JP2015213147A - 電荷輸送性ワニス、電荷輸送性薄膜及び有機エレクトロルミネッセンス素子 - Google Patents
電荷輸送性ワニス、電荷輸送性薄膜及び有機エレクトロルミネッセンス素子 Download PDFInfo
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- JP2015213147A JP2015213147A JP2014200160A JP2014200160A JP2015213147A JP 2015213147 A JP2015213147 A JP 2015213147A JP 2014200160 A JP2014200160 A JP 2014200160A JP 2014200160 A JP2014200160 A JP 2014200160A JP 2015213147 A JP2015213147 A JP 2015213147A
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- QEFYFXOXNSNQGX-UHFFFAOYSA-N neodymium atom Chemical compound [Nd] QEFYFXOXNSNQGX-UHFFFAOYSA-N 0.000 description 1
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- 229910000027 potassium carbonate Inorganic materials 0.000 description 1
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- 229910052707 ruthenium Inorganic materials 0.000 description 1
- KZUNJOHGWZRPMI-UHFFFAOYSA-N samarium atom Chemical compound [Sm] KZUNJOHGWZRPMI-UHFFFAOYSA-N 0.000 description 1
- CGFYHILWFSGVJS-UHFFFAOYSA-N silicic acid;trioxotungsten Chemical compound O[Si](O)(O)O.O=[W]1(=O)O[W](=O)(=O)O[W](=O)(=O)O1.O=[W]1(=O)O[W](=O)(=O)O[W](=O)(=O)O1.O=[W]1(=O)O[W](=O)(=O)O[W](=O)(=O)O1.O=[W]1(=O)O[W](=O)(=O)O[W](=O)(=O)O1 CGFYHILWFSGVJS-UHFFFAOYSA-N 0.000 description 1
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- PUZPDOWCWNUUKD-UHFFFAOYSA-M sodium fluoride Chemical compound [F-].[Na+] PUZPDOWCWNUUKD-UHFFFAOYSA-M 0.000 description 1
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- HPALAKNZSZLMCH-UHFFFAOYSA-M sodium;chloride;hydrate Chemical class O.[Na+].[Cl-] HPALAKNZSZLMCH-UHFFFAOYSA-M 0.000 description 1
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- PJANXHGTPQOBST-UHFFFAOYSA-N stilbene Chemical compound C=1C=CC=CC=1C=CC1=CC=CC=C1 PJANXHGTPQOBST-UHFFFAOYSA-N 0.000 description 1
- 235000021286 stilbenes Nutrition 0.000 description 1
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- 229910001637 strontium fluoride Inorganic materials 0.000 description 1
- 125000001424 substituent group Chemical group 0.000 description 1
- 125000005017 substituted alkenyl group Chemical group 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
- HXJUTPCZVOIRIF-UHFFFAOYSA-N sulfolane Chemical compound O=S1(=O)CCCC1 HXJUTPCZVOIRIF-UHFFFAOYSA-N 0.000 description 1
- 150000003462 sulfoxides Chemical class 0.000 description 1
- 239000000725 suspension Substances 0.000 description 1
- GZCRRIHWUXGPOV-UHFFFAOYSA-N terbium atom Chemical compound [Tb] GZCRRIHWUXGPOV-UHFFFAOYSA-N 0.000 description 1
- PCCVSPMFGIFTHU-UHFFFAOYSA-N tetracyanoquinodimethane Chemical compound N#CC(C#N)=C1C=CC(=C(C#N)C#N)C=C1 PCCVSPMFGIFTHU-UHFFFAOYSA-N 0.000 description 1
- LFQCEHFDDXELDD-UHFFFAOYSA-N tetramethyl orthosilicate Chemical compound CO[Si](OC)(OC)OC LFQCEHFDDXELDD-UHFFFAOYSA-N 0.000 description 1
- ZQZCOBSUOFHDEE-UHFFFAOYSA-N tetrapropyl silicate Chemical compound CCCO[Si](OCCC)(OCCC)OCCC ZQZCOBSUOFHDEE-UHFFFAOYSA-N 0.000 description 1
