WO2017057738A1 - Dispositif d'inspection de matière étrangère - Google Patents

Dispositif d'inspection de matière étrangère Download PDF

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Publication number
WO2017057738A1
WO2017057738A1 PCT/JP2016/079138 JP2016079138W WO2017057738A1 WO 2017057738 A1 WO2017057738 A1 WO 2017057738A1 JP 2016079138 W JP2016079138 W JP 2016079138W WO 2017057738 A1 WO2017057738 A1 WO 2017057738A1
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WO
WIPO (PCT)
Prior art keywords
unit
inspection
ray
foreign matter
metal detection
Prior art date
Application number
PCT/JP2016/079138
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English (en)
Japanese (ja)
Inventor
真也 飯永
Original Assignee
株式会社イシダ
日新電子工業株式会社
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Filing date
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Application filed by 株式会社イシダ, 日新電子工業株式会社 filed Critical 株式会社イシダ
Publication of WO2017057738A1 publication Critical patent/WO2017057738A1/fr

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/18—Investigating the presence of flaws defects or foreign matter
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables

Definitions

  • This disclosure relates to a foreign matter inspection apparatus.
  • Patent Document 1 X-ray inspection for detecting foreign matter contained in an object to be inspected using X-ray permeability and foreign matter contained in the object to be inspected using an interaction between a magnetic field and a metal are disclosed.
  • a foreign substance inspection apparatus capable of performing both of metal detection and the detection is described.
  • an X-ray inspection unit that performs X-ray inspection is housed in a housing, and external leakage of X-rays is suppressed, and a metal detection unit that performs metal detection and an inspection target are included in the same housing. At least a part of a transport unit that transports an object is accommodated. In such a configuration, the inside of the housing may be narrow, and it may be difficult for an operator to perform maintenance work such as cleaning the inside of the housing.
  • This disclosure is intended to provide a foreign matter inspection apparatus capable of improving maintainability.
  • a foreign matter inspection apparatus is included in a conveyance unit that conveys an inspection object along a conveyance path and an inspection object that is conveyed by the conveyance unit using X-ray permeability.
  • An X-ray inspection unit that detects foreign matter a DC-type metal detection unit that detects foreign matter contained in an object being transported by the transport unit using the interaction between the magnetic field and metal, and a transport unit
  • a housing that houses at least a portion of the metal detection unit and the X-ray inspection unit and suppresses external leakage of X-rays of the X-ray inspection unit, the metal detection unit facing the conveyance path
  • a detection head including a search coil and the detection head has a cantilever structure supported on one side in the width direction of the conveyance path.
  • This foreign substance inspection apparatus has a cantilever structure in which the detection head of the metal detection unit housed in the housing is supported on one side in the width direction of the conveyance path. Thereby, it becomes possible for the worker to easily insert a hand from the other side in the width direction of the transport path into the back of the metal detection unit in the housing, and to facilitate cleaning and maintenance in the housing. . As a result, the maintainability of the foreign substance inspection apparatus can be improved.
  • the metal detection unit is disposed on the upstream side of the detection head in the conveyance direction, and includes a magnetizer that magnetizes the inspection object, and the X-ray inspection unit detects in the conveyance direction. It may be arranged between the head and the magnetizer. According to this configuration, the X-ray inspection unit can be arranged using the space between the detection head and the magnetizer in the metal detection unit, and the apparatus can be downsized.
  • the transport unit may be a conveyor, and the conveyor may have a cantilever structure supported on one side in the width direction of the transport path. According to this configuration, the worker can easily insert his / her hand from the other side in the width direction of the conveyance path into the back of the conveyor in the housing, and the maintainability of the foreign matter inspection apparatus can be further improved. It becomes possible.
  • FIG. 1 is a front view of a foreign matter inspection apparatus according to an embodiment.
  • FIG. 2 is a conceptual diagram illustrating the internal configuration and control system of the foreign matter inspection apparatus shown in FIG.
  • FIG. 3 is a schematic perspective view of the configuration of the examination room in the housing shown in FIG.
  • FIG. 4A is a left side view of the configuration shown in FIG.
  • FIG. 4B is a right side view of the configuration shown in FIG.
  • FIG. 1 is a front view of a foreign matter inspection apparatus 1 according to an embodiment.
