct Ion Detection Chips
  • Shift Register Based Direct Ion Detection Chips it is understood and appreciated that any type of ion detector arrays may be used.

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
US11/071,992 2004-03-05 2005-03-04 Gas chromatograph and mass spectrometer Abandoned US20060011829A1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
US11/071,992 US20060011829A1 (en) 2004-03-05 2005-03-04 Gas chromatograph and mass spectrometer

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US55066304P 2004-03-05 2004-03-05
US55066404P 2004-03-05 2004-03-05
US55796904P 2004-03-31 2004-03-31
US55792004P 2004-03-31 2004-03-31
US11/071,992 US20060011829A1 (en) 2004-03-05 2005-03-04 Gas chromatograph and mass spectrometer

Publications (1)

Publication Number Publication Date
US20060011829A1 true US20060011829A1 (en) 2006-01-19

Family

ID=34961731

Family Applications (2)

Application Number Title Priority Date Filing Date
US11/071,992 Abandoned US20060011829A1 (en) 2004-03-05 2005-03-04 Gas chromatograph and mass spectrometer
US11/073,426 Expired - Lifetime US7550722B2 (en) 2004-03-05 2005-03-04 Focal plane detector assembly of a mass spectrometer

Family Applications After (1)

Application Number Title Priority Date Filing Date
US11/073,426 Expired - Lifetime US7550722B2 (en) 2004-03-05 2005-03-04 Focal plane detector assembly of a mass spectrometer

Country Status (4)

Country Link
US (2) US20060011829A1 (enExample)
EP (1) EP1721330A2 (enExample)
JP (1) JP4931793B2 (enExample)
WO (2) WO2005088671A2 (enExample)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20050274888A1 (en) * 1998-10-06 2005-12-15 University Of Washington Charged particle beam detection system
US7339169B1 (en) 2006-11-29 2008-03-04 Lawrence Livermore National Security, Llc Sample rotating turntable kit for infrared spectrometers
US20100223978A1 (en) * 2009-03-06 2010-09-09 Mccauley Edward B System and Method for a Gas Chromatograph to Mass Spectrometer Interface
US20170271138A1 (en) * 2016-03-17 2017-09-21 Leidos, Inc. Low Power Mass Analyzer and System Integrating Same For Chemical Analysis
US20190057854A1 (en) * 2015-10-28 2019-02-21 Duke University Mass spectrometers having segmented electrodes and associated methods
US11227754B2 (en) 2018-04-30 2022-01-18 Leidos, Inc. Low-power mass interrogation system and assay for determining vitamin D levels

Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102006004478A1 (de) * 2006-01-30 2007-08-02 Spectro Analytical Instruments Gmbh & Co. Kg Vorrichtung zur Detektion von Teilchen
JP4973659B2 (ja) * 2006-05-30 2012-07-11 株式会社島津製作所 質量分析装置
DE102007052794A1 (de) * 2007-11-02 2009-05-07 Schwarzer, Robert, Prof. Dr. Vorrichtung zur Kristallorientierungsmessung mittels Ionen-Blocking-Pattern und einer fokussierten Ionensonde
JP5452038B2 (ja) * 2009-03-06 2014-03-26 浜松ホトニクス株式会社 電子増倍器及び電子検出器
JP5210940B2 (ja) * 2009-03-31 2013-06-12 浜松ホトニクス株式会社 質量分析装置
GB2478984A (en) 2010-03-26 2011-09-28 Hexcel Composites Ltd Curable composite material
GB2576077B (en) 2018-05-31 2021-12-01 Micromass Ltd Mass spectrometer
GB201808936D0 (en) 2018-05-31 2018-07-18 Micromass Ltd Bench-top time of flight mass spectrometer
GB201808932D0 (en) 2018-05-31 2018-07-18 Micromass Ltd Bench-top time of flight mass spectrometer
GB201808949D0 (en) 2018-05-31 2018-07-18 Micromass Ltd Bench-top time of flight mass spectrometer
GB201808894D0 (en) 2018-05-31 2018-07-18 Micromass Ltd Mass spectrometer
GB201808892D0 (en) 2018-05-31 2018-07-18 Micromass Ltd Mass spectrometer
GB201808890D0 (en) 2018-05-31 2018-07-18 Micromass Ltd Bench-top time of flight mass spectrometer
GB201808912D0 (en) 2018-05-31 2018-07-18 Micromass Ltd Bench-top time of flight mass spectrometer
GB201808893D0 (en) 2018-05-31 2018-07-18 Micromass Ltd Bench-top time of flight mass spectrometer
US11373849B2 (en) 2018-05-31 2022-06-28 Micromass Uk Limited Mass spectrometer having fragmentation region
CN109031452B (zh) * 2018-06-29 2019-11-12 北京空间机电研究所 一种多谱段探测器的拼接焦面组件及拼接方法
CN108962717B (zh) * 2018-08-09 2024-01-26 金华职业技术学院 一种用于研究大分子的质谱仪及研究电荷量方法
JP6734449B1 (ja) 2019-08-02 2020-08-05 浜松ホトニクス株式会社 イオン検出器、測定装置および質量分析装置
JP7252179B2 (ja) * 2020-07-08 2023-04-04 浜松ホトニクス株式会社 イオン検出器、測定装置および質量分析装置

