JP2015109459A5 - - Google Patents
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- JP2015109459A5 JP2015109459A5 JP2015002653A JP2015002653A JP2015109459A5 JP 2015109459 A5 JP2015109459 A5 JP 2015109459A5 JP 2015002653 A JP2015002653 A JP 2015002653A JP 2015002653 A JP2015002653 A JP 2015002653A JP 2015109459 A5 JP2015109459 A5 JP 2015109459A5
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Applications Claiming Priority (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US23670409P | 2009-08-25 | 2009-08-25 | |
| US61/236,704 | 2009-08-25 | ||
| US12/860,097 US8514395B2 (en) | 2009-08-25 | 2010-08-20 | Exposure method, exposure apparatus, and device manufacturing method |
| US12/860,097 | 2010-08-20 |
Related Parent Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2014045912A Division JP5812370B2 (ja) | 2009-08-25 | 2014-03-10 | 露光装置及び露光方法、並びにデバイス製造方法 |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2015127274A Division JP6035695B2 (ja) | 2009-08-25 | 2015-06-25 | 露光装置及び露光方法、並びにデバイス製造方法 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2015109459A JP2015109459A (ja) | 2015-06-11 |
| JP2015109459A5 true JP2015109459A5 (OSRAM) | 2015-07-23 |
| JP6035692B2 JP6035692B2 (ja) | 2016-11-30 |
Family
ID=43625432
Family Applications (8)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2010187052A Active JP5637496B2 (ja) | 2009-08-25 | 2010-08-24 | 露光方法及び露光装置、並びにデバイス製造方法 |
| JP2014045912A Active JP5812370B2 (ja) | 2009-08-25 | 2014-03-10 | 露光装置及び露光方法、並びにデバイス製造方法 |
| JP2014125963A Active JP5846255B2 (ja) | 2009-08-25 | 2014-06-19 | 露光装置及び露光方法、並びにデバイス製造方法 |
| JP2015002653A Active JP6035692B2 (ja) | 2009-08-25 | 2015-01-08 | 露光装置及び露光方法、並びにデバイス製造方法 |
| JP2015127274A Active JP6035695B2 (ja) | 2009-08-25 | 2015-06-25 | 露光装置及び露光方法、並びにデバイス製造方法 |
| JP2016004179A Active JP6107981B2 (ja) | 2009-08-25 | 2016-01-13 | 露光装置及び露光方法、並びにデバイス製造方法 |
| JP2016218331A Active JP6292546B2 (ja) | 2009-08-25 | 2016-11-08 | 露光装置及び露光方法、並びにデバイス製造方法 |
| JP2018025540A Active JP6548150B2 (ja) | 2009-08-25 | 2018-02-16 | 露光装置及び露光方法、並びにデバイス製造方法 |
Family Applications Before (3)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2010187052A Active JP5637496B2 (ja) | 2009-08-25 | 2010-08-24 | 露光方法及び露光装置、並びにデバイス製造方法 |
| JP2014045912A Active JP5812370B2 (ja) | 2009-08-25 | 2014-03-10 | 露光装置及び露光方法、並びにデバイス製造方法 |
| JP2014125963A Active JP5846255B2 (ja) | 2009-08-25 | 2014-06-19 | 露光装置及び露光方法、並びにデバイス製造方法 |
