JP2013519180A5 - - Google Patents

Download PDF

Info

Publication number
JP2013519180A5
JP2013519180A5 JP2012551964A JP2012551964A JP2013519180A5 JP 2013519180 A5 JP2013519180 A5 JP 2013519180A5 JP 2012551964 A JP2012551964 A JP 2012551964A JP 2012551964 A JP2012551964 A JP 2012551964A JP 2013519180 A5 JP2013519180 A5 JP 2013519180A5
Authority
JP
Japan
Prior art keywords
nmos
drain
bulk region
source
transistor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2012551964A
Other languages
English (en)
Japanese (ja)
Other versions
JP2013519180A (ja
JP5649664B2 (ja
Filing date
Publication date
Priority claimed from US12/698,318 external-priority patent/US8363469B1/en
Application filed filed Critical
Publication of JP2013519180A publication Critical patent/JP2013519180A/ja
Publication of JP2013519180A5 publication Critical patent/JP2013519180A5/ja
Application granted granted Critical
Publication of JP5649664B2 publication Critical patent/JP5649664B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

JP2012551964A 2010-02-02 2010-11-29 全ｎｍｏｓ−４トランジスタ不揮発性メモリセルのプログラム方法 Active JP5649664B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US12/698,318 US8363469B1 (en) 2010-02-02 2010-02-02 All-NMOS 4-transistor non-volatile memory cell
US12/698,318 2010-02-02
PCT/US2010/058203 WO2011096977A2 (en) 2010-02-02 2010-11-29 All-nmos 4-transistor non-volatile memory cell

Publications (3)

Publication Number Publication Date
JP2013519180A JP2013519180A (ja) 2013-05-23
JP2013519180A5 true JP2013519180A5 (enExample) 2014-01-16
JP5649664B2 JP5649664B2 (ja) 2015-01-07

Family

ID=44356028

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2012551964A Active JP5649664B2 (ja) 2010-02-02 2010-11-29 全ｎｍｏｓ−４トランジスタ不揮発性メモリセルのプログラム方法

Country Status (5)

Country Link
US (1) US8363469B1 (enExample)
JP (1) JP5649664B2 (enExample)
CN (1) CN102741825B (enExample)
TW (1) TWI449047B (enExample)
WO (1) WO2011096977A2 (enExample)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5556873B2 (ja) * 2012-10-19 2014-07-23 株式会社フローディア 不揮発性半導体記憶装置
CN103137201A (zh) * 2013-03-21 2013-06-05 苏州宽温电子科技有限公司 一种标准逻辑工艺兼容的差分架构nvm存储器单元
US8953380B1 (en) * 2013-12-02 2015-02-10 Cypress Semiconductor Corporation Systems, methods, and apparatus for memory cells with common source lines
US9558804B2 (en) * 2014-07-23 2017-01-31 Namlab Ggmbh Charge storage ferroelectric memory hybrid and erase scheme
US9524785B2 (en) * 2015-04-01 2016-12-20 Ememory Technology Inc. Memory unit with voltage passing device

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7007A (en) * 1850-01-08 Improvement in machinery for making cotton cordage
US9026A (en) * 1852-06-15 Improvement in imitation stone
US6137723A (en) 1998-04-01 2000-10-24 National Semiconductor Corporation Memory device having erasable Frohmann-Bentchkowsky EPROM cells that use a well-to-floating gate coupled voltage during erasure
US6188594B1 (en) 1999-06-09 2001-02-13 Neomagic Corp. Reduced-pitch 6-transistor NMOS content-addressable-memory cell
US6434040B1 (en) 2001-02-23 2002-08-13 Silicon Access Networks Loadless NMOS four transistor SRAM cell
CN1292484C (zh) * 2002-07-31 2006-12-27 连邦科技股份有限公司 非易失性静态随机存取存储器存储单元
US6920061B2 (en) 2003-08-27 2005-07-19 International Business Machines Corporation Loadless NMOS four transistor dynamic dual Vt SRAM cell
US6903978B1 (en) 2003-09-17 2005-06-07 National Semiconductor Corporation Method of PMOS stacked-gate memory cell programming enhancement utilizing stair-like pulses of control gate voltage
US6985386B1 (en) * 2004-07-08 2006-01-10 National Semiconductor Corporation Programming method for nonvolatile memory cell
US6992927B1 (en) 2004-07-08 2006-01-31 National Semiconductor Corporation Nonvolatile memory cell
US7164606B1 (en) 2005-07-15 2007-01-16 National Semiconductor Corporation Reverse fowler-nordheim tunneling programming for non-volatile memory cell
JP2007123830A (ja) * 2005-09-29 2007-05-17 Matsushita Electric Ind Co Ltd 不揮発性半導体記憶装置
CN1941203A (zh) * 2005-09-29 2007-04-04 松下电器产业株式会社 非易失性半导体存储装置
US7483310B1 (en) * 2006-11-02 2009-01-27 National Semiconductor Corporation System and method for providing high endurance low cost CMOS compatible EEPROM devices
US7453726B1 (en) 2007-01-23 2008-11-18 National Semiconductor Corporation Non-volatile memory cell with improved programming technique and density
JP5228195B2 (ja) * 2007-04-20 2013-07-03 インターチップ株式会社 不揮発性メモリ内蔵シフトレジスタ
JP5266443B2 (ja) * 2008-04-18 2013-08-21 インターチップ株式会社 不揮発性メモリセル及び不揮発性メモリセル内蔵データラッチ

Similar Documents

Publication Publication Date Title
JP2013519182A5 (enExample)
JP2012221522A5 (enExample)
JP2011508354A5 (enExample)
TWI736763B (zh) 記憶體電路、操作記憶體電路的方法以及記憶體陣列
WO2011096978A3 (en) 5-transistor non-volatile memory cell
WO2016012976A3 (en) Charge storage ferroelectric memory hybrid and erase scheme
JP2005527933A5 (enExample)
JP2011187940A5 (enExample)
US20130223148A1 (en) Nonvolatile memory device and embedded memory system including the same
JP2014022031A5 (enExample)
JP2010520571A5 (enExample)
TW200746148A (en) Non-volatile memory embedded in a conventional logic process and methods for operating same
JP2013149984A5 (enExample)
JP2013519180A5 (enExample)
US20190006013A1 (en) Selective body reset operation for three dimensional (3d) nand memory
JP2012195051A5 (enExample)
CN1391231A (zh) 非易失性半导体存储装置的编程方法
WO2008070578A3 (en) Method for reducing charge loss in analog floating gate cell
WO2011096977A3 (en) All-nmos 4-transistor non-volatile memory cell
JP2008541325A5 (enExample)
TW200701237A (en) Reference scheme for a non-volatile semiconductor memory device
JP2011524599A5 (enExample)
CN104103305B (zh) 半导体器件和包括半导体器件的半导体系统
KR101458792B1 (ko) 플래시 메모리 장치
CN104464810B (zh) 存储器及其擦除、编程和读取方法