CN109975687A - 一种基于ic键合引线的质量检测装置及方法 - Google Patents
一种基于ic键合引线的质量检测装置及方法 Download PDFInfo
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- CN109975687A CN109975687A CN201910193313.6A CN201910193313A CN109975687A CN 109975687 A CN109975687 A CN 109975687A CN 201910193313 A CN201910193313 A CN 201910193313A CN 109975687 A CN109975687 A CN 109975687A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2853—Electrical testing of internal connections or -isolation, e.g. latch-up or chip-to-lead connections
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2896—Testing of IC packages; Test features related to IC packages
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
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- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
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Abstract
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CN201910193313.6A CN109975687B (zh) | 2019-03-14 | 2019-03-14 | 一种基于ic键合引线的质量检测装置及方法 |
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CN201910193313.6A CN109975687B (zh) | 2019-03-14 | 2019-03-14 | 一种基于ic键合引线的质量检测装置及方法 |
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CN109975687A true CN109975687A (zh) | 2019-07-05 |
CN109975687B CN109975687B (zh) | 2022-07-08 |
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Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN114237159A (zh) * | 2022-02-24 | 2022-03-25 | 深圳市大族光电设备股份有限公司 | 焊接线弧自动生成方法、装置、计算机设备及存储介质 |
CN117153714A (zh) * | 2023-10-31 | 2023-12-01 | 宁波尚进自动化科技有限公司 | 焊接键合的检测方法、系统、设备及其介质 |
Citations (8)
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JP2002014134A (ja) * | 2000-06-30 | 2002-01-18 | Hioki Ee Corp | 回路基板検査装置 |
CN1336552A (zh) * | 2000-05-31 | 2002-02-20 | 威尔特克株式会社 | 用调谐型传感器线圈检测ic端子上焊接不良的检测方法 |
CN1769916A (zh) * | 2004-11-02 | 2006-05-10 | 安捷伦科技有限公司 | 对不可达短路连接进行非接触测试和诊断的方法与装置 |
CN1851488A (zh) * | 2005-04-22 | 2006-10-25 | 安捷伦科技有限公司 | 用容性测量检测不可访问的插针上的短路的方法和装置 |
CN101231322A (zh) * | 2007-02-09 | 2008-07-30 | 段超毅 | 集成电路开路/短路的测试连接方法及装置 |
CN101726542A (zh) * | 2009-09-25 | 2010-06-09 | 中南大学 | 芯片封装互连中的超声键合质量在线监测判别方法及系统 |
CN103822869A (zh) * | 2014-02-28 | 2014-05-28 | 工业和信息化部电子第五研究所 | 电源键合引线焊点的可靠性检测方法 |
CN204439680U (zh) * | 2015-02-12 | 2015-07-01 | 武汉格蓝若光电互感器有限公司 | 一种交直流两用的标准电流源 |
-
2019
- 2019-03-14 CN CN201910193313.6A patent/CN109975687B/zh active Active
Patent Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
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CN1336552A (zh) * | 2000-05-31 | 2002-02-20 | 威尔特克株式会社 | 用调谐型传感器线圈检测ic端子上焊接不良的检测方法 |
JP2002014134A (ja) * | 2000-06-30 | 2002-01-18 | Hioki Ee Corp | 回路基板検査装置 |
CN1769916A (zh) * | 2004-11-02 | 2006-05-10 | 安捷伦科技有限公司 | 对不可达短路连接进行非接触测试和诊断的方法与装置 |
CN1851488A (zh) * | 2005-04-22 | 2006-10-25 | 安捷伦科技有限公司 | 用容性测量检测不可访问的插针上的短路的方法和装置 |
CN101231322A (zh) * | 2007-02-09 | 2008-07-30 | 段超毅 | 集成电路开路/短路的测试连接方法及装置 |
CN101726542A (zh) * | 2009-09-25 | 2010-06-09 | 中南大学 | 芯片封装互连中的超声键合质量在线监测判别方法及系统 |
CN103822869A (zh) * | 2014-02-28 | 2014-05-28 | 工业和信息化部电子第五研究所 | 电源键合引线焊点的可靠性检测方法 |
CN204439680U (zh) * | 2015-02-12 | 2015-07-01 | 武汉格蓝若光电互感器有限公司 | 一种交直流两用的标准电流源 |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN114237159A (zh) * | 2022-02-24 | 2022-03-25 | 深圳市大族光电设备股份有限公司 | 焊接线弧自动生成方法、装置、计算机设备及存储介质 |
CN117153714A (zh) * | 2023-10-31 | 2023-12-01 | 宁波尚进自动化科技有限公司 | 焊接键合的检测方法、系统、设备及其介质 |
CN117153714B (zh) * | 2023-10-31 | 2024-04-02 | 宁波尚进自动化科技有限公司 | 焊接键合的检测方法、系统、设备及其介质 |
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Address after: 518000 No. 9988 Shennan Road, Nanshan District, Shenzhen, Guangdong Applicant after: HAN'S LASER TECHNOLOGY INDUSTRY GROUP Co.,Ltd. Applicant after: Shenzhen Dazu Photoelectric Equipment Co.,Ltd. Address before: 518000 No. 9988 Shennan Road, Nanshan District, Shenzhen, Guangdong Applicant before: HAN'S LASER TECHNOLOGY INDUSTRY GROUP Co.,Ltd. Applicant before: SHENZHEN HAN'S PHOTOELECTRIC EQUIPMENT Co.,Ltd. |
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Effective date of registration: 20220329 Address after: 518000 floor 6, building 5, Han's laser Industrial Park, No. 128, Chongqing Road, Fuyong street, Bao'an District, Shenzhen, Guangdong Province Applicant after: Shenzhen Dazu Photoelectric Equipment Co.,Ltd. Address before: 518000 No. 9988 Shennan Road, Nanshan District, Shenzhen, Guangdong Applicant before: HAN'S LASER TECHNOLOGY INDUSTRY GROUP Co.,Ltd. Applicant before: Shenzhen Dazu Photoelectric Equipment Co.,Ltd. |
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Address after: 518000 floor 6, building 5, Han's laser Industrial Park, No. 128, Chongqing Road, Fuyong street, Bao'an District, Shenzhen, Guangdong Province Applicant after: Shenzhen Han family sealing and Testing Technology Co.,Ltd. Address before: 518000 floor 6, building 5, Han's laser Industrial Park, No. 128, Chongqing Road, Fuyong street, Bao'an District, Shenzhen, Guangdong Province Applicant before: Shenzhen Dazu Photoelectric Equipment Co.,Ltd. |
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