JP4536148B2 - リソグラフィ・インプリント・システム - Google Patents
リソグラフィ・インプリント・システム Download PDFInfo
- Publication number
- JP4536148B2 JP4536148B2 JP2009504231A JP2009504231A JP4536148B2 JP 4536148 B2 JP4536148 B2 JP 4536148B2 JP 2009504231 A JP2009504231 A JP 2009504231A JP 2009504231 A JP2009504231 A JP 2009504231A JP 4536148 B2 JP4536148 B2 JP 4536148B2
- Authority
- JP
- Japan
- Prior art keywords
- template
- substrate
- creating
- vacuum environment
- nanoimprint mold
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000001459 lithography Methods 0.000 title description 10
- 238000000034 method Methods 0.000 claims abstract description 16
- 239000000758 substrate Substances 0.000 claims description 45
- 239000012530 fluid Substances 0.000 claims description 7
- 238000005329 nanolithography Methods 0.000 claims description 3
- 230000000149 penetrating effect Effects 0.000 claims 1
- 238000001127 nanoimprint lithography Methods 0.000 abstract 1
- 239000000463 material Substances 0.000 description 7
- 238000000059 patterning Methods 0.000 description 7
- 239000007789 gas Substances 0.000 description 6
- 239000002861 polymer material Substances 0.000 description 4
- 239000007788 liquid Substances 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 3
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- 238000005229 chemical vapour deposition Methods 0.000 description 2
- 238000004891 communication Methods 0.000 description 2
- 238000009826 distribution Methods 0.000 description 2
- 238000005240 physical vapour deposition Methods 0.000 description 2
- 238000012545 processing Methods 0.000 description 2
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 1
- 239000005388 borosilicate glass Substances 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 238000000151 deposition Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000003618 dip coating Methods 0.000 description 1
- KPUWHANPEXNPJT-UHFFFAOYSA-N disiloxane Chemical class [SiH3]O[SiH3] KPUWHANPEXNPJT-UHFFFAOYSA-N 0.000 description 1
- 239000012636 effector Substances 0.000 description 1
- 230000008030 elimination Effects 0.000 description 1
- 238000003379 elimination reaction Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 229920002313 fluoropolymer Polymers 0.000 description 1
- 239000001307 helium Substances 0.000 description 1
- 229910052734 helium Inorganic materials 0.000 description 1
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 description 1
- 230000013011 mating Effects 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 229920000620 organic polymer Polymers 0.000 description 1
- 239000001301 oxygen Substances 0.000 description 1
- 229910052760 oxygen Inorganic materials 0.000 description 1
- 231100000572 poisoning Toxicity 0.000 description 1
- 230000000607 poisoning effect Effects 0.000 description 1
- 229920000642 polymer Polymers 0.000 description 1
- 238000004886 process control Methods 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- 229910052594 sapphire Inorganic materials 0.000 description 1
- 239000010980 sapphire Substances 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 238000004528 spin coating Methods 0.000 description 1
- 238000013518 transcription Methods 0.000 description 1
- 230000035897 transcription Effects 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/0002—Lithographic processes using patterning methods other than those involving the exposure to radiation, e.g. by stamping