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5686655A (en) * 1995-05-30 1997-11-11 Shimadzu Corporation Gas chromatograph/mass spectrometer system
US6858839B1 (en) * 2000-02-08 2005-02-22 Agilent Technologies, Inc. Ion optics for mass spectrometers

Family Cites Families (83)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2309414A (en) * 1939-10-24 1943-01-26 Gen Electric Damping magnet system
GB650861A (en) 1948-10-01 1951-03-07 Jack Blears Improvements relating to magnet systems for mass spectrometers
GB674729A (en) 1949-04-13 1952-07-02 Mullard Radio Valve Co Ltd Mass spectrographs and like apparatus
US2964627A (en) * 1957-07-01 1960-12-13 Trub Tauber & Co A G Double-focussing spectrometer for electrically charged particles
US3478204A (en) * 1964-08-24 1969-11-11 Jean R Berry Mass spectrometer ion source having a laser to cause autoionization of gas
US3521054A (en) * 1968-02-29 1970-07-21 Webb James E Analytical photoionization mass spectrometer with an argon gas filter between the light source and monochrometer
US3555331A (en) * 1968-08-08 1971-01-12 Susquehanna Corp Apparatus for maintaining vacuum conditions by molecular depletion of gas
SE358254B (enExample) 1971-09-15 1973-07-23 K Linderoth
US3898456A (en) * 1974-07-25 1975-08-05 Us Energy Electron multiplier-ion detector system
US4016421A (en) * 1975-02-13 1977-04-05 E. I. Du Pont De Nemours And Company Analytical apparatus with variable energy ion beam source
US4071848A (en) * 1976-11-26 1978-01-31 Bell Telephone Laboratories, Incorporated Thinned aperiodic antenna arrays with improved peak sidelobe level control
US4182984A (en) * 1978-05-05 1980-01-08 Westinghouse Electric Corp. Magnetic damping assembly with temperature compensator for watthour meters
DE3014053A1 (de) * 1980-04-11 1981-10-15 Max-Planck-Gesellschaft zur Förderung der Wissenschaften e.V., 3400 Göttingen Regelanordnung fuer ein massenspektrometer
JPS57191952A (en) * 1981-05-22 1982-11-25 Jeol Ltd Mass spectrograph
US4456898A (en) * 1982-02-11 1984-06-26 General Electric Company Thermal compensators for magnetic circuits
FR2544914B1 (fr) * 1983-04-19 1986-02-21 Cameca Perfectionnements apportes aux spectrometres de masse
US4476732A (en) * 1983-04-21 1984-10-16 Varian Associates, Inc. Septumless jet stream on-column injector for chromatography
DE3510378A1 (de) * 1985-03-22 1986-10-02 Coulston International Corp., Albany, N.Y. Verfahren zur analytischen bestimmung von organischen stoffen
DE3710935C2 (de) * 1986-04-23 1994-08-18 Finnigan Mat Gmbh Verfahren zum Betrieb eines Massenspektrometers sowie Massenspektrometer zur Durchführung des Verfahrens
US4855747A (en) * 1987-08-17 1989-08-08 Trustees Of The University Of Pennsylvania Method of target imaging and identification
US4859848A (en) * 1987-10-09 1989-08-22 Masstron, Inc. Mass spectrometer apparatus
FR2640697B1 (fr) * 1988-12-16 1993-01-08 Cit Alcatel Ensemble de pompage pour l'obtention de vides eleves
FR2640821B1 (fr) * 1988-12-16 1991-05-31 Thomson Csf Antenne a couverture tridimensionnelle et balayage electronique, du type reseau volumique rarefie aleatoire
JPH0812773B2 (ja) * 1989-04-11 1996-02-07 日本電子株式会社 同時検出型質量分析装置
US5299577A (en) * 1989-04-20 1994-04-05 National Fertility Institute Apparatus and method for image processing including one-dimensional clean approximation
US5313061A (en) * 1989-06-06 1994-05-17 Viking Instrument Miniaturized mass spectrometer system
