JP3639807B2 - 光学素子及び製造方法 - Google Patents
光学素子及び製造方法 Download PDFInfo
- Publication number
- JP3639807B2 JP3639807B2 JP2001244970A JP2001244970A JP3639807B2 JP 3639807 B2 JP3639807 B2 JP 3639807B2 JP 2001244970 A JP2001244970 A JP 2001244970A JP 2001244970 A JP2001244970 A JP 2001244970A JP 3639807 B2 JP3639807 B2 JP 3639807B2
- Authority
- JP
- Japan
- Prior art keywords
- axis
- optical
- optical system
- optical element
- intrinsic birefringence
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
- G03F7/7095—Materials, e.g. materials for housing, stage or other support having particular properties, e.g. weight, strength, conductivity, thermal expansion coefficient
- G03F7/70958—Optical materials or coatings, e.g. with particular transmittance, reflectance or anti-reflection properties
- G03F7/70966—Birefringence
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B1/00—Optical elements characterised by the material of which they are made; Optical coatings for optical elements
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B11/00—Single-crystal growth by normal freezing or freezing under temperature gradient, e.g. Bridgman-Stockbarger method
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/10—Inorganic compounds or compositions
- C30B29/12—Halides
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B1/00—Optical elements characterised by the material of which they are made; Optical coatings for optical elements
- G02B1/02—Optical elements characterised by the material of which they are made; Optical coatings for optical elements made of crystals, e.g. rock-salt, semi-conductors
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S117/00—Single-crystal, oriented-crystal, and epitaxy growth processes; non-coating apparatus therefor
- Y10S117/918—Single-crystal waveguide
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- Chemical & Material Sciences (AREA)
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Crystallography & Structural Chemistry (AREA)
- General Physics & Mathematics (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Optics & Photonics (AREA)
- Public Health (AREA)
- Epidemiology (AREA)
- Environmental & Geological Engineering (AREA)
- Health & Medical Sciences (AREA)
- Inorganic Chemistry (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Lenses (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
- Polarising Elements (AREA)
- Liquid Crystal (AREA)
- Pressure Sensors (AREA)
Priority Applications (9)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2001244970A JP3639807B2 (ja) | 2001-06-27 | 2001-07-06 | 光学素子及び製造方法 |
| US09/934,947 US7102828B2 (en) | 2001-06-27 | 2001-08-22 | Optical element and manufacturing method thereof |
| TW091108576A TWI244679B (en) | 2001-06-27 | 2002-04-25 | Optical element and manufacturing method therefor |
| DE60217673T DE60217673T2 (de) | 2001-06-27 | 2002-06-13 | Belichtungsvorrichtung mit einem optischen Element aus isometrischem Kristall |
| KR1020037014060A KR100544394B1 (ko) | 2001-06-27 | 2002-06-13 | 광학소자 및 그 제조방법 |
| EP02736104A EP1399766B1 (en) | 2001-06-27 | 2002-06-13 | Exposure apparatus comprising an optical element made of an isometric crystal |
| PCT/JP2002/005952 WO2003003072A2 (en) | 2001-06-27 | 2002-06-13 | Optical element and manufacturing method therefor |
| AT02736104T ATE352048T1 (de) | 2001-06-27 | 2002-06-13 | Belichtungsvorrichtung mit einem optischen element aus isometrischem kristall |
| US10/684,294 US7262920B2 (en) | 2001-06-27 | 2003-10-10 | Optical element and manufacturing method therefor |
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2001234254 | 2001-06-27 | ||
| JP2001-234254 | 2001-06-27 | ||
| JP2001244970A JP3639807B2 (ja) | 2001-06-27 | 2001-07-06 | 光学素子及び製造方法 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2003131002A JP2003131002A (ja) | 2003-05-08 |
| JP3639807B2 true JP3639807B2 (ja) | 2005-04-20 |
| JP2003131002A5 JP2003131002A5 (enExample) | 2005-07-28 |
Family
ID=26619804
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2001244970A Expired - Fee Related JP3639807B2 (ja) | 2001-06-27 | 2001-07-06 | 光学素子及び製造方法 |
Country Status (8)
| Country | Link |
|---|---|
| US (2) | US7102828B2 (enExample) |
| EP (1) | EP1399766B1 (enExample) |
| JP (1) | JP3639807B2 (enExample) |
| KR (1) | KR100544394B1 (enExample) |
| AT (1) | ATE352048T1 (enExample) |
