WO2014150707A2 - Mixed signal tdc with embedded t2v adc - Google Patents
Mixed signal tdc with embedded t2v adc Download PDFInfo
- Publication number
- WO2014150707A2 WO2014150707A2 PCT/US2014/024035 US2014024035W WO2014150707A2 WO 2014150707 A2 WO2014150707 A2 WO 2014150707A2 US 2014024035 W US2014024035 W US 2014024035W WO 2014150707 A2 WO2014150707 A2 WO 2014150707A2
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- signal
- time
- supply voltage
- transition
- digital converter
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
- H03M1/00—Analogue/digital conversion; Digital/analogue conversion
- H03M1/12—Analogue/digital converters
- H03M1/50—Analogue/digital converters with intermediate conversion to time interval
-
- G—PHYSICS
- G04—HOROLOGY
- G04F—TIME-INTERVAL MEASURING
- G04F10/00—Apparatus for measuring unknown time intervals by electric means
- G04F10/005—Time-to-digital converters [TDC]
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03L—AUTOMATIC CONTROL, STARTING, SYNCHRONISATION OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES
- H03L7/00—Automatic control of frequency or phase; Synchronisation
- H03L7/06—Automatic control of frequency or phase; Synchronisation using a reference signal applied to a frequency- or phase-locked loop
- H03L7/08—Details of the phase-locked loop
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03L—AUTOMATIC CONTROL, STARTING, SYNCHRONISATION OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES
- H03L7/00—Automatic control of frequency or phase; Synchronisation
- H03L7/06—Automatic control of frequency or phase; Synchronisation using a reference signal applied to a frequency- or phase-locked loop
- H03L7/08—Details of the phase-locked loop
- H03L7/099—Details of the phase-locked loop concerning mainly the controlled oscillator of the loop
- H03L7/0991—Details of the phase-locked loop concerning mainly the controlled oscillator of the loop the oscillator being a digital oscillator, e.g. composed of a fixed oscillator followed by a variable frequency divider
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03L—AUTOMATIC CONTROL, STARTING, SYNCHRONISATION OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES
- H03L2207/00—Indexing scheme relating to automatic control of frequency or phase and to synchronisation
- H03L2207/50—All digital phase-locked loop
Definitions
- the present disclosure relates to electronic circuits, and more particualry to a time-to-digital converter.
- a time-to-digital converter is an electronic circuit that converts the difference between transition times of two signals to a digital signal whose value is proportional to such timing difference.
- a time-to-digital converter may be used in a phase-locked loop to convert the difference between the transition times of a reference clock signal and an oscillating signal to a digital signal in order to lock the phase of the oscillating signal to the phase of the clock signal.
- a time-to-digital converter converts the difference between transition times of a reference clock signal and an oscillating signal to a digital signal whose value is proportional to the transitions timing difference.
- the time-to-digital converter in accordance with one embodiment of the present invention, includes an edge detector, a time-to-voltage converter, and an analog-to-digital converter.
- the edge detector is adapted to detect, during each period of the reference clock signal, the edge (transition) of the oscillating signal that is closest to the edge of the reference clock signal.
- the time-to-voltage converter is adapted to generate an analog signal having a value proportional to the difference between the occurrences of the detected edge of the oscillating signal and the edge of the reference clock signal.
- the analog-to-digital converter is adapted to convert the analog signal to a digital signal.
- the time-to-digital converter has first and second differential outputs that are charged to a predefined voltage level in response to a reset signal. Thereafter, depending on the relative arrival times of the detected edge of the oscillating signal and the reference clock signals, one of the differential outputs is enable to charge to a higher voltage (or discharge to a lower voltage) while the other QUALCOMM Ref. No.: 121395U2WO 2 differential output remains at the same predefined voltage level. The longer the period between the arrival times of the two edges, the greater is the amount of voltage increase (or decrease).
- a conductive path is formed between the first differential output and a first supply voltage via first and second transistors if the edge of the reference clock signal leads the detected edge of the oscillating signal. Conversely, a conductive path is formed between the second differential output and the first supply voltage via third and fourth transistors if the edge of the reference clock signal lags the detected edge of the oscillating signal.
- the first differential output of the time-to-digital converter is charged to the predefined voltage level via a fifth transistor, and the second differential output of the time-to-digital converter is charged to the predefined voltage level via a sixth transistor.