  • a foreign matter inspection device 1 shown in FIG. 1 is a device that detects foreign matter contained in an inspection object.
  • the inspected object is, for example, food.
  • the foreign object inspection apparatus 1 performs X-ray inspection and metal detection while conveying the inspection object in the interior thereof, and inspects whether or not the inspection object contains foreign objects.
  • X-ray inspection is a technique for detecting foreign matter contained in an object to be inspected using X-ray transparency, and is realized by the X-ray inspection unit 2 (see FIG. 2).
  • metal detection is a technique for detecting foreign matter contained in an object to be inspected by utilizing the interaction between a magnetic field and metal, and is realized by a direct current type metal detection unit 3 (see FIG. 2). In metal detection, a metal foreign object can be detected. Details of the X-ray inspection unit 2 and the metal detection unit 3 will be described later.
  • the foreign matter inspection apparatus 1 has a housing 4 in which a space is defined.
  • the housing 4 accommodates the X-ray inspection unit 2 and the metal detection unit 3 therein.
  • the housing 4 shields X-rays generated by the X-ray inspection unit 2 and suppresses external leakage of X-rays.
  • the housing 4 is made of, for example, stainless steel.
  • the housing 4 has a box shape in this embodiment.
  • An opening 4 a that communicates with the inside of the housing 4 is formed on the left side surface of the housing 4.
  • an opening 4 b that communicates with the inside of the housing 4 is formed on the right side surface of the housing 4.
  • the object to be inspected is carried into the inside of the housing 4 from the opening 4a and inspected, and is carried out of the housing 4 through the opening 4b. That is, the opening 4a serves as an inspection object carry-in port, and the opening 4b serves as an inspection object carry-out port.
  • an upper door 40 and a lower door 41 that open and close the housing 4 are provided on the front surface of the housing 4.
  • the upper door 40 and the lower door 41 have a hinged door structure, for example. By opening or closing the upper door 40 or the lower door 41, at least a part of an X-ray inspection unit 2 and a metal detection unit 3 described later are exposed to the outside.
  • the upper door 40 and the lower door 41 are made of, for example, stainless steel.
  • a display 5 and an operation switch 6 are provided on the front surface of the upper door 40.
  • the display 5 is a display device having both a display function and an input function, for example, a touch panel.
  • the display 5 displays the result of X-ray inspection and metal detection, and also displays an operation screen for setting various parameters related to metal detection and X-ray inspection.
  • the operation switch 6 is a power switch for the X-ray inspection unit 2 and the metal detection unit 3.
  • the housing 4 is supported by a support base 7.
  • a notification unit 8 and a cooler 9 are provided on the upper surface of the housing 4.
  • the notification unit 8 notifies of foreign matter contamination and the operating state of the device.
  • the notification unit 8 includes a first notification device 81 corresponding to the X-ray inspection unit 2 and a second notification device 82 corresponding to the metal detection unit 3.
  • the cooler 9 sends cool air to the inside of the housing 4 and adjusts the temperature of the devices arranged inside the housing 4.
  • FIG. 2 is a conceptual diagram illustrating the internal configuration and control system of the foreign matter inspection apparatus 1 shown in FIG.
  • the inside of the housing 4 is inspected with a substrate chamber T ⁇ b> 1 in which a part of an X-ray generator to be described later and a control board of a component are arranged, and an object S to be inspected. It is divided into the inspection room T2 to be performed. The temperature of the substrate chamber T1 is adjusted by the cooler 9 described above.
  • a conveyor (conveying unit) 10 for conveying the inspection object S is disposed.
  • the conveyor 10 is a roller belt conveyor in the present embodiment, and extends in the horizontal direction inside the housing 4 with one end located in the opening 4a and the other end located in the opening 4b. is doing. That is, the housing
  • the conveyor 10 according to the present embodiment carries the inspection object S into the housing 4 through the opening 4a and carries the inspection object S out of the housing 4 through the opening 4b.
  • An X-ray shielding curtain 42 is disposed in the opening 4a.
  • an X-ray shielding curtain 43 is disposed in the opening 4b.
  • the X-ray shielding curtains 42 and 43 have upper ends that are fixed to the housing 4 and lower ends that are free ends.
  • the X-ray shielding curtains 42 and 43 shield X-rays generated by the X-ray inspection unit 2 and suppress external leakage of X-rays.
  • the X-ray shielding curtains 42 and 43 are made of, for example, a flexible material containing tungsten.
  • the loading conveyor 11 may be disposed on the right side of the conveyor 10 and the unloading conveyor 12 may be disposed on the left side of the conveyor 10. Further, the carry-out conveyor 12 may have a function of distributing the inspection object S.
