JP2013533391A - 高密度インジウムスズ酸化物(ito)スパッタリングターゲットの製造方法 - Google Patents
高密度インジウムスズ酸化物(ito)スパッタリングターゲットの製造方法 Download PDFInfo
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- JP2013533391A JP2013533391A JP2013523673A JP2013523673A JP2013533391A JP 2013533391 A JP2013533391 A JP 2013533391A JP 2013523673 A JP2013523673 A JP 2013523673A JP 2013523673 A JP2013523673 A JP 2013523673A JP 2013533391 A JP2013533391 A JP 2013533391A
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- 238000004519 manufacturing process Methods 0.000 title claims abstract description 18
- 238000005477 sputtering target Methods 0.000 title abstract description 5
- AMGQUBHHOARCQH-UHFFFAOYSA-N indium;oxotin Chemical compound [In].[Sn]=O AMGQUBHHOARCQH-UHFFFAOYSA-N 0.000 title abstract description 3
- 238000000034 method Methods 0.000 claims abstract description 78
- 239000000843 powder Substances 0.000 claims abstract description 53
- 238000005245 sintering Methods 0.000 claims abstract description 43
- 238000009694 cold isostatic pressing Methods 0.000 claims abstract description 7
- WATWJIUSRGPENY-UHFFFAOYSA-N antimony atom Chemical compound [Sb] WATWJIUSRGPENY-UHFFFAOYSA-N 0.000 claims description 11
- 150000001875 compounds Chemical class 0.000 claims description 11
- 229910052787 antimony Inorganic materials 0.000 claims description 10
- 229910052785 arsenic Inorganic materials 0.000 claims description 10
- RQNWIZPPADIBDY-UHFFFAOYSA-N arsenic atom Chemical compound [As] RQNWIZPPADIBDY-UHFFFAOYSA-N 0.000 claims description 10
- 229910052797 bismuth Inorganic materials 0.000 claims description 10
- JCXGWMGPZLAOME-UHFFFAOYSA-N bismuth atom Chemical compound [Bi] JCXGWMGPZLAOME-UHFFFAOYSA-N 0.000 claims description 10
- 229910052711 selenium Inorganic materials 0.000 claims description 10
- 239000011669 selenium Substances 0.000 claims description 10
- 229910052714 tellurium Inorganic materials 0.000 claims description 10
- PORWMNRCUJJQNO-UHFFFAOYSA-N tellurium atom Chemical compound [Te] PORWMNRCUJJQNO-UHFFFAOYSA-N 0.000 claims description 10
- RJMMFJHMVBOLGY-UHFFFAOYSA-N indium(3+) Chemical compound [In+3] RJMMFJHMVBOLGY-UHFFFAOYSA-N 0.000 claims description 9
- 238000007569 slipcasting Methods 0.000 claims description 9
- BUGBHKTXTAQXES-UHFFFAOYSA-N Selenium Chemical compound [Se] BUGBHKTXTAQXES-UHFFFAOYSA-N 0.000 claims description 7
- ZOXJGFHDIHLPTG-UHFFFAOYSA-N Boron Chemical compound [B] ZOXJGFHDIHLPTG-UHFFFAOYSA-N 0.000 claims description 5
- 229910052796 boron Inorganic materials 0.000 claims description 5
- 229920000642 polymer Polymers 0.000 claims description 5
- GOLCXWYRSKYTSP-UHFFFAOYSA-N Arsenious Acid Chemical compound O1[As]2O[As]1O2 GOLCXWYRSKYTSP-UHFFFAOYSA-N 0.000 claims description 4
- MSBGPEACXKBQSX-UHFFFAOYSA-N (4-fluorophenyl) carbonochloridate Chemical compound FC1=CC=C(OC(Cl)=O)C=C1 MSBGPEACXKBQSX-UHFFFAOYSA-N 0.000 claims description 3