- the predefined voltage level may be a second supply voltage.
- the fifth and sixth transistors are NMOS transistors and the second supply voltage is smaller than the first supply voltage.
- the time-to-digital converter further includes, in part, first and second multitudes of capacitors. Each of the first multitude of capacitors is adapted to be coupled between the first differential output and the second supply voltage in response to a different one of a first multitude of control signals. Similarly, each of the second multitude of capacitors is adapted to be coupled between the second differential output and the second supply voltage in response to a different one of a second multitude of control signals.
- the analog-to-digital converter further includes a comparator adapted to compare voltages of the first and second differential outputs of the time-to-voltage converter and supply a comparison signal to the control logic.
- the QUALCOMM Ref. No.: 121395U2WO 3 control logic generates the output signal of the time-to-voltage converter.
- Figure 1 is a block diagram of a time-to-digital converter, in accordance with one exemplary embodiment of the present invention.
- Figure 2 A is a schematic diagram of a time-to-digital converter, in accordance with one exemplary embodiment of the present invention.
- Figure 7A is a block diagram of a logic circuit disposed in the edge detector of Figure 1 , in accordance with one exemplary embodiment of the present invention.
- Edge detector 100 is adapted to receive an oscillating signal DCO 10, and a reference clock signal FREF 12 that has a longer time period than signal DCO 10. Accordingly, during each period of signal FREF 12, a number of transitions (edges) occur on signal DCO 10. In one embodiment, during each period of signal FREF 12, edge detector 100 filters out all DCO 10 signal edges except the rising (or falling) DCO 10 edge that is closest in time to the rising (or falling) edge of signal FREF 12 in that period. The DCO 10 signal edge detected as being closest in time to the rising (or falling) edge of signal FREF 12 is supplied as output signal CKV 14. The corresponding edge of signal FREF 12 is supplied as output signal REF 16 by edge detector 100.
- the drop in voltage level of node OUT 18 from VDD to V2 is dependent on the period (T5-T4). In other words, the longer is the delay between arrival times of the corresponding edges (i.e., transition times) of signals REF 16 and CKV 14, the greater is the drop in the voltage level of node OUT 18.
- the differential voltage across nodes OUT 18 and OUT B 20 is converted to a digital signal by an analog-to-digital converter whose output voltage represents the output of the TDC.
- Capacitor bank 280 includes N capacitors 282; and N switches 284;, where i is an integer varying from 1 to N.
- a first terminal of each capacitor 282 is coupled to node OUT 18.
- a second terminal of each capacitor 282 is coupled to supply voltage Vref via an associated switch 284; which opens or closes in response to one of the N bits of signal PhiP.
- the second terminal of capacitor 282 receives voltage Vref when bit i of N-bit signal PhiP is asserted in order to close an associated switch 284;.
- capacitor bank 290 includes N capacitors 292; and N switches 294;.
- a first terminal of each capacitor 292; is coupled to node OUT B 20.
- a second terminal of each capacitor 292; is coupled to supply voltage Vref via an associated switch 294; which opens or closes in response to one of the N bits of signal PhiN.
- the second terminal of capacitor 292 receives Vref when bit i of N-bit signal PhiN is asserted in order to close an associated switch 294;.
- the differential voltage across output nodes OUT 18, OUT B 20 of capacitor banks 280, 290 is converted to a digital signal using an ADC.
- Phase detecotor 604 is adapted to detect the difference between the signal value supplied by adder 610, namely ADD OUT 66, and the signal value supplied by delat- sigma modulator 602, namely signal FCW F to generate a phase error signal P Error 74.
- Loop filter 606 is a low-pass filter adapted to filter out the high frequency components of the noise from signal P Error and supply the filtered signal FIL OUT 76 to DCO 608.
- the phase of the osciallting signal DCO 10 generated by digitally- controlled oscillator 608 is varied in accordance with the filtered signal it receives from loop-filter 606 so as to lock the phase of signal DCO 10 to the phase of signal FREF 12.
- a TDC in accordance with embodiments of the present invention, may be used in any other controlled-loop circuitry, such as frequency-locked loop, phase/frequency locked loop, and the like.
