JP2018018819A5 - - Google Patents

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Publication number
JP2018018819A5
JP2018018819A5 JP2017140416A JP2017140416A JP2018018819A5 JP 2018018819 A5 JP2018018819 A5 JP 2018018819A5 JP 2017140416 A JP2017140416 A JP 2017140416A JP 2017140416 A JP2017140416 A JP 2017140416A JP 2018018819 A5 JP2018018819 A5 JP 2018018819A5
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JP
Japan
Prior art keywords
heater
photodiode
substrate
trigger
electrode layer
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JP2017140416A
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English (en)
Japanese (ja)
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JP2018018819A (ja
JP6938257B2 (ja
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Priority claimed from US15/220,221 external-priority patent/US10224297B2/en
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Publication of JP2018018819A publication Critical patent/JP2018018819A/ja
Publication of JP2018018819A5 publication Critical patent/JP2018018819A5/ja
Application granted granted Critical
Publication of JP6938257B2 publication Critical patent/JP6938257B2/ja
Expired - Fee Related legal-status Critical Current
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JP2017140416A 2016-07-26 2017-07-20 刺激開始される自己破壊基板のためのセンサおよびヒータ Expired - Fee Related JP6938257B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US15/220,221 2016-07-26
US15/220,221 US10224297B2 (en) 2016-07-26 2016-07-26 Sensor and heater for stimulus-initiated fracture of a substrate

Publications (3)

Publication Number Publication Date
JP2018018819A JP2018018819A (ja) 2018-02-01
JP2018018819A5 true JP2018018819A5 (https=) 2021-03-04
JP6938257B2 JP6938257B2 (ja) 2021-09-22

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JP2017140416A Expired - Fee Related JP6938257B2 (ja) 2016-07-26 2017-07-20 刺激開始される自己破壊基板のためのセンサおよびヒータ

Country Status (3)

Country Link
US (2) US10224297B2 (https=)
EP (1) EP3285399B1 (https=)
JP (1) JP6938257B2 (https=)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9154138B2 (en) 2013-10-11 2015-10-06 Palo Alto Research Center Incorporated Stressed substrates for transient electronic systems
US9780044B2 (en) 2015-04-23 2017-10-03 Palo Alto Research Center Incorporated Transient electronic device with ion-exchanged glass treated interposer
US10012250B2 (en) 2016-04-06 2018-07-03 Palo Alto Research Center Incorporated Stress-engineered frangible structures
US9853001B1 (en) 2016-06-28 2017-12-26 International Business Machines Corporation Prevention of reverse engineering of security chips
US10224297B2 (en) 2016-07-26 2019-03-05 Palo Alto Research Center Incorporated Sensor and heater for stimulus-initiated fracture of a substrate
US10026579B2 (en) 2016-07-26 2018-07-17 Palo Alto Research Center Incorporated Self-limiting electrical triggering for initiating fracture of frangible glass
US10903173B2 (en) 2016-10-20 2021-01-26 Palo Alto Research Center Incorporated Pre-conditioned substrate
US10626048B2 (en) 2017-12-18 2020-04-21 Palo Alto Research Center Incorporated Dissolvable sealant for masking glass in high temperature ion exchange baths
US10717669B2 (en) 2018-05-16 2020-07-21 Palo Alto Research Center Incorporated Apparatus and method for creating crack initiation sites in a self-fracturing frangible member
US11107645B2 (en) 2018-11-29 2021-08-31 Palo Alto Research Center Incorporated Functionality change based on stress-engineered components
US10947150B2 (en) 2018-12-03 2021-03-16 Palo Alto Research Center Incorporated Decoy security based on stress-engineered substrates
US10969205B2 (en) 2019-05-03 2021-04-06 Palo Alto Research Center Incorporated Electrically-activated pressure vessels for fracturing frangible structures
EP4066276A4 (en) * 2019-11-27 2024-03-27 Corning Incorporated GLASS WAFER TO MAKE SEMICONDUCTOR DEVICES
US12013043B2 (en) * 2020-12-21 2024-06-18 Xerox Corporation Triggerable mechanisms and fragment containment arrangements for self-destructing frangible structures and sealed vessels
US11904986B2 (en) 2020-12-21 2024-02-20 Xerox Corporation Mechanical triggers and triggering methods for self-destructing frangible structures and sealed vessels
US11901304B2 (en) * 2021-05-18 2024-02-13 Globalfoundries U.S. Inc. Integrated circuit structure with fluorescent material, and related methods

