JP2018506858A - 落下防止機能を有する半導体デバイス洗浄装置、および、その装置を備えるチャンバ - Google Patents
落下防止機能を有する半導体デバイス洗浄装置、および、その装置を備えるチャンバ Download PDFInfo
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- 238000004140 cleaning Methods 0.000 title claims abstract description 98
- 239000004065 semiconductor Substances 0.000 title claims abstract description 58
- 230000002265 prevention Effects 0.000 title claims abstract description 48
- 238000000034 method Methods 0.000 claims abstract description 23
- 238000002604 ultrasonography Methods 0.000 claims description 42
- 239000007921 spray Substances 0.000 claims description 33
- 239000007788 liquid Substances 0.000 claims description 20
- 230000003287 optical effect Effects 0.000 claims description 15
- 239000000126 substance Substances 0.000 claims description 11
- 238000011010 flushing procedure Methods 0.000 claims description 6
- 238000012544 monitoring process Methods 0.000 claims description 4
- 230000001960 triggered effect Effects 0.000 claims description 4
- 238000007599 discharging Methods 0.000 claims description 3
- 238000005406 washing Methods 0.000 description 7
- 238000010586 diagram Methods 0.000 description 6
- 238000005259 measurement Methods 0.000 description 6
- 239000002245 particle Substances 0.000 description 4
- 238000012545 processing Methods 0.000 description 2
- 238000006243 chemical reaction Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000007774 longterm Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67028—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H01L21/6704—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
- H01L21/67051—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing using mainly spraying means, e.g. nozzles
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B13/00—Accessories or details of general applicability for machines or apparatus for cleaning
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B3/00—Cleaning by methods involving the use or presence of liquid or steam
- B08B3/02—Cleaning by the force of jets or sprays
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B3/00—Cleaning by methods involving the use or presence of liquid or steam
- B08B3/02—Cleaning by the force of jets or sprays
- B08B3/024—Cleaning by means of spray elements moving over the surface to be cleaned
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B3/00—Cleaning by methods involving the use or presence of liquid or steam
- B08B3/04—Cleaning involving contact with liquid
- B08B3/08—Cleaning involving contact with liquid the liquid having chemical or dissolving effect
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B3/00—Cleaning by methods involving the use or presence of liquid or steam
- B08B3/04—Cleaning involving contact with liquid
- B08B3/10—Cleaning involving contact with liquid with additional treatment of the liquid or of the object being cleaned, e.g. by heat, by electricity or by vibration
- B08B3/12—Cleaning involving contact with liquid with additional treatment of the liquid or of the object being cleaned, e.g. by heat, by electricity or by vibration by sonic or ultrasonic vibrations
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B5/00—Cleaning by methods involving the use of air flow or gas flow
- B08B5/02—Cleaning by the force of jets, e.g. blowing-out cavities
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B9/00—Cleaning hollow articles by methods or apparatus specially adapted thereto
-
- G—PHYSICS
- G08—SIGNALLING