US5046018A (en) * 1989-09-11 1991-09-03 Nellcor, Inc. Agent gas analyzer and method of use
US5231591A (en) * 1989-09-11 1993-07-27 Nellcor Incorporated Agent gas analyzer and method of use
US4988867A (en) * 1989-11-06 1991-01-29 Galileo Electro-Optics Corp. Simultaneous positive and negative ion detector
GB8928917D0 (en) * 1989-12-21 1990-02-28 Vg Instr Group Method and apparatus for surface analysis
US5135870A (en) * 1990-06-01 1992-08-04 Arizona Board Of Regents Laser ablation/ionizaton and mass spectrometric analysis of massive polymers
GB2249426A (en) 1990-10-31 1992-05-06 Dennis Leigh Technology Limite Mass spectrometer
JPH04326943A (ja) * 1991-04-25 1992-11-16 Hitachi Ltd 真空排気システム及び排気方法
US5461235A (en) * 1991-06-21 1995-10-24 Cottrell; John S. Mass spectrometry apparatus and method relating thereto
US5382793A (en) * 1992-03-06 1995-01-17 Hewlett-Packard Company Laser desorption ionization mass monitor (LDIM)
US5264813A (en) * 1992-05-19 1993-11-23 Caterpillar Inc. Force motor having temperature compensation characteristics
US5317151A (en) * 1992-10-30 1994-05-31 Sinha Mahadeva P Miniaturized lightweight magnetic sector for a field-portable mass spectrometer
US5331158A (en) * 1992-12-07 1994-07-19 Hewlett-Packard Company Method and arrangement for time of flight spectrometry
US5490765A (en) * 1993-05-17 1996-02-13 Cybor Corporation Dual stage pump system with pre-stressed diaphragms and reservoir
US5386115A (en) * 1993-09-22 1995-01-31 Westinghouse Electric Corporation Solid state micro-machined mass spectrograph universal gas detection sensor
GB9409953D0 (en) * 1994-05-17 1994-07-06 Fisons Plc Mass spectrometer and electron impact ion source therefor
DE19524609A1 (de) * 1995-07-06 1997-01-09 Leybold Ag Vorrichtung zum raschen Evakuieren einer Vakuumkammer
WO1997017018A1 (en) * 1995-11-09 1997-05-15 Brigham & Women's Hospital Aperiodic ultrasound phased array
US5801380A (en) * 1996-02-09 1998-09-01 California Institute Of Technology Array detectors for simultaneous measurement of ions in mass spectrometry
US5808299A (en) * 1996-04-01 1998-09-15 Syagen Technology Real-time multispecies monitoring by photoionization mass spectrometry
WO1997039474A1 (en) * 1996-04-12 1997-10-23 The Perkin-Elmer Corporation Ion detector, detector array and instrument using same
US6051832A (en) * 1996-08-20 2000-04-18 Graseby Dynamics Limited Drift chambers
DE19644713A1 (de) * 1996-10-28 1998-05-07 Bruker Franzen Analytik Gmbh Hochauflösender Hochmassendetektor für Flugzeitmassenspektrometer
US6316768B1 (en) * 1997-03-14 2001-11-13 Leco Corporation Printed circuit boards as insulated components for a time of flight mass spectrometer
US5929819A (en) * 1996-12-17 1999-07-27 Hughes Electronics Corporation Flat antenna for satellite communication
US6191419B1 (en) * 1997-08-06 2001-02-20 California Institute Of Technology Machined electrostatic sector for mass spectrometer
CA2304868A1 (en) * 1997-09-23 1999-04-01 Ciphergen Biosystems, Inc Secondary ion generator detector for time-of-flight mass spectrometry
AU1067799A (en) * 1997-10-07 1999-04-27 Sti Optronics Inc. Magnetic separator for linear dispersion and method for producing the same
US6403956B1 (en) * 1998-05-01 2002-06-11 California Institute Of Technology Temperature compensation for miniaturized magnetic sector
US6155097A (en) * 1998-05-29 2000-12-05 Varian, Inc. Method and apparatus for selectively extracting and compressing trace samples from a carrier to enhance detection