- WMWLMWRWZQELOS-UHFFFAOYSA-N bismuth(III) oxide Inorganic materials O=[Bi]O[Bi]=O WMWLMWRWZQELOS-UHFFFAOYSA-N 0.000 claims description 3
- XUGISPSHIFXEHZ-GPJXBBLFSA-N [(3r,8s,9s,10r,13r,14s,17r)-10,13-dimethyl-17-[(2r)-6-methylheptan-2-yl]-2,3,4,7,8,9,11,12,14,15,16,17-dodecahydro-1h-cyclopenta[a]phenanthren-3-yl] acetate Chemical compound C1C=C2C[C@H](OC(C)=O)CC[C@]2(C)[C@@H]2[C@@H]1[C@@H]1CC[C@H]([C@H](C)CCCC(C)C)[C@@]1(C)CC2 XUGISPSHIFXEHZ-GPJXBBLFSA-N 0.000 claims description 2
- ADCOVFLJGNWWNZ-UHFFFAOYSA-N antimony trioxide Inorganic materials O=[Sb]O[Sb]=O ADCOVFLJGNWWNZ-UHFFFAOYSA-N 0.000 claims description 2
- SFOQXWSZZPWNCL-UHFFFAOYSA-K bismuth;phosphate Chemical compound [Bi+3].[O-]P([O-])([O-])=O SFOQXWSZZPWNCL-UHFFFAOYSA-K 0.000 claims description 2
- KGBXLFKZBHKPEV-UHFFFAOYSA-N boric acid Chemical compound OB(O)O KGBXLFKZBHKPEV-UHFFFAOYSA-N 0.000 claims description 2
- 239000004327 boric acid Substances 0.000 claims description 2
- OSGAYBCDTDRGGQ-UHFFFAOYSA-L calcium sulfate Inorganic materials [Ca+2].[O-]S([O-])(=O)=O OSGAYBCDTDRGGQ-UHFFFAOYSA-L 0.000 claims description 2
- ZOMBKNNSYQHRCA-UHFFFAOYSA-J calcium sulfate hemihydrate Chemical compound O.[Ca+2].[Ca+2].[O-]S([O-])(=O)=O.[O-]S([O-])(=O)=O ZOMBKNNSYQHRCA-UHFFFAOYSA-J 0.000 claims description 2
- 239000011507 gypsum plaster Substances 0.000 claims description 2
- 238000001694 spray drying Methods 0.000 claims description 2
- YZYDPPZYDIRSJT-UHFFFAOYSA-K boron phosphate Chemical compound [B+3].[O-]P([O-])([O-])=O YZYDPPZYDIRSJT-UHFFFAOYSA-K 0.000 claims 1
- VSXOUQNLLPQTQK-UHFFFAOYSA-N selanylideneindium;selenium Chemical compound [Se].[In]=[Se].[In]=[Se] VSXOUQNLLPQTQK-UHFFFAOYSA-N 0.000 claims 1
- TWZRXWXUSGBTAD-UHFFFAOYSA-N tellanylideneindium;tellurium Chemical compound [Te].[Te]=[In].[Te]=[In] TWZRXWXUSGBTAD-UHFFFAOYSA-N 0.000 claims 1
- 239000002002 slurry Substances 0.000 abstract description 31
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 abstract description 12
- 239000011230 binding agent Substances 0.000 abstract description 10
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- 239000000654 additive Substances 0.000 abstract description 6
- 238000000465 moulding Methods 0.000 abstract description 5
- 238000003801 milling Methods 0.000 abstract description 3
- CVNKFOIOZXAFBO-UHFFFAOYSA-J tin(4+);tetrahydroxide Chemical class [OH-].[OH-].[OH-].[OH-].[Sn+4] CVNKFOIOZXAFBO-UHFFFAOYSA-J 0.000 abstract description 2
- 238000001035 drying Methods 0.000 abstract 1
- 150000004679 hydroxides Chemical class 0.000 abstract 1
- 230000001376 precipitating effect Effects 0.000 abstract 1
- 238000004544 sputter deposition Methods 0.000 description 14
- PJXISJQVUVHSOJ-UHFFFAOYSA-N indium(iii) oxide Chemical compound [O-2].[O-2].[O-2].[In+3].[In+3] PJXISJQVUVHSOJ-UHFFFAOYSA-N 0.000 description 13
