JP2012501542A5 - - Google Patents
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- JP2012501542A5 JP2012501542A5 JP2011525070A JP2011525070A JP2012501542A5 JP 2012501542 A5 JP2012501542 A5 JP 2012501542A5 JP 2011525070 A JP2011525070 A JP 2011525070A JP 2011525070 A JP2011525070 A JP 2011525070A JP 2012501542 A5 JP2012501542 A5 JP 2012501542A5
- Authority
- JP
- Japan
- Prior art keywords
- layer
- groove
- semiconductor
- liner
- covering
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US12/199,616 US7998832B2 (en) | 2008-08-27 | 2008-08-27 | Semiconductor device with isolation trench liner, and related fabrication methods |
| US12/199,616 | 2008-08-27 | ||
| PCT/US2009/053271 WO2010025024A1 (en) | 2008-08-27 | 2009-08-10 | Semiconductor device with isolation trench liner, and related fabrication methods |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2012501542A JP2012501542A (ja) | 2012-01-19 |
| JP2012501542A5 true JP2012501542A5 (enExample) | 2012-09-06 |
| JP5619003B2 JP5619003B2 (ja) | 2014-11-05 |
Family
ID=41202835
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2011525070A Active JP5619003B2 (ja) | 2008-08-27 | 2009-08-10 | 分離溝ライナを有する半導体デバイス、及び関連する製造方法 |
Country Status (6)
| Country | Link |
|---|---|
| US (3) | US7998832B2 (enExample) |
| EP (1) | EP2324496B1 (enExample) |
| JP (1) | JP5619003B2 (enExample) |
| KR (2) | KR101701360B1 (enExample) |
| CN (1) | CN102132397B (enExample) |
| WO (1) | WO2010025024A1 (enExample) |
Families Citing this family (25)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2007083237A1 (en) * | 2006-01-18 | 2007-07-26 | Stmicroelectronics (Crolles 2) Sas | Integration of self-aligned trenches in-between metal lines |
| JP2010199156A (ja) * | 2009-02-23 | 2010-09-09 | Panasonic Corp | 半導体装置及びその製造方法 |
| US20110014726A1 (en) | 2009-07-20 | 2011-01-20 | Taiwan Semiconductor Manufacturing Company, Ltd. | Method of forming shallow trench isolation structure |
| US8716095B2 (en) * | 2010-06-03 | 2014-05-06 | Institute of Microelectronics, Chinese Academy of Sciences | Manufacturing method of gate stack and semiconductor device |
| US8680644B2 (en) * | 2011-04-11 | 2014-03-25 | International Business Machines Coroporation | Semiconductor device and method for making same |
| US8530312B2 (en) | 2011-08-08 | 2013-09-10 | Micron Technology, Inc. | Vertical devices and methods of forming |
| FR2981793A1 (fr) * | 2011-10-25 | 2013-04-26 | St Microelectronics Crolles 2 | Procede de fabrication de transistors a grille isolee |
| US8564074B2 (en) * | 2011-11-29 | 2013-10-22 | International Business Machines Corporation | Self-limiting oxygen seal for high-K dielectric and design structure |
| JP5999525B2 (ja) * | 2012-03-23 | 2016-09-28 | 国立研究開発法人科学技術振興機構 | 薄膜トランジスタ及び薄膜トランジスタの製造方法 |
| US20130341762A1 (en) * | 2012-06-20 | 2013-12-26 | Macronix International Co., Ltd. | Semiconductor hole structure |
| US9059243B2 (en) | 2012-06-25 | 2015-06-16 | International Business Machines Corporation | Shallow trench isolation structures |
| JP6033594B2 (ja) * | 2012-07-18 | 2016-11-30 | 国立大学法人北陸先端科学技術大学院大学 | 薄膜トランジスタ及び薄膜トランジスタの製造方法 |
| KR20140059107A (ko) * | 2012-11-07 | 2014-05-15 | 주식회사 유피케미칼 | 실리콘 질화물 박막 제조 방법 |
| US8900952B2 (en) | 2013-03-11 | 2014-12-02 | International Business Machines Corporation | Gate stack including a high-k gate dielectric that is optimized for low voltage applications |
| US20140315371A1 (en) * | 2013-04-17 | 2014-10-23 | International Business Machines Corporation | Methods of forming isolation regions for bulk finfet semiconductor devices |
| US9679917B2 (en) | 2014-12-23 | 2017-06-13 | International Business Machines Corporation | Semiconductor structures with deep trench capacitor and methods of manufacture |
| US9991124B2 (en) * | 2015-01-20 | 2018-06-05 | Taiwan Semiconductor Manufacturing Company Ltd. | Metal gate and manufacturing method thereof |
| KR102271239B1 (ko) | 2015-03-23 | 2021-06-29 | 삼성전자주식회사 | 반도체 장치 및 이의 제조 방법 |
| US9865703B2 (en) | 2015-12-31 | 2018-01-09 | International Business Machines Corporation | High-K layer chamfering to prevent oxygen ingress in replacement metal gate (RMG) process |