- CMOS complementary metal-oxide-semiconductor
- Bipolar complementary metal-oxide-semiconductor
- BICMOS complementary metal-oxide-semiconductor
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Analogue/Digital Conversion (AREA)
- Manipulation Of Pulses (AREA)
- Stabilization Of Oscillater, Synchronisation, Frequency Synthesizers (AREA)
Priority Applications (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1020157028038A KR20150129794A (ko) | 2013-03-15 | 2014-03-12 | 임베딩된 t2v adc를 가진 혼합된 신호 tdc |
| EP14714891.0A EP2972598B1 (en) | 2013-03-15 | 2014-03-12 | Mixed signal tdc with embedded t2v adc |
| CN201480014340.8A CN105191141B (zh) | 2013-03-15 | 2014-03-12 | 具有嵌入的t2v adc的混合信号tdc |
| JP2016501405A JP6382292B2 (ja) | 2013-03-15 | 2014-03-12 | 組み込みt2v adcを有する混合信号tdc |
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US13/842,481 | 2013-03-15 | ||
| US13/842,481 US8957712B2 (en) | 2013-03-15 | 2013-03-15 | Mixed signal TDC with embedded T2V ADC |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| WO2014150707A2 true WO2014150707A2 (en) | 2014-09-25 |
| WO2014150707A3 WO2014150707A3 (en) | 2015-07-23 |
Family
ID=50424773
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PCT/US2014/024035 Ceased WO2014150707A2 (en) | 2013-03-15 | 2014-03-12 | Mixed signal tdc with embedded t2v adc |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US8957712B2 (OSRAM) |
| EP (1) | EP2972598B1 (OSRAM) |
| JP (1) | JP6382292B2 (OSRAM) |
| KR (1) | KR20150129794A (OSRAM) |
| CN (1) | CN105191141B (OSRAM) |
| WO (1) | WO2014150707A2 (OSRAM) |
Families Citing this family (25)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9164134B2 (en) * | 2012-11-13 | 2015-10-20 | Nvidia Corporation | High-resolution phase detector |
| US9471091B2 (en) | 2012-11-28 | 2016-10-18 | Nvidia Corporation | Periodic synchronizer using a reduced timing margin to generate a speculative synchronized output signal that is either validated or recalled |
| US9270288B2 (en) * | 2013-11-27 | 2016-02-23 | Silicon Laboratories Inc. | Time-to-digital converter based on a voltage controlled oscillator |
| US9344103B1 (en) * | 2015-07-21 | 2016-05-17 | Realtek Semiconductor Corporation | High-resolution time-to-digital converter and method thereof |
| TWI591457B (zh) * | 2015-09-15 | 2017-07-11 | 瑞昱半導體股份有限公司 | 高解析度時間至數位轉換器及其方法 |
| EP3217558B1 (en) * | 2016-03-11 | 2020-05-13 | Socionext Inc. | Timing-difference measurement |
| CN106168753B (zh) * | 2016-06-28 | 2018-10-23 | 中国科学院微电子研究所 | 时间数字转换器 |
| CN106066599B (zh) * | 2016-07-15 | 2018-10-12 | 中国地震局地震研究所 | 用于三维激光扫描仪的精密时间测量系统 |
| JP6819114B2 (ja) | 2016-07-25 | 2021-01-27 | セイコーエプソン株式会社 | コンパレーター、回路装置、物理量センサー、電子機器及び移動体 |
| JP6776691B2 (ja) * | 2016-07-25 | 2020-10-28 | セイコーエプソン株式会社 | 回路装置、電子機器、物理量センサー及び移動体 |
| US11038511B2 (en) | 2017-06-28 | 2021-06-15 | Analog Devices International Unlimited Company | Apparatus and methods for system clock compensation |
| EP3422580B1 (en) | 2017-06-28 | 2025-01-01 | Analog Devices, Inc. | Apparatus and methods for clock synchronization and frequency translation |
| WO2019167670A1 (ja) * | 2018-03-02 | 2019-09-06 | ソニーセミコンダクタソリューションズ株式会社 | 位相同期回路 |
| US11095295B2 (en) | 2018-06-26 | 2021-08-17 | Silicon Laboratories Inc. | Spur cancellation for spur measurement |
| US10659060B2 (en) | 2018-09-27 | 2020-05-19 | Silicon Laboratories Inc. | Spur cancellation with adaptive frequency tracking |