- 239000000463 material Substances 0.000 description 13
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- 229910052602 gypsum Inorganic materials 0.000 description 12
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 12
- KFZMGEQAYNKOFK-UHFFFAOYSA-N Isopropanol Chemical compound CC(C)O KFZMGEQAYNKOFK-UHFFFAOYSA-N 0.000 description 9
- 239000000203 mixture Substances 0.000 description 9
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 8
- 239000002253 acid Substances 0.000 description 8
- 229910052802 copper Inorganic materials 0.000 description 8
- 239000010949 copper Substances 0.000 description 8
- 239000000243 solution Substances 0.000 description 8
- 239000010409 thin film Substances 0.000 description 8
- XOLBLPGZBRYERU-UHFFFAOYSA-N tin dioxide Chemical compound O=[Sn]=O XOLBLPGZBRYERU-UHFFFAOYSA-N 0.000 description 8
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 7
- 229910052760 oxygen Inorganic materials 0.000 description 7
- 239000001301 oxygen Substances 0.000 description 7
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 6
- NIXOWILDQLNWCW-UHFFFAOYSA-N acrylic acid group Chemical group C(C=C)(=O)O NIXOWILDQLNWCW-UHFFFAOYSA-N 0.000 description 6
- 239000008367 deionised water Substances 0.000 description 6
- 229910021641 deionized water Inorganic materials 0.000 description 6
- 239000000839 emulsion Substances 0.000 description 6
- 229910003437 indium oxide Inorganic materials 0.000 description 6
- VEXZGXHMUGYJMC-UHFFFAOYSA-N Hydrochloric acid Chemical compound Cl VEXZGXHMUGYJMC-UHFFFAOYSA-N 0.000 description 5
- 229910000041 hydrogen chloride Inorganic materials 0.000 description 5
- IXCSERBJSXMMFS-UHFFFAOYSA-N hydrogen chloride Substances Cl.Cl IXCSERBJSXMMFS-UHFFFAOYSA-N 0.000 description 5
- 239000002245 particle Substances 0.000 description 5
- 229910001887 tin oxide Inorganic materials 0.000 description 5
- 229910000673 Indium arsenide Inorganic materials 0.000 description 4
- GRYLNZFGIOXLOG-UHFFFAOYSA-N Nitric acid Chemical compound O[N+]([O-])=O GRYLNZFGIOXLOG-UHFFFAOYSA-N 0.000 description 4
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 4
- 239000011324 bead Substances 0.000 description 4
- 238000007796 conventional method Methods 0.000 description 4
- 239000007789 gas Substances 0.000 description 4
- WPYVAWXEWQSOGY-UHFFFAOYSA-N indium antimonide Chemical compound [Sb]#[In] WPYVAWXEWQSOGY-UHFFFAOYSA-N 0.000 description 4
- RPQDHPTXJYYUPQ-UHFFFAOYSA-N indium arsenide Chemical compound [In]#[As] RPQDHPTXJYYUPQ-UHFFFAOYSA-N 0.000 description 4
- AKUCEXGLFUSJCD-UHFFFAOYSA-N indium(3+);selenium(2-) Chemical compound [Se-2].[Se-2].[Se-2].[In+3].[In+3] AKUCEXGLFUSJCD-UHFFFAOYSA-N 0.000 description 4
- 239000007791 liquid phase Substances 0.000 description 4
- 238000003701 mechanical milling Methods 0.000 description 4
