JP4025167B2 - 抵抗素子を有する半導体装置 - Google Patents

抵抗素子を有する半導体装置 Download PDF

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Publication number
JP4025167B2
JP4025167B2 JP2002302759A JP2002302759A JP4025167B2 JP 4025167 B2 JP4025167 B2 JP 4025167B2 JP 2002302759 A JP2002302759 A JP 2002302759A JP 2002302759 A JP2002302759 A JP 2002302759A JP 4025167 B2 JP4025167 B2 JP 4025167B2
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JP
Japan
Prior art keywords
resistance element
resistance
node
potential
output
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2002302759A
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English (en)
Japanese (ja)
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JP2004140144A5 (enExample
JP2004140144A (ja
Inventor
慎一郎 白武
恒平 及川
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
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Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to JP2002302759A priority Critical patent/JP4025167B2/ja
Priority to US10/685,490 priority patent/US7053696B2/en
Publication of JP2004140144A publication Critical patent/JP2004140144A/ja
Publication of JP2004140144A5 publication Critical patent/JP2004140144A5/ja
Priority to US11/401,303 priority patent/US20060181339A1/en
Application granted granted Critical
Publication of JP4025167B2 publication Critical patent/JP4025167B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05F—SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
    • G05F1/00—Automatic systems in which deviations of an electric quantity from one or more predetermined values are detected at the output of the system and fed back to a device within the system to restore the detected quantity to its predetermined value or values, i.e. retroactive systems
    • G05F1/10—Regulating voltage or current 
    • G05F1/46—Regulating voltage or current  wherein the variable actually regulated by the final control device is DC
    • G05F1/56—Regulating voltage or current  wherein the variable actually regulated by the final control device is DC using semiconductor devices in series with the load as final control devices
    • G05F1/565—Regulating voltage or current  wherein the variable actually regulated by the final control device is DC using semiconductor devices in series with the load as final control devices sensing a condition of the system or its load in addition to means responsive to deviations in the output of the system, e.g. current, voltage, power factor
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D1/00—Resistors, capacitors or inductors
    • H10D1/40—Resistors
    • H10D1/43—Resistors having PN junctions

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Automation & Control Theory (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Continuous-Control Power Sources That Use Transistors (AREA)
  • Logic Circuits (AREA)
  • Dram (AREA)
JP2002302759A 2002-10-17 2002-10-17 抵抗素子を有する半導体装置 Expired - Fee Related JP4025167B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2002302759A JP4025167B2 (ja) 2002-10-17 2002-10-17 抵抗素子を有する半導体装置
US10/685,490 US7053696B2 (en) 2002-10-17 2003-10-16 Semiconductor device with resistor element
US11/401,303 US20060181339A1 (en) 2002-10-17 2006-04-11 Semiconductor device with resistor element

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2002302759A JP4025167B2 (ja) 2002-10-17 2002-10-17 抵抗素子を有する半導体装置

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2006001457A Division JP4021918B2 (ja) 2006-01-06 2006-01-06 半導体装置

Publications (3)

Publication Number Publication Date
JP2004140144A JP2004140144A (ja) 2004-05-13
JP2004140144A5 JP2004140144A5 (enExample) 2005-07-14
JP4025167B2 true JP4025167B2 (ja) 2007-12-19

Family

ID=32450735

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2002302759A Expired - Fee Related JP4025167B2 (ja) 2002-10-17 2002-10-17 抵抗素子を有する半導体装置

Country Status (2)

