JP4029182B2 - 露光方法 - Google Patents
露光方法 Download PDFInfo
- Publication number
- JP4029182B2 JP4029182B2 JP33284696A JP33284696A JP4029182B2 JP 4029182 B2 JP4029182 B2 JP 4029182B2 JP 33284696 A JP33284696 A JP 33284696A JP 33284696 A JP33284696 A JP 33284696A JP 4029182 B2 JP4029182 B2 JP 4029182B2
- Authority
- JP
- Japan
- Prior art keywords
- stage
- substrate
- wafer
- alignment
- exposure
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
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Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70691—Handling of masks or workpieces
- G03F7/70733—Handling masks and workpieces, e.g. exchange of workpiece or mask, transport of workpiece or mask
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70691—Handling of masks or workpieces
- G03F7/70716—Stages
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
Priority Applications (32)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP33284696A JP4029182B2 (ja) | 1996-11-28 | 1996-11-28 | 露光方法 |
| CNB011216433A CN1244021C (zh) | 1996-11-28 | 1997-11-28 | 光刻装置和曝光方法 |
| AU50678/98A AU5067898A (en) | 1996-11-28 | 1997-11-28 | Aligner and method for exposure |
| PCT/JP1997/004350 WO1998024115A1 (en) | 1996-11-28 | 1997-11-28 | Aligner and method for exposure |
| SG200005339A SG93267A1 (en) | 1996-11-28 | 1997-11-28 | An exposure apparatus and an exposure method |
| CNB971811172A CN1144263C (zh) | 1996-11-28 | 1997-11-28 | 曝光装置以及曝光方法 |
| DE69738910T DE69738910D1 (de) | 1996-11-28 | 1997-11-28 | Ausrichtvorrichtung und belichtungsverfahren |
| EP08005700A EP1944654A3 (en) | 1996-11-28 | 1997-11-28 | An exposure apparatus and an exposure method |
| SG200103142A SG88824A1 (en) | 1996-11-28 | 1997-11-28 | Projection exposure method |
| SG200103143A SG102627A1 (en) | 1996-11-28 | 1997-11-28 | Lithographic device |
| EP97913467A EP0951054B1 (en) | 1996-11-28 | 1997-11-28 | Aligner and method for exposure |
| AT97913467T ATE404906T1 (de) | 1996-11-28 | 1997-11-28 | Ausrichtvorrichtung und belichtungsverfahren |
| CNB011176660A CN1244019C (zh) | 1996-11-28 | 1997-11-28 | 曝光装置以及曝光方法 |
| IL13013797A IL130137A (en) | 1996-11-28 | 1997-11-28 | Exposure apparatus and an exposure method |
| HK00103393.7A HK1024104B (en) | 1996-11-28 | 1997-11-28 | Aligner and method for exposure |
| CNB011176652A CN1244018C (zh) | 1996-11-28 | 1997-11-28 | 曝光方法和曝光装置 |
| SG200103141A SG88823A1 (en) | 1996-11-28 | 1997-11-28 | Projection exposure apparatus |
| KR1020017006773A KR20030096435A (ko) | 1996-11-28 | 1997-11-28 | 노광장치 및 노광방법 |
| CNB011216425A CN1244020C (zh) | 1996-11-28 | 1997-11-28 | 曝光装置 |
| KR1019997004747A KR100315249B1 (ko) | 1996-11-28 | 1999-05-28 | 노광장치 및 노광방법 |
| KR1019997004939A KR100314557B1 (ko) | 1996-11-28 | 1999-06-03 | 노광장치 및 노광방법 |
| US09/666,407 US6400441B1 (en) | 1996-11-28 | 2000-09-20 | Projection exposure apparatus and method |
| US09/714,620 US6549269B1 (en) | 1996-11-28 | 2000-11-17 | Exposure apparatus and an exposure method |
| US09/714,943 US6341007B1 (en) | 1996-11-28 | 2000-11-20 | Exposure apparatus and method |
| US09/716,405 US6590634B1 (en) | 1996-11-28 | 2000-11-21 | Exposure apparatus and method |
| KR1020017006771A KR100315250B1 (ko) | 1996-11-28 | 2001-05-30 | 노광장치 및 노광방법 |
| KR1020017006772A KR100315251B1 (ko) | 1996-11-28 | 2001-05-30 | 노광장치 및 노광방법 |
| US10/024,147 US6798491B2 (en) | 1996-11-28 | 2001-12-21 | Exposure apparatus and an exposure method |
| KR1020020072333A KR20060086495A (ko) | 1996-11-28 | 2002-11-20 | 노광장치 및 노광방법 |
| KR1020020072335A KR20060086496A (ko) | 1996-11-28 | 2002-11-20 | 노광장치 및 노광방법 |
| US10/879,144 US7177008B2 (en) | 1996-11-28 | 2004-06-30 | Exposure apparatus and method |
| US11/647,492 US7256869B2 (en) | 1996-11-28 | 2006-12-29 | Exposure apparatus and an exposure method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP33284696A JP4029182B2 (ja) | 1996-11-28 | 1996-11-28 | 露光方法 |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2007112572A Division JP4196411B2 (ja) | 2007-04-23 | 2007-04-23 | 露光装置及びデバイス製造方法 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JPH10163099A JPH10163099A (ja) | 1998-06-19 |
| JPH10163099A5 JPH10163099A5 (enExample) | 2005-08-11 |
| JP4029182B2 true JP4029182B2 (ja) | 2008-01-09 |
Family
ID=18259456
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP33284696A Expired - Lifetime JP4029182B2 (ja) | 1996-11-28 | 1996-11-28 | 露光方法 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP4029182B2 (enExample) |
Families Citing this family (193)
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| WO2001023933A1 (en) | 1999-09-29 | 2001-04-05 | Nikon Corporation | Projection optical system |
| WO2001023935A1 (en) | 1999-09-29 | 2001-04-05 | Nikon Corporation | Projection exposure method and apparatus and projection optical system |
| US7301605B2 (en) | 2000-03-03 | 2007-11-27 | Nikon Corporation | Projection exposure apparatus and method, catadioptric optical system and manufacturing method of devices |
| TW497013B (en) * | 2000-09-07 | 2002-08-01 | Asm Lithography Bv | Method for calibrating a lithographic projection apparatus and apparatus capable of applying such a method |
| JP2002287023A (ja) | 2001-03-27 | 2002-10-03 | Nikon Corp | 投影光学系、該投影光学系を備えた投影露光装置及び投影露光方法 |
| SG158745A1 (en) | 2002-12-10 | 2010-02-26 | Nikon Corp | Exposure apparatus and method for producing device |
| KR20050085026A (ko) | 2002-12-10 | 2005-08-29 | 가부시키가이샤 니콘 | 광학 소자 및 그 광학 소자를 사용한 투영 노광 장치 |
| EP1598855B1 (en) | 2003-02-26 | 2015-04-22 | Nikon Corporation | Exposure apparatus and method, and method of producing apparatus |
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1996
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