- 229910052716 thallium Inorganic materials 0.000 description 1
- BKVIYDNLLOSFOA-UHFFFAOYSA-N thallium Chemical compound [Tl] BKVIYDNLLOSFOA-UHFFFAOYSA-N 0.000 description 1
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- JOXIMZWYDAKGHI-UHFFFAOYSA-N toluene-4-sulfonic acid Chemical compound CC1=CC=C(S(O)(=O)=O)C=C1 JOXIMZWYDAKGHI-UHFFFAOYSA-N 0.000 description 1
- TVIVIEFSHFOWTE-UHFFFAOYSA-K tri(quinolin-8-yloxy)alumane Chemical compound [Al+3].C1=CN=C2C([O-])=CC=CC2=C1.C1=CN=C2C([O-])=CC=CC2=C1.C1=CN=C2C([O-])=CC=CC2=C1 TVIVIEFSHFOWTE-UHFFFAOYSA-K 0.000 description 1
- DENFJSAFJTVPJR-UHFFFAOYSA-N triethoxy(ethyl)silane Chemical compound CCO[Si](CC)(OCC)OCC DENFJSAFJTVPJR-UHFFFAOYSA-N 0.000 description 1
- XVYIJOWQJOQFBG-UHFFFAOYSA-N triethoxy(fluoro)silane Chemical compound CCO[Si](F)(OCC)OCC XVYIJOWQJOQFBG-UHFFFAOYSA-N 0.000 description 1
- SAWDTKLQESXBDN-UHFFFAOYSA-N triethoxy(heptyl)silane Chemical compound CCCCCCC[Si](OCC)(OCC)OCC SAWDTKLQESXBDN-UHFFFAOYSA-N 0.000 description 1
- OYGYKEULCAINCL-UHFFFAOYSA-N triethoxy(hexadecyl)silane Chemical compound CCCCCCCCCCCCCCCC[Si](OCC)(OCC)OCC OYGYKEULCAINCL-UHFFFAOYSA-N 0.000 description 1
- CPUDPFPXCZDNGI-UHFFFAOYSA-N triethoxy(methyl)silane Chemical compound CCO[Si](C)(OCC)OCC CPUDPFPXCZDNGI-UHFFFAOYSA-N 0.000 description 1
- FZMJEGJVKFTGMU-UHFFFAOYSA-N triethoxy(octadecyl)silane Chemical compound CCCCCCCCCCCCCCCCCC[Si](OCC)(OCC)OCC FZMJEGJVKFTGMU-UHFFFAOYSA-N 0.000 description 1
- FHVAUDREWWXPRW-UHFFFAOYSA-N triethoxy(pentyl)silane Chemical compound CCCCC[Si](OCC)(OCC)OCC FHVAUDREWWXPRW-UHFFFAOYSA-N 0.000 description 1
- JCVQKRGIASEUKR-UHFFFAOYSA-N triethoxy(phenyl)silane Chemical compound CCO[Si](OCC)(OCC)C1=CC=CC=C1 JCVQKRGIASEUKR-UHFFFAOYSA-N 0.000 description 1
- NBXZNTLFQLUFES-UHFFFAOYSA-N triethoxy(propyl)silane Chemical compound CCC[Si](OCC)(OCC)OCC NBXZNTLFQLUFES-UHFFFAOYSA-N 0.000 description 1
- ZRQAIBMAFLMIND-UHFFFAOYSA-N triethoxy(thiophen-2-yl)silane Chemical compound CCO[Si](OCC)(OCC)C1=CC=CS1 ZRQAIBMAFLMIND-UHFFFAOYSA-N 0.000 description 1
- CUVIJHAPWYUQIV-UHFFFAOYSA-N triethoxy-[3-(1,1,1,2,3,3,3-heptafluoropropan-2-yloxy)propyl]silane Chemical compound CCO[Si](OCC)(OCC)CCCOC(F)(C(F)(F)F)C(F)(F)F CUVIJHAPWYUQIV-UHFFFAOYSA-N 0.000 description 1
- JXUKBNICSRJFAP-UHFFFAOYSA-N triethoxy-[3-(oxiran-2-ylmethoxy)propyl]silane Chemical compound CCO[Si](OCC)(OCC)CCCOCC1CO1 JXUKBNICSRJFAP-UHFFFAOYSA-N 0.000 description 1
- ZIBGPFATKBEMQZ-UHFFFAOYSA-N triethylene glycol Chemical compound OCCOCCOCCO ZIBGPFATKBEMQZ-UHFFFAOYSA-N 0.000 description 1
- 125000005951 trifluoromethanesulfonyloxy group Chemical group 0.000 description 1
- NMEPHPOFYLLFTK-UHFFFAOYSA-N trimethoxy(octyl)silane Chemical compound CCCCCCCC[Si](OC)(OC)OC NMEPHPOFYLLFTK-UHFFFAOYSA-N 0.000 description 1
- HILHCDFHSDUYNX-UHFFFAOYSA-N trimethoxy(pentyl)silane Chemical compound CCCCC[Si](OC)(OC)OC HILHCDFHSDUYNX-UHFFFAOYSA-N 0.000 description 1
