JP4028163B2 - メカノケミカル研磨方法及びメカノケミカル研磨装置 - Google Patents
メカノケミカル研磨方法及びメカノケミカル研磨装置 Download PDFInfo
- Publication number
- JP4028163B2 JP4028163B2 JP2000259116A JP2000259116A JP4028163B2 JP 4028163 B2 JP4028163 B2 JP 4028163B2 JP 2000259116 A JP2000259116 A JP 2000259116A JP 2000259116 A JP2000259116 A JP 2000259116A JP 4028163 B2 JP4028163 B2 JP 4028163B2
- Authority
- JP
- Japan
- Prior art keywords
- polishing
- cloth
- mechanochemical
- silicon carbide
- abrasive grains
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Images
Classifications
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K3/00—Materials not provided for elsewhere
- C09K3/14—Anti-slip materials; Abrasives
- C09K3/1454—Abrasive powders, suspensions and pastes for polishing
- C09K3/1463—Aqueous liquid suspensions
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/04—Lapping machines or devices; Accessories designed for working plane surfaces
- B24B37/042—Lapping machines or devices; Accessories designed for working plane surfaces operating processes therefor
- B24B37/044—Lapping machines or devices; Accessories designed for working plane surfaces operating processes therefor characterised by the composition of the lapping agent
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09G—POLISHING COMPOSITIONS; SKI WAXES
- C09G1/00—Polishing compositions
- C09G1/02—Polishing compositions containing abrasives or grinding agents
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/0445—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising crystalline silicon carbide
- H01L21/0475—Changing the shape of the semiconductor body, e.g. forming recesses
Landscapes
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Organic Chemistry (AREA)
- Physics & Mathematics (AREA)
- Mechanical Engineering (AREA)
- Crystallography & Structural Chemistry (AREA)
- Materials Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2000259116A JP4028163B2 (ja) | 1999-11-16 | 2000-08-29 | メカノケミカル研磨方法及びメカノケミカル研磨装置 |
| US09/709,454 US6835120B1 (en) | 1999-11-16 | 2000-11-13 | Method and apparatus for mechanochemical polishing |
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11-325437 | 1999-11-16 | ||
| JP32543799 | 1999-11-16 | ||
| JP2000259116A JP4028163B2 (ja) | 1999-11-16 | 2000-08-29 | メカノケミカル研磨方法及びメカノケミカル研磨装置 |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2006003055A Division JP4345746B2 (ja) | 1999-11-16 | 2006-01-10 | メカノケミカル研磨装置 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2001205555A JP2001205555A (ja) | 2001-07-31 |
| JP2001205555A5 JP2001205555A5 (enExample) | 2005-10-27 |
| JP4028163B2 true JP4028163B2 (ja) | 2007-12-26 |
Family
ID=26571822
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2000259116A Expired - Lifetime JP4028163B2 (ja) | 1999-11-16 | 2000-08-29 | メカノケミカル研磨方法及びメカノケミカル研磨装置 |
