JP2015501921A5 - - Google Patents

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Publication number
JP2015501921A5
JP2015501921A5 JP2014541253A JP2014541253A JP2015501921A5 JP 2015501921 A5 JP2015501921 A5 JP 2015501921A5 JP 2014541253 A JP2014541253 A JP 2014541253A JP 2014541253 A JP2014541253 A JP 2014541253A JP 2015501921 A5 JP2015501921 A5 JP 2015501921A5
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Japan
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encoder
encoder system
regression
diffractive
optical component
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JP2014541253A
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Japanese (ja)
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JP5714780B2 (ja
JP2015501921A (ja
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Priority claimed from PCT/US2012/064086 external-priority patent/WO2013070871A1/en
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JP2014541253A 2011-11-09 2012-11-08 ダブルパス干渉方式エンコーダシステム Active JP5714780B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US201161557755P 2011-11-09 2011-11-09
US61/557,755 2011-11-09
PCT/US2012/064086 WO2013070871A1 (en) 2011-11-09 2012-11-08 Double pass interferometric encoder system

Related Child Applications (1)

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JP2015048528A Division JP6224019B2 (ja) 2011-11-09 2015-03-11 ダブルパス干渉方式エンコーダシステムを用いた物体の位置判定方法。

Publications (3)

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JP2015501921A JP2015501921A (ja) 2015-01-19
JP2015501921A5 true JP2015501921A5 (enExample) 2015-02-26
JP5714780B2 JP5714780B2 (ja) 2015-05-07

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JP2014541253A Active JP5714780B2 (ja) 2011-11-09 2012-11-08 ダブルパス干渉方式エンコーダシステム
JP2015048528A Active JP6224019B2 (ja) 2011-11-09 2015-03-11 ダブルパス干渉方式エンコーダシステムを用いた物体の位置判定方法。

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JP2015048528A Active JP6224019B2 (ja) 2011-11-09 2015-03-11 ダブルパス干渉方式エンコーダシステムを用いた物体の位置判定方法。

Country Status (7)

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US (2) US9025161B2 (enExample)
EP (1) EP2776792B1 (enExample)
JP (2) JP5714780B2 (enExample)
KR (1) KR101521146B1 (enExample)
CN (2) CN106289336B (enExample)
TW (1) TWI476376B (enExample)
WO (1) WO2013070871A1 (enExample)

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CN107167081B (zh) * 2017-06-02 2021-06-15 哈尔滨师范大学 一种野外鸟卵测量装置
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JP7233305B2 (ja) * 2019-05-30 2023-03-06 Dmg森精機株式会社 光学式変位測定装置
TWI721719B (zh) 2019-12-19 2021-03-11 財團法人工業技術研究院 量測裝置
US11598629B2 (en) * 2020-04-14 2023-03-07 Mitutoyo Corporation Optical displacement sensor
WO2022042947A1 (en) * 2020-08-27 2022-03-03 Asml Netherlands B.V. Compact dual pass interferometer for a plane mirror interferometer
CN112097651B (zh) * 2020-09-11 2022-07-22 中国科学院长春光学精密机械与物理研究所 外差二维光栅位移测量系统及测量方法
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CN114413945B (zh) * 2021-12-20 2025-02-21 四川云盾光电科技有限公司 一种亮度定位的绝对式编码器
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