JP2017067688A - 異物検査装置 - Google Patents
異物検査装置 Download PDFInfo
- Publication number
- JP2017067688A JP2017067688A JP2015195923A JP2015195923A JP2017067688A JP 2017067688 A JP2017067688 A JP 2017067688A JP 2015195923 A JP2015195923 A JP 2015195923A JP 2015195923 A JP2015195923 A JP 2015195923A JP 2017067688 A JP2017067688 A JP 2017067688A
- Authority
- JP
- Japan
- Prior art keywords
- unit
- ray
- inspection
- foreign matter
- metal detection
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000007689 inspection Methods 0.000 title claims abstract description 139
- 238000001514 detection method Methods 0.000 claims abstract description 98
- 229910052751 metal Inorganic materials 0.000 claims abstract description 78
- 239000002184 metal Substances 0.000 claims abstract description 78
- 230000003993 interaction Effects 0.000 claims abstract description 5
- 230000032258 transport Effects 0.000 claims description 37
- 238000011144 upstream manufacturing Methods 0.000 claims description 7
- 239000000126 substance Substances 0.000 description 10
- 239000000758 substrate Substances 0.000 description 7
- 230000005540 biological transmission Effects 0.000 description 6
- 239000000463 material Substances 0.000 description 5
- 238000012545 processing Methods 0.000 description 5
- 125000002066 L-histidyl group Chemical group [H]N1C([H])=NC(C([H])([H])[C@](C(=O)[*])([H])N([H])[H])=C1[H] 0.000 description 4
- 230000006870 function Effects 0.000 description 4
- 238000000034 method Methods 0.000 description 4
- 229910001220 stainless steel Inorganic materials 0.000 description 4
- 239000010935 stainless steel Substances 0.000 description 4
- 238000003860 storage Methods 0.000 description 4
- 230000008859 change Effects 0.000 description 3
- 230000035699 permeability Effects 0.000 description 3
- 229910052782 aluminium Inorganic materials 0.000 description 2
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 2
- 238000004140 cleaning Methods 0.000 description 2
- 238000004891 communication Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 238000012423 maintenance Methods 0.000 description 2
- 230000007246 mechanism Effects 0.000 description 2
- 230000004044 response Effects 0.000 description 2
- 230000035945 sensitivity Effects 0.000 description 2
- 238000002834 transmittance Methods 0.000 description 2
- 230000008901 benefit Effects 0.000 description 1
- 238000011109 contamination Methods 0.000 description 1
- 238000012905 input function Methods 0.000 description 1
- 230000001678 irradiating effect Effects 0.000 description 1
- 239000000696 magnetic material Substances 0.000 description 1
- 230000005415 magnetization Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000005022 packaging material Substances 0.000 description 1
- 229910052573 porcelain Inorganic materials 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 1
- 229910052721 tungsten Inorganic materials 0.000 description 1
- 239000010937 tungsten Substances 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
- G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
- G01N23/18—Investigating the presence of flaws defects or foreign matter
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
Landscapes
- Health & Medical Sciences (AREA)
- Chemical & Material Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Toxicology (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Electrochemistry (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2015195923A JP2017067688A (ja) | 2015-10-01 | 2015-10-01 | 異物検査装置 |
| PCT/JP2016/079138 WO2017057738A1 (fr) | 2015-10-01 | 2016-09-30 | Dispositif d'inspection de matière étrangère |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2015195923A JP2017067688A (ja) | 2015-10-01 | 2015-10-01 | 異物検査装置 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JP2017067688A true JP2017067688A (ja) | 2017-04-06 |
Family
ID=58424130
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2015195923A Pending JP2017067688A (ja) | 2015-10-01 | 2015-10-01 | 異物検査装置 |
Country Status (2)
| Country | Link |
|---|---|
| JP (1) | JP2017067688A (fr) |
| WO (1) | WO2017057738A1 (fr) |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH11183407A (ja) * | 1997-12-18 | 1999-07-09 | Shimadzu Corp | Ｘ線異物検査装置 |
| JP2003307572A (ja) * | 2002-04-12 | 2003-10-31 | San Denshi Kk | 上載せ及び自立型金属検知機 |
| JP2006038691A (ja) * | 2004-07-28 | 2006-02-09 | Anritsu Sanki System Co Ltd | 物品検査装置 |
| JP2006337340A (ja) * | 2005-06-06 | 2006-12-14 | Ishida Co Ltd | Ｘ線検査装置 |
| JPWO2005043149A1 (ja) * | 2003-10-30 | 2007-11-29 | トック・エンジニアリング株式会社 | ハイブリッド型異物検知装置とそのトレサビリティ用システム |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2008039442A (ja) * | 2006-08-02 | 2008-02-21 | Ishida Co Ltd | Ｘ線検査装置 |
-
2015
- 2015-10-01 JP JP2015195923A patent/JP2017067688A/ja active Pending
-
2016
- 2016-09-30 WO PCT/JP2016/079138 patent/WO2017057738A1/fr active Application Filing
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH11183407A (ja) * | 1997-12-18 | 1999-07-09 | Shimadzu Corp | Ｘ線異物検査装置 |
| JP2003307572A (ja) * | 2002-04-12 | 2003-10-31 | San Denshi Kk | 上載せ及び自立型金属検知機 |
| JPWO2005043149A1 (ja) * | 2003-10-30 | 2007-11-29 | トック・エンジニアリング株式会社 | ハイブリッド型異物検知装置とそのトレサビリティ用システム |
| JP2006038691A (ja) * | 2004-07-28 | 2006-02-09 | Anritsu Sanki System Co Ltd | 物品検査装置 |
| JP2006337340A (ja) * | 2005-06-06 | 2006-12-14 | Ishida Co Ltd | Ｘ線検査装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| WO2017057738A1 (fr) | 2017-04-06 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20180927 |
|
| A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20190924 |
|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20191125 |
|
| A02 | Decision of refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A02 Effective date: 20200414 |