JP4397326B2 - ボンディング装置 - Google Patents
ボンディング装置 Download PDFInfo
- Publication number
- JP4397326B2 JP4397326B2 JP2004377541A JP2004377541A JP4397326B2 JP 4397326 B2 JP4397326 B2 JP 4397326B2 JP 2004377541 A JP2004377541 A JP 2004377541A JP 2004377541 A JP2004377541 A JP 2004377541A JP 4397326 B2 JP4397326 B2 JP 4397326B2
- Authority
- JP
- Japan
- Prior art keywords
- circuit
- capacitance
- wire
- bonding
- target device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Images
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/075—Connecting or disconnecting of bond wires
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/0711—Apparatus therefor
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/0711—Apparatus therefor
- H10W72/07141—Means for applying energy, e.g. ovens or lasers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/075—Connecting or disconnecting of bond wires
- H10W72/07521—Aligning
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/075—Connecting or disconnecting of bond wires
- H10W72/07531—Techniques
- H10W72/07532—Compression bonding, e.g. thermocompression bonding
- H10W72/07533—Ultrasonic bonding, e.g. thermosonic bonding
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/531—Shapes of wire connectors
- H10W72/536—Shapes of wire connectors the connected ends being ball-shaped
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/531—Shapes of wire connectors
- H10W72/5363—Shapes of wire connectors the connected ends being wedge-shaped
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/551—Materials of bond wires
- H10W72/552—Materials of bond wires comprising metals or metalloids, e.g. silver
- H10W72/5522—Materials of bond wires comprising metals or metalloids, e.g. silver comprising gold [Au]
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/551—Materials of bond wires
- H10W72/552—Materials of bond wires comprising metals or metalloids, e.g. silver
- H10W72/5524—Materials of bond wires comprising metals or metalloids, e.g. silver comprising aluminium [Al]
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/551—Materials of bond wires
- H10W72/552—Materials of bond wires comprising metals or metalloids, e.g. silver
- H10W72/5525—Materials of bond wires comprising metals or metalloids, e.g. silver comprising copper [Cu]
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/751—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires
- H10W90/756—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires between a chip and a stacked lead frame, conducting package substrate or heat sink
Landscapes
- Wire Bonding (AREA)
- Manufacturing Of Electrical Connectors (AREA)
Priority Applications (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2004377541A JP4397326B2 (ja) | 2004-12-27 | 2004-12-27 | ボンディング装置 |
| TW094134911A TW200633094A (en) | 2004-12-27 | 2005-10-06 | Bonding apparatus |
| KR1020050105873A KR100730046B1 (ko) | 2004-12-27 | 2005-11-07 | 본딩 장치 |
| US11/317,276 US7842897B2 (en) | 2004-12-27 | 2005-12-23 | Bonding apparatus |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2004377541A JP4397326B2 (ja) | 2004-12-27 | 2004-12-27 | ボンディング装置 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2006186087A JP2006186087A (ja) | 2006-07-13 |
| JP2006186087A5 JP2006186087A5 (https=) | 2007-04-05 |
| JP4397326B2 true JP4397326B2 (ja) | 2010-01-13 |
Family
ID=36738984
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2004377541A Expired - Lifetime JP4397326B2 (ja) | 2004-12-27 | 2004-12-27 | ボンディング装置 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US7842897B2 (https=) |
| JP (1) | JP4397326B2 (https=) |
| KR (1) | KR100730046B1 (https=) |
| TW (1) | TW200633094A (https=) |
Families Citing this family (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100810508B1 (ko) * | 2007-01-05 | 2008-03-07 | 삼성전자주식회사 | 시스템 에어컨 및 그 제어방법 |
| US8919632B2 (en) * | 2012-11-09 | 2014-12-30 | Asm Technology Singapore Pte. Ltd. | Method of detecting wire bonding failures |
| KR101672510B1 (ko) | 2012-11-16 | 2016-11-03 | 가부시키가이샤 신가와 | 와이어 본딩 장치 및 와이어 본딩 방법 |
| TWI562252B (en) * | 2014-02-17 | 2016-12-11 | Shinkawa Kk | Detecting discharging device, wire bonding device and detecting discharging method |
| TWI585927B (zh) * | 2014-02-21 | 2017-06-01 | 新川股份有限公司 | 半導體裝置的製造方法、半導體裝置以及打線裝置 |
| TWI639202B (zh) * | 2016-03-25 | 2018-10-21 | 日商新川股份有限公司 | 打線裝置、打線裝置用電路及半導體裝置之製造方法 |
| JP7122740B2 (ja) * | 2018-03-29 | 2022-08-22 | 株式会社新川 | 接続状態判定装置及び接続状態判定方法 |
| KR102891276B1 (ko) | 2021-05-25 | 2025-12-03 | 야마하 로보틱스 가부시키가이샤 | 와이어 본딩 시스템, 검사 장치, 와이어 본딩 방법, 및 기록 매체 |
| US20250113441A1 (en) * | 2023-09-29 | 2025-04-03 | Biosense Webster (Israel) Ltd. | System and method to control height between a joining tool and a connection pad |