Family Cites Families (89)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2529210A (en) 1947-05-23 1950-11-07 Joseph F Butler Cutting apparatus for wallboards and the like
GB1138401A (en) 1965-05-06 1969-01-01 Mallory & Co Inc P R Bonding
US3601114A (en) 1969-01-21 1971-08-24 Norton Co Method and apparatus for cutting complex shapes
US3673667A (en) 1970-11-23 1972-07-04 Whittaker Corp Method for producing complex shapes by filled billet extrusion
US3666967A (en) 1971-05-12 1972-05-30 Us Navy Self-destruct aluminum-tungstic oxide films
US3882323A (en) * 1973-12-17 1975-05-06 Us Navy Method and apparatus for protecting sensitive information contained in thin-film microelectonic circuitry
US4102664A (en) 1977-05-18 1978-07-25 Corning Glass Works Method for making glass articles with defect-free surfaces
US4139359A (en) 1977-11-02 1979-02-13 Ppg Industries, Inc. Method and apparatus for shaping glass sheets by roll forming
DE3230554C2 (de) 1982-04-28 1984-07-26 GTI Glastechnische Industrie Peter Lisec, GmbH, Amstetten Verfahren und Vorrichtung zum Schneiden von Verbundglas
SE435352B (sv) 1983-05-04 1984-09-24 Hydro Betong Ab Konstruktionskropp for en berande konstruktion bestaende av ett antal med varandra sammanfogade skivor av plastmaterial, av exv uretanskum samt sett att tillverka sagda kropp
GB8322258D0 (en) 1983-08-18 1983-09-21 Holmes A Security and protection screens
US4739555A (en) 1985-06-18 1988-04-26 Werner Jurgens Laminated glass cutter
FR2681472B1 (fr) 1991-09-18 1993-10-29 Commissariat Energie Atomique Procede de fabrication de films minces de materiau semiconducteur.
GB9201863D0 (en) 1992-01-29 1992-03-18 Dunn Kenneth R Multi glazing air cushion release unit
US5791056A (en) 1996-11-22 1998-08-11 Messina; Gary D. Emergency glass breaking tool
DE19958750B4 (de) 1999-12-07 2006-08-24 Robert Bosch Gmbh Leckwellenantenne
KR100771258B1 (ko) * 2000-05-09 2007-10-29 가부시키가이샤 한도오따이 에네루기 켄큐쇼 본인 인증 시스템과 본인 인증 방법 및 휴대 전화 장치
US6418628B1 (en) 2001-03-22 2002-07-16 Task Force Tips, Inc. Spring-loaded car window breaker and retractable safety sheath
FR2823599B1 (fr) 2001-04-13 2004-12-17 Commissariat Energie Atomique Substrat demomtable a tenue mecanique controlee et procede de realisation
GB0127083D0 (en) 2001-11-10 2002-01-02 P W Allen & Company Ltd Device for breaking glass
US20040031966A1 (en) 2002-08-16 2004-02-19 Forrest Stephen R. Organic photonic integrated circuit using a photodetector and a transparent organic light emitting device
JP2004075504A (ja) 2002-08-22 2004-03-11 Nippon Sheet Glass Co Ltd 板ガラスの複曲成形方法及びその装置
DE10305733B4 (de) 2003-02-12 2005-10-20 Saint Gobain Sekurit D Gmbh Verfahren zum Erzeugen von Sollbruchstellen in Glasscheiben, Glasscheibe mit Schwächungszone und Verwendung derselben
JP4115859B2 (ja) 2003-02-28 2008-07-09 株式会社日立製作所 陽極接合方法および電子装置
DE10309826B4 (de) 2003-03-05 2009-11-12 Schott Ag Verfahren zum Strukturieren von Phosphatgläsern durch zerstörungsfreien Ionenaustausch, strukturierte Phosphatgläser und deren Verwendung
US7002517B2 (en) 2003-06-20 2006-02-21 Anritsu Company Fixed-frequency beam-steerable leaky-wave microstrip antenna
EP1517073A1 (en) 2003-09-19 2005-03-23 Universita degli Studi di Trento ESP glass rupture disk
EP1671375A4 (en) 2003-10-09 2009-11-25 Ocas Corp BOLOMETRIC INFRARED SENSOR WITH TWO-LAYER STRUCTURE AND METHOD OF MANUFACTURING THEREOF
US20050082331A1 (en) 2003-10-17 2005-04-21 Chi-Hong Yang Tempered glass breaker
DE102004015546B4 (de) 2004-03-30 2011-05-12 Infineon Technologies Ag Halbleiterchip mit integrierter Schaltung und Verfahren zum Sichern einer integrierten Halbleiterschaltung
