TWI456658B - 圖樣化有機材料以同時形成絕緣體及半導體之方法及藉該方法形成之裝置 - Google Patents

圖樣化有機材料以同時形成絕緣體及半導體之方法及藉該方法形成之裝置 Download PDF

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TWI456658B
TWI456658B TW094138482A TW94138482A TWI456658B TW I456658 B TWI456658 B TW I456658B TW 094138482 A TW094138482 A TW 094138482A TW 94138482 A TW94138482 A TW 94138482A TW I456658 B TWI456658 B TW I456658B
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precursor
light
heating
semiconductor
pentacene
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TW094138482A
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TW200633062A (en
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Fredericus J Touwslager
Gerwin H Gelinck
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Creator Technology Bv
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    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K71/00Manufacture or treatment specially adapted for the organic devices covered by this subclass
    • H10K71/20Changing the shape of the active layer in the devices, e.g. patterning
    • H10K71/211Changing the shape of the active layer in the devices, e.g. patterning by selective transformation of an existing layer
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K10/00Organic devices specially adapted for rectifying, amplifying, oscillating or switching; Organic capacitors or resistors having potential barriers
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K10/00Organic devices specially adapted for rectifying, amplifying, oscillating or switching; Organic capacitors or resistors having potential barriers
    • H10K10/40Organic transistors
    • H10K10/46Field-effect transistors, e.g. organic thin-film transistors [OTFT]
    • H10K10/462Insulated gate field-effect transistors [IGFETs]
    • H10K10/468Insulated gate field-effect transistors [IGFETs] characterised by the gate dielectrics
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K10/00Organic devices specially adapted for rectifying, amplifying, oscillating or switching; Organic capacitors or resistors having potential barriers
    • H10K10/40Organic transistors
    • H10K10/46Field-effect transistors, e.g. organic thin-film transistors [OTFT]
    • H10K10/462Insulated gate field-effect transistors [IGFETs]
    • H10K10/464Lateral top-gate IGFETs comprising only a single gate
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K71/00Manufacture or treatment specially adapted for the organic devices covered by this subclass
    • H10K71/10Deposition of organic active material
    • H10K71/12Deposition of organic active material using liquid deposition, e.g. spin coating
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K71/00Manufacture or treatment specially adapted for the organic devices covered by this subclass
    • H10K71/60Forming conductive regions or layers, e.g. electrodes
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K85/00Organic materials used in the body or electrodes of devices covered by this subclass
    • H10K85/60Organic compounds having low molecular weight
    • H10K85/615Polycyclic condensed aromatic hydrocarbons, e.g. anthracene

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  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Thin Film Transistor (AREA)
  • Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)
  • Polyoxymethylene Polymers And Polymers With Carbon-To-Carbon Bonds (AREA)
  • Formation Of Insulating Films (AREA)

Claims (25)

