JP2017500733A5 - - Google Patents
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- JP2017500733A5 JP2017500733A5 JP2016527287A JP2016527287A JP2017500733A5 JP 2017500733 A5 JP2017500733 A5 JP 2017500733A5 JP 2016527287 A JP2016527287 A JP 2016527287A JP 2016527287 A JP2016527287 A JP 2016527287A JP 2017500733 A5 JP2017500733 A5 JP 2017500733A5
- Authority
- JP
- Japan
- Prior art keywords
- offset
- signal
- hall
- hall element
- read signal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000000034 method Methods 0.000 claims 30
- 238000005259 measurement Methods 0.000 claims 17
- 239000004065 semiconductor Substances 0.000 claims 14
- 238000012886 linear function Methods 0.000 claims 4
- 230000002596 correlated effect Effects 0.000 claims 2
- 230000001419 dependent effect Effects 0.000 claims 2
- 239000000463 material Substances 0.000 claims 2
- 230000006870 function Effects 0.000 claims 1
- 239000011159 matrix material Substances 0.000 claims 1
- 238000009987 spinning Methods 0.000 claims 1
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| GBGB1319627.4A GB201319627D0 (en) | 2013-11-06 | 2013-11-06 | Hall sensor readout system with offset determination using the hall element itself |
| GB1319627.4 | 2013-11-06 | ||
| PCT/EP2014/073856 WO2015067675A1 (en) | 2013-11-06 | 2014-11-06 | Hall sensor readout system with offset determination using the hall element itself |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2017500733A JP2017500733A (ja) | 2017-01-05 |
| JP2017500733A5 true JP2017500733A5 (enExample) | 2017-12-14 |
| JP6496314B2 JP6496314B2 (ja) | 2019-04-03 |
Family
ID=49767776
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2016527287A Active JP6496314B2 (ja) | 2013-11-06 | 2014-11-06 | ホール素子自体を用いるオフセット決定を行うホールセンサ読み出しシステム |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US10345394B2 (enExample) |
| EP (1) | EP3066487B1 (enExample) |
| JP (1) | JP6496314B2 (enExample) |
| KR (1) | KR20160083888A (enExample) |
| GB (1) | GB201319627D0 (enExample) |
| WO (1) | WO2015067675A1 (enExample) |
Families Citing this family (32)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB201319627D0 (en) * | 2013-11-06 | 2013-12-18 | Melexis Technologies Nv | Hall sensor readout system with offset determination using the hall element itself |
| JP6483418B2 (ja) * | 2014-11-27 | 2019-03-13 | エイブリック株式会社 | ホールセンサおよびホールセンサの温度によるオフセットの補償方法 |
| DE102015109009B4 (de) | 2015-06-08 | 2025-10-30 | Infineon Technologies Ag | Stromsensorchip mit Magnetfeldsensor |
| GB2539681A (en) | 2015-06-23 | 2016-12-28 | Melexis Tech Sa | Stress and temperature compensated hall sensor, and method |
| EP3394561B1 (en) * | 2015-12-22 | 2022-02-09 | Mitutoyo Corporation | Sensor signal offset compensation system for a cmm touch probe |
| CN105607018B (zh) * | 2016-01-27 | 2019-05-21 | 南京邮电大学 | 一种集成霍尔磁传感器封装应力补偿电路和方法 |
| DE102016110613B4 (de) | 2016-06-09 | 2024-05-02 | Elmos Semiconductor Se | Vorrichtung und Verfahren zur Ansteuerung einer Hall-Struktur mit vergrößerter Signalamplitude |
| DE102016110611B4 (de) | 2016-06-09 | 2024-05-02 | Elmos Semiconductor Se | Vorrichtung mit einer Hall-Struktur mit einer vergrößerten Signalamplitude |
| DE102016110612B4 (de) | 2016-06-09 | 2024-05-02 | Elmos Semiconductor Se | Verfahren zum Betrieb einer Hall-Struktur mit vergrößerter Signalamplitude |
| DE102017105317B3 (de) * | 2017-03-14 | 2018-05-09 | Helmholtz-Zentrum Dresden - Rossendorf E.V. | Vorrichtung zum Charakterisieren des elektrischen Widerstandes eines Messobjekts |