| US20250170664A1 (en) * | 2023-11-28 | 2025-05-29 | Biosense Webster (Israel) Ltd. | Automated control of an electrical connection joining process |
Family Cites Families (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3283577A (en) * | 1964-06-29 | 1966-11-08 | Honeywell Inc | Divided capacitance probe level gauge |
| US5037023A (en) * | 1988-11-28 | 1991-08-06 | Hitachi, Ltd. | Method and apparatus for wire bonding |
| JP3041812B2 (ja) * | 1993-09-21 | 2000-05-15 | 株式会社新川 | ワイヤボンデイング装置 |
| KR100193903B1 (ko) * | 1995-12-30 | 1999-06-15 | 윤종용 | 본딩 와이어의 단선 불량을 감지할 수 있는 회로 기판 및 와이어 본딩 장치 |
| JPH09213752A (ja) | 1996-01-31 | 1997-08-15 | Kaijo Corp | ワイヤボンディング装置における不着検出回路 |
| JP3025648B2 (ja) * | 1996-08-30 | 2000-03-27 | 株式会社九州エレクトロニクスシステム | 半導体のボンディング不良検出装置 |
| JPH11176868A (ja) * | 1997-12-16 | 1999-07-02 | Kaijo Corp | ワイヤボンディング装置 |
| KR100275377B1 (en) * | 1997-12-24 | 2001-01-15 | Samsung Techwin Co Ltd | Apparatus and method for detecting wire bonding |
| KR20020068858A (ko) * | 2001-02-23 | 2002-08-28 | 삼성전자 주식회사 | 하면 접지부를 포함하는 비지에이용 비금속 리드 프레임 |
| US6750734B2 (en) * | 2002-05-29 | 2004-06-15 | Ukom, Inc. | Methods and apparatus for tuning an LC filter |
-
2004
- 2004-12-27 JP JP2004377541A patent/JP4397326B2/ja not_active Expired - Lifetime
-
2005
- 2005-10-06 TW TW094134911A patent/TW200633094A/zh not_active IP Right Cessation
- 2005-11-07 KR KR1020050105873A patent/KR100730046B1/ko not_active Expired - Lifetime
- 2005-12-23 US US11/317,276 patent/US7842897B2/en active Active
Also Published As
| Publication number | Publication date |
|---|---|
| US7842897B2 (en) | 2010-11-30 |
| US20060186839A1 (en) | 2006-08-24 |
| KR100730046B1 (ko) | 2007-06-20 |
| KR20060074825A (ko) | 2006-07-03 |
| JP2006186087A (ja) | 2006-07-13 |
| TWI337385B (https=) | 2011-02-11 |
| TW200633094A (en) | 2006-09-16 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP4397326B2 (ja) | ボンディング装置 | |
| US9899348B2 (en) | Wire bonding apparatus and method of manufacturing semiconductor device | |
| US5909112A (en) | Configuration and test process for semiconductor overcurrent detecting circuit | |
| CN101825651A (zh) | 探针卡、包括探针卡的半导体测试装置以及探针卡的熔丝检查方法 | |
| US20140103096A1 (en) | Wire bonding machine and method for testing wire bond connections | |
| US6687140B2 (en) | Disconnection detecting circuit detecting disconnection based on a change in detection signal | |
| US6500317B1 (en) | Plating apparatus for detecting the conductivity between plating contacts on a substrate | |
| JP3361311B2 (ja) | 基板検査装置および基板検査方法 | |
| CN100383944C (zh) | 引线接合装置 | |
| CN109975687A (zh) | 一种基于ic键合引线的质量检测装置及方法 | |
| JP6237482B2 (ja) | 測定装置 | |
| JP5236221B2 (ja) | ワイヤボンディング装置 | |
| JP2013225535A (ja) | 半導体装置および半導体試験装置 | |
| JP4876241B2 (ja) | 接合強度測定方法及びこの方法を用いた接合強度測定装置並びに接合強度変動検出器 | |
| KR100250133B1 (ko) | 와이어 끊어짐 검출 장치 | |
| JP7392533B2 (ja) | 検査システム | |
| JP2003057285A (ja) | 抵抗測定装置および回路基板検査装置 | |
| KR100628702B1 (ko) | 와이어 본딩장치 | |
| JPH0574833A (ja) | ワイヤボンデイング装置 | |
| US6660956B1 (en) | Method of and apparatus for monitoring a ball forming process | |
| JP3323150B2 (ja) | プローブカードチェッカー | |
| JP2010205966A (ja) | 半導体装置の試験測定方法及び半導体装置の試験装置 | |
| KR20260009757A (ko) | 시험 회로, 시험 장치 및 시험 방법 | |
| JP2019074384A (ja) | 集積回路の検査装置 | |
| JP3157733B2 (ja) | 集積回路内蔵大電力モノリシック半導体装置の検査方法 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20070216 |
|
| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20070216 |
|
| A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20081128 |
|
| A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20081202 |
|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20090119 |
|
| A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20090303 |
|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20090408 |
|
| A02 | Decision of refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A02 Effective date: 20090512 |
|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20090625 |
|
| A911 | Transfer to examiner for re-examination before appeal (zenchi) |
Free format text: JAPANESE INTERMEDIATE CODE: A911 Effective date: 20090819 |
|
| TRDD | Decision of grant or rejection written | ||
| A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20090929 |
|
| A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 |
|
| A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20091020 |
|
| FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20121030 Year of fee payment: 3 |
|
| R150 | Certificate of patent or registration of utility model |
Ref document number: 4397326 Country of ref document: JP Free format text: JAPANESE INTERMEDIATE CODE: R150 Free format text: JAPANESE INTERMEDIATE CODE: R150 |
|
| FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20131030 Year of fee payment: 4 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| EXPY | Cancellation because of completion of term |