  • the X-ray inspection unit 2 includes an X-ray inspection control unit 20, an X-ray generator 21, and an X-ray detector 22.
  • the X-ray generator 21 includes an X-ray source that generates X-rays and a slit mechanism.
  • the X-ray detector 22 detects X-rays generated by the X-ray generator 21.
  • the X-ray generator 21 and the X-ray detector 22 are arranged to face each other so as to sandwich the conveyor 10 from above and below.
  • an X-ray source and the like are disposed in the substrate chamber T1, and a mechanism for irradiating X-rays is disposed in the examination chamber T2.
  • the X-ray detector 22 for example, a line sensor in which a plurality of X-ray detection sensors are arranged in parallel in the front-rear direction is used.
  • the X-ray detector 22 is accommodated in the substrate case 23 in order to reduce X-ray leakage.
  • the substrate case 23 is provided with a slit for allowing X-rays to reach the X-ray detector 22.
  • the X-ray inspection control unit 20 temporarily stores an input / output interface I / O for inputting / outputting signals to / from the outside, a ROM (Read Only Memory) in which a program and information for processing are stored, and data. It has a storage medium such as RAM (Random Access Memory) and HDD (Hard Disk Drive), a CPU (Central Processing Unit), a communication circuit, and the like.
  • the X-ray inspection control unit 20 stores input data in the RAM based on a signal output from the CPU, loads a program stored in the ROM into the RAM, and executes the program loaded in the RAM. The functions described later are realized.
  • the X-ray inspection control unit 20 is disposed in the substrate chamber T1 and connected to the X-ray generator 21 and the X-ray detector 22.
  • the X-ray inspection control unit 20 is connected to the display 5 and receives operation information from an operator via an operation screen.
  • the X-ray inspection control unit 20 sets operation profiles of the X-ray generator 21 and the X-ray detector 22 based on the operation information, and controls operations of the X-ray generator 21 and the X-ray detector 22.
  • the X-ray inspection control unit 20 detects the inspection object S using the laser sensor 24 arranged on the upstream side of the X-ray inspection unit 2, the X-ray inspection control unit 20 starts inspection of the inspection object S.
  • the X-ray inspection control unit 20 controls the X-ray generator 21 to irradiate the inspection object S being conveyed by the conveyor 10 with X-rays.
  • the X-ray detector 22 measures the X-ray transmission amount of X-rays that have passed through the inspection object S, and outputs the measured X-ray transmission amount to the X-ray inspection control unit 20.
  • the X-ray inspection control unit 20 generates an X-ray transmission image in which the X-ray transmission amount acquired in time series is reflected in the pixel value. Then, the X-ray inspection control unit 20 detects the foreign matter by analyzing the X-ray transmission image using an image processing technique. For example, the X-ray inspection control unit 20 determines whether there is an image region in which the difference from the reference transmittance of the inspection object S is a predetermined value or more based on the pixel value of the X-ray transmission image. The X-ray inspection control unit 20 determines that a foreign object has been detected when there is an image region in which the difference from the reference transmittance of the inspection object S is a predetermined value or more.
  • the X-ray inspection control unit 20 displays the result data of the X-ray inspection on the display 5 or stores the result data in the storage unit in response to a request from the worker. Further, the X-ray inspection control unit 20 indicates that when the X-ray generator 21 and the X-ray detector 22 are operating normally, the device relating to the X-ray inspection is operating using the first alarm 81. To the workers. Further, when it is determined that a foreign object has been detected, the X-ray inspection control unit 20 notifies the worker that the foreign object has been detected using the first notification device 81.
  • the metal detection unit 3 is a DC type device that performs metal detection using a DC magnetic field.
  • the metal detection unit 3 includes a magnetizer 39 that generates a DC magnetic field, and two or three or more search coils as reception coils.
  • the search coils are arranged so that, for example, equal amounts of magnetic field lines intersect.
  • the metal detection unit 3 for example, when the inspection object S magnetized by the magnetizer 39 passes through the DC magnetic field, if the magnetic metal foreign matter is mixed in the inspection object S, the inspection object S passes. As a result, the magnetic field lines change. This change in the magnetic field lines is detected as a difference in electromotive force between the search coils, and as a result, foreign matter is detected.