- 239000007921 spray Substances 0.000 description 4
- 229910016287 MxOy Inorganic materials 0.000 description 3
- 239000004743 Polypropylene Substances 0.000 description 3
- 238000005336 cracking Methods 0.000 description 3
- 238000000280 densification Methods 0.000 description 3
- 239000011521 glass Substances 0.000 description 3
- 238000010438 heat treatment Methods 0.000 description 3
- XLYOFNOQVPJJNP-UHFFFAOYSA-M hydroxide Chemical compound [OH-] XLYOFNOQVPJJNP-UHFFFAOYSA-M 0.000 description 3
- 239000012535 impurity Substances 0.000 description 3
- HWJHZLJIIWOTGZ-UHFFFAOYSA-N n-(hydroxymethyl)acetamide Chemical compound CC(=O)NCO HWJHZLJIIWOTGZ-UHFFFAOYSA-N 0.000 description 3
- -1 polypropylene Polymers 0.000 description 3
- 229920001155 polypropylene Polymers 0.000 description 3
- 239000002244 precipitate Substances 0.000 description 3
- 125000003748 selenium group Chemical group *[Se]* 0.000 description 3
- SYRHIZPPCHMRIT-UHFFFAOYSA-N tin(4+) Chemical compound [Sn+4] SYRHIZPPCHMRIT-UHFFFAOYSA-N 0.000 description 3
- 229910001233 yttria-stabilized zirconia Inorganic materials 0.000 description 3
- KZBUYRJDOAKODT-UHFFFAOYSA-N Chlorine Chemical compound ClCl KZBUYRJDOAKODT-UHFFFAOYSA-N 0.000 description 2
- ZAMOUSCENKQFHK-UHFFFAOYSA-N Chlorine atom Chemical compound [Cl] ZAMOUSCENKQFHK-UHFFFAOYSA-N 0.000 description 2
- 229920002472 Starch Polymers 0.000 description 2
- 150000007513 acids Chemical class 0.000 description 2
- 239000003795 chemical substances by application Substances 0.000 description 2
- 229910052801 chlorine Inorganic materials 0.000 description 2
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- 238000009770 conventional sintering Methods 0.000 description 2
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- 150000004760 silicates Chemical class 0.000 description 2
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- VEXZGXHMUGYJMC-UHFFFAOYSA-M Chloride anion Chemical compound [Cl-] VEXZGXHMUGYJMC-UHFFFAOYSA-M 0.000 description 1
- NYZCHFJDJHGQDF-UHFFFAOYSA-K O.P(=O)([O-])([O-])[O-].[B+3] Chemical compound O.P(=O)([O-])([O-])[O-].[B+3] NYZCHFJDJHGQDF-UHFFFAOYSA-K 0.000 description 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 230000002159 abnormal effect Effects 0.000 description 1
- 238000010521 absorption reaction Methods 0.000 description 1
- 239000003929 acidic solution Substances 0.000 description 1
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- 150000001639 boron compounds Chemical class 0.000 description 1
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- RVTZCBVAJQQJTK-UHFFFAOYSA-N oxygen(2-);zirconium(4+) Chemical compound [O-2].[O-2].[Zr+4] RVTZCBVAJQQJTK-UHFFFAOYSA-N 0.000 description 1
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- 229910052710 silicon Inorganic materials 0.000 description 1