- HQYALQRYBUJWDH-UHFFFAOYSA-N trimethoxy(propyl)silane Chemical compound CCC[Si](OC)(OC)OC HQYALQRYBUJWDH-UHFFFAOYSA-N 0.000 description 1
- BPSIOYPQMFLKFR-UHFFFAOYSA-N trimethoxy-[3-(oxiran-2-ylmethoxy)propyl]silane Chemical compound CO[Si](OC)(OC)CCCOCC1CO1 BPSIOYPQMFLKFR-UHFFFAOYSA-N 0.000 description 1
- XSVXWCZFSFKRDO-UHFFFAOYSA-N triphenyl-(3-triphenylsilylphenyl)silane Chemical compound C1=CC=CC=C1[Si](C=1C=C(C=CC=1)[Si](C=1C=CC=CC=1)(C=1C=CC=CC=1)C=1C=CC=CC=1)(C=1C=CC=CC=1)C1=CC=CC=C1 XSVXWCZFSFKRDO-UHFFFAOYSA-N 0.000 description 1
- DETFWTCLAIIJRZ-UHFFFAOYSA-N triphenyl-(4-triphenylsilylphenyl)silane Chemical compound C1=CC=CC=C1[Si](C=1C=CC(=CC=1)[Si](C=1C=CC=CC=1)(C=1C=CC=CC=1)C=1C=CC=CC=1)(C=1C=CC=CC=1)C1=CC=CC=C1 DETFWTCLAIIJRZ-UHFFFAOYSA-N 0.000 description 1
- HITRWHKLCHWBNZ-UHFFFAOYSA-N triphenyl-[4-(9-phenylfluoren-9-yl)phenyl]silane Chemical compound C1=CC=CC=C1C1(C=2C=CC(=CC=2)[Si](C=2C=CC=CC=2)(C=2C=CC=CC=2)C=2C=CC=CC=2)C2=CC=CC=C2C2=CC=CC=C21 HITRWHKLCHWBNZ-UHFFFAOYSA-N 0.000 description 1
- RFDGVZHLJCKEPT-UHFFFAOYSA-N tris(2,4,6-trimethyl-3-pyridin-3-ylphenyl)borane Chemical compound CC1=C(B(C=2C(=C(C=3C=NC=CC=3)C(C)=CC=2C)C)C=2C(=C(C=3C=NC=CC=3)C(C)=CC=2C)C)C(C)=CC(C)=C1C1=CC=CN=C1 RFDGVZHLJCKEPT-UHFFFAOYSA-N 0.000 description 1
- 238000001132 ultrasonic dispersion Methods 0.000 description 1
- 150000003672 ureas Chemical class 0.000 description 1
- 229910052720 vanadium Inorganic materials 0.000 description 1
- GPPXJZIENCGNKB-UHFFFAOYSA-N vanadium Chemical compound [V]#[V] GPPXJZIENCGNKB-UHFFFAOYSA-N 0.000 description 1
- PXXNTAGJWPJAGM-UHFFFAOYSA-N vertaline Natural products C1C2C=3C=C(OC)C(OC)=CC=3OC(C=C3)=CC=C3CCC(=O)OC1CC1N2CCCC1 PXXNTAGJWPJAGM-UHFFFAOYSA-N 0.000 description 1
- NAWDYIZEMPQZHO-UHFFFAOYSA-N ytterbium Chemical compound [Yb] NAWDYIZEMPQZHO-UHFFFAOYSA-N 0.000 description 1
- 229910052727 yttrium Inorganic materials 0.000 description 1
- VWQVUPCCIRVNHF-UHFFFAOYSA-N yttrium atom Chemical compound [Y] VWQVUPCCIRVNHF-UHFFFAOYSA-N 0.000 description 1
- 229910052725 zinc Inorganic materials 0.000 description 1
- 239000011701 zinc Substances 0.000 description 1
- HTPBWAPZAJWXKY-UHFFFAOYSA-L zinc;quinolin-8-olate Chemical compound [Zn+2].C1=CN=C2C([O-])=CC=CC2=C1.C1=CN=C2C([O-])=CC=CC2=C1 HTPBWAPZAJWXKY-UHFFFAOYSA-L 0.000 description 1
- 229910052726 zirconium Inorganic materials 0.000 description 1
Classifications
-
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Abstract
【解決手段】式(1)で表されるオリゴチオフェン誘導体からなる電荷輸送性物質と、ドーパントと、有機シラン化合物と、有機溶媒とを含むことを特徴とする電荷輸送性ワニス。
(式中、R1〜R8は、それぞれ独立に、水素、アルキル基、アルケニル基、アルキニル基、アリール基、ヘテロアリール基、−OY1基、−SY2基、−NHY3基、−NY4Y5基又は−NHC(O)Y6基を表し、n1〜n3は、それぞれ独立に自然数を表し、かつ4≦n1+n2+n3≦20を満たす。)
【選択図】 なし
Description
なお、特許文献1には、オリゴチオフェン誘導体、ドーパント及び有機シラン化合物を用いたワニスについては、具体的に開示されていない。
1.式(1)で表されるオリゴチオフェン誘導体からなる電荷輸送性物質と、ドーパントと、有機シラン化合物と、有機溶媒とを含むことを特徴とする電荷輸送性ワニス。
