JP2016517216A5 - - Google Patents

Download PDF

Info

Publication number
JP2016517216A5
JP2016517216A5 JP2016501405A JP2016501405A JP2016517216A5 JP 2016517216 A5 JP2016517216 A5 JP 2016517216A5 JP 2016501405 A JP2016501405 A JP 2016501405A JP 2016501405 A JP2016501405 A JP 2016501405A JP 2016517216 A5 JP2016517216 A5 JP 2016517216A5
Authority
JP
Japan
Prior art keywords
signal
power supply
time
supply voltage
digital converter
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2016501405A
Other languages
English (en)
Japanese (ja)
Other versions
JP6382292B2 (ja
JP2016517216A (ja
Filing date
Publication date
Priority claimed from US13/842,481 external-priority patent/US8957712B2/en
Application filed filed Critical
Publication of JP2016517216A publication Critical patent/JP2016517216A/ja
Publication of JP2016517216A5 publication Critical patent/JP2016517216A5/ja
Application granted granted Critical
Publication of JP6382292B2 publication Critical patent/JP6382292B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

JP2016501405A 2013-03-15 2014-03-12 組み込みｔ２ｖ ａｄｃを有する混合信号ｔｄｃ Expired - Fee Related JP6382292B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US13/842,481 2013-03-15
US13/842,481 US8957712B2 (en) 2013-03-15 2013-03-15 Mixed signal TDC with embedded T2V ADC
PCT/US2014/024035 WO2014150707A2 (en) 2013-03-15 2014-03-12 Mixed signal tdc with embedded t2v adc

Publications (3)

Publication Number Publication Date
JP2016517216A JP2016517216A (ja) 2016-06-09
JP2016517216A5 true JP2016517216A5 (OSRAM) 2017-03-23
JP6382292B2 JP6382292B2 (ja) 2018-08-29

Family

ID=50424773

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2016501405A Expired - Fee Related JP6382292B2 (ja) 2013-03-15 2014-03-12 組み込みｔ２ｖ ａｄｃを有する混合信号ｔｄｃ

Country Status (6)

Country Link
US (1) US8957712B2 (OSRAM)
EP (1) EP2972598B1 (OSRAM)
JP (1) JP6382292B2 (OSRAM)
KR (1) KR20150129794A (OSRAM)
CN (1) CN105191141B (OSRAM)
WO (1) WO2014150707A2 (OSRAM)

Families Citing this family (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9164134B2 (en) * 2012-11-13 2015-10-20 Nvidia Corporation High-resolution phase detector
US9471091B2 (en) 2012-11-28 2016-10-18 Nvidia Corporation Periodic synchronizer using a reduced timing margin to generate a speculative synchronized output signal that is either validated or recalled
US9270288B2 (en) * 2013-11-27 2016-02-23 Silicon Laboratories Inc. Time-to-digital converter based on a voltage controlled oscillator
US9344103B1 (en) * 2015-07-21 2016-05-17 Realtek Semiconductor Corporation High-resolution time-to-digital converter and method thereof
TWI591457B (zh) * 2015-09-15 2017-07-11 瑞昱半導體股份有限公司 高解析度時間至數位轉換器及其方法
EP3217558B1 (en) * 2016-03-11 2020-05-13 Socionext Inc. Timing-difference measurement
CN106168753B (zh) * 2016-06-28 2018-10-23 中国科学院微电子研究所 时间数字转换器
CN106066599B (zh) * 2016-07-15 2018-10-12 中国地震局地震研究所 用于三维激光扫描仪的精密时间测量系统
JP6819114B2 (ja) 2016-07-25 2021-01-27 セイコーエプソン株式会社 コンパレーター、回路装置、物理量センサー、電子機器及び移動体
JP6776691B2 (ja) * 2016-07-25 2020-10-28 セイコーエプソン株式会社 回路装置、電子機器、物理量センサー及び移動体
US11038511B2 (en) 2017-06-28 2021-06-15 Analog Devices International Unlimited Company Apparatus and methods for system clock compensation
EP3422580B1 (en) 2017-06-28 2025-01-01 Analog Devices, Inc. Apparatus and methods for clock synchronization and frequency translation
WO2019167670A1 (ja) * 2018-03-02 2019-09-06 ソニーセミコンダクタソリューションズ株式会社 位相同期回路
US11095295B2 (en) 2018-06-26 2021-08-17 Silicon Laboratories Inc. Spur cancellation for spur measurement
US10659060B2 (en) 2018-09-27 2020-05-19 Silicon Laboratories Inc. Spur cancellation with adaptive frequency tracking
US10680622B2 (en) 2018-09-27 2020-06-09 Silicon Laboratories Inc. Spur canceller with multiplier-less correlator
US11101813B2 (en) * 2019-08-16 2021-08-24 Stmicroelectronics S.R.L. Multiple input analog-to-digital converter device and corresponding method
US10819353B1 (en) 2019-10-04 2020-10-27 Silicon Laboratories Inc. Spur cancellation in a PLL system with an automatically updated target spur frequency
CN111025884B (zh) * 2019-12-08 2021-10-26 复旦大学 两步式高速动态时间数字转换器
US11038521B1 (en) 2020-02-28 2021-06-15 Silicon Laboratories Inc. Spur and quantization noise cancellation for PLLS with non-linear phase detection
US11316522B2 (en) 2020-06-15 2022-04-26 Silicon Laboratories Inc. Correction for period error in a reference clock signal
US11456750B2 (en) * 2020-11-12 2022-09-27 Mediatek Inc. Phase-locked loop circuit having linear voltage-domain time-to-digital converter with output subrange
US12107596B2 (en) * 2022-10-07 2024-10-01 Ciena Corporation Successive approximation register based time-to-digital converter using a time difference amplifier
DE112023004394T5 (de) * 2022-11-18 2025-08-14 ams Sensors Germany GmbH Optoelektronisches bauteil und verfahren zum erzeugen eines ausgangssignals
US12308853B1 (en) * 2023-03-31 2025-05-20 Advanced Micro Devices, Inc. High performance time-to-digital converter