- G08B—SIGNALLING OR CALLING SYSTEMS; ORDER TELEGRAPHS; ALARM SYSTEMS
- G08B21/00—Alarms responsive to a single specified undesired or abnormal condition and not otherwise provided for
- G08B21/18—Status alarms
- G08B21/182—Level alarms, e.g. alarms responsive to variables exceeding a threshold
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67242—Apparatus for monitoring, sorting or marking
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/683—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
- H01L21/687—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B2203/00—Details of cleaning machines or methods involving the use or presence of liquid or steam
- B08B2203/02—Details of machines or methods for cleaning by the force of jets or sprays
- B08B2203/0288—Ultra or megasonic jets
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/14—Measuring arrangements characterised by the use of optical techniques for measuring distance or clearance between spaced objects or spaced apertures
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
- G01B5/14—Measuring arrangements characterised by the use of mechanical techniques for measuring distance or clearance between spaced objects or spaced apertures
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
- G01B7/14—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring distance or clearance between spaced objects or spaced apertures
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- Condensed Matter Physics & Semiconductors (AREA)
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- Cleaning By Liquid Or Steam (AREA)
Abstract
Description
Claims (26)
- キャリアに接続されたノズルと、
前記キャリアに固定され、洗浄工程において前記ノズルと共に使用されるメガソニック/超音波装置と、
前記メガソニック/超音波装置が緩み落下するか否かの判断のために、前記メガソニック/超音波装置と前記キャリアとの距離を検出するセンサとを備えている、落下防止機能を有する半導体デバイス洗浄装置。 - 前記メガソニック/超音波装置は、少なくとも一組のネジおよびナットで前記キャリアに固定されており、前記メガソニック/超音波装置と前記キャリアとの間の距離が前記少なくとも一組のネジおよびナットを緩める又は締めることで調整されることを特徴とする請求項1に記載の落下防止機能を有する半導体デバイス洗浄装置。
- 前記センサは、圧力センサ、光センサ及び電気センサのいずれかであることを特徴とする請求項1に記載の落下防止機能を有する半導体デバイス洗浄装置。
- 前記センサの出力が前記メガソニック/超音波装置と前記キャリアとの距離に比例することを特徴とする請求項1に記載の落下防止機能を有する半導体デバイス洗浄装置。
- 前記センサの出力がセンサ信号であり、前記メガソニック/超音波装置との距離が最小値のときは、前記センサ信号が「0」であることを特徴とする請求項4に記載の落下防止機能を有する半導体デバイス洗浄装置。
- 前記センサの精度は0.01mm以上であることを特徴とする請求項1に記載の落下防止機能を有する半導体デバイス洗浄装置。
- 前記落下防止機能を有する半導体デバイス洗浄装置は、前記センサに接続された自動警報器をさらに備えていることを特徴とする請求項1に記載の落下防止機能を有する半導体デバイス洗浄装置。
- 前記自動警報器は前記センサの出力が所定の閾値を超えるとトリガされることを特徴とする請求項7に記載の落下防止機能を有する半導体デバイス洗浄装置。
- 前記落下防止機能を有する半導体デバイス洗浄装置は、当該装置を移動させるスイングアームをさらに備えることを特徴とする請求項1に記載の落下防止機能を有する半導体デバイス洗浄装置。
- 落下防止機能を有する半導体デバイス洗浄装置であって、キャリアに接続されたノズルと、前記キャリアに固定され、洗浄工程において前記ノズルと共に使用されるメガソニック/超音波装置と、前記メガソニック/超音波装置が緩んで落下するか否かの判断のために、前記メガソニック/超音波装置と前記キャリアとの距離を検出するセンサとを備える落下防止機能を有する半導体デバイス洗浄装置と、
前記半導体デバイスを保持および回転させるチャックと、
前記半導体デバイスの上方で前後に揺動し薬液又は気体を噴霧して前記半導体デバイスを洗浄するスイングスプレーヘッドと、
前記スイングスプレーヘッドまたは前記メガソニック/超音波装置をフラッシングまたは洗浄するための少なくとも二つのトレイとを備えている、チャンバ。 - 前記メガソニック/超音波装置は、少なくとも一組のネジおよびナットで前記キャリアに固定されており、前記メガソニック/超音波装置と前記キャリアとの間の距離が前記少なくとも一組のネジおよびナットを緩める又は締めることで調整されることを特徴とする請求項10に記載のチャンバ。
- 前記センサは、圧力センサ、光センサ及び電気センサのいずれかであることを特徴とする請求項10に記載のチャンバ。
- 前記センサの出力が前記メガソニック/超音波装置と前記キャリアとの距離に比例することを特徴とする請求項10に記載のチャンバ。
- 前記センサの出力がセンサ信号であり、前記メガソニック/超音波装置との距離が最小値のときは、前記センサ信号が「0」であることを特徴とする請求項13に記載のチャンバ。
- 前記落下防止機能を有する半導体デバイス洗浄装置は、当該装置を移動させるスイングアームをさらに備えることを特徴とする請求項10に記載のチャンバ。
- 前記スイングアームは、アイドリング期間において第一アイドリング位置に留まり、前記少なくとも二つのトレイのうちの一つの上に前記メガソニック/超音波装置を維持することを特徴とする請求項15に記載のチャンバ。
- 前記スイングスプレーヘッドは、アイドリング期間において第二アイドリング位置に留まり、前記少なくとも二つのトレイのうちの一つの上に前記スイングスプレーヘッドを維持することを特徴とする請求項10に記載のチャンバ。
- 前記少なくとも二つのトレイはそれぞれ、内側トレイと外側トレイとを有しており、前記内側トレイは前記外側トレイの内側に配置されており前記外側トレイよりも低い側壁を有することを特徴とする請求項10に記載のチャンバ。
