JP4167010B2 - 表示用基板の処理装置 - Google Patents
表示用基板の処理装置 Download PDFInfo
- Publication number
- JP4167010B2 JP4167010B2 JP2002177523A JP2002177523A JP4167010B2 JP 4167010 B2 JP4167010 B2 JP 4167010B2 JP 2002177523 A JP2002177523 A JP 2002177523A JP 2002177523 A JP2002177523 A JP 2002177523A JP 4167010 B2 JP4167010 B2 JP 4167010B2
- Authority
- JP
- Japan
- Prior art keywords
- display substrate
- receiving
- support
- base
- disposed
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Images
Landscapes
- Liquid Crystal (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2002177523A JP4167010B2 (ja) | 2002-06-18 | 2002-06-18 | 表示用基板の処理装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2002177523A JP4167010B2 (ja) | 2002-06-18 | 2002-06-18 | 表示用基板の処理装置 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2004022903A JP2004022903A (ja) | 2004-01-22 |
| JP2004022903A5 JP2004022903A5 (enExample) | 2005-09-29 |
| JP4167010B2 true JP4167010B2 (ja) | 2008-10-15 |
Family
ID=31175535
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2002177523A Expired - Lifetime JP4167010B2 (ja) | 2002-06-18 | 2002-06-18 | 表示用基板の処理装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP4167010B2 (enExample) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7714563B2 (en) | 2007-03-13 | 2010-05-11 | Analog Devices, Inc. | Low noise voltage reference circuit |
| US7750728B2 (en) | 2008-03-25 | 2010-07-06 | Analog Devices, Inc. | Reference voltage circuit |
| US7880533B2 (en) | 2008-03-25 | 2011-02-01 | Analog Devices, Inc. | Bandgap voltage reference circuit |
| US7902912B2 (en) | 2008-03-25 | 2011-03-08 | Analog Devices, Inc. | Bias current generator |
| US8102201B2 (en) | 2006-09-25 | 2012-01-24 | Analog Devices, Inc. | Reference circuit and method for providing a reference |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4570930B2 (ja) * | 2004-10-22 | 2010-10-27 | 株式会社日本マイクロニクス | パネルの検査装置に用いられる電気的接続装置 |
| JP2006232477A (ja) * | 2005-02-24 | 2006-09-07 | Fuji Photo Film Co Ltd | シート体位置決め治具及びそれを用いた描画装置 |
| US10141215B2 (en) * | 2016-11-03 | 2018-11-27 | Rohinni, LLC | Compliant needle for direct transfer of semiconductor devices |
| JP2018085523A (ja) * | 2017-12-21 | 2018-05-31 | アプライド マテリアルズ インコーポレイテッドApplied Materials,Incorporated | 基板用キャリア |
-
2002
- 2002-06-18 JP JP2002177523A patent/JP4167010B2/ja not_active Expired - Lifetime
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8102201B2 (en) | 2006-09-25 | 2012-01-24 | Analog Devices, Inc. | Reference circuit and method for providing a reference |
| US7714563B2 (en) | 2007-03-13 | 2010-05-11 | Analog Devices, Inc. | Low noise voltage reference circuit |
| US7750728B2 (en) | 2008-03-25 | 2010-07-06 | Analog Devices, Inc. | Reference voltage circuit |
| US7880533B2 (en) | 2008-03-25 | 2011-02-01 | Analog Devices, Inc. | Bandgap voltage reference circuit |
| US7902912B2 (en) | 2008-03-25 | 2011-03-08 | Analog Devices, Inc. | Bias current generator |
Also Published As
| Publication number | Publication date |
|---|---|
| JP2004022903A (ja) | 2004-01-22 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| KR100784274B1 (ko) | 표시용 패널의 검사장치 | |
| JP4167010B2 (ja) | 表示用基板の処理装置 | |
| KR100707686B1 (ko) | 패널의 검사장치 | |
| JP5432804B2 (ja) | リペア装置 | |
| KR100506702B1 (ko) | 기판 검사장치 | |
| JP4421405B2 (ja) | 表示用パネルの検査装置 | |
| JP4163435B2 (ja) | 被検査基板の検査装置 | |
| JP2008175548A (ja) | 外観検査装置および外観検査方法 | |
| JP2004022903A5 (enExample) | ||
| JP4209661B2 (ja) | 表示用基板の処理装置 | |
| JP2005221568A (ja) | 表示用パネルの処理装置 | |
| JP2002014047A (ja) | 表示用パネルの検査装置 | |
| JP2000180807A (ja) | 液晶基板の検査装置 | |
| JP3478762B2 (ja) | ガラス基板切断装置 | |
| JP3940549B2 (ja) | 表示用パネルの検査装置 | |
| KR101300098B1 (ko) | 기판 검사 장치 및 방법 | |
| JPH11211615A (ja) | 表示パネル用基板の検査装置 | |
| JP2002016127A (ja) | チャックトップ | |
| JP2013164444A (ja) | 表示用パネル基板のプロキシミティ露光装置とその方法 | |
| JPH1010180A (ja) | 液晶表示パネルの検査装置 | |
| KR100676818B1 (ko) | 패널검사장치 | |
| JP2010060991A (ja) | 液晶パネル検査装置及び液晶パネル検査方法 | |
| JP3532670B2 (ja) | 表示パネル基板の検査装置 | |
| JP2005227652A (ja) | 表示用パネルの処理装置 | |
| JP2002014627A (ja) | 表示用パネルの検査装置 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20050509 |
|
| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20050509 |
|
| A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20080306 |
|
| A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20080325 |
|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20080515 |
|
| TRDD | Decision of grant or rejection written | ||
| A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20080715 |
|
| A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 |
|
| A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20080731 |
|
| R150 | Certificate of patent or registration of utility model |
Free format text: JAPANESE INTERMEDIATE CODE: R150 Ref document number: 4167010 Country of ref document: JP Free format text: JAPANESE INTERMEDIATE CODE: R150 |
|
| FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20110808 Year of fee payment: 3 |
|
| FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20140808 Year of fee payment: 6 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| EXPY | Cancellation because of completion of term |