JP2016531837A5 - - Google Patents
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- Publication number
- JP2016531837A5 JP2016531837A5 JP2016540423A JP2016540423A JP2016531837A5 JP 2016531837 A5 JP2016531837 A5 JP 2016531837A5 JP 2016540423 A JP2016540423 A JP 2016540423A JP 2016540423 A JP2016540423 A JP 2016540423A JP 2016531837 A5 JP2016531837 A5 JP 2016531837A5
- Authority
- JP
- Japan
- Prior art keywords
- silicon carbide
- carbide boule
- boule
- maximum diameter
- diameter greater
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- HBMJWWWQQXIZIP-UHFFFAOYSA-N silicon carbide Chemical compound [Si+]#[C-] HBMJWWWQQXIZIP-UHFFFAOYSA-N 0.000 claims 19
- 229910010271 silicon carbide Inorganic materials 0.000 claims 19
- 238000000576 coating method Methods 0.000 claims 3
- 230000007547 defect Effects 0.000 claims 2
- 239000002131 composite material Substances 0.000 claims 1
- 239000010410 layer Substances 0.000 claims 1
- 239000011241 protective layer Substances 0.000 claims 1
- 238000000859 sublimation Methods 0.000 claims 1
- 230000008022 sublimation Effects 0.000 claims 1
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201361874640P | 2013-09-06 | 2013-09-06 | |
| US61/874,640 | 2013-09-06 | ||
| PCT/US2014/054301 WO2015035170A1 (en) | 2013-09-06 | 2014-09-05 | Bulk silicon carbide having low defect density |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2019149764A Division JP7054934B2 (ja) | 2013-09-06 | 2019-08-19 | 欠陥密度の低いバルクの炭化ケイ素 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2016531837A JP2016531837A (ja) | 2016-10-13 |
| JP2016531837A5 true JP2016531837A5 (enExample) | 2017-10-19 |
| JP6574775B2 JP6574775B2 (ja) | 2019-09-11 |
Family
ID=52625896
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2016540423A Active JP6574775B2 (ja) | 2013-09-06 | 2014-09-05 | 欠陥密度の低いバルクの炭化ケイ素 |
| JP2019149764A Active JP7054934B2 (ja) | 2013-09-06 | 2019-08-19 | 欠陥密度の低いバルクの炭化ケイ素 |
Family Applications After (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2019149764A Active JP7054934B2 (ja) | 2013-09-06 | 2019-08-19 | 欠陥密度の低いバルクの炭化ケイ素 |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US9512542B2 (enExample) |
| JP (2) | JP6574775B2 (enExample) |
| KR (1) | KR102245509B1 (enExample) |
| CN (1) | CN105518191B (enExample) |
| DE (1) | DE112014004093T5 (enExample) |
| TW (1) | TWI648218B (enExample) |
| WO (1) | WO2015035170A1 (enExample) |
Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI660076B (zh) * | 2017-10-06 | 2019-05-21 | 環球晶圓股份有限公司 | 碳化矽晶體及其製造方法 |
| JP7393900B2 (ja) | 2019-09-24 | 2023-12-07 | 一般財団法人電力中央研究所 | 炭化珪素単結晶ウェハ及び炭化珪素単結晶インゴットの製造方法 |
| JP2023103015A (ja) * | 2022-01-13 | 2023-07-26 | 信越半導体株式会社 | 炭化珪素単結晶製造方法、及び炭化珪素単結晶製造装置 |
Family Cites Families (17)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH06316499A (ja) * | 1993-04-30 | 1994-11-15 | Sharp Corp | 炭化珪素単結晶の製造方法 |
| KR100454275B1 (ko) | 1995-08-16 | 2005-01-31 | 시크리스탈 아게 | 단결정을생성시키기위한시이드결정,상기시이드결정의용도및SiC단결정또는단결정SiC층의생성방법 |
| US5683507A (en) * | 1995-09-05 | 1997-11-04 | Northrop Grumman Corporation | Apparatus for growing large silicon carbide single crystals |
| US5944890A (en) * | 1996-03-29 | 1999-08-31 | Denso Corporation | Method of producing single crystals and a seed crystal used in the method |
| JP4450118B2 (ja) * | 1999-10-15 | 2010-04-14 | 株式会社デンソー | 炭化珪素単結晶の製造方法 |
| US6508880B2 (en) * | 2000-02-15 | 2003-01-21 | The Fox Group, Inc. | Apparatus for growing low defect density silicon carbide |
| US7294324B2 (en) * | 2004-09-21 | 2007-11-13 | Cree, Inc. | Low basal plane dislocation bulk grown SiC wafers |
| US7314521B2 (en) * | 2004-10-04 | 2008-01-01 | Cree, Inc. | Low micropipe 100 mm silicon carbide wafer |
| US7300519B2 (en) * | 2004-11-17 | 2007-11-27 | Cree, Inc. | Reduction of subsurface damage in the production of bulk SiC crystals |
| CN101680112A (zh) * | 2007-01-16 | 2010-03-24 | Ii-Vi有限公司 | 借助多层生长导向器的直径导向式SiC升华生长 |
| JP5779171B2 (ja) * | 2009-03-26 | 2015-09-16 | トゥー‐シックス・インコーポレイテッド | SiC単結晶の昇華成長方法及び装置 |
| WO2011034850A1 (en) * | 2009-09-15 | 2011-03-24 | Ii-Vi Incorporated | Sublimation growth of sic single crystals |
| WO2011065060A1 (ja) * | 2009-11-30 | 2011-06-03 | 住友電気工業株式会社 | 単結晶の製造方法 |
| JP5614387B2 (ja) * | 2011-08-29 | 2014-10-29 | 新日鐵住金株式会社 | 炭化珪素単結晶の製造方法、及び炭化珪素単結晶インゴット |
| JP5696630B2 (ja) * | 2011-09-21 | 2015-04-08 | 住友電気工業株式会社 | 炭化珪素基板およびその製造方法 |
| EP2852699B1 (en) * | 2012-04-20 | 2025-01-29 | II-VI Incorporated | Method and apparatus for preapring large diameter, high quality sic single crystals |
| JP6473455B2 (ja) * | 2013-09-06 | 2019-02-20 | ジーティーエイティー コーポレーションGtat Corporation | 炭化ケイ素シードを用いたバルクの炭化ケイ素の製造方法及び装置 |
-
2014
- 2014-09-05 US US14/478,674 patent/US9512542B2/en active Active
- 2014-09-05 KR KR1020167008947A patent/KR102245509B1/ko active Active
- 2014-09-05 JP JP2016540423A patent/JP6574775B2/ja active Active
- 2014-09-05 DE DE112014004093.2T patent/DE112014004093T5/de active Pending
- 2014-09-05 CN CN201480049200.4A patent/CN105518191B/zh active Active
- 2014-09-05 WO PCT/US2014/054301 patent/WO2015035170A1/en not_active Ceased
- 2014-09-09 TW TW103130962A patent/TWI648218B/zh active
-
2019
- 2019-08-19 JP JP2019149764A patent/JP7054934B2/ja active Active
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