  1. 一種用於製造一電子裝置之方法,其包括以下步驟:形成(102)一用於形成一固化狀態下之一半導體材料之前驅體材料層;及在光及周圍氧氣存在下加熱(108)該前驅體以在曝露於光下之區域中形成一絕緣體且在未曝露在該光下之區域中形成一半導體,其中該前驅體為一稠五苯前驅體,且在光及周圍氧氣存在下將該前驅體圖案化,藉此形成一稠五苯的氧化物。
  2. 如請求項1之方法,其中該加熱步驟包括使該前驅體材料曝露(104)在可見、UV及/或IR範圍中的光下。
  3. 如請求項2之方法,其中該光包括具有一在約0.1mW/cm2 與1W/cm2 之間之強度的白色光。
  4. 如請求項1之方法,其中該加熱步驟包括使用一雷射器將該前驅體材料同時曝露(104)於光及熱下。
  5. 如請求項1之方法,其中該加熱該前驅體之步驟包括加熱該前驅體至攝氏150度以上。
  6. 如請求項1之方法,其中該加熱該前驅體之步驟包括於氧氣存在下加熱(108)該前驅體以在曝露於該光下之區域中形成一種氧化物。
  7. 如請求項1之方法,其中該絕緣體包括醌。
  8. 如請求項7之方法,其中該醌包括6,13-稠五苯醌,或一更大的同胞材料。
  9. 如請求項1之方法,其中該半導體材料包括稠五 苯。
  10. 如請求項1之方法,其中該於光存在下加熱該前驅體的步驟包括,在選定區域中使用一光源同時加熱及照射(106)該前驅體且隨後加熱(108)該前驅體以在未經照射之區域中形成一半導體。
  11. 一種用於製造一電子裝置之方法,其包括以下步驟:形成(102)一用於形成一固化狀態下之一半導體材料之前驅體材料層;及加熱(108)該前驅體,同時根據一圖樣選擇性地使該前驅體材料的若干部分曝露於光下,以同時在曝露於光下之區域中形成一絕緣體且在未曝露於光下之區域中形成一半導體,其中該前驅體為一稠五苯前驅體,且在光及周圍氧氣存在下將該前驅體圖案化,藉此形成一稠五苯的氧化物。
  12. 如請求項11之方法,其中該加熱步驟包括使該前驅體材料曝露(104)於可見光下。
  13. 如請求項11之方法,其中該加熱步驟包括使該前驅體材料曝露於可見、IR及/或UV光中的至少一種下。
  14. 如請求項11之方法,其中該加熱該前驅體的步驟包括加熱該前驅體至攝氏150度以上達至少5秒。
  15. 如請求項11之方法,其中該加熱該前驅體的步驟包括,在氧氣存在下加熱該前驅體以在曝露於該光下的區域中形成一種氧化物。
  16. 如請求項11之方法,其中該絕緣體包括6,13-稠 五苯醌。
  17. 如請求項11之方法,其中該半導體材料包括稠五苯。
  18. 如請求項11之方法,其中該加熱步驟包括在選定區域中使用一光源同時加熱及照射(106)該前驅體且隨後加熱(108)該前驅體以在未經照射之區域中形成一半導體。
  19. 一種半導體裝置,其包括:至少一層(11),其包括在一加熱過程期間由一相同前驅體材料(10)形成之半導體材料(20)及絕緣體材料(22),其中該半導體材料(20)係藉由該加熱過程形成且該絕緣體(22)係藉由該加熱過程及曝露於可見光而選擇性地形成,其中該至少一層為一稠五苯前驅體,且在光及周圍氧氣存在下將該前驅體圖案化,藉此形成一稠五苯的氧化物。
  20. 如請求項19之半導體裝置,其中該前驅體材料包括一或多個6,13-二氫-6,13-(2,3,4,5-四氯-2,4-環己二烯)-稠五苯,及/或6,13-二氫-6,13-(2,3,4,5-四溴-2,4-環己二烯)-稠五苯。
  21. 如請求項19之半導體裝置,其中該半導體裝置包括一電子元件(20、22)。
  22. 如請求項19之半導體裝置,其中該可見光包括白色光或黃色光。
  23. 如請求項19之半導體裝置,其中該半導體材料包 括稠五苯。
  24. 如請求項19之半導體裝置,其中該絕緣體材料包括稠五苯醌。
  25. 如請求項24之半導體裝置,其中該稠五苯醌包括6,13-稠五苯醌。
TW094138482A 2004-11-05 2005-11-02 圖樣化有機材料以同時形成絕緣體及半導體之方法及藉該方法形成之裝置 TWI456658B (zh)

