JP2019512701A - 粒子特性評価 - Google Patents

粒子特性評価 Download PDF

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Publication number
JP2019512701A
JP2019512701A JP2018548932A JP2018548932A JP2019512701A JP 2019512701 A JP2019512701 A JP 2019512701A JP 2018548932 A JP2018548932 A JP 2018548932A JP 2018548932 A JP2018548932 A JP 2018548932A JP 2019512701 A JP2019512701 A JP 2019512701A
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sample
light
detector
paths
illumination
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JP2019512701A5 (enExample
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ジェイソン コルベット
ジェイソン コルベット
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マルバーン パナリティカル リミテッド
マルバーン パナリティカル リミテッド
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Publication of JP2019512701A publication Critical patent/JP2019512701A/ja
Publication of JP2019512701A5 publication Critical patent/JP2019512701A5/ja
Priority to JP2022144522A priority Critical patent/JP7444941B2/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/02—Investigating particle size or size distribution
    • G01N15/0205—Investigating particle size or size distribution by optical means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/02—Investigating particle size or size distribution
    • G01N15/0205—Investigating particle size or size distribution by optical means
    • G01N15/0211—Investigating a scatter or diffraction pattern
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/01—Arrangements or apparatus for facilitating the optical investigation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/49—Scattering, i.e. diffuse reflection within a body or fluid
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/02—Investigating particle size or size distribution
    • G01N15/0205—Investigating particle size or size distribution by optical means
    • G01N15/0211—Investigating a scatter or diffraction pattern
    • G01N2015/0222—Investigating a scatter or diffraction pattern from dynamic light scattering, e.g. photon correlation spectroscopy
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N2015/03—Electro-optical investigation of a plurality of particles, the analyser being characterised by the optical arrangement
    • G01N2015/035—Electro-optical investigation of a plurality of particles, the analyser being characterised by the optical arrangement the optical arrangement forming an integrated apparatus with the sample container
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N2021/4704—Angular selective
    • G01N2021/4711—Multiangle measurement
    • G01N2021/4719—Multiangle measurement using a optical fibre array

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  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Dispersion Chemistry (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP2018548932A 2016-03-16 2017-03-16 粒子特性評価 Pending JP2019512701A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2022144522A JP7444941B2 (ja) 2016-03-16 2022-09-12 粒子特性評価

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
GBGB1604460.4A GB201604460D0 (en) 2016-03-16 2016-03-16 Dynamic light scattering
GB1604460.4 2016-03-16
PCT/GB2017/050733 WO2017158368A1 (en) 2016-03-16 2017-03-16 Particle characterisation

Related Child Applications (1)

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JP2022144522A Division JP7444941B2 (ja) 2016-03-16 2022-09-12 粒子特性評価

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JP2019512701A true JP2019512701A (ja) 2019-05-16
JP2019512701A5 JP2019512701A5 (enExample) 2019-06-20

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JP2022144522A Active JP7444941B2 (ja) 2016-03-16 2022-09-12 粒子特性評価

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US (2) US11187638B2 (enExample)
EP (2) EP3220128A1 (enExample)
JP (2) JP2019512701A (enExample)
CN (2) CN116359084A (enExample)
GB (1) GB201604460D0 (enExample)
WO (1) WO2017158368A1 (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20210124076A (ko) * 2020-04-06 2021-10-14 오츠카 일렉트로닉스 가부시키가이샤 입자경 측정 방법, 입자경 측정 장치 및 입자경 측정 프로그램

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EP3353527B1 (en) 2015-09-23 2022-12-28 Malvern Panalytical Limited Particle characterisation
US11002655B2 (en) 2015-09-23 2021-05-11 Malvern Panalytical Limited Cuvette carrier
GB201604460D0 (en) 2016-03-16 2016-04-27 Malvern Instr Ltd Dynamic light scattering
EP3379232A1 (en) 2017-03-23 2018-09-26 Malvern Panalytical Limited Particle characterisation
CN109030298B (zh) * 2018-11-01 2020-08-21 山东理工大学 一种利用后向散射纳米颗粒粒度测量装置实现的测量方法
CN109030299B (zh) * 2018-11-01 2020-08-21 山东理工大学 高浓度样品的后向散射纳米颗粒粒度测量装置的测量方法
EP3739321B1 (de) * 2019-05-17 2023-03-08 Xtal Concepts GmbH Qualifizierungsverfahren für kryoelektronenmikroskopie-proben sowie dazugehöriger probenhalter
CN111175203B (zh) * 2020-01-10 2022-04-05 广州市怡文环境科技股份有限公司 一种用于超低粉尘在线监测的检测系统
EP3922977B1 (en) * 2020-06-08 2024-08-07 Universität für Bodenkultur Wien Method for determining a property of a particle in a medium
CN112014284B (zh) * 2020-08-27 2023-11-24 苏州亿利安机电科技有限公司 直读式粉尘浓度测量仪
CN113959376A (zh) * 2021-10-12 2022-01-21 桂林电子科技大学 一种基于少模光纤的表面粗糙度测量系统
CN115791654A (zh) * 2022-11-09 2023-03-14 之江实验室 测量装置及测量方法

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Publication number Priority date Publication date Assignee Title
KR20210124076A (ko) * 2020-04-06 2021-10-14 오츠카 일렉트로닉스 가부시키가이샤 입자경 측정 방법, 입자경 측정 장치 및 입자경 측정 프로그램
KR102878211B1 (ko) 2020-04-06 2025-10-30 오츠카 일렉트로닉스 가부시키가이샤 입자경 측정 방법, 입자경 측정 장치 및 입자경 측정 프로그램

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US20190078990A1 (en) 2019-03-14
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US20220091006A1 (en) 2022-03-24
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GB201604460D0 (en) 2016-04-27
WO2017158368A1 (en) 2017-09-21
US11747257B2 (en) 2023-09-05
CN108627432A (zh) 2018-10-09
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