JP2016070934A - 内腔検査装置 - Google Patents
内腔検査装置 Download PDFInfo
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/954—Inspecting the inner surface of hollow bodies, e.g. bores
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- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
- A61B1/00—Instruments for performing medical examinations of the interior of cavities or tubes of the body by visual or photographical inspection, e.g. endoscopes; Illuminating arrangements therefor
- A61B1/04—Instruments for performing medical examinations of the interior of cavities or tubes of the body by visual or photographical inspection, e.g. endoscopes; Illuminating arrangements therefor combined with photographic or television appliances
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- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
- A61B1/00—Instruments for performing medical examinations of the interior of cavities or tubes of the body by visual or photographical inspection, e.g. endoscopes; Illuminating arrangements therefor
- A61B1/06—Instruments for performing medical examinations of the interior of cavities or tubes of the body by visual or photographical inspection, e.g. endoscopes; Illuminating arrangements therefor with illuminating arrangements
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/08—Measuring arrangements characterised by the use of optical techniques for measuring diameters
- G01B11/12—Measuring arrangements characterised by the use of optical techniques for measuring diameters internal diameters
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/22—Measuring arrangements characterised by the use of optical techniques for measuring depth
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/2441—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures using interferometry
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02015—Interferometers characterised by the beam path configuration
- G01B9/02017—Interferometers characterised by the beam path configuration with multiple interactions between the target object and light beams, e.g. beam reflections occurring from different locations
- G01B9/02021—Interferometers characterised by the beam path configuration with multiple interactions between the target object and light beams, e.g. beam reflections occurring from different locations contacting different faces of object, e.g. opposite faces
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/0209—Low-coherence interferometers
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B23/00—Telescopes, e.g. binoculars; Periscopes; Instruments for viewing the inside of hollow bodies; Viewfinders; Optical aiming or sighting devices
- G02B23/24—Instruments or systems for viewing the inside of hollow bodies, e.g. fibrescopes
- G02B23/2407—Optical details
- G02B23/2461—Illumination
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
- H04N23/10—Cameras or camera modules comprising electronic image sensors; Control thereof for generating image signals from different wavelengths
- H04N23/12—Cameras or camera modules comprising electronic image sensors; Control thereof for generating image signals from different wavelengths with one sensor only
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
- H04N23/56—Cameras or camera modules comprising electronic image sensors; Control thereof provided with illuminating means
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
- H04N23/60—Control of cameras or camera modules
- H04N23/698—Control of cameras or camera modules for achieving an enlarged field of view, e.g. panoramic image capture
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/954—Inspecting the inner surface of hollow bodies, e.g. bores
- G01N2021/9542—Inspecting the inner surface of hollow bodies, e.g. bores using a probe
- G01N2021/9544—Inspecting the inner surface of hollow bodies, e.g. bores using a probe with emitter and receiver on the probe
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
- H04N23/50—Constructional details
- H04N23/555—Constructional details for picking-up images in sites, inaccessible due to their dimensions or hazardous conditions, e.g. endoscopes or borescopes
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- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
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- Instruments For Measurement Of Length By Optical Means (AREA)
Abstract
