JP4394835B2 - 低パワー集積回路用高速オンチップ電圧発生器 - Google Patents

低パワー集積回路用高速オンチップ電圧発生器 Download PDF

Info

Publication number
JP4394835B2
JP4394835B2 JP2000582864A JP2000582864A JP4394835B2 JP 4394835 B2 JP4394835 B2 JP 4394835B2 JP 2000582864 A JP2000582864 A JP 2000582864A JP 2000582864 A JP2000582864 A JP 2000582864A JP 4394835 B2 JP4394835 B2 JP 4394835B2
Authority
JP
Japan
Prior art keywords
circuit
boost
voltage
coupled
node
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP2000582864A
Other languages
English (en)
Japanese (ja)
Other versions
JP2003517719A5 (zh
JP2003517719A (ja
Inventor
クェン−ロン チャン
チュン−シュン ハン
ケン−フイ チェン
ティエン−シン ホー
イ−ロン リー
ツィン−ヘイ シオー
レイ−リン ワン
Original Assignee
マクロニクス インターナショナル カンパニー リミテッド
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by マクロニクス インターナショナル カンパニー リミテッド filed Critical マクロニクス インターナショナル カンパニー リミテッド
Publication of JP2003517719A publication Critical patent/JP2003517719A/ja
Publication of JP2003517719A5 publication Critical patent/JP2003517719A5/ja
Application granted granted Critical
Publication of JP4394835B2 publication Critical patent/JP4394835B2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Images

Classifications

    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05FSYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
    • G05F1/00Automatic systems in which deviations of an electric quantity from one or more predetermined values are detected at the output of the system and fed back to a device within the system to restore the detected quantity to its predetermined value or values, i.e. retroactive systems
    • G05F1/10Regulating voltage or current
    • G05F1/46Regulating voltage or current wherein the variable actually regulated by the final control device is dc

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Automation & Control Theory (AREA)
  • Read Only Memory (AREA)
  • Static Random-Access Memory (AREA)
  • Semiconductor Integrated Circuits (AREA)
JP2000582864A 1998-11-18 1998-11-18 低パワー集積回路用高速オンチップ電圧発生器 Expired - Lifetime JP4394835B2 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/US1998/024766 WO2000029919A1 (en) 1998-11-18 1998-11-18 Rapid on chip voltage generation for low power integrated circuits

Publications (3)

Publication Number Publication Date
JP2003517719A JP2003517719A (ja) 2003-05-27
JP2003517719A5 JP2003517719A5 (zh) 2006-02-16
JP4394835B2 true JP4394835B2 (ja) 2010-01-06

Family

ID=22268334

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2000582864A Expired - Lifetime JP4394835B2 (ja) 1998-11-18 1998-11-18 低パワー集積回路用高速オンチップ電圧発生器

Country Status (6)

Country Link
EP (1) EP1151365B1 (zh)
JP (1) JP4394835B2 (zh)
CN (1) CN1148621C (zh)
DE (1) DE69823888T2 (zh)
HK (1) HK1042954A1 (zh)
WO (1) WO2000029919A1 (zh)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6646950B2 (en) * 2001-04-30 2003-11-11 Fujitsu Limited High speed decoder for flash memory
JP4142685B2 (ja) * 2003-06-05 2008-09-03 スパンション エルエルシー 冗長メモリのブースタ回路を有する半導体メモリ
CN1323434C (zh) * 2003-09-02 2007-06-27 台湾积体电路制造股份有限公司 整合闪存与高电压组件的制造方法
US7466620B2 (en) * 2006-01-04 2008-12-16 Baker Mohammad System and method for low power wordline logic for a memory
US7529117B2 (en) * 2007-03-07 2009-05-05 Taiwan Semiconductor Manufacturing Company, Ltd. Design solutions for integrated circuits with triple gate oxides
CN101620886B (zh) * 2008-07-02 2012-01-25 中芯国际集成电路制造(上海)有限公司 用于闪存器件的字线增压器
JP5808937B2 (ja) * 2011-04-20 2015-11-10 ラピスセミコンダクタ株式会社 半導体メモリの内部電源電圧生成回路及び内部電源電圧生成方法
CN108958639B (zh) * 2017-05-19 2021-07-06 华邦电子股份有限公司 快闪存储器存储装置
JP2021149999A (ja) * 2020-03-23 2021-09-27 キオクシア株式会社 半導体記憶装置