Country Link
US (2) US7053696B2 (enExample)
JP (1) JP4025167B2 (enExample)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7621463B2 (en) * 2005-01-12 2009-11-24 Flodesign, Inc. Fluid nozzle system using self-propelling toroidal vortices for long-range jet impact
US7362084B2 (en) 2005-03-14 2008-04-22 Silicon Storage Technology, Inc. Fast voltage regulators for charge pumps
US7737765B2 (en) * 2005-03-14 2010-06-15 Silicon Storage Technology, Inc. Fast start charge pump for voltage regulators
US7479824B2 (en) * 2006-07-13 2009-01-20 Freescale Semiconductor, Inc. Dual mode voltage supply circuit
JP2008070977A (ja) * 2006-09-12 2008-03-27 Fujitsu Ltd 電源降圧回路及び半導体装置
JP2008083850A (ja) * 2006-09-26 2008-04-10 Nec Electronics Corp レギュレータ回路
KR100816214B1 (ko) * 2006-09-29 2008-03-21 주식회사 하이닉스반도체 플래쉬 메모리 장치의 전압 생성기
KR101045069B1 (ko) * 2010-03-31 2011-06-29 주식회사 하이닉스반도체 반도체 집적회로
JP2012151186A (ja) * 2011-01-17 2012-08-09 Seiko Instruments Inc 抵抗分割回路及び電圧検出回路
JP6084764B2 (ja) * 2011-02-22 2017-02-22 ピーエスフォー ルクスコ エスエイアールエルＰＳ４ Ｌｕｘｃｏ Ｓ．ａ．ｒ．ｌ． 半導体装置
KR101730198B1 (ko) * 2012-12-26 2017-04-25 삼성전기주식회사 Ｓｐｄｔ 스위치 회로
US9317053B2 (en) 2014-04-28 2016-04-19 Winbond Electronics Corp. Voltage regulator for a flash memory
JP2016057913A (ja) * 2014-09-10 2016-04-21 株式会社東芝 電圧生成回路
JP6719233B2 (ja) * 2016-03-07 2020-07-08 エイブリック株式会社 出力回路
KR101716434B1 (ko) 2016-08-10 2017-03-14 윈본드 일렉트로닉스 코포레이션 반도체 장치

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4158786A (en) * 1976-07-27 1979-06-19 Tokyo Shibaura Electric Co., Ltd. Display device driving voltage providing circuit
JPS5865481A (ja) * 1981-10-15 1983-04-19 株式会社東芝 液晶駆動用電圧分割回路
US5179539A (en) 1988-05-25 1993-01-12 Hitachi, Ltd., Hitachi Vlsi Engineering Corporation Large scale integrated circuit having low internal operating voltage
DE3904901A1 (de) * 1989-02-17 1990-08-23 Texas Instruments Deutschland Integrierte gegentakt-ausgangsstufe
JP3036176B2 (ja) 1991-11-12 2000-04-24 日本電気株式会社 入力プルアップ回路付半導体集積回路
JP2950093B2 (ja) 1993-05-13 1999-09-20 日本電気株式会社 半導体集積回路装置
JP3705842B2 (ja) * 1994-08-04 2005-10-12 株式会社ルネサステクノロジ 半導体装置
JPH0897701A (ja) * 1994-09-21 1996-04-12 Mitsubishi Electric Corp 半導体回路
KR100190101B1 (ko) * 1996-10-18 1999-06-01 윤종용 반도체 장치의 내부 전압 변환 회로
JP3076300B2 (ja) * 1998-04-20 2000-08-14 日本電気アイシーマイコンシステム株式会社 出力バッファ回路
US6744294B1 (en) * 1999-05-12 2004-06-01 Telefonaktiebolaget Lm Ericsson (Publ) Cascode signal driver with low harmonic content
JP2002231000A (ja) * 2001-02-05 2002-08-16 Mitsubishi Electric Corp 半導体記憶装置
JP3851791B2 (ja) * 2001-09-04 2006-11-29 株式会社東芝 半導体集積回路
US6686789B2 (en) * 2002-03-28 2004-02-03 Agere Systems, Inc. Dynamic low power reference circuit
US6759880B2 (en) * 2002-06-13 2004-07-06 Hewlett-Packard Development Company, L.P. Driver circuit connected to a switched capacitor and method of operating same
JP2004096493A (ja) * 2002-08-30 2004-03-25 Nec Electronics Corp パルス発生回路及び半導体装置

Also Published As

Publication number Publication date
US7053696B2 (en) 2006-05-30
US20060181339A1 (en) 2006-08-17
JP2004140144A (ja) 2004-05-13
US20040129980A1 (en) 2004-07-08

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