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C43/00—Compression moulding, i.e. applying external pressure to flow the moulding material; Apparatus therefor
- B29C43/003—Compression moulding, i.e. applying external pressure to flow the moulding material; Apparatus therefor characterised by the choice of material
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C59/00—Surface shaping of articles, e.g. embossing; Apparatus therefor
- B29C59/02—Surface shaping of articles, e.g. embossing; Apparatus therefor by mechanical means, e.g. pressing
- B29C59/022—Surface shaping of articles, e.g. embossing; Apparatus therefor by mechanical means, e.g. pressing characterised by the disposition or the configuration, e.g. dimensions, of the embossments or the shaping tools therefor
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y40/00—Manufacture or treatment of nanostructures
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
- G03F7/70808—Construction details, e.g. housing, load-lock, seals or windows for passing light in or out of apparatus
- G03F7/70841—Constructional issues related to vacuum environment, e.g. load-lock chamber
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C43/00—Compression moulding, i.e. applying external pressure to flow the moulding material; Apparatus therefor
- B29C43/02—Compression moulding, i.e. applying external pressure to flow the moulding material; Apparatus therefor of articles of definite length, i.e. discrete articles
- B29C43/021—Compression moulding, i.e. applying external pressure to flow the moulding material; Apparatus therefor of articles of definite length, i.e. discrete articles characterised by the shape of the surface
- B29C2043/023—Compression moulding, i.e. applying external pressure to flow the moulding material; Apparatus therefor of articles of definite length, i.e. discrete articles characterised by the shape of the surface having a plurality of grooves
- B29C2043/025—Compression moulding, i.e. applying external pressure to flow the moulding material; Apparatus therefor of articles of definite length, i.e. discrete articles characterised by the shape of the surface having a plurality of grooves forming a microstructure, i.e. fine patterning
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C43/00—Compression moulding, i.e. applying external pressure to flow the moulding material; Apparatus therefor
- B29C43/32—Component parts, details or accessories; Auxiliary operations
- B29C43/58—Measuring, controlling or regulating
- B29C2043/5833—Measuring, controlling or regulating movement of moulds or mould parts, e.g. opening or closing, actuating
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B29—WORKING OF PLASTICS; WORKING OF SUBSTANCES IN A PLASTIC STATE IN GENERAL
- B29C—SHAPING OR JOINING OF PLASTICS; SHAPING OF MATERIAL IN A PLASTIC STATE, NOT OTHERWISE PROVIDED FOR; AFTER-TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING
- B29C43/00—Compression moulding, i.e. applying external pressure to flow the moulding material; Apparatus therefor
- B29C43/02—Compression moulding, i.e. applying external pressure to flow the moulding material; Apparatus therefor of articles of definite length, i.e. discrete articles
- B29C43/021—Compression moulding, i.e. applying external pressure to flow the moulding material; Apparatus therefor of articles of definite length, i.e. discrete articles characterised by the shape of the surface
Landscapes
- Engineering & Computer Science (AREA)