Family Applications After (4)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2015127274A Active JP6035695B2 (ja) | 2009-08-25 | 2015-06-25 | 露光装置及び露光方法、並びにデバイス製造方法 |
| JP2016004179A Active JP6107981B2 (ja) | 2009-08-25 | 2016-01-13 | 露光装置及び露光方法、並びにデバイス製造方法 |
| JP2016218331A Active JP6292546B2 (ja) | 2009-08-25 | 2016-11-08 | 露光装置及び露光方法、並びにデバイス製造方法 |
| JP2018025540A Active JP6548150B2 (ja) | 2009-08-25 | 2018-02-16 | 露光装置及び露光方法、並びにデバイス製造方法 |
Country Status (7)
| Country | Link |
|---|---|
| US (10) | US8514395B2 (OSRAM) |
| EP (7) | EP3098655B1 (OSRAM) |
| JP (8) | JP5637496B2 (OSRAM) |
| KR (7) | KR101680541B1 (OSRAM) |
| CN (4) | CN105182693B (OSRAM) |
| TW (8) | TWI554844B (OSRAM) |
| WO (1) | WO2011024984A1 (OSRAM) |
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| US8514395B2 (en) | 2009-08-25 | 2013-08-20 | Nikon Corporation | Exposure method, exposure apparatus, and device manufacturing method |
| US8493547B2 (en) * | 2009-08-25 | 2013-07-23 | Nikon Corporation | Exposure apparatus, exposure method, and device manufacturing method |
| US9207549B2 (en) | 2011-12-29 | 2015-12-08 | Nikon Corporation | Exposure apparatus and exposure method, and device manufacturing method with encoder of higher reliability for position measurement |
| JP5832345B2 (ja) * | 2012-03-22 | 2015-12-16 | 株式会社ニューフレアテクノロジー | 検査装置および検査方法 |
| WO2014054690A1 (ja) | 2012-10-02 | 2014-04-10 | 株式会社ニコン | 露光装置及び露光方法、並びにデバイス製造方法 |
| DE102012218039A1 (de) * | 2012-10-02 | 2014-04-03 | Schaeffler Technologies Gmbh & Co. Kg | Planarantrieb sowie Verfahren zu dessen Kalibrierung |
| CN103198035B (zh) * | 2013-02-28 | 2016-07-20 | 北京优纳科技有限公司 | 对位方法及对位系统 |
| JP6229311B2 (ja) * | 2013-05-28 | 2017-11-15 | 株式会社ニコン | 露光装置及びデバイス製造方法 |
| SG11201605303XA (en) * | 2013-12-31 | 2016-08-30 | Shanghai Microelectronics Equi | Silicon wafer pre-alignment device and method therefor |
| CN104865798B (zh) * | 2014-02-21 | 2017-07-11 | 无锡华润上华科技有限公司 | 光刻工艺中的曝光场的尺寸选择方法 |
| CN105185703B (zh) * | 2014-06-18 | 2019-09-17 | 上海华力微电子有限公司 | 一种晶圆边缘找平的方法 |
| JP6661270B2 (ja) | 2015-01-16 | 2020-03-11 | キヤノン株式会社 | 露光装置、露光システム、および物品の製造方法 |
| KR101963336B1 (ko) * | 2015-02-04 | 2019-03-28 | 카와사키 주코교 카부시키 카이샤 | 로봇의 편차 자동조정 장치 및 로봇의 편차 자동조정 방법 |
| CN107278279B (zh) | 2015-02-23 | 2020-07-03 | 株式会社尼康 | 基板处理系统及基板处理方法、以及组件制造方法 |
| TWI693477B (zh) * | 2015-02-23 | 2020-05-11 | 日商尼康股份有限公司 | 測量裝置、微影系統及曝光裝置、以及元件製造方法 |
| CN111158220A (zh) | 2015-02-23 | 2020-05-15 | 株式会社尼康 | 测量装置及方法、光刻系统、曝光装置及方法 |