R7及びR8は、それぞれ独立に、水素原子、Z1で置換されていてもよい炭素数1〜20のアルキル基、Z1で置換されていてもよい炭素数2〜20のアルケニル基、Z1で置換されていてもよい炭素数2〜20のアルキニル基、Z3で置換されていてもよい炭素数6〜20のアリール基、Z3で置換されていてもよい炭素数2〜20のヘテロアリール基、−OY1基、−SY2基、−NHY3基、−NY4Y5基又は−NHC(O)Y6基を表し、
Y1〜Y6は、それぞれ独立に、Z1で置換されていてもよい炭素数1〜20のアルキル基、Z1で置換されていてもよい炭素数2〜20のアルケニル基、Z1で置換されていてもよい炭素数2〜20のアルキニル基、Z2で置換されていてもよい炭素数6〜20のアリール基又はZ2で置換されていてもよい炭素数2〜20のヘテロアリール基を表し、
Z1は、炭素数6〜20のアリール基又は炭素数2〜20のヘテロアリール基を表し、
Z2は、炭素数1〜20のアルキル基、炭素数2〜20のアルケニル基又は炭素数2〜20のアルキニル基を表し、
Z3は、炭素数1〜20のアルキル基、炭素数2〜20のアルケニル基、炭素数2〜20のアルキニル基、各々のアルキル基が炭素数1〜20のアルキル基であるジアルキルアミノ基、又は各々のアリール基が炭素数6〜20のアリール基であるジアリールアミノ基を表し、
n1〜n3は、それぞれ独立に自然数を表し、かつ4≦n1+n2+n3≦20を満たす。)
2.上記ドーパントが、ヘテロポリ酸を含む1の電荷輸送性ワニス。
3.上記ヘテロポリ酸が、リンタングステン酸を含む2の電荷輸送性ワニス。
4.上記オリゴチオフェン誘導体が、式(2)で表される1〜3のいずれかの電荷輸送性ワニス。
5.上記有機シラン化合物が、ジアルコキシシラン化合物、トリアルコキシシラン化合物及びテトラアルコキシシラン化合物から選ばれる少なくとも1種を含む1〜4のいずれかの電荷輸送性ワニス。
6.更に、式(12)で表されるテトラシアノキノジメタン化合物を含む1〜5のいずれかの電荷輸送性ワニス。
7.更に、アリールスルホン酸化合物からなるドーパントを含む1〜6のいずれかの電荷輸送性ワニス。
8.1〜7のいずれかの電荷輸送性ワニスを用いて作製される電荷輸送性薄膜。
9.8の電荷輸送性薄膜を有する有機エレクトロルミネッセンス素子。
10.上記電荷輸送性薄膜が、正孔注入層又は正孔輸送層である9の有機エレクトロルミネッセンス素子。
11.1〜7のいずれかの電荷輸送性ワニスを基材上に塗布して焼成することを特徴とする電荷輸送性薄膜の製造方法。
12.8の電荷輸送性薄膜を用いることを特徴とする有機エレクトロルミネッセンス素子の製造方法。
13.式(1)で表されるオリゴチオフェン誘導体からなる電荷輸送性物質と、ドーパントとを含むことを特徴とする電荷輸送性材料。
R7及びR8は、それぞれ独立に、水素原子、Z1で置換されていてもよい炭素数1〜20のアルキル基、Z1で置換されていてもよい炭素数2〜20のアルケニル基、Z1で置換されていてもよい炭素数2〜20のアルキニル基、Z3で置換されていてもよい炭素数6〜20のアリール基、Z3で置換されていてもよい炭素数2〜20のヘテロアリール基、−OY1基、−SY2基、−NHY3基、−NY4Y5基又は−NHC(O)Y6基を表し、
Y1〜Y6は、それぞれ独立に、Z1で置換されていてもよい炭素数1〜20のアルキル基、Z1で置換されていてもよい炭素数2〜20のアルケニル基、Z1で置換されていてもよい炭素数2〜20のアルキニル基、Z2で置換されていてもよい炭素数6〜20のアリール基又はZ2で置換されていてもよい炭素数2〜20のヘテロアリール基を表し、
Z1は、炭素数6〜20のアリール基又は炭素数2〜20のヘテロアリール基を表し、
Z2は、炭素数1〜20のアルキル基、炭素数2〜20のアルケニル基又は炭素数2〜20のアルキニル基を表し、
Z3は、炭素数1〜20のアルキル基、炭素数2〜20のアルケニル基、炭素数2〜20のアルキニル基、各々のアルキル基が炭素数1〜20のアルキル基であるジアルキルアミノ基、又は各々のアリール基が炭素数6〜20のアリール基であるジアリールアミノ基を表し、
n1〜n3は、それぞれ独立に自然数を表し、かつ4≦n1+n2+n3≦20を満たす。)
また、本発明の電荷輸送性ワニスを用いることで、スピンコート法やスリットコート法等、大面積に成膜可能な各種ウェットプロセスを用いた場合でも電荷輸送性に優れた薄膜を再現性よく製造できるため、近年の有機EL素子の分野における進展にも十分対応できる。
更に、本発明の電荷輸送性ワニスから得られる薄膜は、帯電防止膜や有機薄膜太陽電池の陽極バッファ層等としても使用できる。
本発明に係る電荷輸送性ワニスは、式(1)で表されるオリゴチオフェン誘導体からなる電荷輸送性物質を含む。
Z2は、炭素数1〜20のアルキル基、炭素数2〜20のアルケニル基又は炭素数2〜20のアルキニル基を表す。
Z3は、炭素数1〜20のアルキル基、炭素数2〜20のアルケニル基、炭素数2〜20のアルキニル基、各々のアルキル基が炭素数1〜20のアルキル基であるジアルキルアミノ基、又は各々のアリール基が炭素数6〜20のアリール基であるジアリールアミノ基を表す。
これらのうち、R7及びR8としては、特に、水素原子、各々のアリール基がZ2で置換されていてもよい炭素数6〜10のアリール基であるジアリールアミノ基、又は各々のアリール基が炭素数6〜20のアリール基であるジアリールアミノ基で置換されたフェニル基が好ましく、水素原子又は4−ジフェニルアミノフェニル基が最適である。
また、オリゴチオフェン誘導体の有機溶媒への溶解性を向上させる観点から、n1〜n3は、好ましくはn1+n2+n3≦8、より好ましくはn1+n2+n3≦7、より一層好ましくはn1+n2+n3≦6、更に好ましくはn1+n2+n3≦5を満たす。
擬ハロゲン基としては、メタンスルホニルオキシ基、トリフルオロメタンスルホニルオキシ基、ノナフルオロブタンスルホニルオキシ基等の(フルオロ)アルキルスルホニルオキシ基;ベンゼンスルホニルオキシ基、トルエンスルホニルオキシ基等の芳香族スルホニルオキシ基などが挙げられる。
スキーム2において、式(6)〜(8)で表されるチオフェン誘導体の仕込み比は、通常、式(7)で表されるチオフェン誘導体に対し、式(6)で表されるチオフェン誘導体、式(8)で表されるチオフェン誘導体それぞれ0.5〜1.5当量程度であるが、0.9〜1.3当量程度が好適である。
スキーム3において、式(9)で表されるチオフェン誘導体及び式(10)〜(11)で表される化合物の仕込み比は、通常、式(9)で表されるチオフェン誘導体に対し、式(10)で表される化合物、式(11)で表される化合物それぞれ0.5〜1.5当量程度であるが、0.9〜1.3当量程度が好適である。
また、配位子を用いる場合、その使用量は、使用する金属錯体に対し0.1〜5当量程度でよいが、1〜4当量程度が好適である。