- Nanotechnology (AREA)
- Chemical & Material Sciences (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Crystallography & Structural Chemistry (AREA)
- Mechanical Engineering (AREA)
- Mathematical Physics (AREA)
- Theoretical Computer Science (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Manufacturing & Machinery (AREA)
- Health & Medical Sciences (AREA)
- Environmental & Geological Engineering (AREA)
- Epidemiology (AREA)
- Public Health (AREA)
- Shaping Of Tube Ends By Bending Or Straightening (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Moulds For Moulding Plastics Or The Like (AREA)
Description
1.純粋なヘリウム、又はCO2などの他のプロセス・ガスの雰囲気の生成及び維持、
2.部分又は完全真空インプリント(充填時間、欠陥、酸素中毒を減少させる)、
3.剥離力の減少又は除去。
Claims (5)
- ナノリソグラフィ・インプリント・プロセス中に特定の環境を生成するためのシステムであって、
チャック表面に配置された基板と、
エア・ベアリング基準面を有するテンプレート・ステージと、
前記基板の周囲に配置され、インターフェース隙間を生成する前記エア・ベアリング基準面と連携しているエア・ベアリング面と、
前記テンプレート・ステージに結合され、かつ前記基板に隣接して配置されたテンプレートであって、前記基板は前記テンプレートと前記基板上のナノインプリント・モールドを囲んだ所望の容積を生成する、テンプレートと、
前記ナノインプリント・モールドを囲んだ前記所望の容積内に、部分真空環境を生成する手段であって、それにより前記基板は前記インターフェース隙間を介してガスを流すことが可能になるとともに、前記所望の容積はその容積内に前記特定の真空環境を生成することが可能になる、手段と、
を備えることを特徴とするシステム。 - 前記テンプレートは、前記ナノインプリント・モールドの周囲に配置された前記テンプレートを貫通する複数の孔をさらに備え、前記部分真空環境を作成する手段は、前記ナノインプリント・モールドと前記基板を囲む前記所望の容積内にガスの前記部分真空環境を生成するために前記複数の孔を利用することを特徴とする請求項1に記載のシステム。
- 前記テンプレートは、前記ナノインプリント・モールドのまわりの前記テンプレートに形成されたチャネルをさらに備え、前記チャネルは前記排気させる手段に結合されていることを特徴とする請求項1に記載のシステム。
- 前記部分真空環境を作成する手段は、前記テンプレートの側面と物体の側面との間に前記インターフェース隙間を生成するように前記テンプレートのまわりに配置された、前記エア・ベアリング面を有する前記物体をさらに備え、それによって、前記インターフェース隙間を上向きに通過する空気流が前記テンプレートと前記基板との間からガスを排気することを特徴とする請求項1に記載のシステム。
- 前記ナノインプリント・モールドと前記基板との間に供給された重合可能流体をさらに備えることを特徴とする請求項1に記載のシステム。
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US78877906P | 2006-04-03 | 2006-04-03 | |
PCT/US2007/008075 WO2007123805A2 (en) | 2006-04-03 | 2007-04-02 | Lithography imprinting system |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2010063842A Division JP4917159B2 (ja) | 2006-04-03 | 2010-03-19 | リソグラフィ・インプリント・システム |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2009532245A JP2009532245A (ja) | 2009-09-10 |
JP2009532245A5 JP2009532245A5 (ja) | 2010-05-06 |
JP4536148B2 true JP4536148B2 (ja) | 2010-09-01 |
Family
ID=38625508
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2009504231A Active JP4536148B2 (ja) | 2006-04-03 | 2007-04-02 | リソグラフィ・インプリント・システム |
JP2010063842A Active JP4917159B2 (ja) | 2006-04-03 | 2010-03-19 | リソグラフィ・インプリント・システム |
Family Applications After (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2010063842A Active JP4917159B2 (ja) | 2006-04-03 | 2010-03-19 | リソグラフィ・インプリント・システム |
Country Status (8)
Country | Link |
---|---|
US (1) | US7462028B2 (ja) |
EP (1) | EP2001602B1 (ja) |
JP (2) | JP4536148B2 (ja) |
KR (1) | KR20080114681A (ja) |
CN (1) | CN101405087A (ja) |
AT (1) | ATE513625T1 (ja) |
TW (1) | TWI432311B (ja) |
WO (1) | WO2007123805A2 (ja) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8678808B2 (en) | 2010-10-08 | 2014-03-25 | Canon Kabushiki Kaisha | Imprint apparatus and article manufacturing method |
Families Citing this family (77)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6119463A (en) | 1998-05-12 | 2000-09-19 | Amerigon | Thermoelectric heat exchanger |
US7442336B2 (en) * | 2003-08-21 | 2008-10-28 | Molecular Imprints, Inc. | Capillary imprinting technique |
US7019819B2 (en) | 2002-11-13 | 2006-03-28 | Molecular Imprints, Inc. | Chucking system for modulating shapes of substrates |