Country Status (2)
| Country | Link |
|---|---|
| US (1) | US6835120B1 (enExample) |
| JP (1) | JP4028163B2 (enExample) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2025188982A1 (en) * | 2024-03-07 | 2025-09-12 | Wolfspeed, Inc. | Disc grinding for semiconductor wafers on polishing system |
Families Citing this family (45)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2002043921A1 (en) * | 2000-12-01 | 2002-06-06 | Toyo Boseki Kabushiki Kaisha | Polishing pad, method of manufacturing the polishing pad, and cushion layer for polishing pad |
| US20040134418A1 (en) * | 2002-11-08 | 2004-07-15 | Taisuke Hirooka | SiC substrate and method of manufacturing the same |
| JP4986099B2 (ja) * | 2003-06-09 | 2012-07-25 | 花王株式会社 | 基板の製造方法 |
| JP2005001018A (ja) * | 2003-06-09 | 2005-01-06 | Kao Corp | 基板の製造方法 |
| DE102004010379A1 (de) * | 2004-03-03 | 2005-09-22 | Schott Ag | Verfahren zur Herstellung von Wafern mit defektarmen Oberflächen, die Verwendung solcher Wafer und damit erhaltene elektronische Bauteile |
| JP2007533141A (ja) * | 2004-04-08 | 2007-11-15 | トゥー‐シックス・インコーポレイテッド | コロイド状研磨材と組み合わせて過酸化水素またはオゾン化水溶液を用いたSiC表面の化学機械的研磨 |
| US20060108325A1 (en) * | 2004-11-19 | 2006-05-25 | Everson William J | Polishing process for producing damage free surfaces on semi-insulating silicon carbide wafers |
| JP2006224252A (ja) * | 2005-02-18 | 2006-08-31 | Kumamoto Univ | 研磨装置 |
| JP2008006559A (ja) * | 2006-06-30 | 2008-01-17 | Hitachi Maxell Ltd | 鏡面加工方法、および鏡面加工用の加工体 |
| EP2381008A2 (en) * | 2006-08-28 | 2011-10-26 | Osaka University | Catalyst-aided chemical processing method and apparatus |
| JP4982742B2 (ja) * | 2006-09-13 | 2012-07-25 | 国立大学法人 熊本大学 | 磁性微粒子を用いた触媒化学加工方法及び装置 |
| US7781312B2 (en) * | 2006-12-13 | 2010-08-24 | General Electric Company | Silicon carbide devices and method of making |
| JP5095228B2 (ja) | 2007-01-23 | 2012-12-12 | 株式会社フジミインコーポレーテッド | 研磨用組成物 |
| JP5315573B2 (ja) * | 2007-10-12 | 2013-10-16 | 国立大学法人 熊本大学 | 加工装置および加工方法 |
| CN101422872B (zh) * | 2007-10-30 | 2010-05-26 | 昆明市凯跃机电塑料有限责任公司 | 一种气浮式机械抛光方法 |
| JP4732423B2 (ja) * | 2007-11-13 | 2011-07-27 | 株式会社デンソー | 炭化珪素半導体装置の製造方法 |
| US8580346B2 (en) * | 2007-12-07 | 2013-11-12 | Pcw Holdings, Llc | Compositions and methods for restoring aircraft windows and other plastic surfaces |
| US20090148606A1 (en) * | 2007-12-07 | 2009-06-11 | Lenzsavers, Llc | Compositions and methods for restoring plastic covers and lenses |
| KR101621580B1 (ko) * | 2009-01-30 | 2016-05-16 | 렌즈세이버스, 엘엘씨 | 플라스틱 커버 및 렌즈 복원용 조성물 및 복원 방법 |
| WO2010090024A1 (ja) | 2009-02-04 | 2010-08-12 | 日立金属株式会社 | 炭化珪素単結晶基板およびその製造方法 |
| JP5364959B2 (ja) * | 2009-03-27 | 2013-12-11 | 国立大学法人大阪大学 | 研磨方法及び研磨装置 |
