GB201319627D0 - Hall sensor readout system with offset determination using the hall element itself - Google Patents

Hall sensor readout system with offset determination using the hall element itself

Info

Publication number
GB201319627D0
GB201319627D0 GBGB1319627.4A GB201319627A GB201319627D0 GB 201319627 D0 GB201319627 D0 GB 201319627D0 GB 201319627 A GB201319627 A GB 201319627A GB 201319627 D0 GB201319627 D0 GB 201319627D0
Authority
GB
United Kingdom
Prior art keywords
hall
element itself
readout system
offset determination
sensor readout
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
GBGB1319627.4A
Other languages
English (en)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Melexis Technologies NV
Original Assignee
Melexis Technologies NV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Melexis Technologies NV filed Critical Melexis Technologies NV
Priority to GBGB1319627.4A priority Critical patent/GB201319627D0/en
Publication of GB201319627D0 publication Critical patent/GB201319627D0/en
Priority to EP14793852.6A priority patent/EP3066487B1/en
Priority to JP2016527287A priority patent/JP6496314B2/ja
Priority to US15/034,738 priority patent/US10345394B2/en
Priority to PCT/EP2014/073856 priority patent/WO2015067675A1/en
Priority to KR1020167014458A priority patent/KR20160083888A/ko
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/0017—Means for compensating offset magnetic fields or the magnetic flux to be measured; Means for generating calibration magnetic fields
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/0023—Electronic aspects, e.g. circuits for stimulation, evaluation, control; Treating the measured signals; calibration
    • G01R33/0035—Calibration of single magnetic sensors, e.g. integrated calibration
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R15/00—Details of measuring arrangements of the types provided for in groups G01R17/00 - G01R29/00, G01R33/00 - G01R33/26 or G01R35/00
    • G01R15/14—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks
    • G01R15/20—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using galvano-magnetic devices, e.g. Hall-effect devices, i.e. measuring a magnetic field via the interaction between a current and a magnetic field, e.g. magneto resistive or Hall effect devices
    • G01R15/202—Adaptations providing voltage or current isolation, e.g. for high-voltage or high-current networks using galvano-magnetic devices, e.g. Hall-effect devices, i.e. measuring a magnetic field via the interaction between a current and a magnetic field, e.g. magneto resistive or Hall effect devices using Hall-effect devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/0023—Electronic aspects, e.g. circuits for stimulation, evaluation, control; Treating the measured signals; calibration
    • G01R33/0029—Treating the measured signals, e.g. removing offset or noise
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/007—Environmental aspects, e.g. temperature variations, radiation, stray fields
    • G01R33/0082—Compensation, e.g. compensating for temperature changes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
    • G01R33/07—Hall effect devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
    • G01R33/07—Hall effect devices
    • G01R33/072—Constructional adaptation of the sensor to specific applications
    • G01R33/075—Hall devices configured for spinning current measurements

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Health & Medical Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Environmental & Geological Engineering (AREA)
  • Toxicology (AREA)
  • Hall/Mr Elements (AREA)
  • Measuring Magnetic Variables (AREA)
GBGB1319627.4A 2013-11-06 2013-11-06 Hall sensor readout system with offset determination using the hall element itself Ceased GB201319627D0 (en)

Priority Applications (6)

Application Number Priority Date Filing Date Title
GBGB1319627.4A GB201319627D0 (en) 2013-11-06 2013-11-06 Hall sensor readout system with offset determination using the hall element itself
EP14793852.6A EP3066487B1 (en) 2013-11-06 2014-11-06 Hall sensor readout system with offset determination using the hall element itself
JP2016527287A JP6496314B2 (ja) 2013-11-06 2014-11-06 ホール素子自体を用いるオフセット決定を行うホールセンサ読み出しシステム
US15/034,738 US10345394B2 (en) 2013-11-06 2014-11-06 Hall sensor readout system with offset determination using the Hall element itself
PCT/EP2014/073856 WO2015067675A1 (en) 2013-11-06 2014-11-06 Hall sensor readout system with offset determination using the hall element itself
KR1020167014458A KR20160083888A (ko) 2013-11-06 2014-11-06 홀 요소 자체를 이용한 오프셋 결정의 홀 센서 판독 시스템

