JP2018536994A5 - - Google Patents

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Publication number
JP2018536994A5
JP2018536994A5 JP2018527165A JP2018527165A JP2018536994A5 JP 2018536994 A5 JP2018536994 A5 JP 2018536994A5 JP 2018527165 A JP2018527165 A JP 2018527165A JP 2018527165 A JP2018527165 A JP 2018527165A JP 2018536994 A5 JP2018536994 A5 JP 2018536994A5
Authority
JP
Japan
Prior art keywords
lss
stop layer
support
solder stop
contact surface
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
JP2018527165A
Other languages
English (en)
Japanese (ja)
Other versions
JP2018536994A (ja
Filing date
Publication date
Priority claimed from DE102015120647.1A external-priority patent/DE102015120647B4/de
Application filed filed Critical
Publication of JP2018536994A publication Critical patent/JP2018536994A/ja
Publication of JP2018536994A5 publication Critical patent/JP2018536994A5/ja
Ceased legal-status Critical Current

Links

JP2018527165A 2015-11-27 2016-09-06 薄いはんだストップ層を備える電子部品及び製造方法 Ceased JP2018536994A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE102015120647.1 2015-11-27
DE102015120647.1A DE102015120647B4 (de) 2015-11-27 2015-11-27 Elektrisches Bauelement mit dünner Lot-Stopp-Schicht und Verfahren zur Herstellung
PCT/EP2016/070973 WO2017088998A1 (de) 2015-11-27 2016-09-06 Elektrisches bauelement mit dünner lot-stopp-schicht und verfahren zu seiner herstellung

Publications (2)

Publication Number Publication Date
JP2018536994A JP2018536994A (ja) 2018-12-13
JP2018536994A5 true JP2018536994A5 (enExample) 2019-09-26

Family

ID=56883787

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2018527165A Ceased JP2018536994A (ja) 2015-11-27 2016-09-06 薄いはんだストップ層を備える電子部品及び製造方法

Country Status (8)

Country Link
US (1) US20180331062A1 (enExample)
EP (1) EP3381052A1 (enExample)
JP (1) JP2018536994A (enExample)
KR (1) KR20180088798A (enExample)
CN (1) CN108369935A (enExample)
BR (1) BR112018010666A8 (enExample)
DE (1) DE102015120647B4 (enExample)
WO (1) WO2017088998A1 (enExample)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FI130166B (en) 2019-03-08 2023-03-23 Picosun Oy Solder mask
DE102023116055A1 (de) * 2023-06-20 2024-12-24 Ams-Osram International Gmbh Anschlussträger, verfahren zur herstellung einer lotverbindung und bauelement

Family Cites Families (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03218644A (ja) * 1990-01-24 1991-09-26 Sharp Corp 回路基板の接続構造
US5620131A (en) * 1995-06-15 1997-04-15 Lucent Technologies Inc. Method of solder bonding
US6294840B1 (en) * 1999-11-18 2001-09-25 Lsi Logic Corporation Dual-thickness solder mask in integrated circuit package
US6645791B2 (en) * 2001-04-23 2003-11-11 Fairchild Semiconductor Semiconductor die package including carrier with mask
EP1543549A1 (en) * 2002-09-20 2005-06-22 Honeywell International, Inc. Interlayer adhesion promoter for low k materials
WO2004059708A2 (en) * 2002-12-20 2004-07-15 Agere Systems Inc. Structure and method for bonding to copper interconnect structures
US6790759B1 (en) * 2003-07-31 2004-09-14 Freescale Semiconductor, Inc. Semiconductor device with strain relieving bump design
US7294451B2 (en) * 2003-11-18 2007-11-13 Texas Instruments Incorporated Raised solder-mask-defined (SMD) solder ball pads for a laminate electronic circuit board
US7132303B2 (en) * 2003-12-18 2006-11-07 Freescale Semiconductor, Inc. Stacked semiconductor device assembly and method for forming
KR100626617B1 (ko) * 2004-12-07 2006-09-25 삼성전자주식회사 반도체 패키지용 배선 기판의 볼 랜드 구조
JP4795112B2 (ja) * 2006-05-17 2011-10-19 株式会社フジクラ 接合基材の製造方法
JP5031403B2 (ja) * 2007-03-01 2012-09-19 京セラケミカル株式会社 封止用エポキシ樹脂組成物、樹脂封止型半導体装置及びその製造方法
US7812460B2 (en) * 2008-05-30 2010-10-12 Unimicron Technology Corp. Packaging substrate and method for fabricating the same
US9524945B2 (en) * 2010-05-18 2016-12-20 Taiwan Semiconductor Manufacturing Company, Ltd. Cu pillar bump with L-shaped non-metal sidewall protection structure
US8922004B2 (en) * 2010-06-11 2014-12-30 Taiwan Semiconductor Manufacturing Company, Ltd. Copper bump structures having sidewall protection layers
TWI575684B (zh) * 2011-06-13 2017-03-21 矽品精密工業股份有限公司 晶片尺寸封裝件
KR101307436B1 (ko) * 2011-11-10 2013-09-12 (주)유우일렉트로닉스 Mems 센서 패키징 및 그 방법
US10192804B2 (en) * 2012-07-09 2019-01-29 Taiwan Semiconductor Manufacturing Company, Ltd. Bump-on-trace packaging structure and method for forming the same
GB2520952A (en) * 2013-12-04 2015-06-10 Ibm Flip-chip electronic device with carrier having heat dissipation elements free of solder mask
CN104637967A (zh) * 2015-02-13 2015-05-20 苏州晶方半导体科技股份有限公司 封装方法及封装结构
US9859234B2 (en) * 2015-08-06 2018-01-02 Invensas Corporation Methods and structures to repair device warpage

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