JP2019158478A5 - - Google Patents

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Publication number
JP2019158478A5
JP2019158478A5 JP2018043571A JP2018043571A JP2019158478A5 JP 2019158478 A5 JP2019158478 A5 JP 2019158478A5 JP 2018043571 A JP2018043571 A JP 2018043571A JP 2018043571 A JP2018043571 A JP 2018043571A JP 2019158478 A5 JP2019158478 A5 JP 2019158478A5
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JP
Japan
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electric signal
voltage
receiving element
light receiving
same
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JP2018043571A
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English (en)
Japanese (ja)
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JP2019158478A (ja
JP7071849B2 (ja
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Priority claimed from JP2018043571A external-priority patent/JP7071849B2/ja
Priority to JP2018043571A priority Critical patent/JP7071849B2/ja
Priority to US16/290,788 priority patent/US10705010B2/en
Priority to KR1020190024719A priority patent/KR102166583B1/ko
Priority to CN201910173746.5A priority patent/CN110243729B/zh
Priority to TW108107844A priority patent/TWI685650B/zh
Publication of JP2019158478A publication Critical patent/JP2019158478A/ja
Publication of JP2019158478A5 publication Critical patent/JP2019158478A5/ja
Publication of JP7071849B2 publication Critical patent/JP7071849B2/ja
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JP2018043571A 2018-03-09 2018-03-09 パーティクルカウンタ Active JP7071849B2 (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP2018043571A JP7071849B2 (ja) 2018-03-09 2018-03-09 パーティクルカウンタ
US16/290,788 US10705010B2 (en) 2018-03-09 2019-03-01 Particle counter
KR1020190024719A KR102166583B1 (ko) 2018-03-09 2019-03-04 파티클 카운터
CN201910173746.5A CN110243729B (zh) 2018-03-09 2019-03-07 粒子计数器
TW108107844A TWI685650B (zh) 2018-03-09 2019-03-08 粒子計數器

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2018043571A JP7071849B2 (ja) 2018-03-09 2018-03-09 パーティクルカウンタ

Publications (3)

Publication Number Publication Date
JP2019158478A JP2019158478A (ja) 2019-09-19
JP2019158478A5 true JP2019158478A5 (enExample) 2021-04-30
JP7071849B2 JP7071849B2 (ja) 2022-05-19

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JP2018043571A Active JP7071849B2 (ja) 2018-03-09 2018-03-09 パーティクルカウンタ

Country Status (5)

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US (1) US10705010B2 (enExample)
JP (1) JP7071849B2 (enExample)
KR (1) KR102166583B1 (enExample)
CN (1) CN110243729B (enExample)
TW (1) TWI685650B (enExample)

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EP4162253A4 (en) 2020-06-09 2024-07-03 Particle Measuring Systems, Inc. PARTICLE DETECTION VIA SCATTERED LIGHT IN COMBINATION WITH INCIDENT LIGHT
TW202346835A (zh) * 2022-01-21 2023-12-01 美商粒子監測系統有限公司 增強的雙遍次及多遍次粒子偵測
TW202507254A (zh) * 2023-06-06 2025-02-16 美商恩特葛瑞斯股份有限公司 光學顆粒計數器及方法
TW202507253A (zh) * 2023-06-06 2025-02-16 美商恩特葛瑞斯股份有限公司 光學顆粒計數器及方法
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