US6195705B1 (en) * 1998-06-30 2001-02-27 Cisco Technology, Inc. Mobile IP mobility agent standby protocol
US6300626B1 (en) * 1998-08-17 2001-10-09 Board Of Trustees Of The Leland Stanford Junior University Time-of-flight mass spectrometer and ion analysis
WO2000020851A1 (en) 1998-10-06 2000-04-13 University Of Washington Charged particle beam detection system
US6198096B1 (en) * 1998-12-22 2001-03-06 Agilent Technologies, Inc. High duty cycle pseudo-noise modulated time-of-flight mass spectrometry
JP2001015011A (ja) * 1999-06-30 2001-01-19 Horiba Ltd 強誘電体型光電デバイス
US6635883B2 (en) * 1999-12-06 2003-10-21 Epion Corporation Gas cluster ion beam low mass ion filter
US6614019B2 (en) * 2000-01-20 2003-09-02 W. Bruce Feller Mass spectrometry detector
US6831276B2 (en) * 2000-05-08 2004-12-14 Philip S. Berger Microscale mass spectrometric chemical-gas sensor
CA2409166A1 (en) * 2000-05-31 2001-12-06 Wayne A. Bryden Pulsed laser sampling for mass spectrometer system
RU2182347C2 (ru) * 2000-08-04 2002-05-10 Институт физики полупроводников СО РАН Акустооптический перестраиваемый фильтр
US6576899B2 (en) * 2001-01-16 2003-06-10 California Institute Of Technology Direct detection of low-energy charged particles using metal oxide semiconductor circuitry
US6847039B2 (en) * 2001-03-28 2005-01-25 Canon Kabushiki Kaisha Photodetecting device, radiation detecting device, and radiation imaging system
SE0101555D0 (sv) * 2001-05-04 2001-05-04 Amersham Pharm Biotech Ab Fast variable gain detector system and method of controlling the same
TW589723B (en) * 2001-09-10 2004-06-01 Ebara Corp Detecting apparatus and device manufacturing method
US6649908B2 (en) * 2001-09-20 2003-11-18 Agilent Technologies, Inc. Multiplexing capillary array for atmospheric pressure ionization-mass spectrometry
US6747258B2 (en) * 2001-10-09 2004-06-08 Itt Manufacturing Enterprises, Inc. Intensified hybrid solid-state sensor with an insulating layer
US6646256B2 (en) * 2001-12-18 2003-11-11 Agilent Technologies, Inc. Atmospheric pressure photoionization source in mass spectrometry
EP1573770B1 (en) * 2002-02-20 2013-06-26 University of Washington Analytical instruments using a pseudorandom array of sources, such as a micro-machined mass spectrometer
US6750448B2 (en) * 2002-03-08 2004-06-15 University Of Washington Preparative separation of mixtures by mass spectrometry
WO2004030024A2 (en) * 2002-05-31 2004-04-08 University Of Florida Research Foundation, Inc. Methods and devices for laser desorption chemical ionization
US6680477B2 (en) * 2002-05-31 2004-01-20 Battelle Memorial Institute High spatial resolution matrix assisted laser desorption/ionization (MALDI)
KR100449876B1 (ko) * 2002-12-05 2004-09-22 삼성전기주식회사 블록형 다채널 광신호를 연결할 수 있는 다층인쇄회로기판 및 그 방법
KR100451635B1 (ko) * 2002-12-10 2004-10-08 삼성전기주식회사 섬유 블록과 파이프 블록, 및 이를 이용하여 다층인쇄회로기판의 층간 광신호를 연결하는 방법
US20060076482A1 (en) * 2002-12-13 2006-04-13 Hobbs Steven E High throughput systems and methods for parallel sample analysis
KR100525223B1 (ko) * 2002-12-24 2005-10-28 삼성전기주식회사 장거리 신호 전송이 가능한 광 인쇄회로기판
KR100499005B1 (ko) * 2002-12-27 2005-07-01 삼성전기주식회사 다채널 블록형 광원소자가 패키징된 인쇄회로기판
US20040222374A1 (en) * 2003-05-07 2004-11-11 Scheidemann Adi A. Ion detector array assembly and devices comprising the same
US6979818B2 (en) * 2003-07-03 2005-12-27 Oi Corporation Mass spectrometer for both positive and negative particle detection