US20060270190A1 (en) 2005-05-25 2006-11-30 The Regents Of The University Of California Method of transferring a thin crystalline semiconductor layer
WO2007019277A2 (en) 2005-08-03 2007-02-15 California Institute Of Technology Method of forming semiconductor layers on handle substrates
US7880248B1 (en) 2005-10-17 2011-02-01 Teledyne Technologies Incorporated Destructor integrated circuit chip, interposer electronic device and methods
KR101389808B1 (ko) * 2005-11-18 2014-04-29 가부시키가이샤 한도오따이 에네루기 켄큐쇼 광전변환장치
US8168050B2 (en) * 2006-07-05 2012-05-01 Momentive Performance Materials Inc. Electrode pattern for resistance heating element and wafer processing apparatus
JP2008216848A (ja) * 2007-03-07 2008-09-18 Epson Imaging Devices Corp アレイ基板及び液晶装置、並びに電子機器
GB0717489D0 (en) 2007-09-08 2007-10-17 Design Factor Ni The Ltd A Glass breaking device
US7623560B2 (en) 2007-09-27 2009-11-24 Ostendo Technologies, Inc. Quantum photonic imagers and methods of fabrication thereof
JP2009212315A (ja) 2008-03-04 2009-09-17 Elpida Memory Inc 半導体装置及びその製造方法
WO2009150558A1 (en) 2008-06-13 2009-12-17 Nxp B.V. Intrusion protection using stress changes
JP5670901B2 (ja) 2008-08-08 2015-02-18 コーニング インコーポレイテッド 強化ガラス物品およびその製造方法
KR20100063269A (ko) 2008-12-03 2010-06-11 주식회사 동부하이텍 이미지센서 및 그 제조방법
US8089285B2 (en) * 2009-03-03 2012-01-03 International Business Machines Corporation Implementing tamper resistant integrated circuit chips
US8130072B2 (en) 2009-05-14 2012-03-06 Palo Alto Research Center Incorporated Vanadium oxide thermal microprobes
CN201532635U (zh) * 2009-09-03 2010-07-21 百富计算机技术(深圳)有限公司 一种安全保护装置
US8946590B2 (en) 2009-11-30 2015-02-03 Corning Incorporated Methods for laser scribing and separating glass substrates
FR2953213B1 (fr) 2009-12-01 2013-03-29 Saint Gobain Procede de structuration de surface par abrasion ionique,surface structuree et utilisations
TWI438162B (zh) 2010-01-27 2014-05-21 Wintek Corp 強化玻璃切割方法及強化玻璃切割預置結構
US8393175B2 (en) 2010-08-26 2013-03-12 Corning Incorporated Methods for extracting strengthened glass substrates from glass sheets
JP6014041B2 (ja) 2010-10-15 2016-10-25 シーレイト リミテッド ライアビリティー カンパニーSearete Llc 表面散乱アンテナ
US8607590B2 (en) 2010-11-30 2013-12-17 Corning Incorporated Methods for separating glass articles from strengthened glass substrate sheets
US8616024B2 (en) 2010-11-30 2013-12-31 Corning Incorporated Methods for forming grooves and separating strengthened glass substrate sheets
US8539794B2 (en) 2011-02-01 2013-09-24 Corning Incorporated Strengthened glass substrate sheets and methods for fabricating glass panels from glass substrate sheets
WO2012135950A1 (en) 2011-04-07 2012-10-11 Polyvalor, Limited Partnership Full-space scanning end-switched crlh leaky-wave antenna
US8635887B2 (en) 2011-08-10 2014-01-28 Corning Incorporated Methods for separating glass substrate sheets by laser-formed grooves
TWI415809B (zh) 2011-08-12 2013-11-21 Wintek Corp 強化玻璃單元及其製作方法以及具有強化玻璃單元的覆蓋板
US20130082383A1 (en) 2011-10-03 2013-04-04 Texas Instruments Incorporated Electronic assembly having mixed interface including tsv die
CN108389893A (zh) 2011-12-01 2018-08-10 伊利诺伊大学评议会 经设计以经历可编程转变的瞬态器件
CN102617022B (zh) 2012-03-31 2014-10-22 洛阳兰迪玻璃机器股份有限公司 柱状曲面钢化玻璃加工方法
CN102617023B (zh) 2012-03-31 2014-12-31 洛阳兰迪玻璃机器股份有限公司 柱状曲面钢化玻璃加工装置
SE537874C2 (sv) 2012-04-13 2015-11-03 Silex Microsystems Ab CTE-anpassad interposer och metod att tillverka en sådan
US20130273717A1 (en) 2012-04-17 2013-10-17 Taiwan Semiconductor Manufacturing Co., Ltd. Apparatus and Method for the Singulation of a Semiconductor Wafer
