JP2018078284A5 - - Google Patents

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Publication number
JP2018078284A5
JP2018078284A5 JP2017202502A JP2017202502A JP2018078284A5 JP 2018078284 A5 JP2018078284 A5 JP 2018078284A5 JP 2017202502 A JP2017202502 A JP 2017202502A JP 2017202502 A JP2017202502 A JP 2017202502A JP 2018078284 A5 JP2018078284 A5 JP 2018078284A5
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JP
Japan
Prior art keywords
pedestal
substrate
cavity
annular band
pedestal body
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Application number
JP2017202502A
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English (en)
Japanese (ja)
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JP7096538B2 (ja
JP2018078284A (ja
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Priority claimed from US15/431,088 external-priority patent/US10622243B2/en
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Publication of JP2018078284A publication Critical patent/JP2018078284A/ja
Publication of JP2018078284A5 publication Critical patent/JP2018078284A5/ja
Priority to JP2022093471A priority Critical patent/JP7373022B2/ja
Application granted granted Critical
Publication of JP7096538B2 publication Critical patent/JP7096538B2/ja
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JP2017202502A 2016-10-28 2017-10-19 開放空間均圧化通路および側方閉じ込めを備えた平坦な基板縁部接触部 Active JP7096538B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2022093471A JP7373022B2 (ja) 2016-10-28 2022-06-09 開放空間均圧化通路および側方閉じ込めを備えた平坦な基板縁部接触部

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
US201662414072P 2016-10-28 2016-10-28
US62/414,072 2016-10-28
US15/431,088 US10622243B2 (en) 2016-10-28 2017-02-13 Planar substrate edge contact with open volume equalization pathways and side containment
US15/431,088 2017-02-13

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2022093471A Division JP7373022B2 (ja) 2016-10-28 2022-06-09 開放空間均圧化通路および側方閉じ込めを備えた平坦な基板縁部接触部

Publications (3)

Publication Number Publication Date
JP2018078284A JP2018078284A (ja) 2018-05-17
JP2018078284A5 true JP2018078284A5 (https=) 2020-12-24
JP7096538B2 JP7096538B2 (ja) 2022-07-06

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ID=62021826

Family Applications (2)

Application Number Title Priority Date Filing Date
JP2017202502A Active JP7096538B2 (ja) 2016-10-28 2017-10-19 開放空間均圧化通路および側方閉じ込めを備えた平坦な基板縁部接触部
JP2022093471A Active JP7373022B2 (ja) 2016-10-28 2022-06-09 開放空間均圧化通路および側方閉じ込めを備えた平坦な基板縁部接触部

Family Applications After (1)

Application Number Title Priority Date Filing Date
JP2022093471A Active JP7373022B2 (ja) 2016-10-28 2022-06-09 開放空間均圧化通路および側方閉じ込めを備えた平坦な基板縁部接触部

Country Status (6)

Country Link
US (2) US10622243B2 (https=)
JP (2) JP7096538B2 (https=)
KR (3) KR102430432B1 (https=)
CN (2) CN108091592B (https=)
SG (1) SG10201708448UA (https=)
TW (1) TWI765924B (https=)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10622243B2 (en) * 2016-10-28 2020-04-14 Lam Research Corporation Planar substrate edge contact with open volume equalization pathways and side containment
KR20200130743A (ko) 2018-04-04 2020-11-19 램 리써치 코포레이션 시일 표면을 갖는 정전 척
SG11202010375QA (en) 2018-04-20 2020-11-27 Lam Res Corp Edge exclusion control
CN109594063A (zh) * 2018-12-27 2019-04-09 西安奕斯伟硅片技术有限公司 一种外延反应设备
US12110586B2 (en) 2019-02-08 2024-10-08 Lam Research Corporation Pedestals for modulating film properties in atomic layer deposition (ALD) substrate processing chambers
KR20220012999A (ko) * 2020-02-11 2022-02-04 램 리써치 코포레이션 웨이퍼 베벨/에지 상의 증착을 제어하기 위한 캐리어 링 설계들
US11577665B2 (en) 2020-02-27 2023-02-14 Cpk Interior Products Urethane and graphene interior trim panel
DE102020105538A1 (de) 2020-03-02 2021-09-02 Aixtron Se Vorrichtung zur Halterung eines Substrates in einem CVD-Reaktor
EP3970489A1 (en) 2020-09-18 2022-03-23 CpK Interior Products Inc. Graphene-based antiviral polymer
US11781212B2 (en) * 2021-04-07 2023-10-10 Applied Material, Inc. Overlap susceptor and preheat ring
DE102021126019A1 (de) 2021-10-07 2023-04-13 Aixtron Se CVD-Reaktor mit einem Tragring beziehungsweise Tragring für ein Substrat
US20240014065A1 (en) * 2022-07-08 2024-01-11 Applied Materials, Inc. Flat susceptor with grid pattern and venting grooves on surface thereof
US20250112158A1 (en) 2023-10-03 2025-04-03 Nanya Technology Corporation Contact structure, semiconductor device comprising the same, and method for fabricating the same