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5686655A (en) * 1995-05-30 1997-11-11 Shimadzu Corporation Gas chromatograph/mass spectrometer system
US6858839B1 (en) * 2000-02-08 2005-02-22 Agilent Technologies, Inc. Ion optics for mass spectrometers

Cited By (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7282709B2 (en) * 1998-10-06 2007-10-16 University Of Washington Charged particle beam detection system
US20050274888A1 (en) * 1998-10-06 2005-12-15 University Of Washington Charged particle beam detection system
US7339169B1 (en) 2006-11-29 2008-03-04 Lawrence Livermore National Security, Llc Sample rotating turntable kit for infrared spectrometers
US20100223978A1 (en) * 2009-03-06 2010-09-09 Mccauley Edward B System and Method for a Gas Chromatograph to Mass Spectrometer Interface
US8549893B2 (en) 2009-03-06 2013-10-08 Thermo Finnigan Llc System and method for a gas chromatograph to mass spectrometer interface
US9244044B2 (en) 2009-03-06 2016-01-26 Thermo Finnigan Llc Method for a gas chromatograph to mass spectrometer interface
US11081331B2 (en) * 2015-10-28 2021-08-03 Duke University Mass spectrometers having segmented electrodes and associated methods
US20190057854A1 (en) * 2015-10-28 2019-02-21 Duke University Mass spectrometers having segmented electrodes and associated methods
US20170271138A1 (en) * 2016-03-17 2017-09-21 Leidos, Inc. Low Power Mass Analyzer and System Integrating Same For Chemical Analysis
US10998181B2 (en) * 2016-03-17 2021-05-04 Leidos, Inc. Low power mass analyzer and system integrating same for chemical analysis
US10872755B2 (en) * 2016-03-17 2020-12-22 Leidos, Inc. Low power mass analyzer and system integrating same for chemical analysis
US11227754B2 (en) 2018-04-30 2022-01-18 Leidos, Inc. Low-power mass interrogation system and assay for determining vitamin D levels
US11967495B2 (en) 2018-04-30 2024-04-23 Leidos, Inc. Low-power mass interrogation system and assay for determining Vitamin D levels
US12261032B2 (en) 2018-04-30 2025-03-25 Leidos, Inc. Low-power mass interrogation system and assay for determining vitamin D levels

Also Published As

Publication number Publication date
JP2007527601A (ja) 2007-09-27
WO2005088671A3 (en) 2006-11-09
WO2005088672A3 (en) 2006-08-10
WO2005088672A2 (en) 2005-09-22
EP1721330A2 (en) 2006-11-15
US20060011826A1 (en) 2006-01-19
WO2005088671A2 (en) 2005-09-22
JP4931793B2 (ja) 2012-05-16
US7550722B2 (en) 2009-06-23

Similar Documents

Publication Publication Date Title
US20060011829A1 (en) Gas chromatograph and mass spectrometer
US6979818B2 (en) Mass spectrometer for both positive and negative particle detection
US7442920B2 (en) Optical bench for a mass spectrometer system
US9347920B2 (en) Analytical instruments, assemblies, and methods
US10283341B2 (en) Microscale mass spectrometry systems, devices and related methods
US4105916A (en) Methods and apparatus for simultaneously producing and electronically separating the chemical ionization mass spectrum and the electron impact ionization mass spectrum of the same sample material
US6590207B2 (en) Microscale mass spectrometric chemical-gas sensor
EP1994545B1 (en) Mass spectrometer for trace gas leak detection with suppression of undesired ions
EP1994546B1 (en) High sensitivity slitless ion source mass spectrometer for trace gas leak detection
EP0575409B1 (en) Isotopic-ratio plasma source mass spectrometer
JP3500323B2 (ja) サイクロイド質量分析計に使用されるイオナイザー
US20040222374A1 (en) Ion detector array assembly and devices comprising the same
US7223972B2 (en) Stabilization of a magnetic section of a mass spectrometer
US20110155903A1 (en) Simultaneous inorganic mass spectrometer and method of inorganic mass spectrometry
WO2016149658A1 (en) Ruggedized advanced identification mass spectrometer
US8288719B1 (en) Analytical instruments, assemblies, and methods
WO2005022096A2 (en) Mass spectrometer with light source and/or direct charge measuring
HK1131256B (en) High sensitivity slitless ion source mass spectrometer for trace gas leak detection

Legal Events

Date Code Title Description
AS Assignment

Owner name: OI CORPORATION, TEXAS

Free format text: ASSIGNMENT OF ASSIGNORS INTEREST;ASSIGNORS:SCHEIDEMANN, ADI A.;KIBELKA, GOTTFRIED P.;LONG, CLARE R.;REEL/FRAME:016597/0676;SIGNING DATES FROM 20050613 TO 20050626

STCB Information on status: application discontinuation

Free format text: ABANDONED -- FAILURE TO RESPOND TO AN OFFICE ACTION