  • stainless steel frequently used in food production facilities is a non-magnetic material, but has a property of being magnetized by processing or the like, so the direct current type metal detector 3 can detect stainless steel as a foreign substance. is there.
  • the DC-type metal detection unit 3 can detect only the foreign substance of the magnetic metal that is mixed even with the inspection object using aluminum as the packaging material.
  • the metal detection control unit 30 includes an input / output interface I / O for inputting / outputting signals to / from the outside, a ROM storing programs and information for processing, a RAM for temporarily storing data, an HDD, etc. Storage medium, CPU, and communication circuit.
  • the metal detection control unit 30 stores input data in the RAM based on a signal output from the CPU, loads a program stored in the ROM into the RAM, and executes the program loaded into the RAM, which will be described later. Realize the function to do.
  • the metal detection control unit 30 is disposed in the substrate chamber T1 and connected to the X-ray inspection control unit 20, and receives operation information from the worker input to the operation screen of the display 5 via the X-ray inspection control unit 20. Accept.
  • the metal detection control unit 30 sets an operation profile of the search coil based on the operation information.
  • the metal detection control unit 30 detects the inspection object S using the laser sensor 25 disposed on the upstream side of the metal detection unit 3, the metal detection control unit 30 starts metal detection of the inspection object S.
  • the metal detection control unit 30 acquires a change in the magnetic field lines in the DC magnetic field as an electromotive force difference of the search coil, and determines metal detection.
  • the metal detection control unit 30 displays the metal detection result data on the display 5 or stores the result data in the storage unit in response to a request from the worker.
  • the metal detection control unit 30 uses the second notification device 82 to notify the worker that the device related to metal detection is operating. Furthermore, when the metal detection control unit 30 determines that a foreign object has been detected, the metal detection control unit 30 notifies the worker that the foreign object has been detected using the second notification device 82.
  • the X-ray inspection unit 2 and the metal detection unit 3 described above are configured to be independently operable. That is, the foreign substance inspection apparatus 1 can perform not only both the X-ray inspection and the metal detection but also any one of the X-ray inspection and the metal detection.
  • the X-ray inspection unit 2 since the X-ray inspection unit 2 performs display control of the display 5, the operation screen of the metal detection unit 3 is displayed on the display 5 when the X-ray inspection unit 2 is stopped. Not. For this reason, a sub-display (not shown) connected to the metal detection unit 3 is disposed inside the housing 4.
  • the metal detection unit 3 receives operation information via the sub display and displays result data or the like on the sub display.
  • FIG. 3 is a schematic perspective view of the configuration inside the examination room T2 in the housing 4 of FIG.
  • FIG. 4A is a left side view of the configuration of FIG.
  • FIG. 4B is a right side view of the configuration of FIG.
  • front side the front side of the foreign substance inspection apparatus 1
  • back side the side opposite to the front side
  • the foreign object inspection apparatus 1 includes a conveyor 10, a metal detection unit 3, and an X-ray inspection unit 2 in an inspection room T2.
  • the conveyor 10 is a transport unit that transports the inspection object S along the transport path 13.
  • the conveyor 10 includes an endless (annular) belt 14 that constitutes a conveyance path 13 and a plurality of rollers 15 that support the belt 14 so as to be driven.
  • the belt 14 is driven by a motor via a drive pulley (not shown).
  • the conveyor 10 is not particularly limited, and various known conveying means can be adopted as long as the object to be inspected S is conveyed along the conveying path 13.
  • the metal detector 3 includes a detector 38 and a magnetizer 39.
  • the detector 38 has a horizontal U shape (a U shape) when viewed from the side.
  • the detector 38 includes a pair of detection heads 38A and 38B that are opposed to each other with the belt 14 interposed therebetween.
  • the detection head 38 ⁇ / b> A is disposed above the belt 14 by a predetermined length and faces the conveyance path 13.
  • One or a plurality of search coils as receiving coils are provided in the detection head 38A.
  • the detection head 38B is disposed in the ring of the belt 14 and faces the conveyance path 13.
  • One or a plurality of search coils as receiving coils are provided in the detection head 38B.
  • the magnetizer 39 magnetizes the magnetic foreign metal contained in the inspection object S.
  • the magnetizer 39 is disposed on the upstream side of the detector 38 in the transport direction.
  • the magnetizer 39 has an inverted L shape when viewed from the side.
  • the magnetizer 39 includes a magnetizing head 39 ⁇ / b> A (see FIG. 4B) disposed above the belt 14 by a predetermined length.
