JP2017517767A5 - - Google Patents

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JP2017517767A5
JP2017517767A5 JP2016569612A JP2016569612A JP2017517767A5 JP 2017517767 A5 JP2017517767 A5 JP 2017517767A5 JP 2016569612 A JP2016569612 A JP 2016569612A JP 2016569612 A JP2016569612 A JP 2016569612A JP 2017517767 A5 JP2017517767 A5 JP 2017517767A5
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Japan
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detection
mode
path
functionally integrated
scanning microscope
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JP2016569612A
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Japanese (ja)
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JP6557682B2 (ja
JP2017517767A (ja
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Priority claimed from DE102014107606.0A external-priority patent/DE102014107606A1/de
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JP2016569612A 2014-05-28 2015-05-22 機能的に統合されたレーザ走査型顕微鏡 Active JP6557682B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE102014107606.0 2014-05-28
DE102014107606.0A DE102014107606A1 (de) 2014-05-28 2014-05-28 Funktionsintegriertes Laser-Scanning-Mikroskop
PCT/EP2015/061378 WO2015181068A1 (de) 2014-05-28 2015-05-22 Funktionsintegriertes laser-scanning-mikroskop

Publications (3)

Publication Number Publication Date
JP2017517767A JP2017517767A (ja) 2017-06-29
JP2017517767A5 true JP2017517767A5 (enExample) 2017-08-10
JP6557682B2 JP6557682B2 (ja) 2019-08-07

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JP2016569612A Active JP6557682B2 (ja) 2014-05-28 2015-05-22 機能的に統合されたレーザ走査型顕微鏡

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US (2) US10203490B2 (enExample)
EP (2) EP3798712A1 (enExample)
JP (1) JP6557682B2 (enExample)
CN (1) CN106415357B (enExample)
DE (1) DE102014107606A1 (enExample)
WO (1) WO2015181068A1 (enExample)

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JP6768289B2 (ja) * 2015-12-01 2020-10-14 キヤノン株式会社 走査型顕微鏡
JP6802636B2 (ja) * 2016-03-25 2020-12-16 オリンパス株式会社 顕微鏡システムおよび標本観察方法
DE102016110433B4 (de) * 2016-06-06 2022-01-27 Carl Zeiss Microscopy Gmbh Mikroskop und Mikroskopieverfahren
DE102016011227C5 (de) * 2016-09-19 2020-04-09 Leica Microsystems Cms Gmbh Mikroskopsystem und Verfahren zur Abbildung einer Probe unter Verwendung eines Mikroskopsystems
US10955652B2 (en) 2016-09-30 2021-03-23 The Trustees Of Columbia University In The City Of New York Three-dimensional imaging using swept, confocally aligned planar excitation with a Powell lens and/or deliberate misalignment
DE102016119730A1 (de) 2016-10-17 2018-04-19 Carl Zeiss Microscopy Gmbh Optikgruppe für Detektionslicht für ein Mikroskop, Verfahren zur Mikroskopie und Mikroskop
DE102016120308A1 (de) 2016-10-25 2018-04-26 Carl Zeiss Microscopy Gmbh Optische Anordnung, Multispot-Scanning-Mikroskop und Verfahren zum Betreiben eines Mikroskops
US11506877B2 (en) 2016-11-10 2022-11-22 The Trustees Of Columbia University In The City Of New York Imaging instrument having objective axis and light sheet or light beam projector axis intersecting at less than 90 degrees
US10416429B2 (en) * 2017-09-15 2019-09-17 Agile Focus Designs, LLC Dynamic focus and zoom system for use with wide-field, confocal and multiphoton microscopes
US10466461B2 (en) * 2017-09-15 2019-11-05 Agile Focus Designs, LLC Dynamic focus and zoom system for use with wide-field, confocal and multiphoton microscopes
DE102018124129A1 (de) * 2017-12-04 2019-06-06 Leica Microsystems Cms Gmbh Mikroskopsystem und Verfahren zur mikroskopischen Abbildung mit einem solchen Mikroskopsystem
WO2019204820A1 (en) * 2018-04-20 2019-10-24 Coluxa Inc. Scanning microscope with multiplexed light sources
DE102018209448A1 (de) 2018-06-13 2019-12-19 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Vorrichtung zur ortsaufgelösten Detektion und Verwendung einer solchen Vorrichtung
JP6978592B2 (ja) * 2019-01-25 2021-12-08 アジャイル フォーカス デザインズ, エルエルシーAgile Focus Designs, LLC 広領域の共焦点及び多光子顕微鏡で用いる動的フォーカス・ズームシステム
CN110927947B (zh) * 2019-11-15 2022-03-18 上海安翰医疗技术有限公司 相衬显微成像系统及其成像方法
US11762181B2 (en) * 2019-12-26 2023-09-19 Kessler Optics and Photonics Solutions Ltd. Scanning microscope with enhanced FOV and NA
EP3985423A1 (en) * 2020-10-14 2022-04-20 Leica Microsystems CMS GmbH Control device for a confocal microscope
CA3151215A1 (en) * 2021-03-19 2022-09-19 Thorlabs, Inc Compact laser scanning microscope system
DE102023209080A1 (de) * 2023-09-19 2025-03-20 Carl Zeiss Microscopy Gmbh Multimodales Scanmikroskop und Verfahren zu dessen Betrieb
DE102023134043A1 (de) * 2023-12-05 2025-06-05 Carl Zeiss Microscopy Gmbh Mikroskop
KR102888672B1 (ko) 2025-05-14 2025-11-27 한국표준과학연구원 단일 광원 기반의 hts/hcs 모드 변경이 가능한 광시트 현미경 시스템

