JP4674151B2 - 点灯検査装置 - Google Patents

点灯検査装置 Download PDF

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Publication number
JP4674151B2
JP4674151B2 JP2005331958A JP2005331958A JP4674151B2 JP 4674151 B2 JP4674151 B2 JP 4674151B2 JP 2005331958 A JP2005331958 A JP 2005331958A JP 2005331958 A JP2005331958 A JP 2005331958A JP 4674151 B2 JP4674151 B2 JP 4674151B2
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JP
Japan
Prior art keywords
panel
inspection
lighting
clamp
liquid crystal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JP2005331958A
Other languages
English (en)
Japanese (ja)
Other versions
JP2007139516A (ja
Inventor
慎治 藤原
齋藤　　健
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Micronics Japan Co Ltd
Original Assignee
Micronics Japan Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Micronics Japan Co Ltd filed Critical Micronics Japan Co Ltd
Priority to JP2005331958A priority Critical patent/JP4674151B2/ja
Priority to TW095132237A priority patent/TWI307134B/zh
Priority to KR1020060084040A priority patent/KR100750052B1/ko
Publication of JP2007139516A publication Critical patent/JP2007139516A/ja
Application granted granted Critical
Publication of JP4674151B2 publication Critical patent/JP4674151B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306—Details
    • G02F1/1309—Repairing; Testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N2021/9513—Liquid crystal panels

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Liquid Crystal (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
JP2005331958A 2005-11-16 2005-11-16 点灯検査装置 Active JP4674151B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2005331958A JP4674151B2 (ja) 2005-11-16 2005-11-16 点灯検査装置
TW095132237A TWI307134B (en) 2005-11-16 2006-08-31 Lighting inspection apparatus
KR1020060084040A KR100750052B1 (ko) 2005-11-16 2006-09-01 점등 검사장치

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2005331958A JP4674151B2 (ja) 2005-11-16 2005-11-16 点灯検査装置

Publications (2)

Publication Number Publication Date
JP2007139516A JP2007139516A (ja) 2007-06-07
JP4674151B2 true JP4674151B2 (ja) 2011-04-20

Family

ID=38202582

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2005331958A Active JP4674151B2 (ja) 2005-11-16 2005-11-16 点灯検査装置

Country Status (3)

Country Link
JP (1) JP4674151B2 (ko)
KR (1) KR100750052B1 (ko)
TW (1) TWI307134B (ko)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100969539B1 (ko) * 2008-04-10 2010-07-12 가부시키가이샤 니혼 마이크로닉스 점등 검사장치
JP5631020B2 (ja) * 2009-05-01 2014-11-26 株式会社日本マイクロニクス 平板状被検査体の試験装置
JP5525981B2 (ja) * 2010-09-28 2014-06-18 株式会社日本マイクロニクス 検査装置及び検査方法
CN103680369A (zh) * 2013-12-03 2014-03-26 京东方科技集团股份有限公司 一种显示器模组的测试装置及其测试方法

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000356761A (ja) * 1999-04-23 2000-12-26 Mire Kk Ｌｃｄハンドラー
JP2003273198A (ja) * 2002-03-12 2003-09-26 Seiko Epson Corp 部材の支持固定機構及び検査装置

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100539183B1 (ko) * 2003-07-16 2005-12-27 주식회사 파이컴 회전포스트부를 구비한 액정패널 검사장치의 서브테이블및 이를 이용한 액정패널 정렬방법
JP2005221568A (ja) * 2004-02-03 2005-08-18 Micronics Japan Co Ltd 表示用パネルの処理装置
KR100648468B1 (ko) * 2004-07-28 2006-11-24 주식회사 디이엔티 다종 유리 기판 검사 장치 및 검사 방법
KR100615281B1 (ko) * 2004-12-04 2006-08-25 주식회사 파이컴 외팔보 패널 이송장치

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000356761A (ja) * 1999-04-23 2000-12-26 Mire Kk Ｌｃｄハンドラー
JP2003273198A (ja) * 2002-03-12 2003-09-26 Seiko Epson Corp 部材の支持固定機構及び検査装置

Also Published As

Publication number Publication date
TWI307134B (en) 2009-03-01
TW200721360A (en) 2007-06-01
KR20070052191A (ko) 2007-05-21
KR100750052B1 (ko) 2007-08-16
JP2007139516A (ja) 2007-06-07

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