Family Cites Families (36)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62299786A (ja) * 1986-06-20 1987-12-26 Yokogawa Electric Corp 時間計測装置
JPH07280857A (ja) * 1994-04-05 1995-10-27 Sony Corp パルス幅測定回路
JP3740971B2 (ja) * 2000-09-28 2006-02-01 横河電機株式会社 タイムインターバル測定器
US6868047B2 (en) 2001-12-12 2005-03-15 Teradyne, Inc. Compact ATE with time stamp system
US6909672B2 (en) 2002-09-24 2005-06-21 General Electric Company Time-to-voltage converter
US6956422B2 (en) 2003-03-17 2005-10-18 Indiana University Research And Technology Corporation Generation and measurement of timing delays by digital phase error compensation
FR2878093B1 (fr) * 2004-11-15 2007-02-09 Commissariat Energie Atomique Circuit de conversion temps-tension symetrique
US7205924B2 (en) 2004-11-18 2007-04-17 Texas Instruments Incorporated Circuit for high-resolution phase detection in a digital RF processor
US7570182B2 (en) 2006-09-15 2009-08-04 Texas Instruments Incorporated Adaptive spectral noise shaping to improve time to digital converter quantization resolution using dithering
US7460441B2 (en) * 2007-01-12 2008-12-02 Microchip Technology Incorporated Measuring a long time period
US7567197B2 (en) * 2007-09-17 2009-07-28 Samsung Electronics Co., Ltd. Cascade comparator and control method thereof
US7859442B2 (en) 2007-10-05 2010-12-28 Jorg Daniels Asynchronous sigma delta analog to digital converter using a time to digital converter
US7843771B2 (en) 2007-12-14 2010-11-30 Guide Technology, Inc. High resolution time interpolator
US7583152B2 (en) * 2008-01-04 2009-09-01 Qualcomm Incorporated Phase-locked loop with self-correcting phase-to-digital transfer function
CN101515155B (zh) * 2008-02-18 2010-10-13 瑞昱半导体股份有限公司 时间数字转换电路及其相关方法
WO2010047005A1 (ja) 2008-10-23 2010-04-29 パナソニック株式会社 デジタルｐｌｌ回路及び通信装置
JP5590867B2 (ja) * 2008-12-01 2014-09-17 三星電子株式会社 タイム／デジタルコンバーター及びデジタル位相ロックループ
US8283933B2 (en) 2009-03-13 2012-10-09 Qualcomm, Incorporated Systems and methods for built in self test jitter measurement
CN101577546A (zh) * 2009-06-22 2009-11-11 清华大学 基于全动态电压-时间转换电路的时间域比较器
US7893861B2 (en) * 2009-06-30 2011-02-22 International Business Machines Corporation Time-to-digital based analog-to-digital converter architecture
TWI382669B (zh) * 2009-07-16 2013-01-11 Ralink Technology Corp 用於管線式類比數位轉換器之比較器及相關訊號取樣方法
TWI347085B (en) * 2009-10-09 2011-08-11 Ind Tech Res Inst Pipeline time-to-digital converter
CN201583811U (zh) * 2009-10-15 2010-09-15 山东力创赢芯集成电路有限公司 带有温度测量和驱动功能的时间数字转换器
JP5210289B2 (ja) * 2009-11-26 2013-06-12 旭化成エレクトロニクス株式会社 逐次比較型ａ／ｄ変換器
KR101258877B1 (ko) 2009-11-26 2013-04-29 한국전자통신연구원 클럭 검출기 및 이를 이용한 바이어스 전류 조절 회로
US8324881B2 (en) * 2010-04-21 2012-12-04 Texas Instruments Incorporated Bandgap reference circuit with sampling and averaging circuitry
US8223044B2 (en) * 2010-04-22 2012-07-17 Texas Instruments Incorporated INL correction circuitry and method for SAR ADC
KR101629970B1 (ko) 2010-04-23 2016-06-13 삼성전자주식회사 타임 투 디지털 컨버터 및 그의 동작 방법
US8339302B2 (en) * 2010-07-29 2012-12-25 Freescale Semiconductor, Inc. Analog-to-digital converter having a comparator for a multi-stage sampling circuit and method therefor
KR101212625B1 (ko) * 2010-07-29 2012-12-14 연세대학교 산학협력단 시간-디지털 컨버터 및 그것의 동작 방법
EP2421155B1 (en) * 2010-08-02 2013-07-03 Fraunhofer-Gesellschaft zur Förderung der Angewandten Forschung e.V. A hybrid analog-to-digital converter, an image sensor and a method for providing a plurality of ditigal signals
JP5675299B2 (ja) * 2010-11-26 2015-02-25 三菱電機株式会社 パルス長計測回路
US8324952B2 (en) 2011-05-04 2012-12-04 Phase Matrix, Inc. Time interpolator circuit
WO2012153375A1 (ja) * 2011-05-06 2012-11-15 富士通株式会社 クロック生成回路
JP5659950B2 (ja) * 2011-05-24 2015-01-28 富士通株式会社 Ａ／ｄ変換器
KR20130069147A (ko) * 2011-12-16 2013-06-26 삼성전자주식회사 기저대역 신호를 증폭하기 위한 장치 및 회로