| US10504912B2 (en) * | 2017-07-28 | 2019-12-10 | Taiwan Semiconductor Manufacturing Co., Ltd. | Seal method to integrate non-volatile memory (NVM) into logic or bipolar CMOS DMOS (BCD) technology |
| DE102018107908B4 (de) * | 2017-07-28 | 2023-01-05 | Taiwan Semiconductor Manufacturing Co., Ltd. | Verfahren zum Bilden eines integrierten Schaltkreises mit einer Versiegelungsschicht zum Bilden einer Speicherzellenstruktur in Logik- oder BCD-Technologie sowie ein integrierter Schaltkreis mit einer Dummy-Struktur an einer Grenze einer Vorrichtungsregion |
| CN110707086B (zh) * | 2018-10-09 | 2022-02-18 | 联华电子股份有限公司 | 半导体元件 |
| TW202209688A (zh) * | 2020-06-05 | 2022-03-01 | 日商Ｆｌｏｓｆｉａ股份有限公司 | 半導體裝置 |
| KR20220085482A (ko) | 2020-12-15 | 2022-06-22 | 삼성전자주식회사 | 반도체 소자 |
| CN117156850A (zh) * | 2022-05-18 | 2023-12-01 | 联华电子股份有限公司 | 半导体元件及其制作方法 |
Family Cites Families (17)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100286736B1 (ko) | 1998-06-16 | 2001-04-16 | 윤종용 | 트렌치 격리 형성 방법 |
| US6306741B1 (en) * | 2000-07-13 | 2001-10-23 | Chartered Semiconductor Manufacturing, Inc. | Method of patterning gate electrodes with high K gate dielectrics |
| KR100421046B1 (ko) | 2001-07-13 | 2004-03-04 | 삼성전자주식회사 | 반도체 장치 및 그 제조방법 |
| US6713335B2 (en) | 2002-08-22 | 2004-03-30 | Chartered Semiconductor Manufacturing Ltd. | Method of self-aligning a damascene gate structure to isolation regions |
| US6828211B2 (en) | 2002-10-01 | 2004-12-07 | Taiwan Semiconductor Manufacturing Co., Ltd. | Shallow trench filled with two or more dielectrics for isolation and coupling or for stress control |
| DE20308406U1 (de) * | 2003-05-28 | 2003-08-07 | Dekema Dental-Keramiköfen GmbH, 83395 Freilassing | Ofen für Zahnersatz oder -teilersatz |
| US7071515B2 (en) * | 2003-07-14 | 2006-07-04 | Taiwan Semiconductor Manufacturing Co., Ltd. | Narrow width effect improvement with photoresist plug process and STI corner ion implantation |
| US6936881B2 (en) * | 2003-07-25 | 2005-08-30 | Taiwan Semiconductor Manufacturing Company, Ltd. | Capacitor that includes high permittivity capacitor dielectric |
| US6940705B2 (en) * | 2003-07-25 | 2005-09-06 | Taiwan Semiconductor Manufacturing Company, Ltd. | Capacitor with enhanced performance and method of manufacture |
| JP3802530B2 (ja) * | 2003-12-12 | 2006-07-26 | 株式会社東芝 | 半導体装置及びその製造方法 |
| US7015113B2 (en) * | 2004-04-01 | 2006-03-21 | Micron Technology, Inc. | Methods of forming trench isolation regions |
| KR100672754B1 (ko) * | 2004-05-10 | 2007-01-22 | 주식회사 하이닉스반도체 | 트렌치형 소자분리막을 구비한 반도체 소자의 제조 방법 |
| US7160819B2 (en) * | 2005-04-25 | 2007-01-09 | Sharp Laboratories Of America, Inc. | Method to perform selective atomic layer deposition of zinc oxide |
| US20070003203A1 (en) * | 2005-06-30 | 2007-01-04 | Palmer Jeffrey D | Methods and apparatus for stripping optical fiber |
| US7586158B2 (en) * | 2005-07-07 | 2009-09-08 | Infineon Technologies Ag | Piezoelectric stress liner for bulk and SOI |
| US7229896B2 (en) * | 2005-08-03 | 2007-06-12 | United Microelectronics Corp. | STI process for eliminating silicon nitride liner induced defects |
| KR100764742B1 (ko) | 2006-06-16 | 2007-10-08 | 삼성전자주식회사 | 반도체 소자 및 그 제조 방법 |
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2008
- 2008-08-27 US US12/199,616 patent/US7998832B2/en active Active
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2009
- 2009-08-10 KR KR1020117006475A patent/KR101701360B1/ko active Active
- 2009-08-10 KR KR1020177002051A patent/KR101810111B1/ko active Active
- 2009-08-10 EP EP09791330.5A patent/EP2324496B1/en active Active
- 2009-08-10 WO PCT/US2009/053271 patent/WO2010025024A1/en not_active Ceased
- 2009-08-10 JP JP2011525070A patent/JP5619003B2/ja active Active
- 2009-08-10 CN CN200980134161.7A patent/CN102132397B/zh active Active
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2011
- 2011-07-07 US US13/178,362 patent/US8217472B2/en active Active
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2012
- 2012-05-16 US US13/473,175 patent/US8716828B2/en active Active