JP4852193B2 - モジュール構造のイメージング装置 - Google Patents

モジュール構造のイメージング装置 Download PDF

Info

Publication number
JP4852193B2
JP4852193B2 JP2000525931A JP2000525931A JP4852193B2 JP 4852193 B2 JP4852193 B2 JP 4852193B2 JP 2000525931 A JP2000525931 A JP 2000525931A JP 2000525931 A JP2000525931 A JP 2000525931A JP 4852193 B2 JP4852193 B2 JP 4852193B2
Authority
JP
Japan
Prior art keywords
imaging
tile
module
modules
board
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP2000525931A
Other languages
English (en)
Japanese (ja)
Other versions
JP2001527295A5 (https=
JP2001527295A (ja
Inventor
キーキネン アルト
Original Assignee
ジーメンス アクティエンゲゼルシャフト
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=10823839&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=JP4852193(B2) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by ジーメンス アクティエンゲゼルシャフト filed Critical ジーメンス アクティエンゲゼルシャフト
Publication of JP2001527295A publication Critical patent/JP2001527295A/ja
Publication of JP2001527295A5 publication Critical patent/JP2001527295A5/ja
Application granted granted Critical
Publication of JP4852193B2 publication Critical patent/JP4852193B2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/24—Measuring radiation intensity with semiconductor detectors
    • G01T1/243—Modular detectors, e.g. arrays formed from self contained units
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/79—Arrangements of circuitry being divided between different or multiple substrates, chips or circuit boards, e.g. stacked image sensors

Landscapes

  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Signal Processing (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Multimedia (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Measurement Of Radiation (AREA)
  • Solid State Image Pick-Up Elements (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Studio Devices (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
JP2000525931A 1997-12-18 1998-11-19 モジュール構造のイメージング装置 Expired - Lifetime JP4852193B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
GB9726770A GB2332608B (en) 1997-12-18 1997-12-18 Modular imaging apparatus
GB9726770.2 1997-12-18
PCT/EP1998/007526 WO1999033117A1 (en) 1997-12-18 1998-11-19 Modular imaging apparatus

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2011199589A Division JP5002069B2 (ja) 1997-12-18 2011-09-13 モジュール構造のイメージング装置

Publications (3)

Publication Number Publication Date
JP2001527295A JP2001527295A (ja) 2001-12-25
JP2001527295A5 JP2001527295A5 (https=) 2006-01-05
JP4852193B2 true JP4852193B2 (ja) 2012-01-11

Family

ID=10823839

Family Applications (2)

Application Number Title Priority Date Filing Date
JP2000525931A Expired - Lifetime JP4852193B2 (ja) 1997-12-18 1998-11-19 モジュール構造のイメージング装置
JP2011199589A Expired - Lifetime JP5002069B2 (ja) 1997-12-18 2011-09-13 モジュール構造のイメージング装置

Family Applications After (1)

Application Number Title Priority Date Filing Date
JP2011199589A Expired - Lifetime JP5002069B2 (ja) 1997-12-18 2011-09-13 モジュール構造のイメージング装置

Country Status (7)

Country Link
US (2) US6403964B1 (https=)
EP (1) EP1042815A1 (https=)
JP (2) JP4852193B2 (https=)
AU (1) AU1963199A (https=)
GB (1) GB2332608B (https=)
IL (1) IL136706A (https=)
WO (1) WO1999033117A1 (https=)