  • the magnetizing head 39 ⁇ / b> A faces the conveyance path 13.
  • the magnetizing head 39A is provided with a permanent magnet, for example.
  • the X-ray inspection unit 2 is disposed between the detector 38 (detection heads 38A and 38B) and the magnetizer 39 (magnetization head 39A) in the transport direction.
  • the X-ray inspection unit 2 performs an X-ray inspection on the inspection object S being conveyed by the conveyor 10 at a position between the detector 38 and the magnetizer 39.
  • the detection heads 38 ⁇ / b> A and 38 ⁇ / b> B of the metal detection unit 3 have a cantilever structure supported on the back side, which is one side in the width direction of the transport path 13. .
  • the detection heads 38A and 38B have a block-like outer shape with the vertical direction as the thickness direction, and are supported on the back side and on the other side in the width direction of the transport path 13. It is configured to protrude horizontally toward a certain front side.
  • the detector 38 is fixed to the support 46 in the housing 4 in a cantilever structure with the U-shaped opening side facing forward, and the detection heads 38A and 38B are held in a cantilever structure. ing.
  • the magnetizing head 39A of the metal detection unit 3 has a cantilever structure supported on the back side.
  • the magnetizing head 39 ⁇ / b> A has an arm-like outer shape along the width direction of the transport path 13.
  • the magnetizing head 39A is supported on the back side and is configured to protrude horizontally toward the near side.
  • the magnetizer 39 here includes, for example, a support column 39B standing in the casing 4, and a magnetizing head 39A is held in a cantilever structure at the upper end of the support column 39B.
  • the conveyor 10 has a cantilever structure supported on its back side.
  • the end on the back side of the roller 15 of the conveyor 10 is rotatably supported by a stay 47 in the housing 4, and the conveyor 10 is held in a cantilever structure.
  • Such a conveyor 10 is configured to be detachable along the width direction of the transport path 13 (that is, removable toward the front side and attachable toward the back side).
  • the near side of the conveyor 10 may be covered and protected by a cover part (not shown).
  • the foreign matter inspection apparatus 1 has a cantilever structure in which the detection heads 38A and 38B of the metal detection unit 3 housed in the housing 4 are supported on the back side.
  • the worker can easily insert his / her hand from the near side into the back of the metal detection unit 3 in the housing 4, and can easily clean and maintain the housing 4. .
  • the maintainability of the foreign object inspection apparatus 1 can be improved.
  • the metal detection unit 3 includes a magnetizer 39 disposed upstream of the detection heads 38A and 38B in the transport direction, and the X-ray inspection unit 2 is attached to the detection heads 38A and 38B in the transport direction. It is arranged between the porcelain 39. According to this configuration, the X-ray inspection unit 2 can be arranged using the space between the detection heads 38A and 38B and the magnetizer 39 in the metal detection unit 3, and the apparatus can be downsized.
  • the conveyor 10 has a cantilever structure supported on the back side. According to this configuration, the worker can easily insert his / her hand from the front side into the inside of the conveyor 10 in the housing 4, and the maintainability of the foreign matter inspection apparatus 1 can be further improved. It becomes.
  • the magnetizing head 39 ⁇ / b> A of the metal detection unit 3 housed in the housing 4 has a cantilever structure supported on the back side. Therefore, the operator can more easily insert his / her hand from the front side into the back of the metal detection unit 3 in the housing 4, and the maintainability of the foreign matter inspection apparatus 1 can be further improved. .
  • the X-ray inspection unit 2 is disposed between the detection heads 38A and 38B and the magnetizer 39 in the transport direction, but the arrangement of the X-ray inspection unit 2 is not limited.
  • the X-ray inspection unit 2 may be disposed on the upstream side of the magnetizer 39 in the transport direction, or may be disposed on the downstream side of the detection heads 38A and 38B in the transport direction.
  • the method of the metal detection unit 3 is not limited, and a magnetized type may be used as in the above-described embodiment, or an alternating magnetic type may be used.
  • the magnetizer 39 has an inverted L shape when viewed from the side, and this corresponds to a case where the sensitivity may be low or cost reduction.
  • the shape of the magnetizer 39 is not particularly limited.
  • the magnetizer 39 may have a horizontal U shape (a U shape) when viewed from the side, similarly to the detector 38.
  • the magnetizer 39 further includes another magnetizing head that faces the magnetizing head 39 ⁇ / b> A via the belt 14, and the other magnetizing head is disposed in the ring of the belt 14.
  • the sensitivity can be increased by configuring the magnetizer 39 in a horizontal U shape (U shape).