US7077992B2 (en) * | 2002-07-11 | 2006-07-18 | Molecular Imprints, Inc. | Step and repeat imprint lithography processes |
US8211214B2 (en) | 2003-10-02 | 2012-07-03 | Molecular Imprints, Inc. | Single phase fluid imprint lithography method |
US20060062922A1 (en) | 2004-09-23 | 2006-03-23 | Molecular Imprints, Inc. | Polymerization technique to attenuate oxygen inhibition of solidification of liquids and composition therefor |
US7587901B2 (en) | 2004-12-20 | 2009-09-15 | Amerigon Incorporated | Control system for thermal module in vehicle |
US7611348B2 (en) * | 2005-04-19 | 2009-11-03 | Asml Netherlands B.V. | Imprint lithography |
US7670530B2 (en) | 2006-01-20 | 2010-03-02 | Molecular Imprints, Inc. | Patterning substrates employing multiple chucks |
MY144847A (en) | 2005-12-08 | 2011-11-30 | Molecular Imprints Inc | Method and system for double-sided patterning of substrates |
EP1984208B1 (en) | 2006-01-30 | 2012-02-29 | Amerigon, Inc. | Cooling system for container in a vehicle |
US8215946B2 (en) | 2006-05-18 | 2012-07-10 | Molecular Imprints, Inc. | Imprint lithography system and method |
US8539624B2 (en) | 2006-05-31 | 2013-09-24 | Gentherm Incorporated | Structure based fluid distribution system |
US20080087316A1 (en) | 2006-10-12 | 2008-04-17 | Masa Inaba | Thermoelectric device with internal sensor |
EP2606771B1 (en) | 2006-10-13 | 2015-01-07 | Gentherm Incorporated | air conditioned bed |
US20080303187A1 (en) * | 2006-12-29 | 2008-12-11 | Molecular Imprints, Inc. | Imprint Fluid Control |
KR101319325B1 (ko) * | 2006-12-29 | 2013-10-16 | 엘지디스플레이 주식회사 | 패턴의 형성 방법 |
CN101611503B (zh) | 2007-01-10 | 2012-12-26 | 阿美里根公司 | 热电装置 |
US20090014917A1 (en) * | 2007-07-10 | 2009-01-15 | Molecular Imprints, Inc. | Drop Pattern Generation for Imprint Lithography |
US9105809B2 (en) | 2007-07-23 | 2015-08-11 | Gentherm Incorporated | Segmented thermoelectric device |
US7877827B2 (en) | 2007-09-10 | 2011-02-01 | Amerigon Incorporated | Operational control schemes for ventilated seat or bed assemblies |
US9125497B2 (en) | 2007-10-15 | 2015-09-08 | Gentherm Incorporated | Climate controlled bed assembly with intermediate layer |
US8119052B2 (en) * | 2007-11-02 | 2012-02-21 | Molecular Imprints, Inc. | Drop pattern generation for imprint lithography |
JP4840668B2 (ja) * | 2007-11-30 | 2011-12-21 | 綜研化学株式会社 | 熱インプリント用モールドおよびこのモールドを用いた光学素子の製造方法 |
US20090148619A1 (en) * | 2007-12-05 | 2009-06-11 | Molecular Imprints, Inc. | Controlling Thickness of Residual Layer |
US20090196826A1 (en) * | 2007-12-18 | 2009-08-06 | Board Of Regents, The University Of Texas System | Compositions and methods of making non-spherical micro- and nano-particles |
KR101779870B1 (ko) | 2008-02-01 | 2017-10-10 | 젠썸 인코포레이티드 | 열전 소자용 응결 센서 및 습도 센서 |
US8361371B2 (en) * | 2008-02-08 | 2013-01-29 | Molecular Imprints, Inc. | Extrusion reduction in imprint lithography |
JP5121549B2 (ja) * | 2008-04-21 | 2013-01-16 | 株式会社東芝 | ナノインプリント方法 |
US20100015270A1 (en) * | 2008-07-15 | 2010-01-21 | Molecular Imprints, Inc. | Inner cavity system for nano-imprint lithography |
CN104523071A (zh) | 2008-07-18 | 2015-04-22 | 金瑟姆股份公司 | 气候受控床组件 |
US20100096764A1 (en) * | 2008-10-20 | 2010-04-22 | Molecular Imprints, Inc. | Gas Environment for Imprint Lithography |
US8512797B2 (en) * | 2008-10-21 | 2013-08-20 | Molecular Imprints, Inc. | Drop pattern generation with edge weighting |
US8586126B2 (en) | 2008-10-21 | 2013-11-19 | Molecular Imprints, Inc. | Robust optimization to generate drop patterns in imprint lithography which are tolerant of variations in drop volume and drop placement |