Families Citing this family (65)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2289983B (en) 1994-06-01 1996-10-16 Simage Oy Imaging devices,systems and methods
GB2371196A (en) * 2000-12-22 2002-07-17 Simage Oy High energy radiation scan imaging system
US7136452B2 (en) 1995-05-31 2006-11-14 Goldpower Limited Radiation imaging system, device and method for scan imaging
US9029793B2 (en) 1998-11-05 2015-05-12 Siemens Aktiengesellschaft Imaging device
JP3475847B2 (ja) 1999-04-07 2003-12-10 松下電器産業株式会社 Ｘ線画像センサ
WO2000065376A1 (en) * 1999-04-26 2000-11-02 Simage Oy Device for imaging radiation
FR2793072B1 (fr) * 1999-04-30 2001-11-30 Commissariat Energie Atomique Dispositif de detection compact pour gamma camera
DE19933472A1 (de) * 1999-07-20 2001-02-01 Daimler Chrysler Ag Netzwerk zur Signalverarbeitung, insbesondere zur Bilddatenverarbeitung, und Bildaufnahmesystem
JP4433519B2 (ja) * 1999-08-16 2010-03-17 株式会社ニコン 電子カメラ
US7104686B2 (en) * 2001-05-30 2006-09-12 Canon Kabushiki Kaisha Radiographic apparatus
US6841784B2 (en) * 2002-07-02 2005-01-11 Ray Therapy Imaging Ab Radiation sensor device
WO2004027454A1 (en) * 2002-09-18 2004-04-01 Koninklijke Philips Electronics N.V. X-ray detector with a plurality of detector units
DE10244177A1 (de) * 2002-09-23 2004-04-08 Siemens Ag Bilddetektor für Röntgeneinrichtungen mit rückseitig kontaktierten, organischen Bild-Sensoren
GB0224689D0 (en) 2002-10-23 2002-12-04 Simage Oy Formation of contacts on semiconductor substrates
JP2006504258A (ja) * 2002-10-25 2006-02-02 ゴールドパワー リミテッド 回路基板およびその製造方法
US7223981B1 (en) 2002-12-04 2007-05-29 Aguila Technologies Inc. Gamma ray detector modules
US7247858B2 (en) 2003-04-10 2007-07-24 Agfa Healthcare, N.V. Method for creating a contiguous image using multiple X-ray imagers
EP1467226B1 (en) * 2003-04-10 2008-08-06 Agfa HealthCare NV Method for creating a contiguous image using multiple x-ray imagers
US6982424B2 (en) * 2003-06-02 2006-01-03 Ge Medical Systems Global Technology Company, Llc X-ray and CT image detector
DE10335662A1 (de) * 2003-08-04 2005-03-10 Siemens Ag Detektormodul für einen Detektor zur Detektion ionisierender Strahlung sowie Detektor
JP3863872B2 (ja) * 2003-09-30 2006-12-27 株式会社日立製作所 陽電子放出型断層撮影装置
JP3863873B2 (ja) * 2003-09-30 2006-12-27 株式会社日立製作所 放射線検査装置
JP2007512075A (ja) * 2003-11-28 2007-05-17 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ 放射線検出器モジュール
JP2007514360A (ja) * 2003-12-10 2007-05-31 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ Ｘ線検出器
JP4594624B2 (ja) * 2004-01-13 2010-12-08 株式会社日立製作所 放射線検出装置および核医学診断装置
JP2005241595A (ja) * 2004-02-27 2005-09-08 Japan Nuclear Cycle Development Inst States Of Projects 被測定面形状に適合可能な放射能測定装置
JP4816457B2 (ja) * 2004-09-02 2011-11-16 ソニー株式会社 撮像装置及び撮像結果の出力方法
EP1769744B9 (en) * 2005-09-28 2012-04-04 Kabushiki Kaisha Toshiba X-ray computer tomography system
JP2007125086A (ja) * 2005-11-01 2007-05-24 Ge Medical Systems Global Technology Co Llc Ｘ線検出器およびｘ線ｃｔ装置
US7796174B1 (en) * 2006-04-25 2010-09-14 Ball Aerospace & Technologies Corp. Hybrid imager
US20080001246A1 (en) * 2006-05-24 2008-01-03 Dipak Sengupta Single package detector and digital converter integration