反応終了後は、常法に従って後処理をして、式(1)又は(1')で表されるオリゴチオフェン誘導体を得ることができる。
一方、式(3)、(5)、(7)、(10)及び(11)で表される化合物は、市販品を用いることもできるし、一般的な手法に従い、各化合物に対応する構造を有する、チオフェン、アルカン、アルケン、アルキン、アレーン又はヘテロアレーン(チオフェンを除く)をハロゲン化又は擬ハロゲン化することで得ることができる。
本発明の電荷輸送性ワニスは、ドーパントを含む。ドーパントとしては、特に限定されるものではなく、有機系のドーパント、無機系のドーパントのいずれも用いることができる。
本発明の電荷輸送性ワニスに含まれる有機シラン化合物としては、ジアルコキシシラン化合物、トリアルコキシシラン化合物又はテトラアルコキシシラン化合物が挙げられる。これらは1種単独で又は2種以上組み合わせて用いてもよい。
とりわけ、有機シラン化合物は、ジアルコキシシラン化合物及びトリアルコキシシラン化合物から選ばれる1種を含むことが好ましく、トリアルコキシシラン化合物を含むことがより好ましい。
SiR'2(OR)2 (B1)
SiR'(OR)3 (B2)
Si(OR)4 (B3)
R'は、それぞれ独立に、Z103で置換されていてもよい炭素数1〜20のアルキル基、Z103で置換されていてもよい炭素数2〜20のアルケニル基、Z103で置換されていてもよい炭素数2〜20のアルキニル基、Z104で置換されていてもよい炭素数6〜20のアリール基又はZ104で置換されていてもよい炭素数2〜20のヘテロアリール基を表す。
Z102は、ハロゲン原子、Z105で置換されていてもよい炭素数1〜20のアルキル基、Z105で置換されていてもよい炭素数2〜20のアルケニル基又はZ105で置換されていてもよい炭素数2〜20のアルキニル基を表す。
Z104は、ハロゲン原子、Z105で置換されていてもよい炭素数1〜20のアルキル基、Z105で置換されていてもよい炭素数2〜20のアルケニル基、Z105で置換されていてもよい炭素数2〜20のアルキニル基、エポキシシクロヘキシル基、グリシドキシ基、メタクリロキシ基、アクリロキシ基、ウレイド基(−NHCONH2)、チオール基、イソシアネート基(−NCO)、アミノ基、−NHY101基又は−NY102Y103基を表す。
Z105は、ハロゲン原子、アミノ基、ニトロ基、シアノ基又はチオール基を表す。
ジアルコキシシラン化合物の具体例としては、ジメチルジメトキシシラン、ジメチルジエトキシシラン、メチルエチルジメトキシシラン、ジエチルジメトキシシラン、ジエチルジエトキシシラン、メチルプロピルジメトキシシラン、メチルプロピルジエトキシシラン、ジイソプロピルジメトキシシラン、フェニルメチルジメトキシシラン、ビニルメチルジメトキシシラン、3−グリシドキシプロピルメチルジメトキシシシラン、3−グリシドキシプロピルメチルジエトキシシシラン、3−(3,4−エポキシシクロヘキシル)エチルメチルジメトキシシラン、3−メタクリロキシプロピルメチルジメトキシシラン、3−メタクリロキシプロピルメチルジエトキシシラン、3−メルカプトプロピルメチルジメトキシシラン、3−アミノプロピルメチルジエトキシシラン、N−(2−アミノエチル)アミノプロピルメチルジメトキシシラン、3,3,3−トリフルオロプロピルメチルジメトキシシラン等が挙げられる。
電荷輸送性ワニスを調製する際に用いられる有機溶媒としては、電荷輸送性物質、ドーパント及び有機シラン化合物を良好に溶解し得る高溶解性溶媒を用いることができる。
このような高溶解性溶媒としては、例えば、N,N−ジメチルホルムアミド、N,N−ジメチルアセトアミド、N−メチルピロリドン、1,3−ジメチル−2−イミダゾリジノン、ジエチレングリコールモノメチルエーテル等の有機溶媒を用いることができる。これらの溶媒は1種単独で、又は2種以上混合して用いることができ、その使用量は、ワニスに使用する溶媒全体に対して5〜100質量%とすることができる。
なお、電荷輸送性物質及びドーパントは、いずれも上記溶媒に完全に溶解していることが好ましい。
このような溶媒としては、例えば、エチレングリコールモノブチルエーテル、ジエチレングリコールジエチルエーテル、ジエチレングリコールジメチルエーテル、ジエチレングリコールモノエチルエーテルアセテート、ジエチレングリコールモノブチルエーテルアセテート、ジプロピレングリコールモノメチルエーテル、プロピレングリコールモノメチルエーテルアセテート、ジエチレングリコールモノエチルエーテル、ジアセトンアルコール、γ−ブチロラクトン、エチルラクテート、n−ヘキシルアセテート、プロピレングリコールモノメチルエーテル等が挙げられるが、これらに限定されるものではない。これらの溶媒は1種単独で、又は2種以上混合して用いることができる。
また、本発明における電荷輸送性ワニスの固形分濃度は、ワニスの粘度及び表面張力等や、作製する薄膜の厚み等を勘案して適宜設定されるものではあるが、通常、0.1〜10.0質量%程度であり、ワニスの塗布性を向上させることを考慮すると、好ましくは0.5〜5.0質量%程度、より好ましくは1.0〜3.0質量%程度である。
本発明の電荷輸送性ワニスは、式(12)で表されるテトラシアノキノジメタン化合物を含むことが好ましい。テトラシアノキノジメタン化合物を含むことで、得られる薄膜を正孔注入層とて用いた場合に素子の寿命が向上し、その輝度等の特性が更に向上する。また、ワニスを低温焼成した場合においても、高平坦性及び高電荷輸送性の薄膜を再現性よく製造できる。
本発明の電荷輸送性ワニスは、上述したオリゴチオフェン誘導体のほかに、本発明の効果を妨げない限り、その他の電荷輸送性物質を含んでもよい。また、本発明の電荷輸送性ワニスは、ドーパントとして、上述したヘテロポリ酸の代わりに、その他の物質を含んでもよい。
Z202は、ハロゲン原子、ニトロ基、シアノ基、アルデヒド基、水酸基、チオール基、スルホン酸基、カルボン酸基、Z203で置換されていてもよい炭素数1〜20のアルキル基、Z203で置換されていてもよい炭素数2〜20のアルケニル基又はZ203で置換されていてもよい炭素数2〜20のアルキニル基を表す。
Z203は、ハロゲン原子、ニトロ基、シアノ基、アルデヒド基、水酸基、チオール基、スルホン酸基又はカルボン酸基を表す。
本発明の電荷輸送性材料は、式(1)で表されるオリゴチオフェン誘導体からなる電荷輸送性物質と、ドーパントとを含む。このような電荷輸送性材料は、有機溶媒への良好な溶解性を示し、上述のとおりに、当該電荷輸送性材料を有機溶媒に溶解させることで、容易に電荷輸送性ワニスを製造することができる。
本発明の電荷輸送性ワニスを基材上に塗布して焼成することで、基材上に電荷輸送性薄膜を形成させることができる。