TWI414418B (zh) * | 2008-10-23 | 2013-11-11 | Molecular Imprints Inc | 壓印微影術系統及方法 |
US20100112220A1 (en) * | 2008-11-03 | 2010-05-06 | Molecular Imprints, Inc. | Dispense system set-up and characterization |
WO2010088405A1 (en) | 2009-01-28 | 2010-08-05 | Amerigon Incorporated | Convective heater |
SG174889A1 (en) | 2009-03-23 | 2011-11-28 | Intevac Inc | A process for optimization of island to trench ratio in patterned media |
US8893329B2 (en) | 2009-05-06 | 2014-11-25 | Gentherm Incorporated | Control schemes and features for climate-controlled beds |
JP5349595B2 (ja) * | 2009-07-09 | 2013-11-20 | インハ インダストリー パートナーシップ インスティテュート | マイクロレンズアレイの製造装置及びマイクロレンズアレイの製造方法 |
EP2287666B1 (de) | 2009-08-22 | 2012-06-27 | EV Group E. Thallner GmbH | Vorrichtung zum Prägen von Substraten |
US8332975B2 (en) | 2009-08-31 | 2012-12-18 | Gentherm Incorporated | Climate-controlled topper member for medical beds |
JP5419634B2 (ja) * | 2009-10-26 | 2014-02-19 | 株式会社東芝 | パターン形成方法 |
US20110140304A1 (en) * | 2009-12-10 | 2011-06-16 | Molecular Imprints, Inc. | Imprint lithography template |
EP2534536A2 (en) * | 2010-02-09 | 2012-12-19 | Molecular Imprints, Inc. | Process gas confinement for nanoimprint lithography |
JP5491931B2 (ja) * | 2010-03-30 | 2014-05-14 | 富士フイルム株式会社 | ナノインプリント方法およびモールド製造方法 |
JP5822597B2 (ja) * | 2010-10-01 | 2015-11-24 | キヤノン株式会社 | インプリント装置、及びそれを用いた物品の製造方法 |
US9121414B2 (en) | 2010-11-05 | 2015-09-01 | Gentherm Incorporated | Low-profile blowers and methods |
WO2012083578A1 (zh) * | 2010-12-22 | 2012-06-28 | 青岛理工大学 | 整片晶圆纳米压印的装置和方法. |
JP5787691B2 (ja) * | 2011-09-21 | 2015-09-30 | キヤノン株式会社 | インプリント装置、それを用いた物品の製造方法 |
US9685599B2 (en) | 2011-10-07 | 2017-06-20 | Gentherm Incorporated | Method and system for controlling an operation of a thermoelectric device |
US9989267B2 (en) | 2012-02-10 | 2018-06-05 | Gentherm Incorporated | Moisture abatement in heating operation of climate controlled systems |
KR101515180B1 (ko) * | 2012-05-18 | 2015-04-24 | 주식회사 휴템 | 유체압을 이용한 기판접합 장치 및 기판접합 방법 |
US20130337176A1 (en) * | 2012-06-19 | 2013-12-19 | Seagate Technology Llc | Nano-scale void reduction |
WO2014008423A2 (en) | 2012-07-06 | 2014-01-09 | Gentherm Incorporated | Systems and methods for cooling inductive charging assemblies |
US9662962B2 (en) | 2013-11-05 | 2017-05-30 | Gentherm Incorporated | Vehicle headliner assembly for zonal comfort |
DE112014005563T5 (de) | 2013-12-05 | 2016-11-24 | Gentherm Incorporated | Systeme und Verfahren für klimatisierte Sitze |
JP6294679B2 (ja) | 2014-01-21 | 2018-03-14 | キヤノン株式会社 | インプリント装置及び物品の製造方法 |
US10219323B2 (en) | 2014-02-14 | 2019-02-26 | Genthrem Incorporated | Conductive convective climate controlled seat |
US10160356B2 (en) | 2014-05-09 | 2018-12-25 | Gentherm Incorporated | Climate control assembly |
JP6400090B2 (ja) * | 2014-05-29 | 2018-10-03 | キヤノン株式会社 | 塗布装置、インプリント装置および物品の製造方法 |
JP6361303B2 (ja) * | 2014-06-13 | 2018-07-25 | 大日本印刷株式会社 | インプリント用モールドおよびインプリント装置 |
US11639816B2 (en) | 2014-11-14 | 2023-05-02 | Gentherm Incorporated | Heating and cooling technologies including temperature regulating pad wrap and technologies with liquid system |
US11857004B2 (en) | 2014-11-14 | 2024-01-02 | Gentherm Incorporated | Heating and cooling technologies |
CN107251247B (zh) | 2014-11-14 | 2021-06-01 | 查尔斯·J·柯西 | 加热和冷却技术 |
JP6525567B2 (ja) * | 2014-12-02 | 2019-06-05 | キヤノン株式会社 | インプリント装置及び物品の製造方法 |