加工品8内の内腔6の内面4を検査するための、軸線方向12を規定する測定ヘッド10を有する内腔検査装置2であって、360度の視野を有する光学素子14が、前記測定ヘッド10に配置されていて、この光学素子14は、デジタル画像センサ16と後続配置されたデジタル評価装置とに画像を伝送するように接続している。
【解決手段】
本発明によれば、前記デジタル画像センサの出力信号から表面凹凸情報を取得するための手段が設けられている。
【選択図】 図1
Description
この実施の形態では内視鏡として構成された測定ヘッド10が、検査すべき内腔6内に挿入される。この場合、光学素子14が、回転する直線母線に沿って当該内腔6の内壁4の画像を取得し、画像センサ16上に投影する。画像処理及びパターン認識の公知の方法を用いて、このときに記録された輝度画像、すなわち画像センサ16の出力信号を評価することによって、異常又は欠陥が、内壁4に存在するか否かが確認され得る。
4 内面、表面、内壁
6 内腔
8 加工品
10 測定ヘッド
12 一点鎖線、軸線方向、軸線
14 光学素子、レンズ
16 デジタル画像センサ、画像センサ
18 両矢印
20 白色光干渉計
22 光源
24 ビーム
26 ビームスプリッタミラー、ビームスプリッタ
28 測定ビーム
30 基準ビーム
32 基準ミラー
34 位置決め装置
36 両矢印、位置決め装置
Claims (5)
- 加工品(8)内の内腔(6)の内面(4)を検査するための、軸線方向(12)を規定する測定ヘッド(10)を有する内腔検査装置(2)であって、360度の視野を有する光学素子(14)が、前記測定ヘッド(10)に配置されていて、この光学素子(14)は、デジタル画像センサ(16)と後続配置されたデジタル評価装置とに画像を伝送するように接続している当該検査装置において、
前記デジタル画像センサ(16)の出力信号から表面凹凸情報を取得するための手段を特徴とする検査装置。 - 表面凹凸情報を取得するための前記手段は、光源(22)を有する白色光干渉計(20)を備え、前記内面(4)上に当てるためのこの光源(22)の光が、前記光学(14)のビーム路内に入射可能であるか又は入射されていることを特徴とする請求項1に記載の検査装置。
- 評価装置が、基準ミラー(32)の異なる位置に前記デジタル画像センサ(16)の対応する出力信号を割り当てるように、前記評価装置にデータを伝送するように接続している制御装置によって制御可能である位置決め装置(34)が、前記白色光干渉計(30)の前記基準ミラー(32)に付設されていることを特徴とする請求項2に記載の検査装置。
- 前記測定ヘッド(10)を軸線方向にステップごとに又は連続して送るための送り装置が、この測定ヘッド(10)に付設されていることを特徴とする請求項1〜3のいずれか1項に記載の検査装置。
- 少なくとも前記測定ヘッド(10)が、特に照明装置を有する測定ヘッド(10)が、検査すべき中空空間(6)内に挿入可能な内視鏡として構成されていることを特徴とする請求項1〜4のいずれか1項に記載の検査装置。
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
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DE102014114304.3 | 2014-10-01 | ||
DE102014114304 | 2014-10-01 | ||
DE102014118753.9 | 2014-12-16 | ||
DE102014118753.9A DE102014118753A1 (de) | 2014-10-01 | 2014-12-16 | Prüfvorrichtung |
Publications (1)
Publication Number | Publication Date |
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JP2016070934A true JP2016070934A (ja) | 2016-05-09 |
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JP2015181555A Active JP6284278B2 (ja) | 2014-10-01 | 2015-09-15 | 穿孔検査装置 |
JP2015188155A Pending JP2016070934A (ja) | 2014-10-01 | 2015-09-25 | 内腔検査装置 |
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JP2015181555A Active JP6284278B2 (ja) | 2014-10-01 | 2015-09-15 | 穿孔検査装置 |
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US (2) | US9983149B2 (ja) |
JP (2) | JP6284278B2 (ja) |
CN (2) | CN105486694B (ja) |
DE (3) | DE102014118753A1 (ja) |
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DE102014118753A1 (de) * | 2014-10-01 | 2016-04-07 | Jenoptik Industrial Metrology Germany Gmbh | Prüfvorrichtung |
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TW202200995A (zh) * | 2020-06-24 | 2022-01-01 | 由田新技股份有限公司 | 孔洞檢測系統以及孔洞檢測方法 |
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CN113483692B (zh) * | 2021-06-23 | 2023-08-29 | 苏州中科全象智能科技有限公司 | 一种孔检测光学系统 |
DE102022102155B4 (de) | 2022-01-31 | 2023-12-28 | Jenoptik Industrial Metrology Germany Gmbh | Kalibrierhilfsmittel und Verfahren zur Herstellung des Kalibrierhilfsmittels |
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- 2015-09-24 CN CN201510613409.5A patent/CN105486694B/zh active Active
- 2015-09-25 JP JP2015188155A patent/JP2016070934A/ja active Pending
- 2015-09-29 CN CN201510631335.8A patent/CN105486695A/zh active Pending
- 2015-09-30 US US14/871,354 patent/US9983149B2/en active Active
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Patent Citations (6)
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JP2006513439A (ja) * | 2003-06-05 | 2006-04-20 | ローベルト ボツシユ ゲゼルシヤフト ミツト ベシユレンクテル ハフツング | 干渉測定装置 |
JP2007531887A (ja) * | 2004-04-05 | 2007-11-08 | ローベルト ボツシユ ゲゼルシヤフト ミツト ベシユレンクテル ハフツング | 特殊光学系の使用のための干渉システム |
JP2010261950A (ja) * | 2009-05-04 | 2010-11-18 | Hommel-Etamic Gmbh | 工作物の空所の内面を模写する装置 |
US20110001984A1 (en) * | 2009-05-04 | 2011-01-06 | Hubert Keller | Apparatus for imaging the inner surface of a cavity within a workpiece |
JP2011017615A (ja) * | 2009-07-09 | 2011-01-27 | High Energy Accelerator Research Organization | 白色干渉法による管内面の形状測定装置及び方法 |
JP2013096996A (ja) * | 2011-11-04 | 2013-05-20 | Hommel-Etamic Gmbh | 加工物内の中空空間の内面を撮影する装置 |
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US20160187265A1 (en) | 2016-06-30 |
CN105486694B (zh) | 2019-03-19 |
DE102014118753A1 (de) | 2016-04-07 |
JP2016070924A (ja) | 2016-05-09 |
DE202014010793U1 (de) | 2016-08-29 |
JP6284278B2 (ja) | 2018-02-28 |
DE102014118844B4 (de) | 2016-11-03 |
US20160187264A1 (en) | 2016-06-30 |
CN105486695A (zh) | 2016-04-13 |
DE102014118844A1 (de) | 2016-04-07 |
CN105486694A (zh) | 2016-04-13 |
US9983149B2 (en) | 2018-05-29 |
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