- 前記内側トレイと前記外側トレイの両方が排出口を有することを特徴とする請求項18に記載のチャンバ。
- 前記少なくとも二つのトレイはそれぞれ、前記スイングスプレーヘッドまたは前記メガソニック/超音波装置に液体を吐出してフラッシングまたは洗浄を行う吐出ヘッドを有することを特徴とする請求項10に記載のチャンバ。
- 前記落下防止機能を有する半導体デバイス洗浄装置は、当該装置を上下に移動させる垂直アクチュエータをさらに備えていることを特徴とする請求項10に記載のチャンバ。
- 前記センサの精度は0.01mm以上であることを特徴とする請求項10に記載のチャンバ。
- 前記落下防止機能を有する半導体デバイス洗浄装置は、前記センサに接続される自動警報器をさらに備えていることを特徴とする請求項10に記載のチャンバ。
- 前記自動警報器は前記センサの出力が所定の閾値を超えるとトリガされることを特徴とする請求項23に記載のチャンバ。
- 前記ノズルおよび前記スイングスプレーヘッドは、関連する技術的パラメータを検出する監視システムに接続されていることを特徴とする請求項10に記載のチャンバ。
- 前記チャンバは、前記スイングアームが曲がっているかどうかを検出するための少なくとも一対の変換器をさらに備えていることを特徴とする請求項14に記載のチャンバ。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
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CN201510081989.8A CN105983552B (zh) | 2015-02-15 | 2015-02-15 | 一种防掉落的半导体清洗装置 |
CN201510081989.8 | 2015-02-15 | ||
PCT/CN2015/089096 WO2016127635A1 (en) | 2015-02-15 | 2015-09-08 | A fall-proof apparatus for cleaning semiconductor devices and a chamber with the apparatus |
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JP2018506858A true JP2018506858A (ja) | 2018-03-08 |
JP6591555B2 JP6591555B2 (ja) | 2019-10-16 |
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US (1) | US10770315B2 (ja) |
JP (1) | JP6591555B2 (ja) |
KR (1) | KR102382343B1 (ja) |
CN (2) | CN105983552B (ja) |
SG (1) | SG11201706200UA (ja) |
WO (1) | WO2016127635A1 (ja) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2023502332A (ja) * | 2019-11-01 | 2023-01-24 | エーシーエム リサーチ (シャンハイ) インコーポレーテッド | 基板の洗浄方法及び洗浄装置 |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN109158236B (zh) * | 2018-08-20 | 2023-11-07 | 华电电力科学研究院有限公司 | 一种热电厂燃机压气机清洗用高压喷头及清洗方法 |
CN117299666A (zh) * | 2022-06-23 | 2023-12-29 | 盛美半导体设备(上海)股份有限公司 | 基板处理设备 |
CN118293767B (zh) * | 2024-06-06 | 2024-08-23 | 南安市装备制造业技术研究院 | 一种市政道路交通测量工具 |
Family Cites Families (36)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4064885A (en) * | 1976-10-26 | 1977-12-27 | Branson Ultrasonics Corporation | Apparatus for cleaning workpieces by ultrasonic energy |
US4326553A (en) * | 1980-08-28 | 1982-04-27 | Rca Corporation | Megasonic jet cleaner apparatus |
US5368054A (en) * | 1993-12-17 | 1994-11-29 | International Business Machines Corporation | Ultrasonic jet semiconductor wafer cleaning apparatus |
US5745946A (en) * | 1994-07-15 | 1998-05-05 | Ontrak Systems, Inc. | Substrate processing system |
US5950643A (en) * | 1995-09-06 | 1999-09-14 | Miyazaki; Takeshiro | Wafer processing system |
US5980647A (en) * | 1997-07-15 | 1999-11-09 | International Business Machines Corporation | Metal removal cleaning process and apparatus |
US6260562B1 (en) * | 1997-10-20 | 2001-07-17 | Dainippon Screen Mfg. Co., Ltd. | Substrate cleaning apparatus and method |
JP3333733B2 (ja) * | 1998-02-20 | 2002-10-15 | 東京エレクトロン株式会社 | 洗浄装置 |
JP2001044467A (ja) * | 1999-07-29 | 2001-02-16 | Kanegafuchi Chem Ind Co Ltd | 集積型薄膜太陽電池の洗浄装置 |
US6495463B2 (en) * | 1999-09-28 | 2002-12-17 | Strasbaugh | Method for chemical mechanical polishing |
US6539952B2 (en) * | 2000-04-25 | 2003-04-01 | Solid State Equipment Corp. | Megasonic treatment apparatus |
JP2001334221A (ja) * | 2000-05-26 | 2001-12-04 | Dainippon Screen Mfg Co Ltd | 基板洗浄装置 |
US6730176B2 (en) * | 2001-07-09 | 2004-05-04 | Birol Kuyel | Single wafer megasonic cleaner method, system, and apparatus |
US6848455B1 (en) * | 2002-04-22 | 2005-02-01 | Novellus Systems, Inc. | Method and apparatus for removing photoresist and post-etch residue from semiconductor substrates by in-situ generation of oxidizing species |