| TW201704892A (zh) * | 2015-03-31 | 2017-02-01 | 尼康股份有限公司 | 曝光裝置、平面顯示器之製造方法、元件製造方法、及曝光方法 |
| TW201643558A (zh) * | 2015-03-31 | 2016-12-16 | 尼康股份有限公司 | 曝光裝置、平面顯示器之製造方法、元件製造方法、及曝光方法 |
| CN108139694B (zh) * | 2015-09-30 | 2021-08-03 | 株式会社尼康 | 曝光装置、曝光方法以及平面显示器制造方法 |
| JP6727556B2 (ja) * | 2015-09-30 | 2020-07-22 | 株式会社ニコン | 露光装置及び露光方法、並びにフラットパネルディスプレイ製造方法 |
| DE102015219810A1 (de) * | 2015-10-13 | 2017-04-13 | Dr. Johannes Heidenhain Gmbh | X-Y-Tisch mit einer Positionsmesseinrichtung |
| CN105425550A (zh) * | 2016-01-14 | 2016-03-23 | 哈尔滨工业大学 | 基于交错磁钢排布的动线圈气磁结合气浮双工件台矢量圆弧换台方法及装置 |
| US9865477B2 (en) * | 2016-02-24 | 2018-01-09 | Taiwan Semiconductor Manufacturing Co., Ltd. | Backside polisher with dry frontside design and method using the same |
| CN205427436U (zh) * | 2016-03-23 | 2016-08-03 | 北京京东方光电科技有限公司 | 显示器件的对位检测设备及曝光工艺系统 |
| JP6718279B2 (ja) * | 2016-03-31 | 2020-07-08 | 株式会社オーク製作所 | 露光装置、ステージ較正システム、およびステージ較正方法 |
| KR102556130B1 (ko) | 2016-09-27 | 2023-07-14 | 가부시키가이샤 니콘 | 결정 방법 및 장치, 프로그램, 정보 기록 매체, 노광 장치, 레이아웃 정보 제공 방법, 레이아웃 방법, 마크 검출 방법, 노광 방법, 그리고 디바이스 제조 방법 |
| CN107883884B (zh) | 2016-09-30 | 2019-10-25 | 上海微电子装备（集团）股份有限公司 | 一种光学测量装置和方法 |
| KR20210119582A (ko) * | 2016-09-30 | 2021-10-05 | 가부시키가이샤 니콘 | 이동체 장치, 이동 방법, 노광 장치, 노광 방법, 플랫 패널 디스플레이의 제조 방법, 그리고 디바이스 제조 방법 |
| JP6752450B2 (ja) * | 2016-09-30 | 2020-09-09 | 株式会社ニコン | 移動体装置、移動方法、露光装置、露光方法、フラットパネルディスプレイの製造方法、並びにデバイス製造方法 |
| CN113504712B (zh) * | 2016-09-30 | 2023-09-19 | 株式会社尼康 | 曝光装置、平板显示器的制造方法、以及元件制造方法 |
| CN107883887B (zh) | 2016-09-30 | 2019-11-26 | 上海微电子装备（集团）股份有限公司 | 一种光学测量装置和方法 |
| CN106773525B (zh) * | 2017-03-01 | 2020-06-16 | 合肥京东方光电科技有限公司 | 掩模板、对位方法、显示面板、显示装置及其对盒方法 |
| US10585360B2 (en) * | 2017-08-25 | 2020-03-10 | Applied Materials, Inc. | Exposure system alignment and calibration method |
| JP6493481B2 (ja) * | 2017-10-18 | 2019-04-03 | 株式会社ニコン | 露光装置及びデバイス製造方法 |
| CN109116593B (zh) * | 2018-08-02 | 2021-07-20 | 深圳市华星光电半导体显示技术有限公司 | 母板曝光方法 |
| KR102592792B1 (ko) * | 2018-08-23 | 2023-10-24 | 에이에스엠엘 네델란즈 비.브이. | 대상물 로딩 프로세스를 캘리브레이션하는 스테이지 장치 및 방법 |
| KR102722920B1 (ko) | 2019-04-18 | 2024-10-28 | 삼성전자주식회사 | 진공 챔버용 계측 장치, 및 그 계측 장치를 포함한 계측 시스템 |
| US11637030B2 (en) * | 2019-06-18 | 2023-04-25 | Kla Corporation | Multi-stage, multi-zone substrate positioning systems |
| CN111948917B (zh) * | 2020-08-26 | 2021-06-25 | 清华大学 | 基于光刻机双工件台运动系统的垂向保护方法及装置 |
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