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Abstract

L'invention concerne un dispositif d'inspection de matière étrangère qui comprend : une unité de transport pour transporter un objet inspecté le long d'un trajet de transport ; une unité d'inspection par rayons X grâce à laquelle de la matière étrangère incluse dans l'objet inspecté transporté par l'unité de transport est détectée par radiotransparence ; une unité de détection de métal de type à courant continu grâce à laquelle la matière étrangère incluse dans l'objet inspecté transporté par l'unité de transport est détectée par l'interaction entre des champs magnétiques et des métaux ; et un boîtier pour supprimer la fuite de rayons X de l'unité d'inspection par rayons X, ledit boîtier recevant en son sein l'unité d'inspection par rayons X, l'unité de détection de métal, et au moins une partie de l'unité de transport. L'unité de détection de métal comprend une tête de détection positionnée de manière à faire face au trajet de transport, la tête de détection comprenant une bobine de recherche. La tête de détection a une structure en porte-à-faux soutenue sur un côté de direction axiale du trajet de transport.
PCT/JP2016/079138 2015-10-01 2016-09-30 Dispositif d'inspection de matière étrangère WO2017057738A1 (fr)

Applications Claiming Priority (2)

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JP2015195923A JP2017067688A (ja) 2015-10-01 2015-10-01 異物検査装置
JP2015-195923 2015-10-01

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WO2017057738A1 true WO2017057738A1 (fr) 2017-04-06

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WO2005043149A1 (fr) * 2003-10-30 2005-05-12 Tok Engineering Co., Ltd. Detecteur de matieres etrangeres de type hybride et son systeme d'utilisation et de traçabilite
JP2006038691A (ja) * 2004-07-28 2006-02-09 Anritsu Sanki System Co Ltd 物品検査装置
JP2006337340A (ja) * 2005-06-06 2006-12-14 Ishida Co Ltd Ｘ線検査装置
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