| US10680622B2 (en) | 2018-09-27 | 2020-06-09 | Silicon Laboratories Inc. | Spur canceller with multiplier-less correlator |
| US11101813B2 (en) * | 2019-08-16 | 2021-08-24 | Stmicroelectronics S.R.L. | Multiple input analog-to-digital converter device and corresponding method |
| US10819353B1 (en) | 2019-10-04 | 2020-10-27 | Silicon Laboratories Inc. | Spur cancellation in a PLL system with an automatically updated target spur frequency |
| CN111025884B (zh) * | 2019-12-08 | 2021-10-26 | 复旦大学 | 两步式高速动态时间数字转换器 |
| US11038521B1 (en) | 2020-02-28 | 2021-06-15 | Silicon Laboratories Inc. | Spur and quantization noise cancellation for PLLS with non-linear phase detection |
| US11316522B2 (en) | 2020-06-15 | 2022-04-26 | Silicon Laboratories Inc. | Correction for period error in a reference clock signal |
| US11456750B2 (en) * | 2020-11-12 | 2022-09-27 | Mediatek Inc. | Phase-locked loop circuit having linear voltage-domain time-to-digital converter with output subrange |
| US12107596B2 (en) * | 2022-10-07 | 2024-10-01 | Ciena Corporation | Successive approximation register based time-to-digital converter using a time difference amplifier |
| DE112023004394T5 (de) * | 2022-11-18 | 2025-08-14 | ams Sensors Germany GmbH | Optoelektronisches bauteil und verfahren zum erzeugen eines ausgangssignals |
| US12308853B1 (en) * | 2023-03-31 | 2025-05-20 | Advanced Micro Devices, Inc. | High performance time-to-digital converter |
Family Cites Families (36)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS62299786A (ja) * | 1986-06-20 | 1987-12-26 | Yokogawa Electric Corp | 時間計測装置 |
| JPH07280857A (ja) * | 1994-04-05 | 1995-10-27 | Sony Corp | パルス幅測定回路 |
| JP3740971B2 (ja) * | 2000-09-28 | 2006-02-01 | 横河電機株式会社 | タイムインターバル測定器 |
| US6868047B2 (en) | 2001-12-12 | 2005-03-15 | Teradyne, Inc. | Compact ATE with time stamp system |
| US6909672B2 (en) | 2002-09-24 | 2005-06-21 | General Electric Company | Time-to-voltage converter |
| US6956422B2 (en) | 2003-03-17 | 2005-10-18 | Indiana University Research And Technology Corporation | Generation and measurement of timing delays by digital phase error compensation |
| FR2878093B1 (fr) * | 2004-11-15 | 2007-02-09 | Commissariat Energie Atomique | Circuit de conversion temps-tension symetrique |
| US7205924B2 (en) | 2004-11-18 | 2007-04-17 | Texas Instruments Incorporated | Circuit for high-resolution phase detection in a digital RF processor |
| US7570182B2 (en) | 2006-09-15 | 2009-08-04 | Texas Instruments Incorporated | Adaptive spectral noise shaping to improve time to digital converter quantization resolution using dithering |
| US7460441B2 (en) * | 2007-01-12 | 2008-12-02 | Microchip Technology Incorporated | Measuring a long time period |
| US7567197B2 (en) * | 2007-09-17 | 2009-07-28 | Samsung Electronics Co., Ltd. | Cascade comparator and control method thereof |
| US7859442B2 (en) | 2007-10-05 | 2010-12-28 | Jorg Daniels | Asynchronous sigma delta analog to digital converter using a time to digital converter |
| US7843771B2 (en) | 2007-12-14 | 2010-11-30 | Guide Technology, Inc. | High resolution time interpolator |
| US7583152B2 (en) * | 2008-01-04 | 2009-09-01 | Qualcomm Incorporated | Phase-locked loop with self-correcting phase-to-digital transfer function |
