KR20150129794A - 임베딩된 t2v adc를 가진 혼합된 신호 tdc - Google Patents
임베딩된 t2v adc를 가진 혼합된 신호 tdc Download PDFInfo
- Publication number
- KR20150129794A KR20150129794A KR1020157028038A KR20157028038A KR20150129794A KR 20150129794 A KR20150129794 A KR 20150129794A KR 1020157028038 A KR1020157028038 A KR 1020157028038A KR 20157028038 A KR20157028038 A KR 20157028038A KR 20150129794 A KR20150129794 A KR 20150129794A
- Authority
- KR
- South Korea
- Prior art keywords
- signal
- differential output
- supply voltage
- time
- transistor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
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Classifications
-
- G—PHYSICS
- G04—HOROLOGY
- G04F—TIME-INTERVAL MEASURING
- G04F10/00—Apparatus for measuring unknown time intervals by electric means
- G04F10/005—Time-to-digital converters [TDC]
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03L—AUTOMATIC CONTROL, STARTING, SYNCHRONISATION OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES
- H03L7/00—Automatic control of frequency or phase; Synchronisation
- H03L7/06—Automatic control of frequency or phase; Synchronisation using a reference signal applied to a frequency- or phase-locked loop
- H03L7/08—Details of the phase-locked loop
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03L—AUTOMATIC CONTROL, STARTING, SYNCHRONISATION OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES
- H03L7/00—Automatic control of frequency or phase; Synchronisation
- H03L7/06—Automatic control of frequency or phase; Synchronisation using a reference signal applied to a frequency- or phase-locked loop
- H03L7/08—Details of the phase-locked loop
- H03L7/099—Details of the phase-locked loop concerning mainly the controlled oscillator of the loop
- H03L7/0991—Details of the phase-locked loop concerning mainly the controlled oscillator of the loop the oscillator being a digital oscillator, e.g. composed of a fixed oscillator followed by a variable frequency divider
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/12—Analogue/digital converters
- H03M1/50—Analogue/digital converters with intermediate conversion to time interval
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03L—AUTOMATIC CONTROL, STARTING, SYNCHRONISATION OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES
- H03L2207/00—Indexing scheme relating to automatic control of frequency or phase and to synchronisation
- H03L2207/50—All digital phase-locked loop
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Analogue/Digital Conversion (AREA)
- Manipulation Of Pulses (AREA)
- Stabilization Of Oscillater, Synchronisation, Frequency Synthesizers (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US13/842,481 | 2013-03-15 | ||
| US13/842,481 US8957712B2 (en) | 2013-03-15 | 2013-03-15 | Mixed signal TDC with embedded T2V ADC |
| PCT/US2014/024035 WO2014150707A2 (en) | 2013-03-15 | 2014-03-12 | Mixed signal tdc with embedded t2v adc |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| KR20150129794A true KR20150129794A (ko) | 2015-11-20 |
Family
ID=50424773
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020157028038A Ceased KR20150129794A (ko) | 2013-03-15 | 2014-03-12 | 임베딩된 t2v adc를 가진 혼합된 신호 tdc |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US8957712B2 (OSRAM) |
