TWI307134B - Lighting inspection apparatus - Google Patents

Lighting inspection apparatus Download PDF

Info

Publication number
TWI307134B
TWI307134B TW095132237A TW95132237A TWI307134B TW I307134 B TWI307134 B TW I307134B TW 095132237 A TW095132237 A TW 095132237A TW 95132237 A TW95132237 A TW 95132237A TW I307134 B TWI307134 B TW I307134B
Authority
TW
Taiwan
Prior art keywords
plate
inspection
liquid crystal
crystal panel
lighting
Prior art date
Application number
TW095132237A
Other languages
English (en)
Chinese (zh)
Other versions
TW200721360A (en
Inventor
Shinji Fujiwara
Takeshi Saitoh
Original Assignee
Nihon Micronics Kk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nihon Micronics Kk filed Critical Nihon Micronics Kk
Publication of TW200721360A publication Critical patent/TW200721360A/zh
Application granted granted Critical
Publication of TWI307134B publication Critical patent/TWI307134B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306—Details
    • G02F1/1309—Repairing; Testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N2021/9513—Liquid crystal panels

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Optics & Photonics (AREA)
  • Liquid Crystal (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
TW095132237A 2005-11-16 2006-08-31 Lighting inspection apparatus TWI307134B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2005331958A JP4674151B2 (ja) 2005-11-16 2005-11-16 点灯検査装置

Publications (2)

Publication Number Publication Date
TW200721360A TW200721360A (en) 2007-06-01
TWI307134B true TWI307134B (en) 2009-03-01

Family

ID=38202582

Family Applications (1)

Application Number Title Priority Date Filing Date
TW095132237A TWI307134B (en) 2005-11-16 2006-08-31 Lighting inspection apparatus

Country Status (3)

Country Link
JP (1) JP4674151B2 (ko)
KR (1) KR100750052B1 (ko)
TW (1) TWI307134B (ko)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100969539B1 (ko) * 2008-04-10 2010-07-12 가부시키가이샤 니혼 마이크로닉스 점등 검사장치
JP5631020B2 (ja) * 2009-05-01 2014-11-26 株式会社日本マイクロニクス 平板状被検査体の試験装置
JP5525981B2 (ja) * 2010-09-28 2014-06-18 株式会社日本マイクロニクス 検査装置及び検査方法
CN103680369A (zh) * 2013-12-03 2014-03-26 京东方科技集团股份有限公司 一种显示器模组的测试装置及其测试方法

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3553460B2 (ja) * 1999-04-23 2004-08-11 ディーイー、エンド、ティー 株式会社 Ｌｃｄテスト装置
JP2003273198A (ja) * 2002-03-12 2003-09-26 Seiko Epson Corp 部材の支持固定機構及び検査装置
KR100539183B1 (ko) * 2003-07-16 2005-12-27 주식회사 파이컴 회전포스트부를 구비한 액정패널 검사장치의 서브테이블및 이를 이용한 액정패널 정렬방법
JP2005221568A (ja) * 2004-02-03 2005-08-18 Micronics Japan Co Ltd 表示用パネルの処理装置
KR100648468B1 (ko) * 2004-07-28 2006-11-24 주식회사 디이엔티 다종 유리 기판 검사 장치 및 검사 방법
KR100615281B1 (ko) * 2004-12-04 2006-08-25 주식회사 파이컴 외팔보 패널 이송장치

Also Published As

Publication number Publication date
TW200721360A (en) 2007-06-01
JP4674151B2 (ja) 2011-04-20
KR20070052191A (ko) 2007-05-21
KR100750052B1 (ko) 2007-08-16
JP2007139516A (ja) 2007-06-07

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