US9938180B2 (en) 2012-06-05 2018-04-10 Corning Incorporated Methods of cutting glass using a laser
KR101395054B1 (ko) 2012-08-08 2014-05-14 삼성코닝정밀소재 주식회사 강화유리 커팅 방법 및 강화유리 커팅용 스테이지
US8765536B2 (en) 2012-09-28 2014-07-01 International Business Machines Corporation Stress engineered multi-layers for integration of CMOS and Si nanophotonics
US8816717B2 (en) 2012-10-17 2014-08-26 International Business Machines Corporation Reactive material for integrated circuit tamper detection and response
US9385435B2 (en) 2013-03-15 2016-07-05 The Invention Science Fund I, Llc Surface scattering antenna improvements
WO2014169170A1 (en) 2013-04-12 2014-10-16 The Board Of Trustees Of The University Of Illinois Inorganic and organic transient electronic devices
US9041205B2 (en) 2013-06-28 2015-05-26 Intel Corporation Reliable microstrip routing for electronics components
JP5582232B1 (ja) 2013-07-30 2014-09-03 日本電気硝子株式会社 曲面形状を有するガラス板の製造方法、曲面形状を有するガラス板及び曲面形状を有するガラス板の製造装置
US9790128B2 (en) 2013-08-07 2017-10-17 Corning Incorporated Laser controlled ion exchange process and glass articles formed therefrom
US9154138B2 (en) * 2013-10-11 2015-10-06 Palo Alto Research Center Incorporated Stressed substrates for transient electronic systems
US9356603B2 (en) 2013-10-11 2016-05-31 Palo Alto Research Center Incorporated Thermally tempered glass substrate using CTE mismatched layers and paste mixtures for transient electronic systems
US9294098B2 (en) 2013-11-26 2016-03-22 Lawrence Livermore National Security, Llc System and method for on demand, vanishing, high performance electronic systems
US9850160B2 (en) 2013-12-17 2017-12-26 Corning Incorporated Laser cutting of display glass compositions
US9711852B2 (en) 2014-06-20 2017-07-18 The Invention Science Fund I Llc Modulation patterns for surface scattering antennas
US9853361B2 (en) 2014-05-02 2017-12-26 The Invention Science Fund I Llc Surface scattering antennas with lumped elements
US10381326B2 (en) 2014-05-28 2019-08-13 Invensas Corporation Structure and method for integrated circuits packaging with increased density
FR3024136B1 (fr) 2014-07-24 2021-04-30 Saint Gobain Procede de rompage d'une feuille de verre
US9586857B2 (en) 2014-11-17 2017-03-07 International Business Machines Corporation Controlling fragmentation of chemically strengthened glass
US9780044B2 (en) 2015-04-23 2017-10-03 Palo Alto Research Center Incorporated Transient electronic device with ion-exchanged glass treated interposer
US9577047B2 (en) 2015-07-10 2017-02-21 Palo Alto Research Center Incorporated Integration of semiconductor epilayers on non-native substrates
US10012250B2 (en) 2016-04-06 2018-07-03 Palo Alto Research Center Incorporated Stress-engineered frangible structures
US10026579B2 (en) 2016-07-26 2018-07-17 Palo Alto Research Center Incorporated Self-limiting electrical triggering for initiating fracture of frangible glass
US10224297B2 (en) 2016-07-26 2019-03-05 Palo Alto Research Center Incorporated Sensor and heater for stimulus-initiated fracture of a substrate
US10903173B2 (en) 2016-10-20 2021-01-26 Palo Alto Research Center Incorporated Pre-conditioned substrate
US10026651B1 (en) 2017-06-21 2018-07-17 Palo Alto Research Center Incorporated Singulation of ion-exchanged substrates
US10479300B2 (en) 2017-10-06 2019-11-19 Ford Global Technologies, Llc Monitoring of vehicle window vibrations for voice-command recognition
US10717669B2 (en) 2018-05-16 2020-07-21 Palo Alto Research Center Incorporated Apparatus and method for creating crack initiation sites in a self-fracturing frangible member

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