本発明の電荷輸送性ワニスを用いてOLED素子を作製する場合の使用材料や、作製方法としては、下記のようなものが挙げられるが、これらに限定されない。
塗布方法としては、特に限定されるものではなく、インクジェット法、スプレー法、ディップ法、スピンコート法、転写印刷法、ロールコート法、刷毛塗り等が挙げられる。なお、塗布は、窒素、アルゴン等の不活性ガス下で行うことが好ましい。
焼成方法としては、不活性ガス下又は真空中、オーブン又はホットプレートで加熱する方法が挙げられる。
(1)1H−NMR:日本電子(株)製 JNM-ECX300 FT NMR SYSTEM
(2)基板洗浄:長州産業(株)製 基板洗浄装置(減圧プラズマ方式)
(3)ワニスの塗布:ミカサ(株)製 スピンコーターMS-A100
(4)膜厚測定:(株)小坂研究所製 微細形状測定機サーフコーダET-4000
(5)EL素子の作製:長州産業(株)製 多機能蒸着装置システムC-E2L1G1-N
(6)EL素子の輝度等の測定:(有)テック・ワールド製 I-V-L測定システム
攪拌後、イオン交換水及びn−ヘキサンを加え分液し、得られた有機層を更にイオン交換水で2回洗浄した後、硫酸ナトリウムを用いて乾燥した。
そして、溶媒を留去して(3,3'''−ジヘキシル−[2,2':5',2'':5'',2'''−クォーターチオフェン]−5,5'''−ジイル)ビス(トリブチルスタナン)を含む混合物(1.7g)を得た。
次に、別のフラスコ内に、得られた混合物1.48gと2−ブロモ−3−ヘキシルチオフェン0.46gを入れて窒素置換した後、トルエン15mL、テトラキス(トリフェニルホスフィン)パラジウム0.05gを順次入れて、還流条件下で4時間攪拌した。
攪拌後、室温まで放冷し、そこへn−ヘキサン、トルエン及びイオン交換水を加えて分液し、得られた有機層を更にイオン交換水で洗浄し、硫酸ナトリウムを用いて乾燥した。
そして、溶媒を留去し、シリカゲルカラムクロマトグラフィーにて精製し、TP2を得た(収量:0.38g、収率:53%、2段階通算収率)。1H−NMRの測定結果を以下に示す。
1H-NMR (CDCl3): δ 7.16-7.13(m, 4H), 7.04(d, J=3.9Hz, 2H), 6.94(s, 4H), 6.92(d, J=5.4Hz, 2H), 2.78(m, 8H), 1.74-1.58(m, 8H), 1.44-1.31(m, 24H), 0.95-0.87(m, 12H).
攪拌終了後、反応混合物を濃縮し、その濃縮液とn−ヘキサンとを混合し、それをろ過した。そして、得られたろ液を濃縮することで、トリブチル(2,3−ジヒドロチエノ[3,4−b][1,4]ジオキシン−5−イル)スタナンを含む混合物7.4gを得た。
次に、別のフラスコ内に、5,5'−ジブロモ−2,2'−ビチオフェン1.5gとテトラキス(トリフェニルホスフィン)パラジウム0.27gを入れて窒素置換した。そこへ、上記トリブチル(2,3−ジヒドロチエノ[3,4−b][1,4]ジオキシン−5−イル)スタナンを含む混合物6.2gとN,N−ジメチルホルムアミド20mLとを加え、125℃に昇温し2時間攪拌した。
攪拌終了後、室温まで放冷し、そこへn−ヘキサンを加え分液し、得られたN,N−ジメチルホルムアミド層をイオン交換水とメタノールの混合液中に滴下して再沈殿を行った。
そして、沈殿物をろ過によって回収して乾燥し、TP3を得た(収量:1.4g、収率:66%)。1H−NMRの測定結果を以下に示す。
1H-NMR (CDCl3): δ 7.11(d, J=4.2Hz, 2H), 7.07(d, J=4.2Hz, 2H), 6.23(s, 2H), 4.37-4.33(m, 4H), 4.28-4.24(m, 4H).
攪拌後、イオン交換水及びn−ヘキサンを加え分液し、得られた有機層を更にイオン交換水で2回洗浄した後、硫酸ナトリウムを用いて乾燥した。
そして、溶媒を留去して(3,3'''−ジヘキシル−[2,2':5',2'':5'',2'''−クォーターチオフェン]−5,5'''−ジイル)ビス(トリブチルスタナン)を含む混合物(3.45g)を得た。
次に、別のフラスコ内に、この得られた混合物3.0gと4−ブロモ−N,N−ジフェニルアニリン1.2を入れて窒素置換した後、トルエン45mL、テトラキス(トリフェニルホスフィン)パラジウム0.10gを順次加え、還流条件下で8時間攪拌した。
攪拌後、室温まで放冷し、そこへクロロホルム及びイオン交換水を加えて分液し、得られた有機層を更にイオン交換水で洗浄し、硫酸ナトリウムを用いて乾燥した。
そして、溶媒を留去し、カラムクロマトグラフィーにて精製し、TP4を得た(収量:0.76g、収率:44%、2段階通算収率)。1H−NMRの測定結果を以下に示す。
1H‐NMR(CDCl3): δ 7.44(4H, d, J=8.9Hz), 7.28-7.23 (m,8H), 7.12-7.10(m, 10H), 7.06-7.00(m, 12H), 2.78(t, J=7.4Hz, 4H), 1.69(quint, J=7.4Hz, 4H), 1.44-1.30(m, 12H), 0.89(m, 6H).
その後、反応混合液を濾過し、その濾液に飽和食塩水を加えて分液処理をした後、有機層から溶媒を留去して得られた固体を1,4−ジオキサンを用いて再結晶し、AN1を得た(収量:22g、収率:65%)。1H−NMRの測定結果を以下に示す。
1H-NMR (CDCl3): δ 7.83(S, 2H), 7.68(S, 1H), 7.26-7.20(m, 8H), 7.01-6.89(m, 28H).
室温まで放冷後、反応後に析出しているSA1を再溶解させるために、N,N−ジメチルホルムアミドを更に500mL加え、室温で90分攪拌した。室温攪拌後、この溶液を濾過して炭酸カリウム残渣を除去し、減圧濃縮した。更に、残存している不純物を除去するために、残渣にメタノール100mLを加え、室温攪拌を行った。室温で30分間攪拌後、懸濁溶液を濾過し、濾物を濾取した。濾物に超純水300mLを加えて溶解し、陽イオン交換樹脂ダウエックス650C(ダウ・ケミカル社製、Hタイプ約200mL、留出溶媒:超純水)を用いたカラムクロマトグラフィーによりイオン交換した。
pH1以下の分画を減圧下で濃縮乾固し、残渣を減圧下で乾固してSA1を得た(11g、収率85%)。1H−NMRの測定結果を以下に示す。
1H-NMR (DMSO-d6): δ 7.18(1H, s, Ar-H), 7.89(1H, d, Ar-H), 8.01(1H, s, Ar-H), 8.23(1H, s, Ar-H), 8.28(1H, d, Ar-H).