CN104637843B (zh) * | 2015-02-02 | 2017-12-05 | 京东方科技集团股份有限公司 | 封装设备和封装方法 |
TR201909874T4 (tr) * | 2015-02-13 | 2019-07-22 | Morphotonics Holding B V | Farklı substratların tekstüre edilmesine yönelik yöntem ve esnek mühür. |
CN107364057A (zh) * | 2017-07-10 | 2017-11-21 | 天津工业大学 | 一种不同粗糙度模板的制备方法 |
JP6992331B2 (ja) * | 2017-09-05 | 2022-01-13 | 大日本印刷株式会社 | インプリントモールド |
US10895806B2 (en) | 2017-09-29 | 2021-01-19 | Canon Kabushiki Kaisha | Imprinting method and apparatus |
JP7077754B2 (ja) * | 2018-05-08 | 2022-05-31 | 大日本印刷株式会社 | インプリントモールド用基板、インプリントモールド及びそれらの製造方法 |
US11223004B2 (en) | 2018-07-30 | 2022-01-11 | Gentherm Incorporated | Thermoelectric device having a polymeric coating |
KR20210095206A (ko) | 2018-11-30 | 2021-07-30 | 젠썸 인코포레이티드 | 열전 공조 시스템 및 방법 |
US11152557B2 (en) | 2019-02-20 | 2021-10-19 | Gentherm Incorporated | Thermoelectric module with integrated printed circuit board |
US11590687B2 (en) | 2020-06-30 | 2023-02-28 | Canon Kabushiki Kaisha | Systems and methods for reducing pressure while shaping a film |
CN118444526B (zh) * | 2024-07-05 | 2024-09-24 | 苏州新维度微纳科技有限公司 | 纳米压印模具及纳米压印的方法 |
Family Cites Families (46)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4279628A (en) | 1979-12-31 | 1981-07-21 | Energy Synergistics, Inc. | Apparatus for drying a natural gas stream |
DE8007086U1 (de) | 1980-03-14 | 1982-03-18 | Multivac Sepp Haggenmüller KG, 8941 Wolfertschwenden | Vorrichtung zum formen von behaeltnissen aus einer folie |
US4767584A (en) | 1985-04-03 | 1988-08-30 | Massachusetts Institute Of Technology | Process of and apparatus for producing design patterns in materials |
DE3514022C1 (de) | 1985-04-18 | 1986-07-10 | Fa. Carl Freudenberg, 6940 Weinheim | Vorrichtung zum gegenseitigen Verkleben thermisch erweichbarer Partikel zu einem Kunststoffkoerper |
US5108532A (en) * | 1988-02-02 | 1992-04-28 | Northrop Corporation | Method and apparatus for shaping, forming, consolidating and co-consolidating thermoplastic or thermosetting composite products |
US5821175A (en) | 1988-07-08 | 1998-10-13 | Cauldron Limited Partnership | Removal of surface contaminants by irradiation using various methods to achieve desired inert gas flow over treated surface |
JPH0292603A (ja) * | 1988-09-30 | 1990-04-03 | Hoya Corp | 案内溝付き情報記録用基板の製造方法 |
US5545367A (en) | 1992-04-15 | 1996-08-13 | Soane Technologies, Inc. | Rapid prototype three dimensional stereolithography |
FR2690375B1 (fr) | 1992-04-22 | 1994-07-08 | Aerospatiale | Dispositif de compactage a chaud pour la fabrication de pieces necessitant des montees en pression et en temperature simultanees. |
US5997273A (en) | 1995-08-01 | 1999-12-07 | Laquer; Henry Louis | Differential pressure HIP forging in a controlled gaseous environment |
US6482742B1 (en) * | 2000-07-18 | 2002-11-19 | Stephen Y. Chou | Fluid pressure imprint lithography |
US5669303A (en) * | 1996-03-04 | 1997-09-23 | Motorola | Apparatus and method for stamping a surface |
US6257866B1 (en) | 1996-06-18 | 2001-07-10 | Hy-Tech Forming Systems, Inc. | Apparatus for accurately forming plastic sheet |
DE19819761C2 (de) | 1998-05-04 | 2000-05-31 | Jenoptik Jena Gmbh | Einrichtung zur Trennung eines geformten Substrates von einem Prägewerkzeug |
US5997963A (en) | 1998-05-05 | 1999-12-07 | Ultratech Stepper, Inc. | Microchamber |
US6099771A (en) | 1998-07-08 | 2000-08-08 | Lear Corporation | Vacuum compression method for forming molded thermoplastic floor mat having a "Class A" finish |
