JP4413293B2 - リセット動作を高速化したメモリデバイス - Google Patents
リセット動作を高速化したメモリデバイス Download PDFInfo
- Publication number
- JP4413293B2 JP4413293B2 JP27026498A JP27026498A JP4413293B2 JP 4413293 B2 JP4413293 B2 JP 4413293B2 JP 27026498 A JP27026498 A JP 27026498A JP 27026498 A JP27026498 A JP 27026498A JP 4413293 B2 JP4413293 B2 JP 4413293B2
- Authority
- JP
- Japan
- Prior art keywords
- bit line
- sense amplifier
- clamper
- line pair
- transfer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Images
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
- G11C11/4063—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
- G11C11/407—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/06—Sense amplifiers; Associated circuits, e.g. timing or triggering circuits
- G11C7/065—Differential amplifiers of latching type
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/12—Bit line control circuits, e.g. drivers, boosters, pull-up circuits, pull-down circuits, precharging circuits, equalising circuits, for bit lines
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- Dram (AREA)
- Static Random-Access Memory (AREA)
Priority Applications (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP27026498A JP4413293B2 (ja) | 1998-09-24 | 1998-09-24 | リセット動作を高速化したメモリデバイス |
| TW088107470A TW425553B (en) | 1998-09-24 | 1999-05-07 | Memory circuit with faster reset operation |
| US09/307,758 US6301173B2 (en) | 1998-09-24 | 1999-05-10 | Memory device with faster reset operation |
| KR1019990018838A KR100351545B1 (ko) | 1998-09-24 | 1999-05-25 | 리셋 동작을 고속화시킨 메모리 회로 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP27026498A JP4413293B2 (ja) | 1998-09-24 | 1998-09-24 | リセット動作を高速化したメモリデバイス |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2000100171A JP2000100171A (ja) | 2000-04-07 |
| JP2000100171A5 JP2000100171A5 (enExample) | 2005-01-20 |
| JP4413293B2 true JP4413293B2 (ja) | 2010-02-10 |
Family
ID=17483837
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP27026498A Expired - Fee Related JP4413293B2 (ja) | 1998-09-24 | 1998-09-24 | リセット動作を高速化したメモリデバイス |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US6301173B2 (enExample) |
| JP (1) | JP4413293B2 (enExample) |
| KR (1) | KR100351545B1 (enExample) |
| TW (1) | TW425553B (enExample) |
Families Citing this family (20)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4748828B2 (ja) * | 1999-06-22 | 2011-08-17 | ルネサスエレクトロニクス株式会社 | 半導体記憶装置 |
| US6473356B1 (en) * | 2001-11-01 | 2002-10-29 | Virage Logic Corp. | Low power read circuitry for a memory circuit based on charge redistribution between bitlines and sense amplifier |
| US7180792B2 (en) * | 2002-02-28 | 2007-02-20 | Stmicroelectronics Pvt. Ltd. | Efficient latch array initialization |
| JP4462528B2 (ja) | 2002-06-24 | 2010-05-12 | 株式会社日立製作所 | 半導体集積回路装置 |
| DE10302650B4 (de) * | 2003-01-23 | 2007-08-30 | Infineon Technologies Ag | RAM-Speicher und Steuerungsverfahren dafür |
| WO2004081945A1 (ja) * | 2003-03-14 | 2004-09-23 | Fujitsu Limited | 半導体記憶装置、および半導体記憶装置の制御方法 |
| US7245549B2 (en) | 2003-03-14 | 2007-07-17 | Fujitsu Limited | Semiconductor memory device and method of controlling the semiconductor memory device |
| DE10339894B4 (de) * | 2003-08-29 | 2006-04-06 | Infineon Technologies Ag | Leseverstärker-Zuschalt/Abschalt-Schaltungsanordnung |
| JP4646106B2 (ja) * | 2004-05-25 | 2011-03-09 | 株式会社日立製作所 | 半導体集積回路装置 |
| KR20060028989A (ko) * | 2004-09-30 | 2006-04-04 | 엘지전자 주식회사 | 다중입출력 시스템에 적용되는 신호 처리 방법 |
| DE102005000812A1 (de) * | 2005-01-05 | 2006-07-20 | Infineon Technologies Ag | Integrierter Halbleiterspeicher mit Testschaltung für Leseverstärker |
| KR100736648B1 (ko) * | 2005-03-08 | 2007-07-09 | 후지쯔 가부시끼가이샤 | 반도체 기억 장치 및 반도체 기억 장치의 제어 방법 |
| US7212458B1 (en) * | 2005-10-25 | 2007-05-01 | Sigmatel, Inc. | Memory, processing system and methods for use therewith |
| WO2007059772A2 (en) | 2005-11-24 | 2007-05-31 | Vip 1 Aps | Direct sequential network addressing (dsna) |
| US7443751B2 (en) * | 2006-12-22 | 2008-10-28 | Qimonda North American Corp. | Programmable sense amplifier multiplexer circuit with dynamic latching mode |
| JP4504397B2 (ja) | 2007-05-29 | 2010-07-14 | 株式会社東芝 | 半導体記憶装置 |
| KR100876900B1 (ko) * | 2007-12-05 | 2009-01-07 | 주식회사 하이닉스반도체 | 센스 앰프와 그의 구동 방법 |
| US7813209B2 (en) * | 2008-10-01 | 2010-10-12 | Nanya Technology Corp. | Method for reducing power consumption in a volatile memory and related device |
| KR101789467B1 (ko) | 2017-04-06 | 2017-10-23 | 국방과학연구소 | 의사 랜덤 이진 수열 발생기의 고속 리셋 장치 |
| US11581033B2 (en) | 2021-06-09 | 2023-02-14 | Powerchip Semiconductor Manufacturing Corporation | Sub-sense amplifier layout scheme to reduce area |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3293219B2 (ja) * | 1993-02-19 | 2002-06-17 | 株式会社日立製作所 | ダイナミック型ramおよびそのデータ処理システム |
| JPH07130175A (ja) * | 1993-09-10 | 1995-05-19 | Toshiba Corp | 半導体記憶装置 |
| JP3862333B2 (ja) * | 1996-12-10 | 2006-12-27 | 株式会社ルネサステクノロジ | 半導体記憶装置 |
| US5717645A (en) * | 1997-02-07 | 1998-02-10 | Alliance Semiconductor Corporation | Random access memory with fast, compact sensing and selection architecture |
| JP3399787B2 (ja) * | 1997-06-27 | 2003-04-21 | 富士通株式会社 | 半導体記憶装置 |
| US5875141A (en) * | 1997-08-14 | 1999-02-23 | Micron Technology, Inc. | Circuit and method for a memory device with P-channel isolation gates |
-
1998
- 1998-09-24 JP JP27026498A patent/JP4413293B2/ja not_active Expired - Fee Related
-
1999
- 1999-05-07 TW TW088107470A patent/TW425553B/zh not_active IP Right Cessation
- 1999-05-10 US US09/307,758 patent/US6301173B2/en not_active Expired - Lifetime
- 1999-05-25 KR KR1019990018838A patent/KR100351545B1/ko not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| US6301173B2 (en) | 2001-10-09 |
| KR100351545B1 (ko) | 2002-09-11 |
| KR20000022636A (ko) | 2000-04-25 |
| TW425553B (en) | 2001-03-11 |
| JP2000100171A (ja) | 2000-04-07 |
| US20010015928A1 (en) | 2001-08-23 |
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