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- 229910001220 stainless steel Inorganic materials 0.000 description 1
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- 238000003756 stirring Methods 0.000 description 1
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- XSOKHXFFCGXDJZ-UHFFFAOYSA-N telluride(2-) Chemical compound [Te-2] XSOKHXFFCGXDJZ-UHFFFAOYSA-N 0.000 description 1
- 150000003498 tellurium compounds Chemical class 0.000 description 1
- 238000000427 thin-film deposition Methods 0.000 description 1
- QHGNHLZPVBIIPX-UHFFFAOYSA-N tin(ii) oxide Chemical class [Sn]=O QHGNHLZPVBIIPX-UHFFFAOYSA-N 0.000 description 1
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- 229910001928 zirconium oxide Inorganic materials 0.000 description 1
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- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
- C23C14/35—Sputtering by application of a magnetic field, e.g. magnetron sputtering
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- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/06—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
- C23C14/08—Oxides
- C23C14/086—Oxides of zinc, germanium, cadmium, indium, tin, thallium or bismuth
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- C04B35/00—Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products
- C04B35/01—Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products based on oxide ceramics
- C04B35/453—Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products based on oxide ceramics based on zinc, tin, or bismuth oxides or solid solutions thereof with other oxides, e.g. zincates, stannates or bismuthates
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- C04B35/00—Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products
- C04B35/01—Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products based on oxide ceramics
- C04B35/453—Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products based on oxide ceramics based on zinc, tin, or bismuth oxides or solid solutions thereof with other oxides, e.g. zincates, stannates or bismuthates
- C04B35/457—Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products based on oxide ceramics based on zinc, tin, or bismuth oxides or solid solutions thereof with other oxides, e.g. zincates, stannates or bismuthates based on tin oxides or stannates
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- C04B35/00—Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products
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- C04B35/00—Shaped ceramic products characterised by their composition; Ceramics compositions; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products
- C04B35/622—Forming processes; Processing powders of inorganic compounds preparatory to the manufacturing of ceramic products