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US7028899B2 (en) * 1999-06-07 2006-04-18 Metrologic Instruments, Inc. Method of speckle-noise pattern reduction and apparatus therefore based on reducing the temporal-coherence of the planar laser illumination beam before it illuminates the target object by applying temporal phase modulation techniques during the transmission of the plib towards the target
DE10344060A1 (de) 2003-09-23 2005-05-04 Zeiss Carl Jena Gmbh Konfokales Laser-Scanning-Mikroskop
JP4414722B2 (ja) * 2003-10-15 2010-02-10 オリンパス株式会社 レーザー顕微鏡
DE102004034971A1 (de) * 2004-07-16 2006-02-09 Carl Zeiss Jena Gmbh Lichtrastermikroskop mit linienförmiger Abtastung und Verwendung
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JP4891057B2 (ja) * 2006-12-27 2012-03-07 オリンパス株式会社 共焦点レーザー走査型顕微鏡
JP4924146B2 (ja) * 2007-03-30 2012-04-25 横河電機株式会社 共焦点顕微鏡システム
DE102008054317A1 (de) * 2008-11-03 2010-05-06 Carl Zeiss Microlmaging Gmbh Kombinationsmikroskopie
JP5371694B2 (ja) * 2009-10-26 2013-12-18 オリンパス株式会社 顕微鏡接続ユニットおよび顕微鏡システム
DE102009060490A1 (de) * 2009-12-22 2011-06-30 Carl Zeiss Microlmaging GmbH, 07745 Hochauflösendes Mikroskop und Bildteileranordnung
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DE102010060121C5 (de) * 2010-10-22 2023-09-28 Leica Microsystems Cms Gmbh SPIM-Mikroskop mit sequenziellem Lightsheet
GB201019181D0 (en) * 2010-11-12 2010-12-29 Univ Leicester Improved optical arrangement
DE102011077269A1 (de) * 2011-06-09 2012-12-13 Carl Zeiss Microimaging Gmbh Hochauflösende Lumineszenzmikroskopie
DE102011087196A1 (de) 2011-11-28 2013-05-29 Leica Microsystems Cms Gmbh Mikroskopbeleuchtungssystem und -verfahren
CN103743714B (zh) * 2014-01-14 2015-12-30 苏州大猫单分子仪器研发有限公司 一种倾斜宽场光切片扫描成像显微系统及其成像方法
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