その後、再び−78℃に冷却して30分間攪拌した後、トリブチルクロロスタナン8.8mLを滴下して10分攪拌し、次いで0℃に昇温して更に30分間攪拌した。
攪拌後、反応混合物から減圧下で溶媒を留去し、得られた残渣をトルエンに加え、ろ過によって不溶物を除去し、得られたろ液から減圧下で溶媒を留去し、ターチオフェンのビススタニル体を含むオイル状物12.88g(当該ビススタニル体の純度51.91%)得た。
次いで、窒素雰囲気下で、別のフラスコ内に、このターチオフェンビススタニル体を含むオイル状物6.44g、2−ブロモ−3−ノルマルヘキシルチオフェン2.41g、トルエン24mL及びテトラキス(トリフェニルホスフィン)パラジウム0.23gを順次入れて、還流条件下4.5時間攪拌した。
室温まで放冷し、溶媒を減圧留去した後、ろ過によって不溶物を除去した。得られたろ液を濃縮し、シリカゲルカラムクロマトグラフィーにて精製し、TP5を得た(収量:1.29g、収率:55%、2段階通算収率)。
1H-NMR(CDCl3): δ 7.17(d, J=5.1Hz, 2H), 7.12(d, J=3.9Hz, 2H), 7.09(s, 2H), 7.01(d, J=3.9Hz, 2H), 6.93(d, J=5.1Hz, 2H), 2.78(t, J=7.7Hz, 4H), 1.54-1.70(m, 4H), 1.28-1.41(m, 12H), 0.89(t, J=7.0Hz, 6H).
[実施例1−1]
TP1 0.035gと、リンタングステン酸(PTA、関東化学(株)製)0.210gとを、窒素雰囲気下で1,3−ジメチル−2−イミダゾリジノン(DMI)4.0gに溶解させた。得られた溶液に、シクロヘキサノール(CHA)6.0g及びプロピレングリコール(PG)2.0gを加えて攪拌し、そこへペンタフルオロフェニルトリエトキシシラン(以下、シランAという。)0.024gを加えて更に攪拌し、電荷輸送性ワニスを調製した。
表1に従い、電荷輸送性物質、ドーパント、有機シラン化合物、有機溶媒、これらの使用量を変更した以外は、実施例1−1と同様の方法でワニスを調製した。
TP1 0.053gと、PTA0.318gとを、窒素雰囲気下でDMI4.0gに溶解させた。得られた溶液に、CHA6.0g及びPG2.0gを加えて攪拌し、電荷輸送性ワニスを調製した。
TP1 0.052gと、PTA0.258gとを、窒素雰囲気下でDMI2.0gに溶解させた。得られた溶液に、プロピレングリコールモノメチルエーテル(PGME)8.0gを加えて攪拌し、そこへシランA0.031g及びF4TCNQ(東京化成工業(株)製)0.031gを加えて更に攪拌し、電荷輸送性ワニスを調製した。
表2に従い、電荷輸送性物質、ドーパント、有機シラン化合物、有機溶媒、これらの使用量を変更した以外は、実施例1−27と同様の方法でワニスを調製した。
なお、表1及び2中、「シランB」は、3,3,3−トリフルオロプロピルトリメトキシシランを、「シランC」は、フェニルトリメトキシシランを、「DEGME」はジエチレングリコールモノメチルエーテルを、「2,3−BD」は、2,3−ブタンジオールを、括弧内の各数字は、使用量(単位:g)を意味する。
[実施例2−1]
実施例1−1で得られたワニスを、スピンコーターを用いてITO基板に塗布した後、50℃で5分間乾燥し、更に、大気雰囲気下、150℃で10分間焼成し、ITO基板上に30nmの均一な薄膜を形成した。ITO基板としては、インジウム錫酸化物(ITO)が表面上に膜厚150nmでパターニングされた25mm×25mm×0.7tのガラス基板を用い、使用前にO2プラズマ洗浄装置(150W、30秒間)によって表面上の不純物を除却した。
次いで、薄膜を形成したITO基板に対し、蒸着装置(真空度1.0×10-5Pa)を用いてα−NPD、Alq3、フッ化リチウム、及びアルミニウムの薄膜を順次積層し、有機EL素子を得た。この際、蒸着レートは、α−NPD、Alq3及びアルミニウムについては0.2nm/秒、フッ化リチウムについては0.02nm/秒の条件でそれぞれ行い、膜厚は、それぞれ30nm、40nm、0.5nm及び120nmとした。
なお、空気中の酸素、水等の影響による特性劣化を防止するため、有機EL素子は封止基板により封止した後、その特性を評価した。封止は、以下の手順で行った。酸素濃度2ppm以下、露点−85℃以下の窒素雰囲気中で、有機EL素子を封止基板の間に収め、封止基板を接着材(ナガセケムテックス(株)製、XNR5516Z-B1)により貼り合わせた。この際、捕水剤(ダイニック(株)製、HD-071010W-40)を有機EL素子と共に封止基板内に収めた。貼り合わせた封止基板に対し、UV光を照射(波長:365nm、照射量:6,000mJ/cm2)した後、80℃で1時間、アニーリング処理して接着材を硬化させた。
実施例1−1で得られたワニスの代わりに、それぞれ、実施例1−2〜1−26で得られたワニスを用いた以外は、実施例2−1と同様の方法で有機EL素子を作製した。
焼成温度を、それぞれ170℃、190℃、210℃とした以外は実施例2−10と同様の方法で素子を作製した。
焼成温度を230℃とした以外は、それぞれ実施例2−14〜2−16、2−20と同様の方法で素子を作製した。
実施例1−1で得られたワニスの代わりに、比較例1−1で得られたワニスを用いた以外は、実施例2−1と同様の方法で素子を作製した。