US7185661B2 (en) * | 2002-05-06 | 2007-03-06 | Akrion Technologies, Inc. | Reciprocating megasonic probe |
JP2003340386A (ja) * | 2002-05-23 | 2003-12-02 | Toshiba Corp | 超音波洗浄装置及び超音波洗浄方法 |
EP2966670B1 (en) * | 2004-06-09 | 2017-02-22 | Nikon Corporation | Exposure apparatus and device manufacturing method |
US20070175502A1 (en) * | 2004-07-30 | 2007-08-02 | I.P. Foundry, Inc. | Apparatus and method for delivering acoustic energy through a liquid stream to a target object for disruptive surface cleaning or treating effects |
KR101369197B1 (ko) * | 2006-01-20 | 2014-03-27 | 아크리온 테크놀로지즈 인코포레이티드 | 평평한 물품을 처리하는 음향 에너지 시스템, 방법 및 장치 |
JP5132108B2 (ja) * | 2006-02-02 | 2013-01-30 | 株式会社Sokudo | 基板処理装置 |
JP2007290111A (ja) * | 2006-03-29 | 2007-11-08 | Ebara Corp | 研磨方法および研磨装置 |
JP4700570B2 (ja) * | 2006-07-14 | 2011-06-15 | 株式会社新川 | ボンディング装置並びにボンディングツール先端部の洗浄方法及びプログラム |
KR100800174B1 (ko) * | 2006-10-20 | 2008-02-01 | 한국기계연구원 | 메가소닉 세정모듈 |
US8052797B2 (en) * | 2006-10-24 | 2011-11-08 | Asahi Glass Company, Limited | Method for removing foreign matter from substrate surface |
US8327861B2 (en) * | 2006-12-19 | 2012-12-11 | Lam Research Corporation | Megasonic precision cleaning of semiconductor process equipment components and parts |
TWI421933B (zh) * | 2007-05-16 | 2014-01-01 | Lam Res Corp | 板狀物件之超音波濕式處理的裝置與方法 |
US7913561B2 (en) * | 2008-02-05 | 2011-03-29 | Olympus Medical Systems Corp. | Ultrasonic wave vibrating apparatus |
KR100964871B1 (ko) * | 2008-07-07 | 2010-06-23 | 세메스 주식회사 | 패드 컨디셔닝 유닛 및 이를 구비한 매엽식 기판 연마 장치 |
JP5648047B2 (ja) * | 2009-03-31 | 2015-01-07 | エーシーエム リサーチ (シャンハイ) インコーポレーテッド | 半導体ウェハの洗浄方法及び洗浄装置 |
EP2270838B1 (en) * | 2009-07-02 | 2019-06-12 | IMEC vzw | Method and apparatus for controlling optimal operation of acoustic cleaning |
US9044794B2 (en) * | 2009-12-31 | 2015-06-02 | Lam Research Ag | Ultrasonic cleaning fluid, method and apparatus |
US9721754B2 (en) * | 2011-04-26 | 2017-08-01 | Carl Zeiss Smt Gmbh | Method and apparatus for processing a substrate with a focused particle beam |
CN202290654U (zh) * | 2011-10-10 | 2012-07-04 | 北京七星华创电子股份有限公司 | 兆声波清洗头及具有该清洗头的兆声波清洗系统 |
US9385020B2 (en) * | 2011-12-19 | 2016-07-05 | SCREEN Holdings Co., Ltd. | Substrate holding and rotating device, substrate treatment apparatus including the device, and substrate treatment method |
US9821348B2 (en) * | 2013-10-22 | 2017-11-21 | Taiwan Semiconductor Manufacturing Company, Ltd. | Method and apparatus for water edge exposure and backside cleaning |
JP6386769B2 (ja) * | 2014-04-16 | 2018-09-05 | 株式会社荏原製作所 | 基板乾燥装置、制御プログラム、及び基板乾燥方法 |
-
2015
- 2015-02-15 CN CN201510081989.8A patent/CN105983552B/zh active Active
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- 2015-09-08 KR KR1020177023766A patent/KR102382343B1/ko active IP Right Grant
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JP2023502332A (ja) * | 2019-11-01 | 2023-01-24 | エーシーエム リサーチ (シャンハイ) インコーポレーテッド | 基板の洗浄方法及び洗浄装置 |
JP7437499B2 (ja) | 2019-11-01 | 2024-02-22 | エーシーエム リサーチ (シャンハイ) インコーポレーテッド | 基板の洗浄方法及び洗浄装置 |
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CN105983552B (zh) | 2019-12-24 |
CN107210208A (zh) | 2017-09-26 |
CN105983552A (zh) | 2016-10-05 |
JP6591555B2 (ja) | 2019-10-16 |
KR20170113595A (ko) | 2017-10-12 |
WO2016127635A1 (en) | 2016-08-18 |
US20180033654A1 (en) | 2018-02-01 |
US10770315B2 (en) | 2020-09-08 |
CN107210208B (zh) | 2020-05-19 |
KR102382343B1 (ko) | 2022-04-04 |
SG11201706200UA (en) | 2017-08-30 |
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