| EP (1) | EP2972598B1 (OSRAM) |
| JP (1) | JP6382292B2 (OSRAM) |
| KR (1) | KR20150129794A (OSRAM) |
| CN (1) | CN105191141B (OSRAM) |
| WO (1) | WO2014150707A2 (OSRAM) |
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| US9164134B2 (en) * | 2012-11-13 | 2015-10-20 | Nvidia Corporation | High-resolution phase detector |
| US9471091B2 (en) | 2012-11-28 | 2016-10-18 | Nvidia Corporation | Periodic synchronizer using a reduced timing margin to generate a speculative synchronized output signal that is either validated or recalled |
| US9270288B2 (en) * | 2013-11-27 | 2016-02-23 | Silicon Laboratories Inc. | Time-to-digital converter based on a voltage controlled oscillator |
| US9344103B1 (en) * | 2015-07-21 | 2016-05-17 | Realtek Semiconductor Corporation | High-resolution time-to-digital converter and method thereof |
| TWI591457B (zh) * | 2015-09-15 | 2017-07-11 | 瑞昱半導體股份有限公司 | 高解析度時間至數位轉換器及其方法 |
| EP3217558B1 (en) * | 2016-03-11 | 2020-05-13 | Socionext Inc. | Timing-difference measurement |
| CN106168753B (zh) * | 2016-06-28 | 2018-10-23 | 中国科学院微电子研究所 | 时间数字转换器 |
| CN106066599B (zh) * | 2016-07-15 | 2018-10-12 | 中国地震局地震研究所 | 用于三维激光扫描仪的精密时间测量系统 |
| JP6819114B2 (ja) | 2016-07-25 | 2021-01-27 | セイコーエプソン株式会社 | コンパレーター、回路装置、物理量センサー、電子機器及び移動体 |
| JP6776691B2 (ja) * | 2016-07-25 | 2020-10-28 | セイコーエプソン株式会社 | 回路装置、電子機器、物理量センサー及び移動体 |
| US11038511B2 (en) | 2017-06-28 | 2021-06-15 | Analog Devices International Unlimited Company | Apparatus and methods for system clock compensation |
| EP3422580B1 (en) | 2017-06-28 | 2025-01-01 | Analog Devices, Inc. | Apparatus and methods for clock synchronization and frequency translation |
| WO2019167670A1 (ja) * | 2018-03-02 | 2019-09-06 | ソニーセミコンダクタソリューションズ株式会社 | 位相同期回路 |
| US11095295B2 (en) | 2018-06-26 | 2021-08-17 | Silicon Laboratories Inc. | Spur cancellation for spur measurement |
| US10659060B2 (en) | 2018-09-27 | 2020-05-19 | Silicon Laboratories Inc. | Spur cancellation with adaptive frequency tracking |
| US10680622B2 (en) | 2018-09-27 | 2020-06-09 | Silicon Laboratories Inc. | Spur canceller with multiplier-less correlator |
| US11101813B2 (en) * | 2019-08-16 | 2021-08-24 | Stmicroelectronics S.R.L. | Multiple input analog-to-digital converter device and corresponding method |
| US10819353B1 (en) | 2019-10-04 | 2020-10-27 | Silicon Laboratories Inc. | Spur cancellation in a PLL system with an automatically updated target spur frequency |
| CN111025884B (zh) * | 2019-12-08 | 2021-10-26 | 复旦大学 | 两步式高速动态时间数字转换器 |
| US11038521B1 (en) | 2020-02-28 | 2021-06-15 | Silicon Laboratories Inc. | Spur and quantization noise cancellation for PLLS with non-linear phase detection |
| US11316522B2 (en) | 2020-06-15 | 2022-04-26 | Silicon Laboratories Inc. | Correction for period error in a reference clock signal |
| US11456750B2 (en) * | 2020-11-12 | 2022-09-27 | Mediatek Inc. | Phase-locked loop circuit having linear voltage-domain time-to-digital converter with output subrange |
| US12107596B2 (en) * | 2022-10-07 | 2024-10-01 | Ciena Corporation | Successive approximation register based time-to-digital converter using a time difference amplifier |