Family Cites Families (33)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2955829A (en) * 1958-07-16 1960-10-11 George F Brewster Work holding chuck
JP3453834B2 (ja) * 1994-02-25 2003-10-06 三菱電機株式会社 ウエハチャック装置および半導体製造装置
JP2001525997A (ja) 1997-05-20 2001-12-11 東京エレクトロン株式会社 処理装置
JPH11111707A (ja) * 1997-10-07 1999-04-23 Hitachi Electron Eng Co Ltd 気相成長装置
US6219219B1 (en) 1998-09-30 2001-04-17 Applied Materials, Inc. Cathode assembly containing an electrostatic chuck for retaining a wafer in a semiconductor wafer processing system
US6179921B1 (en) * 1999-04-19 2001-01-30 Applied Materials, Inc. Backside gas delivery system for a semiconductor wafer processing system
US20050000449A1 (en) * 2001-12-21 2005-01-06 Masayuki Ishibashi Susceptor for epitaxial growth and epitaxial growth method
JP2003197532A (ja) * 2001-12-21 2003-07-11 Sumitomo Mitsubishi Silicon Corp エピタキシャル成長方法及びエピタキシャル成長用サセプター
US7252738B2 (en) * 2002-09-20 2007-08-07 Lam Research Corporation Apparatus for reducing polymer deposition on a substrate and substrate support
US20040099375A1 (en) * 2002-11-21 2004-05-27 Yanghua He Edge-contact ring for a wafer pedestal
JP4317731B2 (ja) 2003-10-27 2009-08-19 豊田合成株式会社 エアバッグを備えたシートベルト
JP4421874B2 (ja) * 2003-10-31 2010-02-24 東京エレクトロン株式会社 プラズマ処理装置及びプラズマ処理方法
JP2006005177A (ja) 2004-06-17 2006-01-05 Tokyo Electron Ltd 熱処理装置
JP4534619B2 (ja) 2004-06-21 2010-09-01 株式会社Sumco 半導体シリコン基板用熱処理治具
US7244311B2 (en) * 2004-10-13 2007-07-17 Lam Research Corporation Heat transfer system for improved semiconductor processing uniformity
WO2007022471A2 (en) 2005-08-17 2007-02-22 Applied Materials, Inc. Substrate support having brazed plates and heater
US7837826B2 (en) * 2006-07-18 2010-11-23 Lam Research Corporation Hybrid RF capacitively and inductively coupled plasma source using multifrequency RF powers and methods of use thereof
JP5102500B2 (ja) * 2007-01-22 2012-12-19 東京エレクトロン株式会社 基板処理装置
US20080314319A1 (en) * 2007-06-19 2008-12-25 Memc Electronic Materials, Inc. Susceptor for improving throughput and reducing wafer damage
US8021968B2 (en) 2007-08-03 2011-09-20 Shin-Etsu Handotai Co., Ltd. Susceptor and method for manufacturing silicon epitaxial wafer
CN101471275B (zh) * 2007-12-26 2011-04-06 北京北方微电子基地设备工艺研究中心有限责任公司 一种被处理体的保持装置
JP5038365B2 (ja) * 2009-07-01 2012-10-03 株式会社東芝 サセプタおよび成膜装置
US8274017B2 (en) * 2009-12-18 2012-09-25 Applied Materials, Inc. Multifunctional heater/chiller pedestal for wide range wafer temperature control
JP5604907B2 (ja) * 2010-02-25 2014-10-15 信越半導体株式会社 気相成長用半導体基板支持サセプタおよびエピタキシャルウェーハ製造装置およびエピタキシャルウェーハの製造方法
US8371567B2 (en) * 2011-04-13 2013-02-12 Novellus Systems, Inc. Pedestal covers
TWM431430U (en) * 2011-08-24 2012-06-11 Wafer Works Corp Clip board type fastening device for use in annularly etching wafer
KR101874901B1 (ko) * 2011-12-07 2018-07-06 삼성전자주식회사 기판 건조 장치 및 방법
US10593521B2 (en) * 2013-03-12 2020-03-17 Applied Materials, Inc. Substrate support for plasma etch operations
US10804081B2 (en) 2013-12-20 2020-10-13 Lam Research Corporation Edge ring dimensioned to extend lifetime of elastomer seal in a plasma processing chamber
TWI734668B (zh) * 2014-06-23 2021-08-01 美商應用材料股份有限公司 在epi腔室中的基材熱控制
US9793096B2 (en) 2014-09-12 2017-10-17 Lam Research Corporation Systems and methods for suppressing parasitic plasma and reducing within-wafer non-uniformity
US10242848B2 (en) 2014-12-12 2019-03-26 Lam Research Corporation Carrier ring structure and chamber systems including the same
US10622243B2 (en) * 2016-10-28 2020-04-14 Lam Research Corporation Planar substrate edge contact with open volume equalization pathways and side containment

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