実施例1−1で得られたワニスの代わりに、それぞれ、実施例1−27〜1−29で得られたワニスを用いた以外は、実施例2−1と同様の方法で有機EL素子を作製した。
焼成温度を230℃とした以外は、それぞれ、実施例2−34〜2−36と同様の方法で有機EL素子を作製した。
実施例1−1で得られたワニスの代わりに、それぞれ、実施例1−30〜1−34で得られたワニスを用いた以外は、実施例2−1と同様の方法で有機EL素子を作製した。
実施例1−1で得られたワニスの代わりに、それぞれ、実施例1−35〜1−37で得られたワニスを用いた以外は、実施例2−1と同様の方法で有機EL素子を作製した。
実施例1−1で得られたワニスの代わりに、実施例1−38で得られたワニスを用い、焼成温度をそれぞれ150℃、160℃、170℃、180℃とした以外は、実施例2−1と同様の方法で有機EL素子を作製した。
Claims (13)
- 式(1)で表されるオリゴチオフェン誘導体からなる電荷輸送性物質と、ドーパントと、有機シラン化合物と、有機溶媒とを含むことを特徴とする電荷輸送性ワニス。
R7及びR8は、それぞれ独立に、水素原子、Z1で置換されていてもよい炭素数1〜20のアルキル基、Z1で置換されていてもよい炭素数2〜20のアルケニル基、Z1で置換されていてもよい炭素数2〜20のアルキニル基、Z3で置換されていてもよい炭素数6〜20のアリール基、Z3で置換されていてもよい炭素数2〜20のヘテロアリール基、−OY1基、−SY2基、−NHY3基、−NY4Y5基又は−NHC(O)Y6基を表し、
Y1〜Y6は、それぞれ独立に、Z1で置換されていてもよい炭素数1〜20のアルキル基、Z1で置換されていてもよい炭素数2〜20のアルケニル基、Z1で置換されていてもよい炭素数2〜20のアルキニル基、Z2で置換されていてもよい炭素数6〜20のアリール基又はZ2で置換されていてもよい炭素数2〜20のヘテロアリール基を表し、
Z1は、炭素数6〜20のアリール基又は炭素数2〜20のヘテロアリール基を表し、
Z2は、炭素数1〜20のアルキル基、炭素数2〜20のアルケニル基又は炭素数2〜20のアルキニル基を表し、
Z3は、炭素数1〜20のアルキル基、炭素数2〜20のアルケニル基、炭素数2〜20のアルキニル基、各々のアルキル基が炭素数1〜20のアルキル基であるジアルキルアミノ基、又は各々のアリール基が炭素数6〜20のアリール基であるジアリールアミノ基を表し、
n1〜n3は、それぞれ独立に自然数を表し、かつ4≦n1+n2+n3≦20を満たす。) - 上記ドーパントが、ヘテロポリ酸を含む請求項1記載の電荷輸送性ワニス。
- 上記ヘテロポリ酸が、リンタングステン酸を含む請求項2記載の電荷輸送性ワニス。
- 上記有機シラン化合物が、ジアルコキシシラン化合物、トリアルコキシシラン化合物及びテトラアルコキシシラン化合物から選ばれる少なくとも1種を含む請求項1〜4のいずれか1項記載の電荷輸送性ワニス。
- 更に、アリールスルホン酸化合物からなるドーパントを含む請求項1〜6のいずれか1項記載の電荷輸送性ワニス。
- 請求項1〜7のいずれか1項記載の電荷輸送性ワニスを用いて作製される電荷輸送性薄膜。
- 請求項8記載の電荷輸送性薄膜を有する有機エレクトロルミネッセンス素子。
- 上記電荷輸送性薄膜が、正孔注入層又は正孔輸送層である請求項9記載の有機エレクトロルミネッセンス素子。
- 請求項1〜7のいずれか1項記載の電荷輸送性ワニスを基材上に塗布して焼成することを特徴とする電荷輸送性薄膜の製造方法。
- 請求項8記載の電荷輸送性薄膜を用いることを特徴とする有機エレクトロルミネッセンス素子の製造方法。
- 式(1)で表されるオリゴチオフェン誘導体からなる電荷輸送性物質と、ドーパントとを含むことを特徴とする電荷輸送性材料。
R7及びR8は、それぞれ独立に、水素原子、Z1で置換されていてもよい炭素数1〜20のアルキル基、Z1で置換されていてもよい炭素数2〜20のアルケニル基、Z1で置換されていてもよい炭素数2〜20のアルキニル基、Z3で置換されていてもよい炭素数6〜20のアリール基、Z3で置換されていてもよい炭素数2〜20のヘテロアリール基、−OY1基、−SY2基、−NHY3基、−NY4Y5基又は−NHC(O)Y6基を表し、
Y1〜Y6は、それぞれ独立に、Z1で置換されていてもよい炭素数1〜20のアルキル基、Z1で置換されていてもよい炭素数2〜20のアルケニル基、Z1で置換されていてもよい炭素数2〜20のアルキニル基、Z2で置換されていてもよい炭素数6〜20のアリール基又はZ2で置換されていてもよい炭素数2〜20のヘテロアリール基を表し、
Z1は、炭素数6〜20のアリール基又は炭素数2〜20のヘテロアリール基を表し、
Z2は、炭素数1〜20のアルキル基、炭素数2〜20のアルケニル基又は炭素数2〜20のアルキニル基を表し、
Z3は、炭素数1〜20のアルキル基、炭素数2〜20のアルケニル基、炭素数2〜20のアルキニル基、各々のアルキル基が炭素数1〜20のアルキル基であるジアルキルアミノ基、又は各々のアリール基が炭素数6〜20のアリール基であるジアリールアミノ基を表し、
n1〜n3は、それぞれ独立に自然数を表し、かつ4≦n1+n2+n3≦20を満たす。)
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