| US9368367B2 (en) | 2009-04-13 | 2016-06-14 | Sinmat, Inc. | Chemical mechanical polishing of silicon carbide comprising surfaces |
| JP4827963B2 (ja) * | 2009-12-11 | 2011-11-30 | 国立大学法人九州大学 | 炭化珪素の研磨液及びその研磨方法 |
| JP2011218494A (ja) * | 2010-04-09 | 2011-11-04 | Mitsui Mining & Smelting Co Ltd | 研摩スラリー及びその研摩方法 |
| JP5236687B2 (ja) * | 2010-05-26 | 2013-07-17 | 兵庫県 | 表面処理方法及び表面処理装置 |
| US8778203B2 (en) * | 2010-05-28 | 2014-07-15 | Clarkson University | Tunable polish rates by varying dissolved oxygen content |
| KR101222764B1 (ko) * | 2010-11-04 | 2013-01-15 | 조희태 | 자동차 유리의 흠집제거방법 |
| US8574032B2 (en) | 2011-03-22 | 2013-11-05 | Pcw Holdings, Llc | UV protective coating composition and method |
| US8828874B2 (en) | 2011-03-28 | 2014-09-09 | Sinmat, Inc. | Chemical mechanical polishing of group III-nitride surfaces |
| JP5743800B2 (ja) * | 2011-08-15 | 2015-07-01 | 新日鉄住金マテリアルズ株式会社 | SiCウェハの製造方法 |
| US9318339B2 (en) | 2011-10-13 | 2016-04-19 | Mitsui Mining & Smelting, Ltd | Polishing slurry and polishing method |
| WO2013161049A1 (ja) * | 2012-04-27 | 2013-10-31 | 三井金属鉱業株式会社 | SiC単結晶基板 |
| JP6016301B2 (ja) * | 2013-02-13 | 2016-10-26 | 昭和電工株式会社 | 単結晶SiC基板の表面加工方法、その製造方法及び単結晶SiC基板の表面加工用研削プレート |
| KR20150060358A (ko) * | 2013-11-26 | 2015-06-03 | 삼성디스플레이 주식회사 | 기판 절단 및 강화 장치, 기판의 절단 및 강화 방법 |
| JP6381068B2 (ja) * | 2014-04-08 | 2018-08-29 | 山口精研工業株式会社 | 炭化ケイ素基板研磨用組成物 |
| JP6475518B2 (ja) * | 2015-03-03 | 2019-02-27 | 株式会社ディスコ | ウエーハの加工方法 |
| KR102372553B1 (ko) | 2016-06-01 | 2022-03-10 | 후지보 홀딩스 가부시키가이샤 | 연마 패드 및 그의 제조 방법, 그리고 연마물의 제조 방법 |
| CN109822454B (zh) * | 2019-03-27 | 2023-11-10 | 西南交通大学 | 一种模块化设计的自供紫外光源的绿色节能抛光头装置 |
| CN110524408A (zh) * | 2019-09-12 | 2019-12-03 | 江苏吉星新材料有限公司 | 一种蓝宝石晶片研磨方法 |
| JP7528681B2 (ja) * | 2020-09-29 | 2024-08-06 | 住友金属鉱山株式会社 | SiC多結晶基板の研磨方法 |
| CN114300401A (zh) * | 2020-09-30 | 2022-04-08 | 广东晶相光电科技有限公司 | 一种发光二极管及其应用 |
| CN113524025B (zh) * | 2021-07-30 | 2023-04-28 | 河南科技学院 | 一种SiC单晶片抛光方法 |
| CN116285698A (zh) * | 2023-02-02 | 2023-06-23 | 浙江兆晶新材料科技有限公司 | 一种用于碳化硅晶片抛光液的组合物、抛光液及其制备方法和应用 |
| CN117567942A (zh) * | 2023-11-08 | 2024-02-20 | 深圳平湖实验室 | 抛光液及其制备方法与应用 |
| CN119260483B (zh) * | 2024-12-06 | 2025-09-30 | 浙江大学杭州国际科创中心 | 碳化硅晶锭的加工方法和碳化硅衬底的加工方法 |
Family Cites Families (24)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4343116A (en) * | 1979-07-26 | 1982-08-10 | Pilkington Brothers Limited | Processes for finishing glass surfaces |
| JPS5623746A (en) | 1979-08-01 | 1981-03-06 | Matsushita Electronics Corp | Manufacture of semiconductor device |
| JPH06333892A (ja) | 1993-03-22 | 1994-12-02 | Fuji Electric Corp Res & Dev Ltd | 電子デバイス |
| US5554064A (en) * | 1993-08-06 | 1996-09-10 | Intel Corporation | Orbital motion chemical-mechanical polishing apparatus and method of fabrication |
