JP7011261B2 - 異物検査装置 - Google Patents
異物検査装置 Download PDFInfo
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- JP7011261B2 JP7011261B2 JP2018521737A JP2018521737A JP7011261B2 JP 7011261 B2 JP7011261 B2 JP 7011261B2 JP 2018521737 A JP2018521737 A JP 2018521737A JP 2018521737 A JP2018521737 A JP 2018521737A JP 7011261 B2 JP7011261 B2 JP 7011261B2
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- G—PHYSICS
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- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
- G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
- G01N23/16—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the material being a moving sheet or film
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- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
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- Analysing Materials By The Use Of Radiation (AREA)
- Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
Description
Claims (5)
- 被検査物を搬送する搬送部と、
磁界と金属との相互作用を利用して、前記搬送部で搬送されている前記被検査物に含まれる金属を異物として検出する金属検出部と、
X線の透過性を利用して、前記搬送部で搬送されている前記被検査物に含まれる異物を検出するX線検査部と、
前記搬送部の少なくとも一部、前記X線検査部、及び前記金属検出部を内部に収容し、前記搬送部による前記被検査物の搬入口、及び前記搬送部による前記被検査物の搬出口を有する筐体と、を備え、
前記搬送部は、
前記搬送部による前記被検査物の搬送領域の上流端に配置された第1送りローラと、
前記搬送領域の下流端に配置された第2送りローラと、
前記第1送りローラ及び前記第2送りローラに架けられた無端ベルトと、
前記搬送領域において前記無端ベルトを支持する支持プレートと、を有し、
前記支持プレートは、前記搬送部による前記被検査物の搬送方向に沿って並設され且つ互いに分離された複数の支持部分を含み、
互いに隣り合う前記支持部分のうちの一方の支持部分は、
第1本体プレートと、
前記第1本体プレートの下側に取り付けられ、互いに隣り合う前記支持部分のうちの他方の支持部分側に突出する少なくとも1つの第1係合部と、を有し、
前記他方の支持部分は、
第2本体プレートと、
前記第2本体プレートの下側に取り付けられ、前記一方の支持部分側に突出する複数の第2係合部と、を有し、
前記一方の支持部分及び前記他方の支持部分は、少なくとも1つの前記第1係合部が、互いに隣り合う前記第2係合部の間に位置した状態で、互いに係合しており、
前記第1本体プレートの上面及び前記第2本体プレートの上面は、同一の平面上に位置しており、前記無端ベルトの支持面を構成している、異物検査装置。 - 複数の前記支持部分のいずれか1つには、前記X線検査部のX線が通過する開口が形成されている、請求項1に記載の異物検査装置。
- 前記金属検出部は、サーチコイルが内部に配置され且つ前記搬送部が内部を通過しているケースを有し、
複数の前記支持部分は、前記ケースの外側で互いに分離されている、請求項1又は2に記載の異物検査装置。 - 前記搬送部は、
前記第1送りローラ、及び複数の前記支持部分のうち前記搬送領域の最も上流側に配置された前記支持部分が取り付けられた第1支持フレームと、
前記第2送りローラ、及び複数の前記支持部分のうち前記搬送領域の最も下流側に配置された前記支持部分が取り付けられた第2支持フレームと、を更に有する、請求項1~3のいずれか一項に記載の異物検査装置。 - 前記支持プレートは、前記搬送方向に沿って並設され且つ互いに分離された2つ又は3つの前記支持部分を含む、請求項1~4のいずれか一項に記載の異物検査装置。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2016112588 | 2016-06-06 | ||
JP2016112588 | 2016-06-06 | ||
PCT/JP2017/021004 WO2017213146A1 (ja) | 2016-06-06 | 2017-06-06 | 異物検査装置 |
Publications (2)
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JPWO2017213146A1 JPWO2017213146A1 (ja) | 2019-03-28 |
JP7011261B2 true JP7011261B2 (ja) | 2022-01-26 |
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JP2018521737A Active JP7011261B2 (ja) | 2016-06-06 | 2017-06-06 | 異物検査装置 |
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JP (1) | JP7011261B2 (ja) |
CN (1) | CN109313280A (ja) |
WO (1) | WO2017213146A1 (ja) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
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JP6123005B2 (ja) * | 2015-10-01 | 2017-04-26 | 株式会社イシダ | 異物検査装置 |
CN108802072A (zh) * | 2018-06-15 | 2018-11-13 | 珠海格力电器股份有限公司 | 检测装置 |
CN114384985B (zh) * | 2022-03-23 | 2022-07-29 | 山东中颖智超数据科技有限公司 | 一种硬盘数据恢复辅助装置 |
Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2001315941A (ja) | 2000-05-11 | 2001-11-13 | Ishida Co Ltd | コンベア装置及びそれを備えた物品検査機器 |
JP2002341050A (ja) | 2001-05-11 | 2002-11-27 | Ishida Co Ltd | 金属検出装置 |
US20030164766A1 (en) | 2000-04-20 | 2003-09-04 | Britton Andrew Michael | Metal detector |
JP2004301763A (ja) | 2003-03-31 | 2004-10-28 | Tok Engineering Kk | チェーン型コンベヤ対応金属探知装置 |
JP2009109298A (ja) | 2007-10-29 | 2009-05-21 | Uchihashi Estec Co Ltd | 磁性異物検出装置 |
JP2015028465A (ja) | 2013-06-25 | 2015-02-12 | 日新電子工業株式会社 | 異物検査装置 |
JP2017067684A (ja) | 2015-10-01 | 2017-04-06 | 株式会社イシダ | 異物検査装置 |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
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JP3002364B2 (ja) * | 1993-09-10 | 2000-01-24 | アンリツ株式会社 | 金属検出機 |
JP3526263B2 (ja) * | 2000-09-08 | 2004-05-10 | 株式会社イシダ | X線異物検査装置 |
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2017
- 2017-06-06 JP JP2018521737A patent/JP7011261B2/ja active Active
- 2017-06-06 WO PCT/JP2017/021004 patent/WO2017213146A1/ja active Application Filing
- 2017-06-06 CN CN201780034732.4A patent/CN109313280A/zh active Pending
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20030164766A1 (en) | 2000-04-20 | 2003-09-04 | Britton Andrew Michael | Metal detector |
JP2001315941A (ja) | 2000-05-11 | 2001-11-13 | Ishida Co Ltd | コンベア装置及びそれを備えた物品検査機器 |
JP2002341050A (ja) | 2001-05-11 | 2002-11-27 | Ishida Co Ltd | 金属検出装置 |
JP2004301763A (ja) | 2003-03-31 | 2004-10-28 | Tok Engineering Kk | チェーン型コンベヤ対応金属探知装置 |
JP2009109298A (ja) | 2007-10-29 | 2009-05-21 | Uchihashi Estec Co Ltd | 磁性異物検出装置 |
JP2015028465A (ja) | 2013-06-25 | 2015-02-12 | 日新電子工業株式会社 | 異物検査装置 |
JP2017067684A (ja) | 2015-10-01 | 2017-04-06 | 株式会社イシダ | 異物検査装置 |
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Publication number | Publication date |
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JPWO2017213146A1 (ja) | 2019-03-28 |
CN109313280A (zh) | 2019-02-05 |
WO2017213146A1 (ja) | 2017-12-14 |
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