JP2014022708A5 - - Google Patents

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Publication number
JP2014022708A5
JP2014022708A5 JP2012171456A JP2012171456A JP2014022708A5 JP 2014022708 A5 JP2014022708 A5 JP 2014022708A5 JP 2012171456 A JP2012171456 A JP 2012171456A JP 2012171456 A JP2012171456 A JP 2012171456A JP 2014022708 A5 JP2014022708 A5 JP 2014022708A5
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Japan
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semiconductor
conductivity type
semiconductor layer
semiconductor device
regions
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JP2012171456A
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English (en)
Japanese (ja)
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JP2014022708A (ja
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Priority to JP2012171456A priority Critical patent/JP2014022708A/ja
Priority claimed from JP2012171456A external-priority patent/JP2014022708A/ja
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Publication of JP2014022708A5 publication Critical patent/JP2014022708A5/ja
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JP2012171456A 2012-07-17 2012-07-17 半導体装置とその動作方法 Pending JP2014022708A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2012171456A JP2014022708A (ja) 2012-07-17 2012-07-17 半導体装置とその動作方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2012171456A JP2014022708A (ja) 2012-07-17 2012-07-17 半導体装置とその動作方法

Related Child Applications (1)

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JP2016207074A Division JP6232687B2 (ja) 2016-10-21 2016-10-21 半導体装置とその動作方法

Publications (2)

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JP2014022708A JP2014022708A (ja) 2014-02-03
JP2014022708A5 true JP2014022708A5 (enExample) 2016-09-08

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JP2012171456A Pending JP2014022708A (ja) 2012-07-17 2012-07-17 半導体装置とその動作方法

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JP (1) JP2014022708A (enExample)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10115815B2 (en) 2012-12-28 2018-10-30 Cree, Inc. Transistor structures having a deep recessed P+ junction and methods for making same
US9530844B2 (en) 2012-12-28 2016-12-27 Cree, Inc. Transistor structures having reduced electrical field at the gate oxide and methods for making same
US20150263145A1 (en) * 2014-03-14 2015-09-17 Cree, Inc. Igbt structure for wide band-gap semiconductor materials
JP2015207588A (ja) 2014-04-17 2015-11-19 ローム株式会社 半導体装置
DE102014226161B4 (de) * 2014-12-17 2017-10-26 Infineon Technologies Ag Halbleitervorrichtung mit Überlaststrombelastbarkeit
JP2016127177A (ja) * 2015-01-06 2016-07-11 住友電気工業株式会社 炭化珪素基板、炭化珪素半導体装置および炭化珪素基板の製造方法
JP6854598B2 (ja) 2016-07-06 2021-04-07 ローム株式会社 半導体装置
WO2018016543A1 (ja) 2016-07-19 2018-01-25 富士電機株式会社 半導体装置
WO2018139172A1 (ja) * 2017-01-25 2018-08-02 株式会社日立製作所 電力変換装置及び電力変換方法
DE112018002905T5 (de) * 2017-06-09 2020-02-20 Fuji Electric Co., Ltd. Halbleitervorrichtung und verfahren zur herstellung einerhalbleitervorrichtung
CN107749420B (zh) * 2017-11-20 2023-09-01 电子科技大学 一种逆阻型igbt
US11489069B2 (en) 2017-12-21 2022-11-01 Wolfspeed, Inc. Vertical semiconductor device with improved ruggedness
US10615274B2 (en) 2017-12-21 2020-04-07 Cree, Inc. Vertical semiconductor device with improved ruggedness
CN110504300B (zh) * 2019-08-19 2023-02-07 广东美的制冷设备有限公司 绝缘栅极晶体管及其制备方法和应用
CN111697070A (zh) * 2020-06-29 2020-09-22 电子科技大学 一种逆导型igbt器件
CN119943694B (zh) * 2024-12-31 2025-12-12 宏茂微电子(上海)有限公司 一种关于晶圆背面减薄加工损伤层的评估方法

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2864629B2 (ja) * 1990-03-05 1999-03-03 富士電機株式会社 伝導度変調型mosfet
JP5157201B2 (ja) * 2006-03-22 2013-03-06 株式会社デンソー 半導体装置
JP2011187693A (ja) * 2010-03-09 2011-09-22 Toshiba Corp 半導体装置
JP2012099630A (ja) * 2010-11-02 2012-05-24 Panasonic Corp 半導体装置および電力変換器

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