- C04B35/626—Preparing or treating the powders individually or as batches ; preparing or treating macroscopic reinforcing agents for ceramic products, e.g. fibres; mechanical aspects section B
- C04B35/62605—Treating the starting powders individually or as mixtures
- C04B35/62625—Wet mixtures
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- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/06—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
- C23C14/08—Oxides
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- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
- C23C14/3407—Cathode assembly for sputtering apparatus, e.g. Target
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Abstract
Description
スピンドル65を使用したブルックフィールド(Brookfield)流量計による測定において、500乃至1400cpsの範囲である。
インジウム(III)およびスズ(IV)の硝酸化合物の溶液から、インジウム(III)およびスズ(IV)を共析(沈殿)させた。脱イオン水を用いて、沈殿物を洗浄した。沈殿水酸化物をフィルタ処理した後、800℃乃至1200℃で加熱し、1乃至5m2/gの範囲の表面積を有する酸化物粉末を得た。寸法が1000mm×700mmで、キャビティ厚さが20mmの焼きせっこうのモールドに、10%の砂糖分散液を少量スプレー塗布した。純度99.999%、表面積が3.5m2/gの96000gのITO粉末を含むスラリーであって、インジウム(iii)酸化物が重量比で90%の組成であるスラリーと、重量比で22%のDaravanCのようなポリカルボン酸分散剤の溶液1800gと、重量比で55%のアクリルエマルジョンバインダ500gと、MxOy(ここでM=ヒ素、アンチモン、ビスマスであり、X=2、Y=3、M=セレン、テルルであり、X=1、Y=2)のような酸化物140gと、10000gの脱イオン水とを、50000リットルの容量の高密度ポリプロピレンポット中に入れた。全混合物を、直径12mmのイットリア安定化ジルコニアビードを使用した回転ボールミルを用いて、72時間で完全に混合し、ITOグリーン本体の成形用スリップのため、表面積が9m2/gの十分に混合されたITO粉末のスリップを得た。
インジウム(III)およびスズ(IV)の硝酸化合物の溶液から、インジウム(III)およびスズ(IV)を共析(沈殿)させた。脱イオン水を用いて、沈殿物を洗浄した。沈殿水酸化物をフィルタ処理した後、800℃乃至1200℃で加熱し、1乃至5m2/gの範囲の表面積を有する酸化物粉末を得た。純度99.999%、表面積が3.5m2/gの96000gのITO粉末を含むスラリーであって、インジウム(iii)酸化物が重量比で90%の組成であるスラリーと、重量比で22%のDaravanCのようなポリカルボン酸分散剤の溶液1800gと、重量比で55%のアクリルエマルジョンバインダ500gと、MxOy(ここでM=ヒ素、アンチモン、ビスマスであり、X=2、Y=3、M=セレン、テルルであり、X=1、Y=2)のような酸化物140gと、10000gの脱イオン水とを、50000リットルの容量の高密度ポリプロピレンポット中に入れた。全混合物を、直径12mmのイットリア安定化ジルコニアビードを使用した回転ボールミルを用いて、72時間で完全に混合し、表面積が9m2/gの十分に混合されたITO粉末のスリップを得た。スリップは、加圧スリップキャスティング装置に固定された、寸法が1500mm×800mm×20mmの多孔質高分子モールドに注入し、10MPaで10乃至30分間成形した。次に、モールドを開放して、モールドから成形グリーン本体を取り出した。
インジウム(III)およびスズ(IV)の硝酸化合物の溶液から、インジウム(III)およびスズ(IV)を共析(沈殿)させた。脱イオン水を用いて、沈殿物を洗浄した。沈殿水酸化物をフィルタ処理した後、800℃乃至1200℃で加熱し、1乃至5m2/gの範囲の表面積を有する酸化物粉末を得た。純度99.999%、表面積が3.5m2/gの96000gのITO粉末を含むスラリーであって、インジウム(iii)酸化物が重量比で90%の組成であるスラリーと、重量比で22%のDaravanCのようなポリカルボン酸分散剤の溶液1800gと、重量比で55%のアクリルエマルジョンバインダ500gと、MxOy(ここでM=ヒ素、アンチモン、ビスマスであり、X=2、Y=3、M=セレン、テルルであり、X=1、Y=2)のような酸化物140gと、10000gの脱イオン水とを、50000リットルの容量の高密度ポリプロピレンポット中に入れた。全混合物を、直径12mmのイットリア安定化ジルコニアビードを使用した回転ボールミルを用いて、72時間で完全に混合し、表面積が8.5m2/gの十分に混合されたITO粉末のスリップを得た。スリップは、110℃でのスプレー乾燥操作を用いてスプレー乾燥し、粒状のITO粉末を得た。その後、冷間等静水圧圧縮法を用いて、120MPaの圧力で、直径1500mmのステンレス鋼のモールド内でこれを稠密化し、稠密化されたITOグリーン本体を製造した。
実施例1、2、3と同様の方法を実施した。ただし、スラリーには、140gのヒ素化インジウムを添加した。得られたターゲットは、99.2%の相対密度であった。
実施例1、2、3と同様の方法を実施した。ただし、スラリーには、140gのアンチモン化インジウムを添加した。得られたターゲットは、99.9%の相対密度であった。
実施例1、2、3と同様の方法を実施した。ただし、スラリーには、140gのセレン化インジウムを添加した。得られたターゲットは、99.7%の相対密度であった。