JP2008096278A (ja) * 2006-10-12 2008-04-24 Fujifilm Corp 放射線画像検出器
US20110001052A1 (en) * 2006-12-04 2011-01-06 Luc Struye Computed radiography system
US7956332B2 (en) * 2008-10-29 2011-06-07 General Electric Company Multi-layer radiation detector assembly
JP5503883B2 (ja) * 2009-03-06 2014-05-28 株式会社東芝 Ｘ線ｃｔ装置及びｘ線検出装置
JP5436004B2 (ja) * 2009-03-31 2014-03-05 キヤノン株式会社 撮影装置
US9158369B2 (en) * 2010-10-12 2015-10-13 Tactonic Technologies, Llc Sensors having a connecting frame and method for composite sensors
US8575558B2 (en) * 2010-11-30 2013-11-05 General Electric Company Detector array with a through-via interposer
US20120193545A1 (en) * 2011-01-31 2012-08-02 General Electric Company Detector systems with anode incidence face and methods of fabricating the same
FR2972268B1 (fr) * 2011-03-01 2013-03-29 Sagem Defense Securite Detecteur de sursauts gamma compact a haute resolution
JP5903772B2 (ja) * 2011-04-11 2016-04-13 ソニー株式会社 固体撮像素子およびカメラシステム
JP5508340B2 (ja) * 2011-05-30 2014-05-28 富士フイルム株式会社 放射線画像検出装置及び放射線画像検出装置の制御方法
JP5848047B2 (ja) 2011-07-07 2016-01-27 富士フイルム株式会社 放射線検出素子、放射線画像撮影装置、及び放射線画像撮影システム
JP6209532B2 (ja) 2011-12-27 2017-10-04 コーニンクレッカ フィリップス エヌ ヴェＫｏｎｉｎｋｌｉｊｋｅ Ｐｈｉｌｉｐｓ Ｎ．Ｖ． Ｐｅｔ検出器のためのタイルの取り付け
KR101911314B1 (ko) 2012-03-30 2018-10-24 삼성전자주식회사 엑스선 검출기
US9012859B2 (en) 2012-05-18 2015-04-21 General Electric Company Tiled X-ray imager panel and method of forming the same
US20150293040A1 (en) * 2012-12-05 2015-10-15 Hitachi, Ltd. Calculation system and calculation method
CZ2013669A3 (cs) * 2013-08-30 2015-01-07 České vysoké učení technické v Praze Ústav technické a experimentální fyziky Detektor ionizujícího záření umožňující vytvoření souvislého digitálního obrazu
CN106255900A (zh) * 2014-04-30 2016-12-21 模拟技术公司 用于成像模式的探测器阵列
JP6595803B2 (ja) * 2014-06-13 2019-10-23 キヤノン株式会社 放射線撮像装置、放射線撮像システムおよびその制御方法
EP3143430B1 (en) * 2014-10-31 2018-01-10 Koninklijke Philips N.V. Sensor device and imaging system for detecting radiation signals
CN105832353B (zh) 2015-01-30 2020-11-06 佳能株式会社 放射线摄像系统
CZ306067B6 (cs) * 2015-05-12 2016-07-20 Advacam S.R.O. Modul detektoru ionizujícího záření
US10686003B2 (en) * 2015-12-31 2020-06-16 General Electric Company Radiation detector assembly
JP6877289B2 (ja) * 2017-07-31 2021-05-26 キヤノン株式会社 放射線検出装置、放射線検出システム、及び放射線出装置の製造方法
US10481284B2 (en) * 2017-10-19 2019-11-19 Kromek Group, PLC Modular gamma imaging device
US10598801B2 (en) 2017-10-19 2020-03-24 Kromek Group, PLC Modular gamma imaging device
US20190285758A1 (en) * 2017-12-09 2019-09-19 Linbo Yang Integrated Multi Slice X-ray Detector for In-Line Computed Tomography
JP7166833B2 (ja) * 2018-08-03 2022-11-08 キヤノンメディカルシステムズ株式会社 放射線検出器及び放射線検出器モジュール
CN110664422A (zh) * 2019-09-09 2020-01-10 东软医疗系统股份有限公司 探测器模块、探测器及医疗成像设备
US11346924B2 (en) * 2019-12-09 2022-05-31 Waymo Llc SiPM with cells of different sizes
US11253212B2 (en) * 2020-01-07 2022-02-22 General Electric Company Tileable X-ray detector cassettes
US12153173B2 (en) 2020-10-06 2024-11-26 National University Corporation Shizuoka University Radiographic device
CN112951864B (zh) * 2021-04-29 2022-08-02 中国科学院长春光学精密机械与物理研究所 一种拼接用图像传感器的窄边柔性封装结构及其封装方法
CN118490258A (zh) * 2024-04-16 2024-08-16 东软医疗系统股份有限公司 偏置式探测器子模块、探测器模块、探测器和医疗成像设备