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EP (1) EP1815501A1 (zh)
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Families Citing this family (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI469224B (zh) 2008-10-20 2015-01-11 Ind Tech Res Inst 有機薄膜電晶體及其製造方法
JP5455110B2 (ja) * 2009-02-03 2014-03-26 独立行政法人科学技術振興機構 ペンタセンキノン誘導体及びその製造方法
US20110108411A1 (en) * 2009-11-11 2011-05-12 Popik Vladimir V Methods for labeling a substrate using a hetero-diels-alder reaction
US9090542B2 (en) 2009-11-11 2015-07-28 University Of Georgia Research Foundation, Inc. Methods for labeling a substrate using a hetero-diels-alder reaction
CN105122387B (zh) 2013-02-21 2019-01-11 恩耐公司 非烧蚀性激光图案化
US9842665B2 (en) 2013-02-21 2017-12-12 Nlight, Inc. Optimization of high resolution digitally encoded laser scanners for fine feature marking
US10464172B2 (en) 2013-02-21 2019-11-05 Nlight, Inc. Patterning conductive films using variable focal plane to control feature size
CN105144346B (zh) 2013-02-21 2017-12-15 恩耐公司 多层结构的激光刻图
US10618131B2 (en) 2014-06-05 2020-04-14 Nlight, Inc. Laser patterning skew correction
CN105720463B (zh) 2014-08-01 2021-05-14 恩耐公司 光纤和光纤传输的激光器中的背向反射保护与监控
US9837783B2 (en) 2015-01-26 2017-12-05 Nlight, Inc. High-power, single-mode fiber sources
US10050404B2 (en) 2015-03-26 2018-08-14 Nlight, Inc. Fiber source with cascaded gain stages and/or multimode delivery fiber with low splice loss
US10520671B2 (en) 2015-07-08 2019-12-31 Nlight, Inc. Fiber with depressed central index for increased beam parameter product
EP3380266B1 (en) 2015-11-23 2021-08-11 NLIGHT, Inc. Fine-scale temporal control for laser material processing
WO2017091606A1 (en) 2015-11-23 2017-06-01 Nlight, Inc. Predictive modification of laser diode drive current waveform in high power laser systems
US11179807B2 (en) 2015-11-23 2021-11-23 Nlight, Inc. Fine-scale temporal control for laser material processing
US10295820B2 (en) 2016-01-19 2019-05-21 Nlight, Inc. Method of processing calibration data in 3D laser scanner systems
US10730785B2 (en) 2016-09-29 2020-08-04 Nlight, Inc. Optical fiber bending mechanisms
US10732439B2 (en) 2016-09-29 2020-08-04 Nlight, Inc. Fiber-coupled device for varying beam characteristics
US10295845B2 (en) 2016-09-29 2019-05-21 Nlight, Inc. Adjustable beam characteristics
CN110651218B (zh) 2017-04-04 2022-03-01 恩耐公司 用于检流计扫描仪校准的设备、系统和方法
CN111384268B (zh) * 2018-12-29 2021-06-18 Tcl科技集团股份有限公司 量子点发光二极管的制备方法及量子点墨水

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20020151117A1 (en) * 1997-08-22 2002-10-17 Koninklijke Philips Electronics Method of manufacturing a field-effect transistor substantially consisting of organic materials

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001102172A (ja) * 1999-09-30 2001-04-13 Idemitsu Kosan Co Ltd 有機エレクトロルミネッセンス素子
USH2084H1 (en) 1999-12-16 2003-10-07 The United States Of America As Represented By The Secretary Of The Navy Pentacene derivatives as red emitters in organic light emitting devices
US6500604B1 (en) * 2000-01-03 2002-12-31 International Business Machines Corporation Method for patterning sensitive organic thin films
WO2003028125A2 (en) * 2001-09-27 2003-04-03 3M Innovative Properties Company Substituted pentacene semiconductors
US6963080B2 (en) * 2001-11-26 2005-11-08 International Business Machines Corporation Thin film transistors using solution processed pentacene precursor as organic semiconductor
JP4281325B2 (ja) * 2002-10-24 2009-06-17 コニカミノルタホールディングス株式会社 有機薄膜トランジスタ素子
JP2004165427A (ja) * 2002-11-13 2004-06-10 Konica Minolta Holdings Inc 有機薄膜トランジスタ素子
US7053401B2 (en) * 2002-12-20 2006-05-30 International Business Machines Corporation Synthesis and application of photosensitive pentacene precursor in organic thin film transistors
JP2006523208A (ja) * 2003-03-18 2006-10-12 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ オリゴセンの前駆体の調製の方法

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20020151117A1 (en) * 1997-08-22 2002-10-17 Koninklijke Philips Electronics Method of manufacturing a field-effect transistor substantially consisting of organic materials

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
"A Soluble Pentacene Precursor: Synthesis, Solid-State Conversion into Pentacene and Application in a Field-Effect Transistor", Peter T. Herwig and Klaus Müllen, Adv. Mater. 1999, 11, No. 6 "Effect of impurities on the mobility of single crystal pentacene", Oana D. Jurchescu, Jacob Baas, and Thomas T. M. Palstra, Appl. Phys. Lett. 84, 3061 (2004) *

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JP2008519451A (ja) 2008-06-05
US8030124B2 (en) 2011-10-04
CN101053090A (zh) 2007-10-10
WO2006048833A1 (en) 2006-05-11
KR20070083946A (ko) 2007-08-24
TW200633062A (en) 2006-09-16
CN101053090B (zh) 2010-12-22
KR101184366B1 (ko) 2012-09-20
US20080246024A1 (en) 2008-10-09
EP1815501A1 (en) 2007-08-08
JP5175102B2 (ja) 2013-04-03

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