| CN101515155B (zh) * | 2008-02-18 | 2010-10-13 | 瑞昱半导体股份有限公司 | 时间数字转换电路及其相关方法 |
| WO2010047005A1 (ja) | 2008-10-23 | 2010-04-29 | パナソニック株式会社 | デジタルpll回路及び通信装置 |
| JP5590867B2 (ja) * | 2008-12-01 | 2014-09-17 | 三星電子株式会社 | タイム/デジタルコンバーター及びデジタル位相ロックループ |
| US8283933B2 (en) | 2009-03-13 | 2012-10-09 | Qualcomm, Incorporated | Systems and methods for built in self test jitter measurement |
| CN101577546A (zh) * | 2009-06-22 | 2009-11-11 | 清华大学 | 基于全动态电压-时间转换电路的时间域比较器 |
| US7893861B2 (en) * | 2009-06-30 | 2011-02-22 | International Business Machines Corporation | Time-to-digital based analog-to-digital converter architecture |
| TWI382669B (zh) * | 2009-07-16 | 2013-01-11 | Ralink Technology Corp | 用於管線式類比數位轉換器之比較器及相關訊號取樣方法 |
| TWI347085B (en) * | 2009-10-09 | 2011-08-11 | Ind Tech Res Inst | Pipeline time-to-digital converter |
| CN201583811U (zh) * | 2009-10-15 | 2010-09-15 | 山东力创赢芯集成电路有限公司 | 带有温度测量和驱动功能的时间数字转换器 |
| JP5210289B2 (ja) * | 2009-11-26 | 2013-06-12 | 旭化成エレクトロニクス株式会社 | 逐次比較型a/d変換器 |
| KR101258877B1 (ko) | 2009-11-26 | 2013-04-29 | 한국전자통신연구원 | 클럭 검출기 및 이를 이용한 바이어스 전류 조절 회로 |
| US8324881B2 (en) * | 2010-04-21 | 2012-12-04 | Texas Instruments Incorporated | Bandgap reference circuit with sampling and averaging circuitry |
| US8223044B2 (en) * | 2010-04-22 | 2012-07-17 | Texas Instruments Incorporated | INL correction circuitry and method for SAR ADC |
| KR101629970B1 (ko) | 2010-04-23 | 2016-06-13 | 삼성전자주식회사 | 타임 투 디지털 컨버터 및 그의 동작 방법 |
| US8339302B2 (en) * | 2010-07-29 | 2012-12-25 | Freescale Semiconductor, Inc. | Analog-to-digital converter having a comparator for a multi-stage sampling circuit and method therefor |
| KR101212625B1 (ko) * | 2010-07-29 | 2012-12-14 | 연세대학교 산학협력단 | 시간-디지털 컨버터 및 그것의 동작 방법 |
| EP2421155B1 (en) * | 2010-08-02 | 2013-07-03 | Fraunhofer-Gesellschaft zur Förderung der Angewandten Forschung e.V. | A hybrid analog-to-digital converter, an image sensor and a method for providing a plurality of ditigal signals |
| JP5675299B2 (ja) * | 2010-11-26 | 2015-02-25 | 三菱電機株式会社 | パルス長計測回路 |
| US8324952B2 (en) | 2011-05-04 | 2012-12-04 | Phase Matrix, Inc. | Time interpolator circuit |
| WO2012153375A1 (ja) * | 2011-05-06 | 2012-11-15 | 富士通株式会社 | クロック生成回路 |
| JP5659950B2 (ja) * | 2011-05-24 | 2015-01-28 | 富士通株式会社 | A/d変換器 |
| KR20130069147A (ko) * | 2011-12-16 | 2013-06-26 | 삼성전자주식회사 | 기저대역 신호를 증폭하기 위한 장치 및 회로 |
-
2013
- 2013-03-15 US US13/842,481 patent/US8957712B2/en active Active
-
2014
- 2014-03-12 CN CN201480014340.8A patent/CN105191141B/zh not_active Expired - Fee Related
- 2014-03-12 KR KR1020157028038A patent/KR20150129794A/ko not_active Ceased
- 2014-03-12 EP EP14714891.0A patent/EP2972598B1/en not_active Not-in-force
- 2014-03-12 JP JP2016501405A patent/JP6382292B2/ja not_active Expired - Fee Related
- 2014-03-12 WO PCT/US2014/024035 patent/WO2014150707A2/en not_active Ceased
Non-Patent Citations (1)
| Title |
|---|
| None |
Also Published As
| Publication number | Publication date |
|---|---|
| JP6382292B2 (ja) | 2018-08-29 |
| US20140266353A1 (en) | 2014-09-18 |
| CN105191141A (zh) | 2015-12-23 |
| US8957712B2 (en) | 2015-02-17 |
| EP2972598A2 (en) | 2016-01-20 |
| EP2972598B1 (en) | 2020-08-26 |
| WO2014150707A3 (en) | 2015-07-23 |
| CN105191141B (zh) | 2018-06-19 |
| KR20150129794A (ko) | 2015-11-20 |
| JP2016517216A (ja) | 2016-06-09 |
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