US5947027A (en) * | 1998-09-08 | 1999-09-07 | Motorola, Inc. | Printing apparatus with inflatable means for advancing a substrate towards the stamping surface |
JP3291488B2 (ja) | 1999-05-27 | 2002-06-10 | 三洋電機株式会社 | 流体の被除去物除去方法 |
EP1072954A3 (en) * | 1999-07-28 | 2002-05-22 | Lucent Technologies Inc. | Lithographic process for device fabrication |
US6873087B1 (en) * | 1999-10-29 | 2005-03-29 | Board Of Regents, The University Of Texas System | High precision orientation alignment and gap control stages for imprint lithography processes |
SE515607C2 (sv) * | 1999-12-10 | 2001-09-10 | Obducat Ab | Anordning och metod vid tillverkning av strukturer |
DE10010001A1 (de) * | 2000-03-02 | 2001-09-06 | Celanese Ventures Gmbh | Neue Blendpolymermembranen zum Einsatz in Brennstoffzellen |
JP2001358056A (ja) | 2000-06-15 | 2001-12-26 | Canon Inc | 露光装置 |
US7322287B2 (en) * | 2000-07-18 | 2008-01-29 | Nanonex Corporation | Apparatus for fluid pressure imprint lithography |
EP1309897A2 (en) * | 2000-08-01 | 2003-05-14 | Board Of Regents, The University Of Texas System | Methods for high-precision gap and orientation sensing between a transparent template and substrate for imprint lithography |
EP1352295B1 (en) * | 2000-10-12 | 2015-12-23 | Board of Regents, The University of Texas System | Template for room temperature, low pressure micro- and nano-imprint lithography |
JP2002208563A (ja) | 2001-01-09 | 2002-07-26 | Ebara Corp | 被加工物の加工装置及び加工方法 |
JP2003109915A (ja) * | 2001-09-28 | 2003-04-11 | National Institute Of Advanced Industrial & Technology | 剥離性雰囲気でのインプリントリソグラフィー方法及び装置 |
US20030071016A1 (en) * | 2001-10-11 | 2003-04-17 | Wu-Sheng Shih | Patterned structure reproduction using nonsticking mold |
US6764386B2 (en) | 2002-01-11 | 2004-07-20 | Applied Materials, Inc. | Air bearing-sealed micro-processing chamber |
US7019819B2 (en) | 2002-11-13 | 2006-03-28 | Molecular Imprints, Inc. | Chucking system for modulating shapes of substrates |
US6932934B2 (en) * | 2002-07-11 | 2005-08-23 | Molecular Imprints, Inc. | Formation of discontinuous films during an imprint lithography process |
MY164487A (en) * | 2002-07-11 | 2017-12-29 | Molecular Imprints Inc | Step and repeat imprint lithography processes |
KR20050026088A (ko) * | 2002-08-01 | 2005-03-14 | 몰레큘러 임프린츠 인코퍼레이티드 | 임프린트 리소그래피용 산란측정 정렬 |
JP2004071934A (ja) * | 2002-08-08 | 2004-03-04 | Kanegafuchi Chem Ind Co Ltd | 微細パターンの製造方法および転写材料 |
JP3700001B2 (ja) * | 2002-09-10 | 2005-09-28 | 独立行政法人産業技術総合研究所 | インプリント方法及び装置 |
US20040132301A1 (en) * | 2002-09-12 | 2004-07-08 | Harper Bruce M. | Indirect fluid pressure imprinting |
US6986815B2 (en) | 2003-01-08 | 2006-01-17 | General Electric Company | Flow system flush process |
US6951173B1 (en) * | 2003-05-14 | 2005-10-04 | Molecular Imprints, Inc. | Assembly and method for transferring imprint lithography templates |
JP2005045168A (ja) * | 2003-07-25 | 2005-02-17 | Tokyo Electron Ltd | インプリント方法およびインプリント装置 |
JP4313109B2 (ja) * | 2003-08-01 | 2009-08-12 | 明昌機工株式会社 | 高精度プレス機 |
JP2005101201A (ja) * | 2003-09-24 | 2005-04-14 | Canon Inc | ナノインプリント装置 |
US7090716B2 (en) | 2003-10-02 | 2006-08-15 | Molecular Imprints, Inc. | Single phase fluid imprint lithography method |
US7500603B2 (en) * | 2004-02-19 | 2009-03-10 | Capital One Financial Corporation | Data card |
KR100558754B1 (ko) * | 2004-02-24 | 2006-03-10 | 한국기계연구원 | Uv 나노임프린트 리소그래피 공정 및 이 공정을수행하는 장치 |