| US5658183A (en) * | 1993-08-25 | 1997-08-19 | Micron Technology, Inc. | System for real-time control of semiconductor wafer polishing including optical monitoring |
| JPH0780770A (ja) | 1993-09-14 | 1995-03-28 | Nippon Steel Corp | 炭化珪素単結晶のメカノケミカルポリシング方法 |
| US6236542B1 (en) | 1994-01-21 | 2001-05-22 | International Business Machines Corporation | Substrate independent superpolishing process and slurry |
| JP3185535B2 (ja) | 1994-04-15 | 2001-07-11 | 富士電機株式会社 | 電子デバイスおよびその製造方法 |
| JPH0822503A (ja) | 1994-07-06 | 1996-01-23 | Sanyo Electric Co Ltd | 遠隔診療支援システム |
| JP3734289B2 (ja) * | 1995-01-24 | 2006-01-11 | 株式会社荏原製作所 | ポリッシング装置 |
| US5674107A (en) * | 1995-04-25 | 1997-10-07 | Lucent Technologies Inc. | Diamond polishing method and apparatus employing oxygen-emitting medium |
| JP3042593B2 (ja) * | 1995-10-25 | 2000-05-15 | 日本電気株式会社 | 研磨パッド |
| US6012966A (en) * | 1996-05-10 | 2000-01-11 | Canon Kabushiki Kaisha | Precision polishing apparatus with detecting means |
| US5904611A (en) * | 1996-05-10 | 1999-05-18 | Canon Kabushiki Kaisha | Precision polishing apparatus |
| JP2865061B2 (ja) * | 1996-06-27 | 1999-03-08 | 日本電気株式会社 | 研磨パッドおよび研磨装置ならびに半導体装置の製造方法 |
| JP3507628B2 (ja) | 1996-08-06 | 2004-03-15 | 昭和電工株式会社 | 化学的機械研磨用研磨組成物 |
| JP3672685B2 (ja) * | 1996-11-29 | 2005-07-20 | 松下電器産業株式会社 | 研磨方法及び研磨装置 |
| US5816900A (en) * | 1997-07-17 | 1998-10-06 | Lsi Logic Corporation | Apparatus for polishing a substrate at radially varying polish rates |
| US5997392A (en) * | 1997-07-22 | 1999-12-07 | International Business Machines Corporation | Slurry injection technique for chemical-mechanical polishing |
| US5931718A (en) * | 1997-09-30 | 1999-08-03 | The Board Of Regents Of Oklahoma State University | Magnetic float polishing processes and materials therefor |
| JP3075352B2 (ja) * | 1998-04-15 | 2000-08-14 | 日本電気株式会社 | 化学的機械研磨液の供給方法および装置 |
| US6270395B1 (en) * | 1998-09-24 | 2001-08-07 | Alliedsignal, Inc. | Oxidizing polishing slurries for low dielectric constant materials |
| US6293851B1 (en) * | 1998-11-06 | 2001-09-25 | Beaver Creek Concepts Inc | Fixed abrasive finishing method using lubricants |
| US6077151A (en) * | 1999-05-17 | 2000-06-20 | Vlsi Technology, Inc. | Temperature control carrier head for chemical mechanical polishing process |
-
2000
- 2000-08-29 JP JP2000259116A patent/JP4028163B2/ja not_active Expired - Lifetime
- 2000-11-13 US US09/709,454 patent/US6835120B1/en not_active Expired - Lifetime
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2025188982A1 (en) * | 2024-03-07 | 2025-09-12 | Wolfspeed, Inc. | Disc grinding for semiconductor wafers on polishing system |
Also Published As
| Publication number | Publication date |
|---|---|
| US6835120B1 (en) | 2004-12-28 |
| JP2001205555A (ja) | 2001-07-31 |
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