Similar Documents

Publication Publication Date Title
JP6382292B2 (ja) 組み込みｔ２ｖ ａｄｃを有する混合信号ｔｄｃ
CN101577549B (zh) 多输出时间数字转换器
US9092013B2 (en) Time-to-digital converter
CN104483557B (zh) 一种减少计数损失的脉冲幅度测量电路及方法
Zhang et al. A 12-bit dynamic tracking algorithm-based SAR ADC with real-time QRS detection
CN105278776A (zh) 电容电压信息感测电路及其相关抗噪声触控电路
CN105676263B (zh) 一种基于相位补偿的脉冲信号峰值检测方法
CN104614756A (zh) 一种核素能谱数字化采集系统及其采集方法
US10101709B2 (en) Time register
JPWO2016104464A1 (ja) 位相デジタル変換器、位相差パルス生成器、無線通信装置および無線通信方法
CN103487662A (zh) 电容检测电路
TWI804842B (zh) 近接感測方法及其應用之電子裝置
US10585499B2 (en) Device and method of detecting pointer
US20130044067A1 (en) Control system of a touch panel and a control method thereof
CN107544719B (zh) 电容感测装置及其感测方法
CN108521278A (zh) 一种基于时间电压转换器的锁相环锁定检测电路
US10528010B2 (en) Range finding device
CN109633245B (zh) 一种新型峰值检测电路
Ghanavati et al. A TLBO optimized TDC for biomedical applications
WO2016024439A1 (ja) アナログデジタル変換器、電子装置、および、アナログデジタル変換器の制御方法
CN104253611A (zh) 一种检测相位差的方法、鉴相器及数字锁相环
US9188961B1 (en) Time-to-digital converter
CN102868401A (zh) 一种tdr中高速模数变换的方法及其电路装置
Duyan et al. Research on heart rate extraction algorithm in motion state based on normalized least mean square combining ensemble empirical mode decomposition
Chai et al. High-performance differential capacitive MEMS sensor readout with relaxation oscillator front-end and phase locked loop time-to-digital converter back-end