US7316554B2 (en) | 2005-09-21 | 2008-01-08 | Molecular Imprints, Inc. | System to control an atmosphere between a body and a substrate |
-
2007
- 2007-04-02 AT AT07754579T patent/ATE513625T1/de not_active IP Right Cessation
- 2007-04-02 WO PCT/US2007/008075 patent/WO2007123805A2/en active Application Filing
- 2007-04-02 KR KR1020087017591A patent/KR20080114681A/ko not_active Application Discontinuation
- 2007-04-02 US US11/695,263 patent/US7462028B2/en active Active
- 2007-04-02 EP EP07754579A patent/EP2001602B1/en active Active
- 2007-04-02 JP JP2009504231A patent/JP4536148B2/ja active Active
- 2007-04-02 CN CNA2007800099833A patent/CN101405087A/zh active Pending
- 2007-04-03 TW TW096111836A patent/TWI432311B/zh active
-
2010
- 2010-03-19 JP JP2010063842A patent/JP4917159B2/ja active Active
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8678808B2 (en) | 2010-10-08 | 2014-03-25 | Canon Kabushiki Kaisha | Imprint apparatus and article manufacturing method |
Also Published As
Publication number | Publication date |
---|---|
ATE513625T1 (de) | 2011-07-15 |
US7462028B2 (en) | 2008-12-09 |
CN101405087A (zh) | 2009-04-08 |
US20070275114A1 (en) | 2007-11-29 |
JP4917159B2 (ja) | 2012-04-18 |
KR20080114681A (ko) | 2008-12-31 |
EP2001602B1 (en) | 2011-06-22 |
EP2001602A2 (en) | 2008-12-17 |
JP2010179655A (ja) | 2010-08-19 |
WO2007123805A2 (en) | 2007-11-01 |
JP2009532245A (ja) | 2009-09-10 |
EP2001602A4 (en) | 2009-04-01 |
TWI432311B (zh) | 2014-04-01 |
WO2007123805A3 (en) | 2007-12-27 |
TW200744830A (en) | 2007-12-16 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP4536148B2 (ja) | リソグラフィ・インプリント・システム | |
JP5745532B2 (ja) | インプリント・リソグラフィ用テンプレート | |
US7931846B2 (en) | Method to control an atmosphere between a body and a substrate | |
JP5198282B2 (ja) | 基板とモールドとの間に位置するガスを排出するための方法 | |
US7691313B2 (en) | Method for expelling gas positioned between a substrate and a mold | |
JP4536157B1 (ja) | 単一位相流体インプリント・リソグラフィ法 | |
US7641840B2 (en) | Method for expelling gas positioned between a substrate and a mold | |
US8211214B2 (en) | Single phase fluid imprint lithography method | |
JP5364533B2 (ja) | インプリントシステムおよびインプリント方法 | |
JP5361309B2 (ja) | インプリント装置およびインプリント方法 | |
JP2012504336A (ja) | インプリント・リソグラフィ用の粒子削減 | |
JP2008532263A (ja) | 基板をウェハ・チャックに保持する方法 | |
JP2009536591A (ja) | 厚さが変化するテンプレート | |
JP2012507391A (ja) | 基板とパターン形成層との間の接着性の促進 | |
US20050160011A1 (en) | Method for concurrently employing differing materials to form a layer on a substrate | |
Childs | Decal transfer lithography |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20100319 |
|
A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20100319 |
|
A871 | Explanation of circumstances concerning accelerated examination |
Free format text: JAPANESE INTERMEDIATE CODE: A871 Effective date: 20100319 |
|
A975 | Report on accelerated examination |
Free format text: JAPANESE INTERMEDIATE CODE: A971005 Effective date: 20100405 |
|
TRDD | Decision of grant or rejection written | ||
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20100608 |
|
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 |
|
A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20100615 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20130625 Year of fee payment: 3 |
|
R150 | Certificate of patent or registration of utility model |
Free format text: JAPANESE INTERMEDIATE CODE: R150 Ref document number: 4536148 Country of ref document: JP Free format text: JAPANESE INTERMEDIATE CODE: R150 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |