JP2015503112A5 - - Google Patents

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Publication number
JP2015503112A5
JP2015503112A5 JP2014533420A JP2014533420A JP2015503112A5 JP 2015503112 A5 JP2015503112 A5 JP 2015503112A5 JP 2014533420 A JP2014533420 A JP 2014533420A JP 2014533420 A JP2014533420 A JP 2014533420A JP 2015503112 A5 JP2015503112 A5 JP 2015503112A5
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JP
Japan
Prior art keywords
stage
tilt
assembly
sample
coupled
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JP2014533420A
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English (en)
Japanese (ja)
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JP5789055B2 (ja
JP2015503112A (ja
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Priority claimed from PCT/US2012/058019 external-priority patent/WO2013049641A1/en
Publication of JP2015503112A publication Critical patent/JP2015503112A/ja
Publication of JP2015503112A5 publication Critical patent/JP2015503112A5/ja
Application granted granted Critical
Publication of JP5789055B2 publication Critical patent/JP5789055B2/ja
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JP2014533420A 2011-09-28 2012-09-28 複数自由度ステージを含むテストアセンブリ Active JP5789055B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201161540317P 2011-09-28 2011-09-28
US61/540,317 2011-09-28
PCT/US2012/058019 WO2013049641A1 (en) 2011-09-28 2012-09-28 Testing assembly including a multiple degree of freedom stage

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2015150364A Division JP6141918B2 (ja) 2011-09-28 2015-07-30 複数自由度ステージを含むテストアセンブリ

Publications (3)

Publication Number Publication Date
JP2015503112A JP2015503112A (ja) 2015-01-29
JP2015503112A5 true JP2015503112A5 (enExample) 2015-05-21
JP5789055B2 JP5789055B2 (ja) 2015-10-07

Family

ID=47996455

Family Applications (2)

Application Number Title Priority Date Filing Date
JP2014533420A Active JP5789055B2 (ja) 2011-09-28 2012-09-28 複数自由度ステージを含むテストアセンブリ
JP2015150364A Active JP6141918B2 (ja) 2011-09-28 2015-07-30 複数自由度ステージを含むテストアセンブリ

Family Applications After (1)

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JP2015150364A Active JP6141918B2 (ja) 2011-09-28 2015-07-30 複数自由度ステージを含むテストアセンブリ

Country Status (6)

Country Link
US (5) US9472374B2 (enExample)
EP (2) EP4155799A3 (enExample)
JP (2) JP5789055B2 (enExample)
DE (1) DE202012013742U1 (enExample)
ES (1) ES2931307T3 (enExample)
WO (1) WO2013049641A1 (enExample)

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WO2013049641A1 (en) 2011-09-28 2013-04-04 Hysitron, Inc. Testing assembly including a multiple degree of freedom stage
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US10127649B2 (en) * 2017-01-24 2018-11-13 International Business Machines Corporation Electron channeling pattern acquisition from small crystalline areas
US11075055B2 (en) * 2017-05-11 2021-07-27 Richard J. Pickreign Automated multi-grid handling apparatus
FR3075983B1 (fr) * 2017-12-22 2021-07-23 Univ Des Antilles Dispositif de nano-manipulation et procede de caracterisation utilisant un tel dispositif
US11549872B2 (en) * 2018-08-14 2023-01-10 Corning Incorporated Methods and apparatus for determining a crush strength of an edge
US11557456B2 (en) * 2018-09-14 2023-01-17 University Of Connecticut Real-time direct measurement of mechanical properties in-situ of scanning beam microscope
CN109872768B (zh) * 2019-01-18 2021-02-05 宁波大学 基于仿生扑翼的多自由度柔顺微操作器
CN112213635B (zh) * 2019-07-09 2024-07-30 致茂电子(苏州)有限公司 马达测试平台的自动装卸装置及系统
CN111929153B (zh) * 2020-07-20 2024-07-19 浙江顺林家具有限公司 一种木质家具生产用抗压检测设备
CZ309523B6 (cs) * 2020-08-27 2023-03-22 Tescan Brno, S.R.O. Naklápěcí prvek manipulačního stolku
CN112178375B (zh) * 2020-09-17 2021-05-18 汕头市摩根冶金实业有限公司 一种高线轧机性能检测多功能试车台
CN115475014B (zh) * 2022-10-21 2024-10-29 苏州心锐医疗科技有限公司 一种用于多自由度外科手术器械的锁定机构
GB2626604A (en) * 2023-01-30 2024-07-31 Lig Nanowise Ltd Sample support system

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