| DE112023004394T5 (de) * | 2022-11-18 | 2025-08-14 | ams Sensors Germany GmbH | Optoelektronisches bauteil und verfahren zum erzeugen eines ausgangssignals |
| US12308853B1 (en) * | 2023-03-31 | 2025-05-20 | Advanced Micro Devices, Inc. | High performance time-to-digital converter |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| JPS62299786A (ja) * | 1986-06-20 | 1987-12-26 | Yokogawa Electric Corp | 時間計測装置 |
| JPH07280857A (ja) * | 1994-04-05 | 1995-10-27 | Sony Corp | パルス幅測定回路 |
| JP3740971B2 (ja) * | 2000-09-28 | 2006-02-01 | 横河電機株式会社 | タイムインターバル測定器 |
| US6868047B2 (en) | 2001-12-12 | 2005-03-15 | Teradyne, Inc. | Compact ATE with time stamp system |
| US6909672B2 (en) | 2002-09-24 | 2005-06-21 | General Electric Company | Time-to-voltage converter |
| US6956422B2 (en) | 2003-03-17 | 2005-10-18 | Indiana University Research And Technology Corporation | Generation and measurement of timing delays by digital phase error compensation |
| FR2878093B1 (fr) * | 2004-11-15 | 2007-02-09 | Commissariat Energie Atomique | Circuit de conversion temps-tension symetrique |
| US7205924B2 (en) | 2004-11-18 | 2007-04-17 | Texas Instruments Incorporated | Circuit for high-resolution phase detection in a digital RF processor |
| US7570182B2 (en) | 2006-09-15 | 2009-08-04 | Texas Instruments Incorporated | Adaptive spectral noise shaping to improve time to digital converter quantization resolution using dithering |
| US7460441B2 (en) * | 2007-01-12 | 2008-12-02 | Microchip Technology Incorporated | Measuring a long time period |
| US7567197B2 (en) * | 2007-09-17 | 2009-07-28 | Samsung Electronics Co., Ltd. | Cascade comparator and control method thereof |
| US7859442B2 (en) | 2007-10-05 | 2010-12-28 | Jorg Daniels | Asynchronous sigma delta analog to digital converter using a time to digital converter |
| US7843771B2 (en) | 2007-12-14 | 2010-11-30 | Guide Technology, Inc. | High resolution time interpolator |
| US7583152B2 (en) * | 2008-01-04 | 2009-09-01 | Qualcomm Incorporated | Phase-locked loop with self-correcting phase-to-digital transfer function |
| CN101515155B (zh) * | 2008-02-18 | 2010-10-13 | 瑞昱半导体股份有限公司 | 时间数字转换电路及其相关方法 |
| WO2010047005A1 (ja) | 2008-10-23 | 2010-04-29 | パナソニック株式会社 | デジタルpll回路及び通信装置 |
| JP5590867B2 (ja) * | 2008-12-01 | 2014-09-17 | 三星電子株式会社 | タイム/デジタルコンバーター及びデジタル位相ロックループ |
| US8283933B2 (en) | 2009-03-13 | 2012-10-09 | Qualcomm, Incorporated | Systems and methods for built in self test jitter measurement |
| CN101577546A (zh) * | 2009-06-22 | 2009-11-11 | 清华大学 | 基于全动态电压-时间转换电路的时间域比较器 |
| US7893861B2 (en) * | 2009-06-30 | 2011-02-22 | International Business Machines Corporation | Time-to-digital based analog-to-digital converter architecture |
| TWI382669B (zh) * | 2009-07-16 | 2013-01-11 | Ralink Technology Corp | 用於管線式類比數位轉換器之比較器及相關訊號取樣方法 |
| TWI347085B (en) * | 2009-10-09 | 2011-08-11 | Ind Tech Res Inst | Pipeline time-to-digital converter |
| CN201583811U (zh) * | 2009-10-15 | 2010-09-15 | 山东力创赢芯集成电路有限公司 | 带有温度测量和驱动功能的时间数字转换器 |
| JP5210289B2 (ja) * | 2009-11-26 | 2013-06-12 | 旭化成エレクトロニクス株式会社 | 逐次比較型a/d変換器 |
