JP4699498B2 - メモリチップにアクセスする方法 - Google Patents
メモリチップにアクセスする方法 Download PDFInfo
- Publication number
- JP4699498B2 JP4699498B2 JP2008179303A JP2008179303A JP4699498B2 JP 4699498 B2 JP4699498 B2 JP 4699498B2 JP 2008179303 A JP2008179303 A JP 2008179303A JP 2008179303 A JP2008179303 A JP 2008179303A JP 4699498 B2 JP4699498 B2 JP 4699498B2
- Authority
- JP
- Japan
- Prior art keywords
- input
- memory chip
- command
- memory
- column
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000000034 method Methods 0.000 claims description 23
- 238000010586 diagram Methods 0.000 description 7
- 238000012360 testing method Methods 0.000 description 6
- 238000009429 electrical wiring Methods 0.000 description 4
- 230000015556 catabolic process Effects 0.000 description 1
- 238000006731 degradation reaction Methods 0.000 description 1
- 230000000593 degrading effect Effects 0.000 description 1
- 230000009977 dual effect Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000001360 synchronised effect Effects 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C5/00—Details of stores covered by group G11C11/00
- G11C5/02—Disposition of storage elements, e.g. in the form of a matrix array
- G11C5/04—Supports for storage elements, e.g. memory modules; Mounting or fixing of storage elements on such supports
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
- G11C29/1201—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details comprising I/O circuitry
Landscapes
- Dram (AREA)
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- For Increasing The Reliability Of Semiconductor Memories (AREA)
- Computer Hardware Design (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW097102177 | 2008-01-21 | ||
TW97102177A TW200933645A (en) | 2008-01-21 | 2008-01-21 | Method for accessing memory chip |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2009176398A JP2009176398A (ja) | 2009-08-06 |
JP4699498B2 true JP4699498B2 (ja) | 2011-06-08 |
Family
ID=40794580
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2008179303A Active JP4699498B2 (ja) | 2008-01-21 | 2008-07-09 | メモリチップにアクセスする方法 |
Country Status (4)
Country | Link |
---|---|
JP (1) | JP4699498B2 (zh) |
KR (1) | KR100951605B1 (zh) |
DE (1) | DE102008034346B4 (zh) |
TW (1) | TW200933645A (zh) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR102542584B1 (ko) * | 2016-03-11 | 2023-06-14 | 에스케이하이닉스 주식회사 | 반도체 메모리의 입력 장치 및 이를 포함하는 반도체 메모리 장치 |
Citations (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH01144664A (ja) * | 1988-03-01 | 1989-06-06 | Mitsubishi Electric Corp | 半導体メモリ用集積回路装置 |
JPH05274877A (ja) * | 1992-03-25 | 1993-10-22 | Mitsubishi Electric Corp | 半導体記憶装置 |
JPH09213092A (ja) * | 1996-02-08 | 1997-08-15 | Hitachi Ltd | 半導体集積回路装置 |
JPH10340224A (ja) * | 1997-05-21 | 1998-12-22 | Internatl Business Mach Corp <Ibm> | Sdramを使用した高性能高帯域幅メモリおよびシステム |
JPH11203859A (ja) * | 1998-01-06 | 1999-07-30 | Fujitsu Ltd | クロック同期型メモリ装置及びそのスケジューラ回路 |
JPH11317080A (ja) * | 1998-03-04 | 1999-11-16 | Matsushita Electric Ind Co Ltd | 半導体集積回路 |
JP2001195882A (ja) * | 1999-11-30 | 2001-07-19 | Hyundai Electronics Ind Co Ltd | ラムバスdramのクロック制御回路 |
JP2006294074A (ja) * | 2005-03-14 | 2006-10-26 | Fujitsu Ltd | 半導体記憶装置 |
JP2007183959A (ja) * | 2006-01-04 | 2007-07-19 | Samsung Electronics Co Ltd | 改善されたアディティブレイテンシを有したメモリシステム及び制御方法 |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5805520A (en) | 1997-04-25 | 1998-09-08 | Hewlett-Packard Company | Integrated circuit address reconfigurability |
US6236251B1 (en) * | 1998-03-04 | 2001-05-22 | Matsushita Electric Industrial Co., Ltd. | Semiconductor integrated circuit with multiple selectively activated synchronization circuits |
-
2008
- 2008-01-21 TW TW97102177A patent/TW200933645A/zh unknown
- 2008-06-26 KR KR1020080060690A patent/KR100951605B1/ko active IP Right Grant
- 2008-07-09 JP JP2008179303A patent/JP4699498B2/ja active Active
- 2008-07-23 DE DE200810034346 patent/DE102008034346B4/de active Active
Patent Citations (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH01144664A (ja) * | 1988-03-01 | 1989-06-06 | Mitsubishi Electric Corp | 半導体メモリ用集積回路装置 |
JPH05274877A (ja) * | 1992-03-25 | 1993-10-22 | Mitsubishi Electric Corp | 半導体記憶装置 |
JPH09213092A (ja) * | 1996-02-08 | 1997-08-15 | Hitachi Ltd | 半導体集積回路装置 |
JPH10340224A (ja) * | 1997-05-21 | 1998-12-22 | Internatl Business Mach Corp <Ibm> | Sdramを使用した高性能高帯域幅メモリおよびシステム |
JPH11203859A (ja) * | 1998-01-06 | 1999-07-30 | Fujitsu Ltd | クロック同期型メモリ装置及びそのスケジューラ回路 |
JPH11317080A (ja) * | 1998-03-04 | 1999-11-16 | Matsushita Electric Ind Co Ltd | 半導体集積回路 |
JP2001195882A (ja) * | 1999-11-30 | 2001-07-19 | Hyundai Electronics Ind Co Ltd | ラムバスdramのクロック制御回路 |
JP2006294074A (ja) * | 2005-03-14 | 2006-10-26 | Fujitsu Ltd | 半導体記憶装置 |
JP2007183959A (ja) * | 2006-01-04 | 2007-07-19 | Samsung Electronics Co Ltd | 改善されたアディティブレイテンシを有したメモリシステム及び制御方法 |
Also Published As
Publication number | Publication date |
---|---|
DE102008034346A1 (de) | 2009-07-30 |
DE102008034346B4 (de) | 2014-10-16 |
KR100951605B1 (ko) | 2010-04-09 |
TW200933645A (en) | 2009-08-01 |
KR20090080463A (ko) | 2009-07-24 |
JP2009176398A (ja) | 2009-08-06 |
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