| US10451688B2 (en) | 2017-03-21 | 2019-10-22 | Honeywell International Inc. | In-package sensor memory readout |
| EP3396397B1 (en) * | 2017-04-28 | 2019-11-20 | Melexis Technologies SA | Bridge sensor biasing and readout |
| EP3401646B1 (en) | 2017-05-09 | 2020-04-15 | Melexis Technologies SA | Bridge sensor error check |
| IT201700071189A1 (it) * | 2017-06-26 | 2018-12-26 | St Microelectronics Srl | Circuito di compensazione in temperatura, dispositivo e procedimento corrispondenti |
| JP6620796B2 (ja) * | 2017-07-28 | 2019-12-18 | Tdk株式会社 | オフセット推定装置および方法、磁気センサの補正装置ならびに電流センサ |
| KR102039784B1 (ko) * | 2017-08-31 | 2019-11-01 | 전자부품연구원 | 스마트 그리드용 가변 바이어스 전원을 이용한 자기 센서 기반 전류 센서 |
| EP3457154B1 (en) * | 2017-09-13 | 2020-04-08 | Melexis Technologies SA | Stray field rejection in magnetic sensors |
| KR101855627B1 (ko) * | 2017-09-28 | 2018-05-04 | 전자부품연구원 | 고감도 십자형 홀 플레이트 |
| EP3467522B1 (en) | 2017-10-06 | 2023-02-22 | STMicroelectronics S.r.l. | A temperature compensation circuit, corresponding device and method |
| KR102582436B1 (ko) * | 2017-12-19 | 2023-09-25 | 엘지이노텍 주식회사 | 센서 장치 |
| DE102018106037B4 (de) * | 2018-03-15 | 2023-03-30 | Infineon Technologies Ag | Mehr-Kontakt-Hall-Platte und Verfahren zum Betreiben derselben |
| US10794940B2 (en) * | 2018-07-02 | 2020-10-06 | Lg Chem, Ltd. | System for accurately determining an amount of electrical current flowing through a hall effect current sensor |
| JP7365771B2 (ja) * | 2019-01-31 | 2023-10-20 | エイブリック株式会社 | 半導体装置 |
| CN110542870B (zh) * | 2019-08-08 | 2021-08-24 | 宁波中车时代传感技术有限公司 | 霍尔传感器集成芯片灵敏度和零点温漂的补偿电路及方法 |
| US11965939B2 (en) | 2021-04-12 | 2024-04-23 | Samsung Electronics Co., Ltd. | Electronic device compensating for geomagnetic sensing data and method for controlling the same |
| KR20220140980A (ko) * | 2021-04-12 | 2022-10-19 | 삼성전자주식회사 | 지자기 센싱 데이터를 보상하는 전자 장치 및 그 제어 방법 |
| GB2618382B (en) * | 2022-05-06 | 2025-07-09 | Coroflo Ltd | Compact target flow meter |
| CN115251878B (zh) * | 2022-08-01 | 2024-06-18 | 北京航空航天大学 | 基于霍尔原件阵列的磁场自由区域检测及标定系统、方法 |
| CN117706157B (zh) * | 2022-09-06 | 2025-10-28 | 苏州纳芯微电子股份有限公司 | 电流感测装置 |
| CN115902345B (zh) * | 2022-10-18 | 2024-07-02 | 苏州纳芯微电子股份有限公司 | 电流检测模块、用电设备及电流检测方法 |
| CN115902346A (zh) * | 2022-10-18 | 2023-04-04 | 苏州纳芯微电子股份有限公司 | 电流感测模块、用电设备及电流感测方法 |
| CN115728536A (zh) * | 2022-10-18 | 2023-03-03 | 苏州纳芯微电子股份有限公司 | 电流传感器、用电设备及电流量测方法 |
Family Cites Families (28)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4327416A (en) * | 1980-04-16 | 1982-04-27 | Sangamo Weston, Inc. | Temperature compensation system for Hall effect element |
| US4833406A (en) * | 1986-04-17 | 1989-05-23 | Household Commercial Financial Services Inc. | Temperature compensated Hall-effect sensor apparatus |
| EP0548391B1 (de) | 1991-12-21 | 1997-07-23 | Deutsche ITT Industries GmbH | Offsetkompensierter Hallsensor |
| DE4302342A1 (en) | 1992-01-28 | 1993-07-29 | El Mos Elektronik In Mos Techn | Offset compensated measurement of magnetic field with Hall element - involves chip-internal electronic compensation with two measurement phases between which measurement and supply connections are interchanged |
| DE19852502A1 (de) | 1998-11-13 | 2000-05-18 | Philips Corp Intellectual Pty | Verfahren zur Offset-Kalibrierung eines magnetoresistiven Winkelsensors |
| DE19858868C2 (de) * | 1998-12-19 | 2003-06-18 | Micronas Gmbh | Hallsensor |
| DE19943128A1 (de) | 1999-09-09 | 2001-04-12 | Fraunhofer Ges Forschung | Hall-Sensoranordnung zur Offset-kompensierten Magnetfeldmessung |
| DE10010370A1 (de) * | 2000-03-02 | 2001-09-06 | Philips Corp Intellectual Pty | Auswerteschaltung für einen magnetoresistiven Sensor |