| KR101258877B1 (ko) | 2009-11-26 | 2013-04-29 | 한국전자통신연구원 | 클럭 검출기 및 이를 이용한 바이어스 전류 조절 회로 |
| US8324881B2 (en) * | 2010-04-21 | 2012-12-04 | Texas Instruments Incorporated | Bandgap reference circuit with sampling and averaging circuitry |
| US8223044B2 (en) * | 2010-04-22 | 2012-07-17 | Texas Instruments Incorporated | INL correction circuitry and method for SAR ADC |
| KR101629970B1 (ko) | 2010-04-23 | 2016-06-13 | 삼성전자주식회사 | 타임 투 디지털 컨버터 및 그의 동작 방법 |
| US8339302B2 (en) * | 2010-07-29 | 2012-12-25 | Freescale Semiconductor, Inc. | Analog-to-digital converter having a comparator for a multi-stage sampling circuit and method therefor |
| KR101212625B1 (ko) * | 2010-07-29 | 2012-12-14 | 연세대학교 산학협력단 | 시간-디지털 컨버터 및 그것의 동작 방법 |
| EP2421155B1 (en) * | 2010-08-02 | 2013-07-03 | Fraunhofer-Gesellschaft zur Förderung der Angewandten Forschung e.V. | A hybrid analog-to-digital converter, an image sensor and a method for providing a plurality of ditigal signals |
| JP5675299B2 (ja) * | 2010-11-26 | 2015-02-25 | 三菱電機株式会社 | パルス長計測回路 |
| US8324952B2 (en) | 2011-05-04 | 2012-12-04 | Phase Matrix, Inc. | Time interpolator circuit |
| WO2012153375A1 (ja) * | 2011-05-06 | 2012-11-15 | 富士通株式会社 | クロック生成回路 |
| JP5659950B2 (ja) * | 2011-05-24 | 2015-01-28 | 富士通株式会社 | A/d変換器 |
| KR20130069147A (ko) * | 2011-12-16 | 2013-06-26 | 삼성전자주식회사 | 기저대역 신호를 증폭하기 위한 장치 및 회로 |
-
2013
- 2013-03-15 US US13/842,481 patent/US8957712B2/en active Active
-
2014
- 2014-03-12 CN CN201480014340.8A patent/CN105191141B/zh not_active Expired - Fee Related
- 2014-03-12 KR KR1020157028038A patent/KR20150129794A/ko not_active Ceased
- 2014-03-12 EP EP14714891.0A patent/EP2972598B1/en not_active Not-in-force
- 2014-03-12 JP JP2016501405A patent/JP6382292B2/ja not_active Expired - Fee Related
- 2014-03-12 WO PCT/US2014/024035 patent/WO2014150707A2/en not_active Ceased
Also Published As
| Publication number | Publication date |
|---|---|
| JP6382292B2 (ja) | 2018-08-29 |
| US20140266353A1 (en) | 2014-09-18 |
| WO2014150707A2 (en) | 2014-09-25 |
| CN105191141A (zh) | 2015-12-23 |
| US8957712B2 (en) | 2015-02-17 |
| EP2972598A2 (en) | 2016-01-20 |
| EP2972598B1 (en) | 2020-08-26 |
| WO2014150707A3 (en) | 2015-07-23 |
| CN105191141B (zh) | 2018-06-19 |
| JP2016517216A (ja) | 2016-06-09 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PA0105 | International application |
Patent event date: 20151007 Patent event code: PA01051R01D Comment text: International Patent Application |
|
| PG1501 | Laying open of application | ||
| A201 | Request for examination | ||
| PA0201 | Request for examination |
Patent event code: PA02012R01D Patent event date: 20190226 Comment text: Request for Examination of Application |
|
| E902 | Notification of reason for refusal | ||
| PE0902 | Notice of grounds for rejection |
Comment text: Notification of reason for refusal Patent event date: 20200701 Patent event code: PE09021S01D |
|
| E601 | Decision to refuse application | ||
| PE0601 | Decision on rejection of patent |
Patent event date: 20200908 Comment text: Decision to Refuse Application Patent event code: PE06012S01D Patent event date: 20200701 Comment text: Notification of reason for refusal Patent event code: PE06011S01I |