JP2016536781A5 - - Google Patents

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Publication number
JP2016536781A5
JP2016536781A5 JP2016520001A JP2016520001A JP2016536781A5 JP 2016536781 A5 JP2016536781 A5 JP 2016536781A5 JP 2016520001 A JP2016520001 A JP 2016520001A JP 2016520001 A JP2016520001 A JP 2016520001A JP 2016536781 A5 JP2016536781 A5 JP 2016536781A5
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JP
Japan
Prior art keywords
deep trench
semiconductor device
gate
conductivity type
vertical
Prior art date
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Application number
JP2016520001A
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English (en)
Japanese (ja)
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JP2016536781A (ja
JP6492068B2 (ja
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Priority claimed from US14/044,926 external-priority patent/US9123802B2/en
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Publication of JP2016536781A5 publication Critical patent/JP2016536781A5/ja
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Publication of JP6492068B2 publication Critical patent/JP6492068B2/ja
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JP2016520001A 2013-10-03 2014-09-26 インテグレートされたパワー技術における垂直トレンチmosfetデバイス Active JP6492068B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US14/044,926 2013-10-03
US14/044,926 US9123802B2 (en) 2013-10-03 2013-10-03 Vertical trench MOSFET device in integrated power technologies
PCT/US2014/057804 WO2015050792A1 (en) 2013-10-03 2014-09-26 Vertical trench mosfet device in integrated power technologies

Publications (3)

Publication Number Publication Date
JP2016536781A JP2016536781A (ja) 2016-11-24
JP2016536781A5 true JP2016536781A5 (enExample) 2017-10-19
JP6492068B2 JP6492068B2 (ja) 2019-03-27

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ID=52776284

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2016520001A Active JP6492068B2 (ja) 2013-10-03 2014-09-26 インテグレートされたパワー技術における垂直トレンチmosfetデバイス

Country Status (5)

Country Link
US (2) US9123802B2 (enExample)
EP (1) EP3053193A4 (enExample)
JP (1) JP6492068B2 (enExample)
CN (1) CN105765718B (enExample)
WO (1) WO2015050792A1 (enExample)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9224854B2 (en) 2013-10-03 2015-12-29 Texas Instruments Incorporated Trench gate trench field plate vertical MOSFET
CN103500763B (zh) * 2013-10-15 2017-03-15 苏州晶湛半导体有限公司 Ⅲ族氮化物半导体器件及其制造方法
US9627328B2 (en) * 2014-10-09 2017-04-18 Infineon Technologies Americas Corp. Semiconductor structure having integrated snubber resistance
WO2016204794A1 (en) * 2015-06-19 2016-12-22 Intel Corporation Vertical transistor using a through silicon via gate
DE102016112020B4 (de) * 2016-06-30 2021-04-22 Infineon Technologies Ag Leistungshalbleitervorrichtung mit vollständig verarmten Kanalregionen
DE102016112017B4 (de) 2016-06-30 2020-03-12 Infineon Technologies Ag Leistungshalbleitervorrichtung mit vollständig verarmten Kanalregionen und Verfahren zum Betreiben einer Leistungshalbleitervorrichtung
DE102016112016A1 (de) 2016-06-30 2018-01-04 Infineon Technologies Ag Leistungshalbleiter mit vollständig verarmten Kanalregionen
DE102017130092B4 (de) 2017-12-15 2025-08-14 Infineon Technologies Dresden GmbH & Co. KG IGBT mit vollständig verarmbaren n- und p-Kanalgebieten und Verfahren
US12057499B2 (en) * 2018-09-25 2024-08-06 Nxp Usa, Inc. Transistor devices with termination regions
US11171206B2 (en) * 2019-07-11 2021-11-09 Micron Technology, Inc. Channel conduction in semiconductor devices
TWI791871B (zh) 2019-07-19 2023-02-11 力晶積成電子製造股份有限公司 通道全環繞半導體裝置及其製造方法
TWI707438B (zh) 2019-07-19 2020-10-11 力晶積成電子製造股份有限公司 電路架構
CN112086517A (zh) * 2020-10-29 2020-12-15 珠海迈巨微电子有限责任公司 一种槽栅功率半导体器件及其制备方法

Family Cites Families (16)

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Publication number Priority date Publication date Assignee Title
JPH06104446A (ja) * 1992-09-22 1994-04-15 Toshiba Corp 半導体装置
US5365102A (en) * 1993-07-06 1994-11-15 North Carolina State University Schottky barrier rectifier with MOS trench
GB9917099D0 (en) * 1999-07-22 1999-09-22 Koninkl Philips Electronics Nv Cellular trench-gate field-effect transistors
US6593620B1 (en) * 2000-10-06 2003-07-15 General Semiconductor, Inc. Trench DMOS transistor with embedded trench schottky rectifier
JP4570806B2 (ja) * 2001-04-11 2010-10-27 セイコーインスツル株式会社 半導体集積回路装置の製造方法
US7786533B2 (en) * 2001-09-07 2010-08-31 Power Integrations, Inc. High-voltage vertical transistor with edge termination structure
RU2230394C1 (ru) * 2002-10-11 2004-06-10 ОАО "ОКБ "Искра" Биполярно-полевой транзистор с комбинированным затвором
GB0407012D0 (en) * 2004-03-27 2004-04-28 Koninkl Philips Electronics Nv Trench insulated gate field effect transistor
DE102004057791B4 (de) * 2004-11-30 2018-12-13 Infineon Technologies Ag Trenchtransistor sowie Verfahren zu dessen Herstellung
US7595523B2 (en) * 2007-02-16 2009-09-29 Power Integrations, Inc. Gate pullback at ends of high-voltage vertical transistor structure
US8159025B2 (en) * 2010-01-06 2012-04-17 Ptek Technology Co., Ltd. Gate electrode in a trench for power MOS transistors
US8519473B2 (en) * 2010-07-14 2013-08-27 Infineon Technologies Ag Vertical transistor component
JP2012178389A (ja) * 2011-02-25 2012-09-13 Renesas Electronics Corp 半導体装置
US9356133B2 (en) * 2012-02-01 2016-05-31 Texas Instruments Incorporated Medium voltage MOSFET device
US8796760B2 (en) * 2012-03-14 2014-08-05 Taiwan Semiconductor Manufacturing Company, Ltd. Transistor and method of manufacturing the same
CN103681315B (zh) * 2012-09-18 2016-08-10 中芯国际集成电路制造(上海)有限公司 埋层的形成方法

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