実施例1、2、3と同様の方法を実施した。ただし、スラリーには、140gのテルル化インジウムを添加した。得られたターゲットは、99.9%の相対密度であった。
実施例1、2、3と同様の方法を実施した。ただし、スラリーには、140gのホウ酸を添加した。得られたターゲットは、99.7%の相対密度であった。
実施例1、2、3と同様の方法を実施した。ただし、スラリーには、140gのリン酸ビスマス(III)を添加した。得られたターゲットは、99.9%の相対密度であった。
実施例1、2、3と同様の方法を実施した。ただし、スラリーには、140gのリン酸ホウ素(III)水和物を添加した。得られたターゲットは、99.4%の相対密度であった。
実施例1、2、3と同様の方法を実施した。ただし、スラリーには、140gの酸化ヒ素(III)を添加した。得られたターゲットは、99.9%の相対密度であった。
実施例1、2、3と同様の方法を実施した。ただし、スラリーには、140gの酸化アンチモン(III)を添加した。得られたターゲットは、99.8%の相対密度であった。
実施例1、2、3と同様の方法を実施した。ただし、スラリーには、140gの酸化ビスマス(III)を添加した。得られたターゲットは、99.9%の相対密度であった。
Claims (18)
- 高密度ITOターゲットを製造する方法であって、
重量比で80%を超えるITO粉末含有量の、ITO粉末の水性スリップを形成するステップを有し、
前記スリップは、ヒ素、アンチモン、ビスマス、セレン、テルル、および/またはホウ素のうちの1または2以上の化合物の形態の、1または2以上の焼結助剤を有することを特徴とする方法。 - 前記焼結助剤の一つは、酸化ヒ素(III)であり、濃度は、乾燥ITO粉末の重量比で、0.001%から1%の間であることを特徴とする請求項1に記載の方法。
- 前記焼結助剤の一つは、酸化アンチモン(III)であり、濃度は、乾燥ITO粉末の重量比で、0.001%から1%の間であることを特徴とする請求項1または2に記載の方法。
- 前記焼結助剤の一つは、酸化ビスマス(III)であり、濃度は、乾燥ITO粉末の重量比で、0.001%から1%の間であることを特徴とする請求項1乃至3のいずれか一つに記載の方法。
- 前記焼結助剤の一つは、ホウ酸であり、濃度は、乾燥ITO粉末の重量比で、0.001%から1%の間であることを特徴とする請求項1乃至4のいずれか一つに記載の方法。
- 前記焼結助剤の一つは、酸化テルル(IV)であり、濃度は、乾燥ITO粉末の重量比で、0.001%から1%の間であることを特徴とする請求項1乃至5のいずれか一つに記載の方法。
- 前記焼結助剤の一つは、酸化ビスマス(III)であり、濃度は、乾燥ITO粉末の重量比で、0.001%から1%の間であることを特徴とする請求項1乃至6のいずれか一つに記載の方法。
- 前記焼結助剤の一つは、ヒ素化インジウム(III)であり、濃度は、乾燥ITO粉末の重量比で、0.001%から1%の間であることを特徴とする請求項1乃至7のいずれか一つに記載の方法。
- 前記焼結助剤の一つは、アンチモン化インジウム(III)であり、濃度は、乾燥ITO粉末の重量比で、0.001%から1%の間であることを特徴とする請求項1乃至8のいずれか一つに記載の方法。
- 前記焼結助剤の一つは、セレン化インジウム(III)であり、濃度は、乾燥ITO粉末の重量比で、0.001%から1%の間であることを特徴とする請求項1乃至9のいずれか一つに記載の方法。
- 前記焼結助剤の一つは、テルル化インジウム(III)であり、濃度は、乾燥ITO粉末の重量比で、0.001%から1%の間であることを特徴とする請求項1乃至10のいずれか一つに記載の方法。
- 前記焼結助剤の一つは、リン酸ビスマス(III)であり、濃度は、乾燥ITO粉末の重量比で、0.001%から1%の間であることを特徴とする請求項1乃至11のいずれか一つに記載の方法。
- 前記焼結助剤の一つは、リン酸ホウ素(III)であり、濃度は、乾燥ITO粉末の重量比で、0.001%から1%の間であることを特徴とする請求項1乃至12のいずれか一つに記載の方法。
- さらに、多孔質焼きせっこう(plaster of paris)モールドを用いて、前記スリップを成形し、ITOグリーン本体を製造するステップを有することを特徴とする請求項1乃至13のいずれか一つに記載の方法。
- さらに、加圧スリップキャスティング装置に固定された多孔質高分子モールドを用いて、前記スリップを成形し、ITOグリーン本体を得るステップを有することを特徴とする請求項1乃至13のいずれか一つに記載の方法。
- さらに、前記スリップをスプレー乾燥処理し、粒状ITO粉末を製造するステップを有し、
前記粒状ITO粉末は、冷間等静水圧圧縮法を用いて、グリーン本体に稠密化されることを特徴とする請求項1乃至13のいずれか一つに記載の方法。 - さらに、前記グリーン本体を、最大1700℃のピーク温度で、炉内で熱処理するステップを有することを特徴とする請求項14、15、16のいずれか一つに記載の方法。
- 請求項1乃至17のいずれか一つに記載の方法を用いて製造されたITOターゲット。
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JPWO2018168963A1 (ja) * | 2017-03-15 | 2020-03-05 | キヤノンオプトロン株式会社 | 親水性蒸着膜及び蒸着材料 |
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Also Published As
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EP2601328A1 (en) | 2013-06-12 |
GB2482544A (en) | 2012-02-08 |
KR20130099032A (ko) | 2013-09-05 |
US20130206590A1 (en) | 2013-08-15 |
CN103221572A (zh) | 2013-07-24 |
GB201013255D0 (en) | 2010-09-22 |
WO2012017305A1 (en) | 2012-02-09 |
EP2601328A4 (en) | 2014-02-05 |
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