CN109975687B - 一种基于ic键合引线的质量检测装置及方法 - Google Patents
一种基于ic键合引线的质量检测装置及方法 Download PDFInfo
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- CN109975687B CN109975687B CN201910193313.6A CN201910193313A CN109975687B CN 109975687 B CN109975687 B CN 109975687B CN 201910193313 A CN201910193313 A CN 201910193313A CN 109975687 B CN109975687 B CN 109975687B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2853—Electrical testing of internal connections or -isolation, e.g. latch-up or chip-to-lead connections
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2896—Testing of IC packages; Test features related to IC packages
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
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CN201910193313.6A CN109975687B (zh) | 2019-03-14 | 2019-03-14 | 一种基于ic键合引线的质量检测装置及方法 |
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CN109975687A CN109975687A (zh) | 2019-07-05 |
CN109975687B true CN109975687B (zh) | 2022-07-08 |
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Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
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CN114237159B (zh) * | 2022-02-24 | 2022-07-12 | 深圳市大族封测科技股份有限公司 | 焊接线弧自动生成方法、装置、计算机设备及存储介质 |
CN117153714B (zh) * | 2023-10-31 | 2024-04-02 | 宁波尚进自动化科技有限公司 | 焊接键合的检测方法、系统、设备及其介质 |
Citations (8)
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JP2002014134A (ja) * | 2000-06-30 | 2002-01-18 | Hioki Ee Corp | 回路基板検査装置 |
CN1336552A (zh) * | 2000-05-31 | 2002-02-20 | 威尔特克株式会社 | 用调谐型传感器线圈检测ic端子上焊接不良的检测方法 |
CN1769916A (zh) * | 2004-11-02 | 2006-05-10 | 安捷伦科技有限公司 | 对不可达短路连接进行非接触测试和诊断的方法与装置 |
CN1851488A (zh) * | 2005-04-22 | 2006-10-25 | 安捷伦科技有限公司 | 用容性测量检测不可访问的插针上的短路的方法和装置 |
CN101231322A (zh) * | 2007-02-09 | 2008-07-30 | 段超毅 | 集成电路开路/短路的测试连接方法及装置 |
CN101726542A (zh) * | 2009-09-25 | 2010-06-09 | 中南大学 | 芯片封装互连中的超声键合质量在线监测判别方法及系统 |
CN103822869A (zh) * | 2014-02-28 | 2014-05-28 | 工业和信息化部电子第五研究所 | 电源键合引线焊点的可靠性检测方法 |
CN204439680U (zh) * | 2015-02-12 | 2015-07-01 | 武汉格蓝若光电互感器有限公司 | 一种交直流两用的标准电流源 |
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2019
- 2019-03-14 CN CN201910193313.6A patent/CN109975687B/zh active Active
Patent Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1336552A (zh) * | 2000-05-31 | 2002-02-20 | 威尔特克株式会社 | 用调谐型传感器线圈检测ic端子上焊接不良的检测方法 |
JP2002014134A (ja) * | 2000-06-30 | 2002-01-18 | Hioki Ee Corp | 回路基板検査装置 |
CN1769916A (zh) * | 2004-11-02 | 2006-05-10 | 安捷伦科技有限公司 | 对不可达短路连接进行非接触测试和诊断的方法与装置 |
CN1851488A (zh) * | 2005-04-22 | 2006-10-25 | 安捷伦科技有限公司 | 用容性测量检测不可访问的插针上的短路的方法和装置 |
CN101231322A (zh) * | 2007-02-09 | 2008-07-30 | 段超毅 | 集成电路开路/短路的测试连接方法及装置 |
CN101726542A (zh) * | 2009-09-25 | 2010-06-09 | 中南大学 | 芯片封装互连中的超声键合质量在线监测判别方法及系统 |
CN103822869A (zh) * | 2014-02-28 | 2014-05-28 | 工业和信息化部电子第五研究所 | 电源键合引线焊点的可靠性检测方法 |
CN204439680U (zh) * | 2015-02-12 | 2015-07-01 | 武汉格蓝若光电互感器有限公司 | 一种交直流两用的标准电流源 |
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