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GBGB1319627.4A GB201319627D0 (en) 2013-11-06 2013-11-06 Hall sensor readout system with offset determination using the hall element itself

Publications (1)

Publication Number Publication Date
GB201319627D0 true GB201319627D0 (en) 2013-12-18

Family

ID=49767776

Family Applications (1)

Application Number Title Priority Date Filing Date
GBGB1319627.4A Ceased GB201319627D0 (en) 2013-11-06 2013-11-06 Hall sensor readout system with offset determination using the hall element itself

Country Status (6)

Country Link
US (1) US10345394B2 (enExample)
EP (1) EP3066487B1 (enExample)
JP (1) JP6496314B2 (enExample)
KR (1) KR20160083888A (enExample)
GB (1) GB201319627D0 (enExample)
WO (1) WO2015067675A1 (enExample)

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DE102016110612B4 (de) 2016-06-09 2024-05-02 Elmos Semiconductor Se Verfahren zum Betrieb einer Hall-Struktur mit vergrößerter Signalamplitude
DE102016110613B4 (de) 2016-06-09 2024-05-02 Elmos Semiconductor Se Vorrichtung und Verfahren zur Ansteuerung einer Hall-Struktur mit vergrößerter Signalamplitude
DE102016110611B4 (de) 2016-06-09 2024-05-02 Elmos Semiconductor Se Vorrichtung mit einer Hall-Struktur mit einer vergrößerten Signalamplitude
DE102017105317B3 (de) * 2017-03-14 2018-05-09 Helmholtz-Zentrum Dresden - Rossendorf E.V. Vorrichtung zum Charakterisieren des elektrischen Widerstandes eines Messobjekts
US10451688B2 (en) 2017-03-21 2019-10-22 Honeywell International Inc. In-package sensor memory readout
EP3396397B1 (en) * 2017-04-28 2019-11-20 Melexis Technologies SA Bridge sensor biasing and readout
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JP7365771B2 (ja) 2019-01-31 2023-10-20 エイブリック株式会社 半導体装置
CN110542870B (zh) * 2019-08-08 2021-08-24 宁波中车时代传感技术有限公司 霍尔传感器集成芯片灵敏度和零点温漂的补偿电路及方法
US11965939B2 (en) 2021-04-12 2024-04-23 Samsung Electronics Co., Ltd. Electronic device compensating for geomagnetic sensing data and method for controlling the same
KR20220140980A (ko) * 2021-04-12 2022-10-19 삼성전자주식회사 지자기 센싱 데이터를 보상하는 전자 장치 및 그 제어 방법
GB2618382B (en) * 2022-05-06 2025-07-09 Coroflo Ltd Compact target flow meter
CN115251878B (zh) * 2022-08-01 2024-06-18 北京航空航天大学 基于霍尔原件阵列的磁场自由区域检测及标定系统、方法
CN117706157B (zh) * 2022-09-06 2025-10-28 苏州纳芯微电子股份有限公司 电流感测装置
CN115902346A (zh) * 2022-10-18 2023-04-04 苏州纳芯微电子股份有限公司 电流感测模块、用电设备及电流感测方法
CN115728536A (zh) * 2022-10-18 2023-03-03 苏州纳芯微电子股份有限公司 电流传感器、用电设备及电流量测方法
CN115902345B (zh) * 2022-10-18 2024-07-02 苏州纳芯微电子股份有限公司 电流检测模块、用电设备及电流检测方法

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Also Published As

Publication number Publication date
JP2017500733A (ja) 2017-01-05
EP3066487B1 (en) 2018-04-25
EP3066487A1 (en) 2016-09-14
JP6496314B2 (ja) 2019-04-03
KR20160083888A (ko) 2016-07-12
US10345394B2 (en) 2019-07-09
US20160252589A1 (en) 2016-09-01
WO2015067675A1 (en) 2015-05-14

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Legal Events

Date Code Title Description
AT Applications terminated before publication under section 16(1)