| DE (1) | DE60217673T2 (enExample) |
| TW (1) | TWI244679B (enExample) |
| WO (1) | WO2003003072A2 (enExample) |
Families Citing this family (124)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE10028434B4 (de) * | 2000-06-14 | 2005-09-29 | Ludwig Felser | Stahlbausystem |
| WO2002031570A1 (en) * | 2000-10-10 | 2002-04-18 | Nikon Corporation | Method of evaluating imaging performance |
| US7239447B2 (en) * | 2001-05-15 | 2007-07-03 | Carl Zeiss Smt Ag | Objective with crystal lenses |
| KR20040015251A (ko) * | 2001-05-15 | 2004-02-18 | 칼 짜이스 에스엠티 아게 | 불화물 결정 렌즈들을 포함하는 렌즈 시스템 |
| DE10210782A1 (de) * | 2002-03-12 | 2003-10-09 | Zeiss Carl Smt Ag | Objektiv mit Kristall-Linsen |
| DE10123725A1 (de) | 2001-05-15 | 2002-11-21 | Zeiss Carl | Projektionsbelichtungsanlage der Mikrolithographie, Optisches System und Herstellverfahren |
| US6683710B2 (en) * | 2001-06-01 | 2004-01-27 | Optical Research Associates | Correction of birefringence in cubic crystalline optical systems |
| US20030011893A1 (en) * | 2001-06-20 | 2003-01-16 | Nikon Corporation | Optical system and exposure apparatus equipped with the optical system |
| US6831731B2 (en) * | 2001-06-28 | 2004-12-14 | Nikon Corporation | Projection optical system and an exposure apparatus with the projection optical system |
| US6788389B2 (en) * | 2001-07-10 | 2004-09-07 | Nikon Corporation | Production method of projection optical system |
| US6775063B2 (en) | 2001-07-10 | 2004-08-10 | Nikon Corporation | Optical system and exposure apparatus having the optical system |
| US6844915B2 (en) * | 2001-08-01 | 2005-01-18 | Nikon Corporation | Optical system and exposure apparatus provided with the optical system |
| KR20040032994A (ko) * | 2001-09-07 | 2004-04-17 | 가부시키가이샤 니콘 | 광학계 및 이 광학계를 구비한 노광장치, 그리고디바이스의 제조방법 |
| US20030070606A1 (en) * | 2001-10-05 | 2003-04-17 | Leblond Nicolas | Preparation of feedstock of alkaline earth and alkali metal fluorides |
| US7453641B2 (en) | 2001-10-30 | 2008-11-18 | Asml Netherlands B.V. | Structures and methods for reducing aberration in optical systems |
| US6970232B2 (en) * | 2001-10-30 | 2005-11-29 | Asml Netherlands B.V. | Structures and methods for reducing aberration in integrated circuit fabrication systems |
| US6995908B2 (en) * | 2001-10-30 | 2006-02-07 | Asml Netherlands B.V. | Methods for reducing aberration in optical systems |
| DE10162796B4 (de) * | 2001-12-20 | 2007-10-31 | Carl Zeiss Smt Ag | Verfahren zur Optimierung der Abbildungseigenschaften von mindestens zwei optischen Elementen sowie photolithographisches Fertigungsverfahren |
| US7075721B2 (en) * | 2002-03-06 | 2006-07-11 | Corning Incorporated | Compensator for radially symmetric birefringence |
| JP2003309059A (ja) * | 2002-04-17 | 2003-10-31 | Nikon Corp | 投影光学系、その製造方法、露光装置および露光方法 |
| JP4333078B2 (ja) * | 2002-04-26 | 2009-09-16 | 株式会社ニコン | 投影光学系、該投影光学系を備えた露光装置および該投影光学系を用いた露光方法並びにデバイス製造方法 |
| US7292388B2 (en) * | 2002-05-08 | 2007-11-06 | Carl Zeiss Smt Ag | Lens made of a crystalline material |
| JP2004045692A (ja) * | 2002-07-11 | 2004-02-12 | Canon Inc | 投影光学系、露光装置及びデバイス製造方法 |
| US7072102B2 (en) * | 2002-08-22 | 2006-07-04 | Asml Netherlands B.V. | Methods for reducing polarization aberration in optical systems |
| DE10345895B4 (de) * | 2002-10-01 | 2015-11-05 | Nikon Corp. | Verfahren zur Herstellung eines durch einen Fluoridkristall gebildeten optischen Elements |
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| US7463422B2 (en) * | 2004-01-14 | 2008-12-09 | Carl Zeiss Smt Ag | Projection exposure apparatus |
| US7239450B2 (en) | 2004-11-22 | 2007-07-03 | Carl Zeiss Smt Ag | Method of determining lens materials for a projection exposure apparatus |
| JP4776891B2 (ja) * | 2004-04-23 | 2011-09-21 | キヤノン株式会社 | 照明光学系、露光装置、及びデバイス製造方法 |
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| EP1399766A2 (en) | 2004-03-24 |
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| DE60217673D1 (de) | 2007-03-08 |
| US7102828B2 (en) | 2006-09-05 |
| KR100544394B1 (ko) | 2006-01-23 |
| US20030000453A1 (en) | 2003-01-02 |
| US20040136084A1 (en) | 2004-07-15 |
| US7262920B2 (en) | 2007-08-28 |
| WO2003003072A2 (en) | 2003-01-09 |
| JP2003131002A (ja) | 2003-05-08 |
| EP1399766B1 (en) | 2007-01-17 |
| ATE352048T1 (de) | 2007-02-15 |
| TWI244679B (en) | 2005-12-01 |
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