| DE10154495C5 (de) | 2001-11-07 | 2018-01-11 | Infineon Technologies Ag | Konzept zur Kompensation der Einflüsse externer Störgrößen auf physikalische Funktionsparameter von integrierten Schaltungen |
| DE10154498B4 (de) | 2001-11-07 | 2005-08-25 | Infineon Technologies Ag | Hallsondensystem und Verfahren zum Herstellen eines Hallsondensystems sowie Verfahren zum Steuern einer Hallspannung |
| EP1503181A1 (de) | 2003-07-31 | 2005-02-02 | Getrag Ford Transmissions GmbH | Verfahren zur Positionserfassung und Positionsmesssystem |
| DE102004003853B4 (de) | 2004-01-26 | 2009-12-17 | Infineon Technologies Ag | Vorrichtung und Verfahren zur Kompensation von Piezo-Einflüssen auf eine integrierte Schaltungsanordnung |
| DE102005029464B4 (de) * | 2005-06-24 | 2009-11-26 | Infineon Technologies Ag | Vorrichtung und Verfahren zum Ermitteln eines Kompensationssignals zum Kompensieren von Piezo-Einflüssen auf eine integrierte Halbleiterschaltung |
| JP2008008883A (ja) * | 2006-06-02 | 2008-01-17 | Denso Corp | 磁気センサ及びセンサ |
| JP2008096213A (ja) | 2006-10-10 | 2008-04-24 | Toyota Motor Corp | ホールセンサ及びホール電圧補正方法 |
| GB0620307D0 (en) * | 2006-10-16 | 2006-11-22 | Ami Semiconductor Belgium Bvba | Auto-calibration of magnetic sensor |
| DE102007044471A1 (de) * | 2007-09-18 | 2009-04-02 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Verfahren zur abschnittsweisen Bestimmung eines parameterabhängigen Korrekturwertnäherungsverlaufs und Sensoranordnung |
| US7980138B2 (en) | 2007-10-29 | 2011-07-19 | Infineon Technologies Ag | Integrated circuit with stress sensing element |
| EP2360455B1 (en) | 2010-02-04 | 2012-12-26 | Nxp B.V. | Magnetic field angular sensor and sensing method |
| US9874609B2 (en) | 2010-09-24 | 2018-01-23 | Infineon Technologies Ag | Sensor self-diagnostics using multiple signal paths |
| KR20120116036A (ko) | 2011-04-12 | 2012-10-22 | 삼성전기주식회사 | 오프셋을 제거한 홀 센서 |
| DE102011102483A1 (de) | 2011-05-24 | 2012-11-29 | Austriamicrosystems Ag | Verfahren zum Betreiben einer Hallsensoranordnung und Hallsensoranordnung |
| EP2662675A1 (de) | 2012-05-07 | 2013-11-13 | Melexis Technologies NV | Verfahren für die Bestimmung eines Stresswertes für isotropen Stress und Verfahren für die Bestimmung eines Magnetfeldes und Stresssensor und Hallsensor |
| CN104303065B (zh) * | 2012-06-29 | 2017-04-12 | 旭化成微电子株式会社 | 霍尔电动势校正装置以及霍尔电动势校正方法 |
| US9134383B2 (en) * | 2012-12-28 | 2015-09-15 | Asahi Kasei Microdevices Corporation | Hall device, magnetic sensor having same, and signal correcting method thereof |
| US9252354B2 (en) * | 2013-01-29 | 2016-02-02 | Infineon Technologies Ag | Vertical hall device with highly conductive opposite face node for electrically connecting first and second hall effect regions |
| US9671486B2 (en) * | 2013-06-18 | 2017-06-06 | Infineon Technologies Ag | Sensors, systems and methods for compensating for thermal EMF |
| GB201319627D0 (en) * | 2013-11-06 | 2013-12-18 | Melexis Technologies Nv | Hall sensor readout system with offset determination using the hall element itself |
-
2013
- 2013-11-06 GB GBGB1319627.4A patent/GB201319627D0/en not_active Ceased
-
2014
- 2014-11-06 KR KR1020167014458A patent/KR20160083888A/ko not_active Ceased
- 2014-11-06 US US15/034,738 patent/US10345394B2/en active Active
- 2014-11-06 JP JP2016527287A patent/JP6496314B2/ja active Active
- 2014-11-06 WO PCT/EP2014/073856 patent/WO2015067675A1/en not_active Ceased
- 2014-11-06 EP EP14793852.6A patent/EP3066487B1/en active Active
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