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4467342A (en) * 1982-07-15 1984-08-21 Rca Corporation Multi-chip imager
JPH01240887A (ja) * 1988-03-23 1989-09-26 Hitachi Ltd 放射線検出器及びその製造方法
JPH06342099A (ja) * 1992-12-23 1994-12-13 E I Du Pont De Nemours & Co Ｘ線像記録用電子カセットおよびｘ線ラジオグラム撮影方法
GB2305096A (en) * 1995-08-29 1997-03-26 Simage Oy Imaging system with support for imaging devices
US5635718A (en) * 1996-01-16 1997-06-03 Minnesota Mining And Manufacturing Company Multi-module radiation detecting device and fabrication method

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1564385A (en) * 1977-03-24 1980-04-10 Emi Ltd Arrangements for detecting ionising radiation
US5043582A (en) * 1985-12-11 1991-08-27 General Imagining Corporation X-ray imaging system and solid state detector therefor
FR2598250B1 (fr) * 1986-04-30 1988-07-08 Thomson Csf Panneau de prise de vue radiologique, et procede de fabrication
FR2652655A1 (fr) * 1989-10-04 1991-04-05 Commissariat Energie Atomique Dispositif matriciel de grandes dimensions pour la prise ou la restitution d'images.
JP2881856B2 (ja) * 1989-11-07 1999-04-12 株式会社島津製作所 放射線像受像装置
JP2890553B2 (ja) * 1989-11-24 1999-05-17 株式会社島津製作所 Ｘ線像撮像装置
US5065245A (en) * 1990-04-30 1991-11-12 Eastman Kodak Company Modular image sensor array
FR2693033B1 (fr) * 1992-06-30 1994-08-19 Commissariat Energie Atomique Dispositif d'imagerie de grande dimension.
US5436458A (en) * 1993-12-06 1995-07-25 Minnesota Mining And Manufacturing Company Solid state radiation detection panel having tiled photosensitive detectors arranged to minimize edge effects between tiles
US5381014B1 (en) * 1993-12-29 1997-06-10 Du Pont Large area x-ray imager and method of fabrication
GB2289983B (en) * 1994-06-01 1996-10-16 Simage Oy Imaging devices,systems and methods
US5629524A (en) * 1995-02-21 1997-05-13 Advanced Scientific Concepts, Inc. High speed crystallography detector
JP2558403Y2 (ja) * 1996-06-28 1997-12-24 株式会社島津製作所 放射線検出器
GB2315157B (en) * 1996-07-11 1998-09-30 Simage Oy Imaging apparatus
GB2322233B (en) * 1997-02-18 2001-07-25 Simage Oy Semi-conductor imaging device

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4467342A (en) * 1982-07-15 1984-08-21 Rca Corporation Multi-chip imager
JPH01240887A (ja) * 1988-03-23 1989-09-26 Hitachi Ltd 放射線検出器及びその製造方法
JPH06342099A (ja) * 1992-12-23 1994-12-13 E I Du Pont De Nemours & Co Ｘ線像記録用電子カセットおよびｘ線ラジオグラム撮影方法
GB2305096A (en) * 1995-08-29 1997-03-26 Simage Oy Imaging system with support for imaging devices
US5635718A (en) * 1996-01-16 1997-06-03 Minnesota Mining And Manufacturing Company Multi-module radiation detecting device and fabrication method

Also Published As

Publication number Publication date
IL136706A (en) 2004-07-25
US20020130266A1 (en) 2002-09-19
IL136706A0 (en) 2001-06-14
WO1999033117A1 (en) 1999-07-01
GB2332608B (en) 2000-09-06
GB2332608A (en) 1999-06-23
JP5002069B2 (ja) 2012-08-15
AU1963199A (en) 1999-07-12
JP2011257431A (ja) 2011-12-22
EP1042815A1 (en) 2000-10-11
US6403964B1 (en) 2002-06-11
GB9726770D0 (en) 1998-02-18
JP2001527295A (ja) 2001-12-25

Similar Documents

Publication Publication Date Title
JP4852193B2 (ja) モジュール構造のイメージング装置
US6408110B2 (en) Tiled imaging apparatus providing substantially continuous imaging
CN100431150C (zh) 由光敏和/或x-射线敏传感器组成的传感器设备
US8497483B2 (en) Circuit substrate and method
US7136452B2 (en) Radiation imaging system, device and method for scan imaging
JP4112175B2 (ja) ハイブリッド半導体イメージング・デバイス
US6703617B1 (en) Device for imaging radiation
US9960203B2 (en) Radiation sensor
CN100483745C (zh) 电路基板、辐射检测器及其制造方法
GB2349504A (en) Imaging device assembly
JP4315593B2 (ja) 半導体撮像装置および撮像システム

Legal Events

Date Code Title Description
A711 Notification of change in applicant

Free format text: JAPANESE INTERMEDIATE CODE: A711

Effective date: 20050408

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20051031

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20051031

A711 Notification of change in applicant

Free format text: JAPANESE INTERMEDIATE CODE: A711

Effective date: 20070705

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20090818

A601 Written request for extension of time

Free format text: JAPANESE INTERMEDIATE CODE: A601

Effective date: 20091111

A602 Written permission of extension of time

Free format text: JAPANESE INTERMEDIATE CODE: A602

Effective date: 20091118

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20100216

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20100330

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20100526

A711 Notification of change in applicant

Free format text: JAPANESE INTERMEDIATE CODE: A711

Effective date: 20110325

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20110621

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20110913

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20111011

A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20111024

R150 Certificate of patent or registration of utility model

Free format text: JAPANESE INTERMEDIATE CODE: R150

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20141028

Year of fee payment: 3

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

EXPY Cancellation because of completion of term