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR910004737B1 (ko) * 1988-12-19 1991-07-10 삼성전자 주식회사 백바이어스전압 발생회로
KR0172337B1 (ko) * 1995-11-13 1999-03-30 김광호 반도체 메모리장치의 내부승압전원 발생회로
US5708387A (en) * 1995-11-17 1998-01-13 Advanced Micro Devices, Inc. Fast 3-state booster-circuit
JPH09320267A (ja) * 1996-05-28 1997-12-12 Oki Micro Design Miyazaki:Kk 昇圧回路の駆動方法および昇圧回路

Also Published As

Publication number Publication date
EP1151365A4 (en) 2002-01-30
CN1327552A (zh) 2001-12-19
WO2000029919A1 (en) 2000-05-25
EP1151365B1 (en) 2004-05-12
DE69823888T2 (de) 2004-10-21
CN1148621C (zh) 2004-05-05
DE69823888D1 (de) 2004-06-17
JP2003517719A (ja) 2003-05-27
HK1042954A1 (en) 2002-08-30
EP1151365A1 (en) 2001-11-07

Similar Documents

Publication Publication Date Title
JP2604526B2 (ja) 半導体メモリ装置
US6753720B2 (en) Internal high voltage generation circuit capable of stably generating internal high voltage and circuit element therefor
US5699303A (en) Semiconductor memory device having controllable supplying capability of internal voltage
JPH07122998B2 (ja) 半導体メモリ素子の高電圧発生回路
US6255900B1 (en) Rapid on chip voltage generation for low power integrated circuits
US5677643A (en) Potential detecting circuit which suppresses the adverse effects and eliminates dependency of detected potential on power supply potential
US6002630A (en) On chip voltage generation for low power integrated circuits
KR100336254B1 (ko) 승압 회로
JPH04102292A (ja) 昇圧回路
KR940003409B1 (ko) 반도체 메모리 장치의 센스앰프 제어회로
JP4394835B2 (ja) 低パワー集積回路用高速オンチップ電圧発生器
JPH1079191A (ja) 半導体メモリ装置の内部昇圧電圧発生器
JP4178205B2 (ja) メモリ装置のワード線信号をブーストするブーストシステムおよびブースト方法
US5642313A (en) Voltage booster circuit for a memory device
JP2002260393A (ja) 昇圧電圧発生回路
JP3392497B2 (ja) テスト電位転送回路およびこれを用いた半導体記憶装置
EP0612075B1 (en) Self-timed bootstrap decoder
JPH087567A (ja) 半導体記憶装置
JP4808988B2 (ja) チャージポンピング効率を維持する高電圧発生回路
JPH05234373A (ja) 半導体記憶装置
KR100507701B1 (ko) 부스트랩 회로
US5805519A (en) Semiconductor memory device
JPH08205526A (ja) 半導体集積回路の内部電圧昇圧回路
JPH10257756A (ja) 昇圧回路及び降圧回路
JP2001160295A (ja) 半導体集積回路

Legal Events

Date Code Title Description
A521 Written amendment

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20050830

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20050830

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20090119

A521 Written amendment

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20090420

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20090608

A521 Written amendment

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20090908

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20091008

A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20091016

R150 Certificate of patent or registration of utility model

Free format text: JAPANESE INTERMEDIATE CODE: R150

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20121023

Year of fee payment: 3

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20121023

Year of fee payment: 3

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20131023

Year of fee payment: 4

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

EXPY Cancellation because of completion of term